JPH0521884Y2 - - Google Patents

Info

Publication number
JPH0521884Y2
JPH0521884Y2 JP18799887U JP18799887U JPH0521884Y2 JP H0521884 Y2 JPH0521884 Y2 JP H0521884Y2 JP 18799887 U JP18799887 U JP 18799887U JP 18799887 U JP18799887 U JP 18799887U JP H0521884 Y2 JPH0521884 Y2 JP H0521884Y2
Authority
JP
Japan
Prior art keywords
cylindrical frame
docking assembly
slide ring
motherboard
rivet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP18799887U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0192136U (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18799887U priority Critical patent/JPH0521884Y2/ja
Publication of JPH0192136U publication Critical patent/JPH0192136U/ja
Application granted granted Critical
Publication of JPH0521884Y2 publication Critical patent/JPH0521884Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP18799887U 1987-12-10 1987-12-10 Expired - Lifetime JPH0521884Y2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18799887U JPH0521884Y2 (fr) 1987-12-10 1987-12-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18799887U JPH0521884Y2 (fr) 1987-12-10 1987-12-10

Publications (2)

Publication Number Publication Date
JPH0192136U JPH0192136U (fr) 1989-06-16
JPH0521884Y2 true JPH0521884Y2 (fr) 1993-06-04

Family

ID=31479123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18799887U Expired - Lifetime JPH0521884Y2 (fr) 1987-12-10 1987-12-10

Country Status (1)

Country Link
JP (1) JPH0521884Y2 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0747790Y2 (ja) * 1989-09-14 1995-11-01 富士通株式会社 電子ビームテスタ

Also Published As

Publication number Publication date
JPH0192136U (fr) 1989-06-16

Similar Documents

Publication Publication Date Title
US4563640A (en) Fixed probe board
US7355425B2 (en) Probe card clamp mechanism and probe apparatus
JPH04319678A (ja) Ｄｕｔ基板取付システム
US7093361B2 (en) Method of assembling an actuator with an internal sensor
JP4271568B2 (ja) 容器芯出し装置および方法並びに容器
US3185951A (en) Slip ring assembly
JPH0521884Y2 (fr)
US20040056675A1 (en) Locking apparatus and loadboard assembly
JP2005300140A (ja) ガスタービン・エンジンに燃料噴射器を装着するための心出し、位置決め装置
US2689102A (en) Leveling saddle assembly
JP4937882B2 (ja) 検査ソケット
US3964814A (en) Pluggable high-amperage contact
KR20060088416A (ko) 프로브 유닛의 평탄화 장치
KR20100069300A (ko) 프로브 카드와, 이를 이용한 반도체 디바이스 테스트 장치 및 방법
CN111716061A (zh) 一种径向扩压器螺座焊接用夹具及其使用方法
TWI714245B (zh) 電性檢查用探針卡及探針卡之探針頭
TW202033967A (zh) 檢查用輔助具支持具、支持具及檢查用輔助具
US20070007982A1 (en) Test head for semiconductor integrated circuit tester
JPS59138345A (ja) プロ−ブカ−ド
CN218984571U (zh) 离心试验夹具及离心试验机
JPS627486B2 (fr)
KR200480667Y1 (ko) 검사용 가이드 장치
KR100220050B1 (ko) 차체강성시험용 지그장치
KR100365761B1 (ko) 이미지센서 칩 테스트 장치
CN219074765U (zh) 筒状件辅助焊接装置