JPH05306466A - Plasma cvd apparatus - Google Patents

Plasma cvd apparatus

Info

Publication number
JPH05306466A
JPH05306466A JP11108592A JP11108592A JPH05306466A JP H05306466 A JPH05306466 A JP H05306466A JP 11108592 A JP11108592 A JP 11108592A JP 11108592 A JP11108592 A JP 11108592A JP H05306466 A JPH05306466 A JP H05306466A
Authority
JP
Japan
Prior art keywords
substrate
processing chamber
thin film
plasma cvd
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11108592A
Other languages
Japanese (ja)
Inventor
Yuichiro Yamada
雄一郎 山田
Hiroshi Tanabe
浩 田辺
Riyuuzou Houchin
隆三 宝珍
Tomohiro Okumura
智洋 奧村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11108592A priority Critical patent/JPH05306466A/en
Publication of JPH05306466A publication Critical patent/JPH05306466A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide the plasma CVD apparatus which is excellent in the heating performance of substrates, does not require the labor for maintenance and administration and is good in treatment quality. CONSTITUTION:This apparatus has an electrode member 30 and means for supplying reactive gases consisting of shower plates 40, etc., in the positions facing the surfaces of substrates 20 held on holding means, such as substrate holders 22 within a treating chamber 10. The apparatus has also light transmittable double windows 50 in the positions facing the rear surfaces of the substrates 20 on the wall surfaces of the treating chamber 10 and has heating lamps 60 adjacently to the light transmittable double windows 50 on the wall surface of the treating chamber 10. The substrates 20 in the treating chamber 10 are heated via the light transmittable double windows 50 by the radiation heat from the heating lamps 60.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、プラズマCVD装置
に関し、詳しくは、比較的大型の基板に対してプラズマ
CVD法による薄膜形成を行うのに適したプラズマCV
D装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma CVD apparatus, and more particularly to a plasma CV suitable for forming a thin film on a relatively large substrate by the plasma CVD method.
D device.

【0002】[0002]

【従来の技術】従来、プラズマCVD装置は、半導体製
造用のシリコン基板など、比較的小型の基板に対する薄
膜形成に利用されていたが、近年、大型液晶板のよう
に、面積の大きな基板に対する薄膜形成にも利用される
ようになってきた。また、従来のプラズマCVD装置で
は、一定枚数の基板毎に薄膜形成処理を行うバッチ式の
装置が多かったが、近年、基板の取り扱いを自動化し
て、基板を処理室に順番に送り込み、薄膜形成処理やそ
の前処理である加熱処理、後処理である冷却処理などを
連続的に行う連続式の装置も開発されている。
2. Description of the Related Art Conventionally, a plasma CVD apparatus has been used for forming a thin film on a relatively small substrate such as a silicon substrate for semiconductor manufacturing, but in recent years, a thin film for a large area substrate such as a large liquid crystal plate has been used. It has also come to be used for formation. In addition, in the conventional plasma CVD apparatus, there were many batch-type apparatuses that perform a thin film forming process for every fixed number of substrates. In recent years, however, the substrate handling is automated and the substrates are sequentially fed into the processing chamber to form a thin film. A continuous apparatus for continuously performing treatment, heat treatment as its pretreatment and cooling treatment as its posttreatment has also been developed.

【0003】図2は、従来、大型液晶板などの作製に利
用されていたプラズマCVD装置の構造を表している。
ガラス等からなる基板1は、左右一対の基板トレー2
に、それぞれ複数枚づつ装着されており、基板トレー2
はコンベア等の搬送手段に取り付けられている。基板1
は基板トレー2に取り付けられた状態で、処理室3に順
次連続的に送り込まれ、処理が終了すれば、処理室3か
ら運び出される。処理室3内には、左右の基材トレー2
の隙間位置に、シーズヒータパネル4が設置されてお
り、このヒータパネル4で、基板1を背面から加熱す
る。基板トレー2の左右外側には、それぞれ、電極部材
6およびシャワープレート5が設置されている。電極部
材6には高周波電源が接続され、シャワープレート5と
電極部材6の間の空間には反応ガスが供給されるように
なっており、電極部材6と基板トレー2の間に電圧を印
加しながら、シャワープレート5の前面から基板1のほ
うに反応ガスを噴出することにより、基板1の表面に薄
膜が形成されるようになっている。
FIG. 2 shows the structure of a plasma CVD apparatus which has been conventionally used for producing a large liquid crystal plate or the like.
The substrate 1 made of glass or the like is a pair of left and right substrate trays 2.
Each of them is mounted on the
Is attached to a conveyer such as a conveyor. Board 1
While being attached to the substrate tray 2, they are sequentially and continuously fed into the processing chamber 3, and when the processing is completed, they are carried out of the processing chamber 3. Left and right substrate trays 2 in the processing chamber 3
The sheathed heater panel 4 is installed in the gap position of 1., and the heater panel 4 heats the substrate 1 from the back surface. Electrode members 6 and shower plates 5 are installed on the left and right outer sides of the substrate tray 2, respectively. A high frequency power source is connected to the electrode member 6, and a reaction gas is supplied to the space between the shower plate 5 and the electrode member 6, and a voltage is applied between the electrode member 6 and the substrate tray 2. Meanwhile, a thin film is formed on the surface of the substrate 1 by ejecting a reaction gas from the front surface of the shower plate 5 toward the substrate 1.

【0004】[0004]

【発明が解決しようとする課題】ところが、上記のよう
な従来のプラズマCVD装置では、ヒータパネルを用い
ているため、加熱効率が悪く、取り扱いが面倒であると
いう問題があった。
However, since the conventional plasma CVD apparatus as described above uses the heater panel, there is a problem that the heating efficiency is poor and the handling is troublesome.

【0005】これは、まず、プラズマCVD装置の処理
室3内では、真空状態で基板を加熱することになる。ヒ
ータパネル4の伝熱効率は、熱伝導では優れているが、
真空空間を挟んだ輻射伝熱では低い効率しか達成できな
いという特性がある。基板1および基板トレー2は、コ
ンベア等による移動がスムーズに行えるように、ヒータ
パネル4との間に、ある程度の隙間をあけた状態で配置
されるので、基板1とヒータパネル4の間には、どうし
ても隙間があく。その結果、ヒータパネル4から基板1
への伝熱が良好に行われず、加熱効率が悪くなってしま
うのである。
This means that the substrate is heated in a vacuum state in the processing chamber 3 of the plasma CVD apparatus. The heat transfer efficiency of the heater panel 4 is excellent in heat conduction,
Radiant heat transfer across a vacuum space has the characteristic that only low efficiency can be achieved. The board 1 and the board tray 2 are arranged with a certain gap between them and the heater panel 4 so that the board 1 and the board tray 2 can be smoothly moved by a conveyor or the like. , There is a gap. As a result, the heater panel 4 to the substrate 1
Therefore, the heat transfer to the heater is not performed well, and the heating efficiency becomes poor.

【0006】また、プラズマCVD装置で薄膜形成を行
うと、基板1の表面以外にも薄膜が付着する。当然、ヒ
ータパネル4やその周辺にも、上記のような薄膜の付着
が生じる。そこで、定期的に、処理室3内の構造部材に
付着した薄膜を除去する必要がある。一方、ヒータパネ
ル4は、処理室3内で適当な支持部材に取り付けられて
おり、ヒータパネル4の熱が支持部材から外部に逃げ出
さないように、支持部材へのヒータパネル4の取付個所
には、スリットや切り欠きが多数形成されている。この
スリットや切り欠きの内部にも、前記した薄膜の付着が
生じる。平坦な面に付着した薄膜を除去するのは比較的
簡単であるが、上記したスリットや切り欠きの内部まで
付着した薄膜を除去するのは非常に面倒であり、手間の
かかる作業であった。特に、ヒータパネル4の内部機構
を含めた全体を、処理室3内から取り出して、薄膜の除
去作業を行わなければならないため、作業時間のロスが
大きい。しかも、薄膜の除去が不十分である場合、この
薄膜が、以後の処理工程中に脱落して基板1の表面に付
着すると、基板1の仕上がり品質が大きく損なわれるこ
とになる。
Further, when a thin film is formed by the plasma CVD apparatus, the thin film is attached to other than the surface of the substrate 1. As a matter of course, the above-mentioned thin film adheres to the heater panel 4 and its periphery. Therefore, it is necessary to regularly remove the thin film attached to the structural members in the processing chamber 3. On the other hand, the heater panel 4 is attached to an appropriate supporting member in the processing chamber 3, and the heater panel 4 is attached to the supporting member at a mounting position so that heat of the heater panel 4 does not escape to the outside from the supporting member. , Many slits and notches are formed. The thin film adheres to the inside of the slits or notches. It is relatively easy to remove the thin film attached to the flat surface, but it is very troublesome and time-consuming to remove the thin film attached even to the inside of the slits or notches. In particular, the entire work including the internal mechanism of the heater panel 4 has to be taken out from the inside of the processing chamber 3 to remove the thin film, resulting in a large loss of work time. In addition, if the thin film is not sufficiently removed, if the thin film falls off and adheres to the surface of the substrate 1 during the subsequent processing steps, the finish quality of the substrate 1 is greatly impaired.

【0007】さらに、大型のヒータパネル4は、一旦冷
却してしまうと、再度所定の温度まで昇温するのに時間
がかかるため、前記したような、ヒータパネル4の取り
外しおよび薄膜除去作業を行うと、つぎに処理を開始で
きるまでに、長い昇温待機時間を設けなければならず、
作業時間の無駄および加熱エネルギーの無駄が大きいも
のであった。
Further, once the large heater panel 4 is cooled, it takes time to raise the temperature to a predetermined temperature again. Therefore, the above-described removal of the heater panel 4 and thin film removal work are performed. Then, until the next process can be started, a long temperature rising waiting time must be set,
The waste of working time and the waste of heating energy were large.

【0008】そこで、この発明の課題は、前記したよう
なプラズマCVD装置における問題点を解消し、基板の
加熱性能に優れ、保守管理に手間がかからず、処理品質
も良好なプラズマCVD装置を提供することにある。
[0008] Therefore, an object of the present invention is to solve the problems in the plasma CVD apparatus as described above, to provide a plasma CVD apparatus which has excellent substrate heating performance, requires less maintenance, and has good processing quality. To provide.

【0009】[0009]

【課題を解決するための手段】上記課題を解決する、こ
の発明にかかるプラズマCVD装置は、処理室内で、保
持手段に保持された基板の表面と対向する位置に、電極
部材および反応ガスの供給手段を備えるとともに、処理
室壁面で基板の背面と対向する位置に光透過二重窓を備
え、処理室外で光透過二重窓に隣接して加熱ランプを備
えている。
A plasma CVD apparatus according to the present invention which solves the above-mentioned problems supplies an electrode member and a reaction gas to a position facing a surface of a substrate held by a holding means in a processing chamber. The light-transmitting double window is provided on the wall surface of the processing chamber facing the back surface of the substrate, and the heating lamp is provided adjacent to the light-transmitting double window outside the processing chamber.

【0010】プラズマCVD装置の基本的な構造は、通
常の装置と同様であり、真空排気が可能な処理室内に、
プラズマを形成させるための電圧を印加する電極部材
や、プラズマを構成する反応ガスを供給する反応ガスの
供給手段などを備えているとともに、基板を保持する基
板トレーあるいは基板ホルダーなどの保持手段が、コン
ベア等の搬送機構によって、処理室の内部に出入り自在
に設置されている。
The basic structure of the plasma CVD apparatus is the same as that of an ordinary apparatus, and a processing chamber capable of vacuum exhaustion is
An electrode member for applying a voltage for forming plasma, a reaction gas supply means for supplying a reaction gas forming plasma, and the like, and a holding means such as a substrate tray or a substrate holder for holding a substrate, It is installed in and out of the processing chamber by a transport mechanism such as a conveyor.

【0011】基板は、プラズマCVDの目的に合わせ
て、ガラス基板その他の通常の基板材料が用いられ、ま
た、形成する薄膜の種類によって、任意の反応ガスを用
いることができる。基板を、基板トレーなどの保持手段
に保持された状態で、処理室に送り込む際には、基板お
よび基板トレーが垂直に立った状態、および、水平に寝
かせた状態の何れであってもよい。基板トレー等の保持
手段の構造も、通常の薄膜形成装置と同様の構造でよ
い。
As the substrate, a glass substrate or other ordinary substrate material is used for the purpose of plasma CVD, and any reaction gas can be used depending on the type of thin film to be formed. When the substrate is held in a holding means such as a substrate tray and sent into the processing chamber, the substrate and the substrate tray may be in a vertically standing state or in a horizontally lying state. The structure of the holding means such as the substrate tray may be the same as that of a normal thin film forming apparatus.

【0012】処理室内で、保持手段に保持された基板の
表面と対向する位置に、電極部材および反応ガスの供給
手段を備えておくのは、従来のプラズマCVD装置と同
様である。電極部材やガス供給手段の基本的な構造も、
通常の装置と同様でよい。
As in the conventional plasma CVD apparatus, an electrode member and a reaction gas supply means are provided at positions facing the surface of the substrate held by the holding means in the processing chamber. The basic structure of electrode members and gas supply means
It may be similar to a normal device.

【0013】この発明では、処理室壁面で基板の背面と
対向する位置に光透過二重窓を備えており、処理室外で
光透過二重窓に隣接して加熱ランプを備えている。した
がって、基板に対する加熱は、加熱ランプからの照射光
が、光透過二重窓を通過して基板または保持手段に当た
ることによって行われ、従来の装置のようなヒータパネ
ルは使用しない。
In the present invention, the light transmission double window is provided at a position facing the back surface of the substrate on the wall surface of the processing chamber, and the heating lamp is provided adjacent to the light transmission double window outside the processing chamber. Therefore, the heating of the substrate is performed by the irradiation light from the heating lamp passing through the light-transmissive double window and hitting the substrate or the holding means, and does not use a heater panel like the conventional device.

【0014】加熱ランプは、通常の各種加熱装置で用い
られている加熱ランプが用いられ、赤外線ランプなどの
加熱効率の良いランプが好ましい。光透過二重窓を構成
する光透過性材料は、加熱ランプの照射光を良好に透過
するととも、処理室内の真空状態を良好に維持できる密
閉性や機械的強度あるいは耐熱性などに優れたものが好
ましい。具体的には、石英ガラスなどが使用される。光
透過二重窓とは、光透過性材料からなる光透過板が、処
理室の内面側と外面側の二重構造になっているものであ
る。そして、少なくとも内面側の光透過板は着脱自在に
なっていることが望ましい。内外の光透過板は、その厚
みや材料が異なるものであってもよい。
As the heating lamp, a heating lamp used in various ordinary heating devices is used, and a lamp having a high heating efficiency such as an infrared lamp is preferable. The light-transmissive material that composes the light-transmissive double window is a material that can transmit the irradiation light of the heating lamp well and that is excellent in hermeticity, mechanical strength, and heat resistance that can maintain a good vacuum condition in the processing chamber. Is preferred. Specifically, quartz glass or the like is used. The light-transmissive double window is a light-transmissive plate made of a light-transmissive material having a double structure on the inner surface side and the outer surface side of the processing chamber. It is desirable that at least the light transmitting plate on the inner surface side be detachable. The inner and outer light transmitting plates may be different in thickness and material.

【0015】処理室に、左右一対の基板保持手段が同時
に出入りするように構成し、左右の基板保持手段に、そ
れぞれ基板を、その表面が内側を向くように保持し、そ
の中央に、前記電極部材および反応ガス供給手段を、両
側の基板とそれぞれ対向するように設置し、さらに、左
右の基板保持手段の外側の処理室壁面にそれぞれ光透過
二重窓を設け、その外側にそれぞれ加熱ランプを配置し
ておけば、左右の基板保持手段に取り付けた複数の基板
を同時に効率良く処理することができ、プラズマCVD
装置の処理効率の向上および設備の小型化を図ることが
できる。
A pair of left and right substrate holding means are configured to move in and out of the processing chamber at the same time, and the left and right substrate holding means hold substrates so that their surfaces face inward, and the electrode is provided at the center thereof. The members and the reaction gas supply means are installed so as to face the substrates on both sides, and further, light-transmitting double windows are provided on the wall surfaces of the processing chambers outside the left and right substrate holding means, and heating lamps are provided on the outside thereof. If arranged, the plurality of substrates attached to the left and right substrate holding means can be processed efficiently at the same time, and plasma CVD
It is possible to improve the processing efficiency of the device and downsize the equipment.

【0016】[0016]

【作用】この発明では、基板の加熱を、処理室内に設置
されたヒータパネルで行う代わりに、処理室外に設置さ
れた加熱ランプで、処理室壁面に設けられた光透過二重
窓を通じて行う。加熱ランプによる加熱は、輻射熱によ
る加熱であるから、基板との間に真空空間があっても、
伝熱効率には影響がなく、基板を効率良く迅速に加熱す
ることができる。
According to the present invention, the substrate is heated by the heating lamp installed outside the processing chamber through the light-transmissive double window provided on the wall surface of the processing chamber, instead of the heater panel installed inside the processing chamber. Since the heating by the heating lamp is the heating by the radiant heat, even if there is a vacuum space with the substrate,
The heat transfer efficiency is not affected and the substrate can be heated efficiently and quickly.

【0017】処理室内にヒータパネルのような複雑な構
造部分が存在しないので、基板以外の部材に薄膜が付着
しても、この付着した薄膜は簡単に除去することができ
る。特に、光透過二重窓を構成する光透過性材料は、石
英ガラスなど、平坦かつ平滑な表面を有するものが使用
できるから、薄膜の除去はきわめて簡単になる。また、
光透過性材料は比較的単純な構造の部品であるから、こ
れを取り外したり、交換したりするのも容易である。基
板に薄膜形成する際に光透過二重窓に薄膜が付着して
も、この薄膜が付着した内面側の光透過板のみを取り外
して薄膜を除去したり、交換したりすることによって、
薄膜の除去作業を簡略化できる。
Since there is no complicated structural portion such as the heater panel in the processing chamber, even if the thin film adheres to a member other than the substrate, the adhered thin film can be easily removed. In particular, as the light-transmissive material forming the light-transmissive double window, a material having a flat and smooth surface such as quartz glass can be used, so that the thin film can be removed very easily. Also,
Since the light transmissive material is a component having a relatively simple structure, it is easy to remove or replace it. Even if a thin film adheres to the light transmitting double window when forming a thin film on the substrate, by removing only the light transmitting plate on the inner surface side to which this thin film is attached and removing or replacing the thin film,
The work of removing the thin film can be simplified.

【0018】加熱ランプによる加熱は、ランプの点灯と
同時に直ぐに開始されるから、従来のヒータパネルのよ
うに、一旦冷却すると再昇温するのに長い時間がかかる
ものに比べて、作業の開始が迅速に行われ、保守管理の
ための作業時間のロスを短くして、プラズマCVD装置
の利用効率を高めることができる。
Since the heating by the heating lamp is started immediately after the lighting of the lamp, the work can be started as compared with the conventional heater panel which takes a long time to reheat after being cooled once. It can be performed quickly, the loss of work time for maintenance management can be shortened, and the utilization efficiency of the plasma CVD apparatus can be improved.

【0019】[0019]

【実施例】ついで、この発明の実施例を図面を参照しな
がら以下に説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0020】図1は、プラズマCVD装置の全体構造を
表している。処理室10には、真空排気口12を備えて
いる。基板20は、基板ホルダー22に保持され、基板
ホルダー22を垂直に立てた状態で、処理室10の内部
に送り込まれる。基板ホルダー22は、コンベア機構な
どの搬送手段に取り付けられているが、搬送手段につい
ては図示を省略している。一対の基板ホルダー22が、
処理室10の左右の壁面近くに、それぞれ配置される。
左右の基板ホルダー22に保持された基板20は、互い
に中央側に表面を向けている。
FIG. 1 shows the overall structure of the plasma CVD apparatus. The processing chamber 10 is provided with a vacuum exhaust port 12. The substrate 20 is held by the substrate holder 22, and is fed into the processing chamber 10 with the substrate holder 22 standing upright. The substrate holder 22 is attached to a conveying means such as a conveyor mechanism, but the conveying means is not shown. The pair of substrate holders 22
They are arranged near the left and right wall surfaces of the processing chamber 10, respectively.
The substrates 20 held by the left and right substrate holders 22 face each other toward the center.

【0021】左右の基板ホルダー22の内側には、それ
ぞれの基板20の表面と対向する位置に、電極部材30
およびシャワープレート40が設置されている。シャワ
ープレート40には、多数のガス通過孔42が貫通形成
されている。電極部材30の前面で、シャワープレート
40の背面に形成された空間44に、ガス供給配管46
が連結されている。電極部材30には、高周波電源32
が接続されている。電極部材30とシャワープレート4
0の間は絶縁されている。反応ガスは、ガス供給配管4
6から空間44に入り、ガス通過孔42を経て、基板2
0に向かって供給される。
Inside the left and right substrate holders 22, electrode members 30 are provided at positions facing the surfaces of the respective substrates 20.
And the shower plate 40 is installed. A large number of gas passage holes 42 are formed through the shower plate 40. In the space 44 formed on the front surface of the electrode member 30 and on the back surface of the shower plate 40, the gas supply pipe 46 is provided.
Are connected. The electrode member 30 includes a high frequency power source 32.
Are connected. Electrode member 30 and shower plate 4
It is insulated between 0. The reaction gas is the gas supply pipe 4
6 enters the space 44, passes through the gas passage hole 42,
Supplied towards 0.

【0022】つぎに、基板ホルダー22の左右外側で、
処理室10の壁面には光透過二重窓50が設けられて
る。光透過二重窓50には、石英ガラスなどからなる、
内外2重の光透過板52、54が取り付けられている。
内側の光透過板52は、取り外し自在になっている。光
透過二重窓50の外側には、加熱ランプ60が設置され
ている。加熱ランプ60は、ランプ光源と反射板などか
らなり、加熱ランプ60の照射光が、光透過二重窓50
を通じて処理室10内の基板ホルダー22背面に当たる
ようになっている。
Next, on the right and left outer sides of the substrate holder 22,
A light transmission double window 50 is provided on the wall surface of the processing chamber 10. The light transmission double window 50 is made of quartz glass or the like,
Inner and outer double light transmission plates 52 and 54 are attached.
The inner light transmitting plate 52 is removable. A heating lamp 60 is installed outside the light transmission double window 50. The heating lamp 60 is composed of a lamp light source and a reflecting plate, and the irradiation light of the heating lamp 60 is a light transmitting double window 50.
It contacts the back surface of the substrate holder 22 in the processing chamber 10 through.

【0023】上記のような構造のプラズマCVD装置で
は、基板ホルダー22に保持された基板20を処理室1
0に挿入した後、加熱ランプ60を点灯すれば、光透過
二重窓50を介して基板ホルダー22および基板20に
輻射熱が供給され、基板ホルダー22および基板20が
加熱昇温される。電極部材30に電圧を印加し、ガス供
給配管46から反応ガスを供給すれば、この反応ガスの
プラズマが生成し、基板20の表面に供給されて、いわ
ゆるプラズマCVDによる薄膜の形成が行われることに
なる。
In the plasma CVD apparatus having the above structure, the substrate 20 held by the substrate holder 22 is placed in the processing chamber 1
When the heating lamp 60 is turned on after the insertion into the 0, the radiant heat is supplied to the substrate holder 22 and the substrate 20 through the light transmitting double window 50, and the substrate holder 22 and the substrate 20 are heated and heated. When a voltage is applied to the electrode member 30 and a reaction gas is supplied from the gas supply pipe 46, plasma of this reaction gas is generated and supplied to the surface of the substrate 20 to form a thin film by so-called plasma CVD. become.

【0024】プラズマCVD装置で薄膜形成を行ってい
ると、基板20以外の個所にも薄膜が付着する。そし
て、光透過二重窓50の内面にも薄膜が付着することに
なる。この場合、光透過二重窓50を構成する光透過板
52、54のうち、内面側の光透過板52のみを取り外
して、新しい光透過板52と交換したり、取り外した光
透過板52の薄膜を処理室10外で除去してから、再び
取り付けなおせばよい。加熱ランフ60の交換や点検
は、処理室10外で自由に行える。
When a thin film is formed by the plasma CVD apparatus, the thin film adheres to a place other than the substrate 20. Then, the thin film also adheres to the inner surface of the light transmitting double window 50. In this case, of the light transmitting plates 52 and 54 forming the light transmitting double window 50, only the light transmitting plate 52 on the inner surface side is removed and replaced with a new light transmitting plate 52, or the removed light transmitting plate 52 is replaced. The thin film may be removed outside the processing chamber 10 and then attached again. The heating runf 60 can be freely exchanged and inspected outside the processing chamber 10.

【0025】[0025]

【発明の効果】以上に述べた、この発明にかかるプラズ
マCVD装置は、基板の加熱手段として、処理室の壁面
に設けられた光透過二重窓を介して、処理室外から加熱
する加熱ランプを備えていることにより、従来のよう
に、処理室内にヒータパネルを設置しておく構造に比べ
て、加熱効率が良く、保守管理が容易で、基板の仕上が
り品質も良好になる。
As described above, in the plasma CVD apparatus according to the present invention, the heating lamp for heating the substrate from outside the processing chamber is provided as the substrate heating means through the light transmitting double window provided on the wall surface of the processing chamber. As a result, the heating efficiency is higher, the maintenance management is easier, and the finished quality of the substrate is better than the conventional structure in which the heater panel is installed in the processing chamber.

【0026】すなわち、処理室が真空であっても、加熱
ランプによる輻射熱であれば伝熱効率が良く、基板を効
率良く迅速に加熱することができる。また、光透過二重
窓に薄膜が付着しても、光透過二重窓から薄膜を除去す
るのは簡単である。薄膜の除去が簡単かつ確実に行えれ
ば、これらの薄膜が脱落して基板の表面に付着する問題
も解消され、基板への薄膜形成の仕上がり品質が良好に
なる。加熱ランプを点灯すれば、直ちに基板が加熱され
るので、処理開始までの昇温待機時間が短縮され、作業
能率が向上するとともに、エネルギー消費も低減され
る。
That is, even if the processing chamber is in vacuum, if the radiation heat from the heating lamp is used, the heat transfer efficiency is good and the substrate can be efficiently and quickly heated. Further, even if the thin film adheres to the light transmissive double window, it is easy to remove the thin film from the light transmissive double window. If the thin films can be removed easily and reliably, the problem of these thin films falling off and adhering to the surface of the substrate can be solved, and the finished quality of the thin film formation on the substrate can be improved. When the heating lamp is turned on, the substrate is immediately heated, so that the temperature rising waiting time before the start of processing is shortened, the work efficiency is improved, and the energy consumption is also reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施例を示す断面構造図FIG. 1 is a sectional structural view showing an embodiment of the present invention.

【図2】従来例の断面構造図FIG. 2 is a cross-sectional structure diagram of a conventional example.

【符号の説明】[Explanation of symbols]

10 処理室 20 基板 22 基板ホルダー(保持手段) 30 電極部材 40 シャワープレート(ガス供給手段) 50 光透過二重窓 60 加熱ランプ 10 Processing Chamber 20 Substrate 22 Substrate Holder (Holding Means) 30 Electrode Member 40 Shower Plate (Gas Supply Means) 50 Light Transmission Double Window 60 Heating Lamp

───────────────────────────────────────────────────── フロントページの続き (72)発明者 奧村 智洋 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Tomohiro Okumura 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 処理室内で、保持手段に保持された基板
の表面と対向する位置に、電極部材および反応ガスの供
給手段を備えるとともに、処理室壁面で基板の背面と対
向する位置に光透過二重窓を備え、処理室外で光透過二
重窓に隣接して加熱ランプを備えていることを特徴とす
るプラズマCVD装置。
1. A processing chamber is provided with an electrode member and a reaction gas supply means at a position facing a surface of a substrate held by a holding means, and light is transmitted to a position facing a back surface of the substrate on a wall surface of the processing chamber. A plasma CVD apparatus comprising a double window and a heating lamp provided outside the processing chamber and adjacent to the light transmitting double window.
JP11108592A 1992-04-30 1992-04-30 Plasma cvd apparatus Pending JPH05306466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11108592A JPH05306466A (en) 1992-04-30 1992-04-30 Plasma cvd apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11108592A JPH05306466A (en) 1992-04-30 1992-04-30 Plasma cvd apparatus

Publications (1)

Publication Number Publication Date
JPH05306466A true JPH05306466A (en) 1993-11-19

Family

ID=14552006

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11108592A Pending JPH05306466A (en) 1992-04-30 1992-04-30 Plasma cvd apparatus

Country Status (1)

Country Link
JP (1) JPH05306466A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0843339A2 (en) * 1996-11-18 1998-05-20 Applied Materials, Inc. Processing apparatus
KR100596503B1 (en) * 2004-06-01 2006-07-03 삼성전자주식회사 wafer heating furnace and apparatus for chemical Vapor Deposition including the same
KR100782740B1 (en) * 2006-12-11 2007-12-05 삼성전기주식회사 Chemical vapor deposition apparatus
JP2011511459A (en) * 2008-01-31 2011-04-07 アプライド マテリアルズ インコーポレイテッド CVD equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0843339A2 (en) * 1996-11-18 1998-05-20 Applied Materials, Inc. Processing apparatus
EP0843339A3 (en) * 1996-11-18 1999-02-17 Applied Materials, Inc. Processing apparatus
KR100596503B1 (en) * 2004-06-01 2006-07-03 삼성전자주식회사 wafer heating furnace and apparatus for chemical Vapor Deposition including the same
KR100782740B1 (en) * 2006-12-11 2007-12-05 삼성전기주식회사 Chemical vapor deposition apparatus
JP2011511459A (en) * 2008-01-31 2011-04-07 アプライド マテリアルズ インコーポレイテッド CVD equipment

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