JPH0526357B2 - - Google Patents
Info
- Publication number
- JPH0526357B2 JPH0526357B2 JP56179439A JP17943981A JPH0526357B2 JP H0526357 B2 JPH0526357 B2 JP H0526357B2 JP 56179439 A JP56179439 A JP 56179439A JP 17943981 A JP17943981 A JP 17943981A JP H0526357 B2 JPH0526357 B2 JP H0526357B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- ionization
- electrons
- present
- ionization coefficient
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/60—Impurity distributions or concentrations
Landscapes
- Light Receiving Elements (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56179439A JPS5880880A (ja) | 1981-11-09 | 1981-11-09 | 半導体素子 |
| US06/437,627 US4553317A (en) | 1981-11-09 | 1982-10-29 | Method of obtaining an impact ionization coefficient rate by junction of different kinds of semiconductors |
| DE19823241176 DE3241176A1 (de) | 1981-11-09 | 1982-11-08 | Verfahren zum erzielen eines stossionisationskoeffizienten-verhaeltnisses durch verbinden verschiedenartiger halbleiter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56179439A JPS5880880A (ja) | 1981-11-09 | 1981-11-09 | 半導体素子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5880880A JPS5880880A (ja) | 1983-05-16 |
| JPH0526357B2 true JPH0526357B2 (cs) | 1993-04-15 |
Family
ID=16065879
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56179439A Granted JPS5880880A (ja) | 1981-11-09 | 1981-11-09 | 半導体素子 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5880880A (cs) |
-
1981
- 1981-11-09 JP JP56179439A patent/JPS5880880A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5880880A (ja) | 1983-05-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4383269A (en) | Graded bandgap photodetector | |
| US5914491A (en) | Detector for detecting photons or particles, method for fabricating the detector, and measuring method | |
| JP2699807B2 (ja) | 組成変調アバランシ・フォトダイオード | |
| KR20040094418A (ko) | 전하제어된 애벌란시 광다이오드 및 그 제조방법 | |
| JPS6016474A (ja) | ヘテロ多重接合型光検出器 | |
| US3955082A (en) | Photodiode detector with selective frequency response | |
| US4553317A (en) | Method of obtaining an impact ionization coefficient rate by junction of different kinds of semiconductors | |
| JP2747299B2 (ja) | 半導体受光素子 | |
| JP2682253B2 (ja) | アバランシェ・フォトダイオード及びその製造方法 | |
| JP6705762B2 (ja) | アバランシェフォトダイオード | |
| JPH0526357B2 (cs) | ||
| KR101663644B1 (ko) | 변형된 도핑 및 조성 흡수층을 이용한 애벌랜치 포토다이오드 | |
| JPH0526356B2 (cs) | ||
| US5280182A (en) | Resonant tunneling transistor with barrier layers | |
| EP0109855A2 (en) | Photodiode having heterojunction | |
| JPH11330536A (ja) | 半導体受光素子 | |
| US4410903A (en) | Heterojunction-diode transistor EBS amplifier | |
| JPS6057233B2 (ja) | ホトダイオ−ド検出器及びその製造方法 | |
| US20210167239A1 (en) | Light-Receiving Element | |
| JP2671569B2 (ja) | アバランシェフォトダイオード | |
| JPH03244164A (ja) | 半導体受光素子 | |
| JP2666841B2 (ja) | アバランシェ型半導体受光素子の製造方法 | |
| JPS59232470A (ja) | 半導体受光素子 | |
| JPH0316276A (ja) | 光検出器 | |
| JP2001237454A (ja) | 半導体受光素子 |