JPH0527060B2 - - Google Patents
Info
- Publication number
- JPH0527060B2 JPH0527060B2 JP58223934A JP22393483A JPH0527060B2 JP H0527060 B2 JPH0527060 B2 JP H0527060B2 JP 58223934 A JP58223934 A JP 58223934A JP 22393483 A JP22393483 A JP 22393483A JP H0527060 B2 JPH0527060 B2 JP H0527060B2
- Authority
- JP
- Japan
- Prior art keywords
- level
- signal
- measured
- light
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22393483A JPS60114750A (ja) | 1983-11-28 | 1983-11-28 | 表面欠陥計測装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22393483A JPS60114750A (ja) | 1983-11-28 | 1983-11-28 | 表面欠陥計測装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60114750A JPS60114750A (ja) | 1985-06-21 |
JPH0527060B2 true JPH0527060B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-04-20 |
Family
ID=16805993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22393483A Granted JPS60114750A (ja) | 1983-11-28 | 1983-11-28 | 表面欠陥計測装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60114750A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5713340A (en) * | 1980-06-27 | 1982-01-23 | Hitachi Ltd | Inspection apparatus for surface defect |
JPS5862543A (ja) * | 1981-10-09 | 1983-04-14 | Nippon Kogaku Kk <Nikon> | 欠陥検査装置 |
-
1983
- 1983-11-28 JP JP22393483A patent/JPS60114750A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60114750A (ja) | 1985-06-21 |