JPH05211195A - Wire bonding apparatus - Google Patents

Wire bonding apparatus

Info

Publication number
JPH05211195A
JPH05211195A JP3315892A JP31589291A JPH05211195A JP H05211195 A JPH05211195 A JP H05211195A JP 3315892 A JP3315892 A JP 3315892A JP 31589291 A JP31589291 A JP 31589291A JP H05211195 A JPH05211195 A JP H05211195A
Authority
JP
Japan
Prior art keywords
tool
bonding
wire
cleaning
covered wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3315892A
Other languages
Japanese (ja)
Inventor
Hideaki Sato
英明 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP3315892A priority Critical patent/JPH05211195A/en
Publication of JPH05211195A publication Critical patent/JPH05211195A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7801Means for cleaning, e.g. brushes, for hydro blasting, for ultrasonic cleaning, for dry ice blasting, using gas-flow, by etching, by applying flux or plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01039Yttrium [Y]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To enable a bonding wire to be fed smoothly, by providing a cleaner for cleaning a tool kept in the ready state capable of bonding operations, and by removing automatically the peeled pieces of the covering material of a covered wire, etc., generated in the tool by the bonding operations. CONSTITUTION:On a bonding head 2 provided on an X-Y table 1, a horn 3 at whose end a tool 4 is provided is mounted elevatably, and a bonding stage 6a is provided below the tool 4. On the bonding stage 6a, a cleaning vessel 7 filled with a cleaning liquid 8 and a drier 9 by which the tool 4 after cleaning is dried are provided respectively. When bondings are performed about fifty thousand times, the tool 4 is dipped in the cleaning liquid 8 of alcohol, etc., in the cleaning vessel 7, keeping the state intact, wherein a covered wire is passed through the tool 4 and its bonding is possible. Then, by applying ultrasonic vibration to the tool 4, peeled pieces, etc., left in the tool 4 are removed The tool 4 after cleaning is dried by the drier 9.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ワイヤーボンディング
装置に関し、特に、被覆されたワイヤーを用いるワイヤ
ーボンディング装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wire bonding device, and more particularly to a wire bonding device using a coated wire.

【0002】[0002]

【従来の技術】通常、ワイヤーボンディング装置は、半
導体チップにおけるパッドと外部にあるリードとを金あ
るいはアルミニウム,銅などの金属細線にて接続する装
置である。また、このワイヤーボンディング装置には金
属細線を絶縁物で被覆した被覆ワイヤーを用いて接続す
る装置がある。
2. Description of the Related Art Usually, a wire bonding apparatus is an apparatus for connecting a pad on a semiconductor chip and an external lead with a fine metal wire such as gold, aluminum or copper. Further, this wire bonding device includes a device for connecting a thin metal wire with a coated wire coated with an insulating material.

【0003】図3(a)〜(c)は従来のワイヤーボン
ディング装置の一例を動作順に示す図である。このワイ
ヤーボンディング装置は、図3に示すように、XY方向
に移動するXYテーブル1と、このXYテーブルに載置
されるボンディングヘッド2と、ボンディングヘッド2
より一方向に伸びるホーン3と、このホーン3の先端部
に取付けられるツール4と、このツール4の下方にあっ
て半導体素子13及び外部リード12を載置するボンデ
ィングステージ6と、ツール4の穴に被覆ワイヤー14
を通し被覆ワイヤー14が巻かれるスプール16と、被
覆ワイヤ14を固定保持するクランパ15とを有してい
た。
FIGS. 3A to 3C are diagrams showing an example of a conventional wire bonding apparatus in the order of operation. As shown in FIG. 3, this wire bonding apparatus includes an XY table 1 that moves in XY directions, a bonding head 2 that is placed on the XY table, and a bonding head 2.
A horn 3 extending further in one direction, a tool 4 attached to the tip of the horn 3, a bonding stage 6 below the tool 4 for mounting the semiconductor element 13 and the external leads 12, and a hole for the tool 4. Covered wire 14
There was a spool 16 around which the covered wire 14 was wound and a clamper 15 which fixedly holds the covered wire 14.

【0004】次に、このワイヤーボンディング装置の動
作を説明する。まず、図3(a)に示すように、X−Y
テーブル1上のボンディングヘッド2の水平方向の移動
と、ホーン3の上下動作により、ツール4およびそれに
通された被覆ワイヤー14がボンディングステージ6上
の半導体素子13上に移動される。なお、被覆ワイヤー
14の接続方式は、熱圧着方式あるいは超音波併用熱圧
着方式にて行われる。次に、図3(b)に示すように、
ツール4が外部リード11上に移動し、被覆ワイヤー1
4と外部リード11が接続される。なお、この移動の際
に被覆ワイヤー14はスプール16より繰り出されツー
ル4の穴より導出される。次に、接続の後、図3(c)
に示すように、被覆ワイヤー14はクランプ15の固定
保持されツール4の上昇により接続部の近傍で切断され
る。そして、クランプ15はワイヤーを緩め、ツール4
の加工により接続動作に必要な長さだけツール4より被
覆ワイヤー14が突出した状態に保たれる。このように
一連の動作により、半導体素子13と外部リード11と
が被覆ワイヤー14にて接続されていた。
Next, the operation of this wire bonding apparatus will be described. First, as shown in FIG.
By the horizontal movement of the bonding head 2 on the table 1 and the vertical movement of the horn 3, the tool 4 and the covered wire 14 passed through the tool 4 are moved onto the semiconductor element 13 on the bonding stage 6. The connection method of the covered wire 14 is a thermocompression bonding method or an ultrasonic combined thermocompression bonding method. Next, as shown in FIG.
The tool 4 moves onto the outer lead 11 and the coated wire 1
4 and the external lead 11 are connected. During this movement, the covered wire 14 is paid out from the spool 16 and led out from the hole of the tool 4. Next, after connection, FIG.
As shown in FIG. 5, the covered wire 14 is fixedly held by the clamp 15 and is cut in the vicinity of the connection portion by the rising of the tool 4. Then the clamp 15 loosens the wire and the tool 4
By the processing described above, the covered wire 14 is kept in a state of protruding from the tool 4 by the length required for the connecting operation. As described above, the semiconductor element 13 and the external lead 11 were connected by the covered wire 14 by a series of operations.

【0005】[0005]

【発明が解決しようとする課題】この従来のワイヤーボ
ンディング装置では、被覆ワイヤー14に超音波が印加
される際や、被覆ワイヤー14がツール4の穴に摺動す
る際に、被覆ワイヤー14の表面被覆物が剥離したり、
あるいはその剥離片がツール4の内部に付着・堆積し、
被覆ワイヤー14の円滑な移動を妨げ、ボンディング動
作を困難にする問題がある。また、これらの不具合を防
止するためには、ツール4を頻繁に洗浄する必要がある
が、この洗浄作業は、被覆ワイヤー14をツール4の内
部より除去し、ツール4をホーン3より取りはずした後
洗浄し再度取り付けるという操作により行われるため、
多大な労力と時間を必要とする問題点があった。
In this conventional wire bonding apparatus, when ultrasonic waves are applied to the coated wire 14 or when the coated wire 14 slides in the hole of the tool 4, the surface of the coated wire 14 is broken. The coating may peel off,
Alternatively, the peeled pieces adhere and accumulate inside the tool 4,
There is a problem that the smooth movement of the covered wire 14 is hindered and the bonding operation becomes difficult. Further, in order to prevent these problems, it is necessary to frequently clean the tool 4, but this cleaning work is performed after removing the covered wire 14 from the inside of the tool 4 and removing the tool 4 from the horn 3. Since it is performed by the operation of cleaning and reattaching,
There was a problem that required a lot of labor and time.

【0006】本発明の目的は、かかる問題を解消すべく
ワイヤーの被覆の剥離により動作の不具合を無くし円滑
に接続動作のできるワイヤーボンディング装置を提供す
ることである。
It is an object of the present invention to provide a wire bonding apparatus which eliminates the problem of operation by peeling off the wire coating in order to solve such a problem and enables a smooth connection operation.

【0007】[0007]

【課題を解決するための手段】本発明のワイヤーボンデ
ィング装置は、被接合物を載置するボンディングステー
ジと、金属細線を絶縁物で被覆する被覆ワイヤーを通し
前記被接合物に押し付けて接合するツールと、このツー
ルを上下方向に移動させるボンディングヘッドと、この
ボンディングヘッドを水平方向に移動させるXYテーブ
ルと、前記ボンディングステージに配置されるとともに
前記ツールのボンディング動作に入る前に前記ツールを
洗浄する機構とを備えている。
A wire bonding apparatus according to the present invention is a tool for bonding by pressing a bonding stage on which an object to be bonded is placed and a coated wire for coating a thin metal wire with an insulator to the object to be bonded. A bonding head for moving the tool in the vertical direction, an XY table for moving the bonding head in the horizontal direction, and a mechanism arranged on the bonding stage for cleaning the tool before starting the bonding operation of the tool. It has and.

【0008】[0008]

【実施例】次に本発明について図面を参照して説明す
る。
The present invention will be described below with reference to the drawings.

【0009】図1(a)〜(c)は本発明の一実施例の
ワイヤーボンディング装置を動作順に示す図である。こ
のワイヤボンディング装置は、図1に示すように、ボン
ディングステージ6aに載置されるとともにツール4を
洗浄する洗浄液8が満たされる洗浄層7と洗浄後のツー
ル4を乾燥する乾燥装置9を設けたことである。それ以
外は従来例と同じである。このワイヤーボンディング装
置の動作は、従来と同様にボンディングステージ6上
の、図示しない半導体素子と外部リードからなる被ボン
ディング物5に対し、ツール4の移動とXYテーブル1
の移動によりボンディングを行う。そして約5万回程度
のボンディングが行なわれると、図1(b)に示すよう
に、XYテーブル1上にあるボンディングヘッド2の水
平方向移動およびホーン3の上下動作により、ツール4
は、図示しない被覆ワイヤーが内部に通されたボンディ
ング可能な状態のまま洗浄層7内の、アルコール等から
なる洗浄液8に浸される。この状態で、ツール4に超音
波振動が印加されることにより、ツール4の内部の剥離
片等が除去される。次に、図1(c)に示すように、上
記と同様の移動方法にて、ツール4は、その内部に図示
しない被覆ワイヤーが通されたボンディング可能な状態
のまま、乾燥装置9の前方へ導かれる。ここで、乾燥装
置から送り出される熱風により、ツール4近辺に付着し
た洗浄液8が乾燥される。次に、乾燥後ツール4は、再
び、図1(a)に示す位置に移動し、ボンディングを行
う。
1 (a) to 1 (c) are views showing a wire bonding apparatus according to an embodiment of the present invention in order of operation. As shown in FIG. 1, this wire bonding apparatus is provided with a cleaning layer 7 placed on the bonding stage 6a and filled with a cleaning liquid 8 for cleaning the tool 4, and a drying device 9 for drying the tool 4 after cleaning. That is. Otherwise, it is the same as the conventional example. The operation of this wire bonding apparatus is performed by moving the tool 4 and the XY table 1 with respect to the object 5 to be bonded, which is composed of a semiconductor element and external leads (not shown), on the bonding stage 6 as in the conventional case.
Bonding is performed by moving. When the bonding is performed about 50,000 times, the tool 4 is moved by the horizontal movement of the bonding head 2 on the XY table 1 and the vertical movement of the horn 3, as shown in FIG.
Is immersed in a cleaning liquid 8 made of alcohol or the like in the cleaning layer 7 in a bondable state in which a covered wire (not shown) is passed inside. In this state, ultrasonic vibration is applied to the tool 4 to remove the peeling pieces and the like inside the tool 4. Next, as shown in FIG. 1C, the tool 4 is moved to the front of the drying device 9 in a bondable state in which a coating wire (not shown) is passed through the tool 4 by the same moving method as described above. Be guided. Here, the cleaning liquid 8 attached near the tool 4 is dried by the hot air sent from the drying device. Next, after drying, the tool 4 again moves to the position shown in FIG. 1A to perform bonding.

【0010】図2は本発明のワイヤーボンディング装置
の他の実施例を示す図である。このワイヤーボンディン
グ装置は、図2に示すように、ツール4に高圧乾燥空気
を吹きつける噴射ノズル10と、この噴射ノズル10に
より吹き飛ばされる剥離物を収集する集塵装置11を設
けたことである。このワイヤボンディング装置の動作、
まず、前述の実施例と同様にボンディング動作を続けて
行い、被覆ワイヤーの使用量が規定に達すると、ツール
4は、内部に被覆ワイヤーが通されたボンディング可能
な状態で、X−Yテーブル1上のボンディングヘッド2
の水平方向移動およびホーン3の上下動作により噴射ノ
ズル10の下方へ移動する。ここで噴射ノズル10より
例えば圧力3.5kg/平方cm,流量28l/h前後
の高圧乾燥空気が、ツール3とそれに通された被覆ワイ
ヤーとの隙間に噴射され、かつツール4に超音波振動が
印加されることにより、ツール4の内部の剥離片が除去
される。そしてこれらの剥離片は、噴射ノズル10の下
方へ設置された集塵装置11により集められ、ワイヤー
ボンディング装置近辺への飛散が防止される。このよう
なツール洗浄動作後、ツール4は、ボンディングヘッド
2およびホーン3の動作により、再びボンディングステ
ージ6上に移動しワイヤーボンディングを行う。
FIG. 2 is a diagram showing another embodiment of the wire bonding apparatus of the present invention. As shown in FIG. 2, this wire bonding device is provided with a spray nozzle 10 for spraying high-pressure dry air onto the tool 4, and a dust collecting device 11 for collecting debris blown off by the spray nozzle 10. Operation of this wire bonding device,
First, the bonding operation is continuously performed in the same manner as in the above-described embodiment, and when the usage amount of the covered wire reaches the specified value, the tool 4 is in a bondable state with the covered wire passed through the inside thereof, and the XY table 1 Upper bonding head 2
By moving the horn 3 in the horizontal direction and moving the horn 3 up and down. Here, for example, high-pressure dry air having a pressure of 3.5 kg / square cm and a flow rate of about 28 l / h is jetted from the jet nozzle 10 into the gap between the tool 3 and the covered wire passed through it, and ultrasonic vibration is applied to the tool 4. By being applied, the peeled pieces inside the tool 4 are removed. Then, these peeled pieces are collected by the dust collector 11 installed below the injection nozzle 10, and are prevented from scattering near the wire bonding device. After such a tool cleaning operation, the tool 4 is moved to the bonding stage 6 again by the operation of the bonding head 2 and the horn 3 to perform wire bonding.

【0011】[0011]

【発明の効果】以上説明したように本発明は、ボンディ
ング動作の準備が可能な状態のツールを洗浄する装置を
備えることにより、ボンディング動作により発生するツ
ール内部の被覆ワイヤーからの被覆物質剥離片等を自動
的に排除し、円滑なワイヤ送りが出来るワイヤーボンデ
ィング装置が得られるという効果がある。
As described above, the present invention is provided with the device for cleaning the tool ready for the bonding operation, so that the stripping material or the like from the coated wire inside the tool generated by the bonding operation can be removed. There is an effect that a wire bonding device capable of automatically eliminating the wire feeding and smoothly feeding the wire can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のワイヤーボンディング装置の一実施例
における動作順に示す図である。
FIG. 1 is a diagram showing an operation sequence in an embodiment of a wire bonding apparatus of the present invention.

【図2】本発明のワイヤーボンディング装置の他の実施
例を示す図である。
FIG. 2 is a diagram showing another embodiment of the wire bonding apparatus of the present invention.

【図3】従来のワイヤーボンディング装置の一例におけ
る動作順に示す図である。
FIG. 3 is a diagram showing an operation sequence in an example of a conventional wire bonding apparatus.

【符号の説明】[Explanation of symbols]

1 XYテーブル 2 ボンディングヘッド 3 ホーン 4 ツール 5 被ボンディング物 6,6a,6b ボンディングステージ 7 洗浄槽 8 洗浄液 9 乾燥装置 10 噴射ノズル 11 集塵装置 12 外部リード 13 半導体素子 14 被覆ワイヤー 15 クランパ 16 スプール 1 XY Table 2 Bonding Head 3 Horn 4 Tool 5 Object to be Bonded 6, 6a, 6b Bonding Stage 7 Cleaning Tank 8 Cleaning Liquid 9 Drying Device 10 Spray Nozzle 11 Dust Collecting Device 12 External Lead 13 Semiconductor Element 14 Coated Wire 15 Clamper 16 Spool

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 被接合物を載置するボンディングステー
ジと、金属細線を絶縁物で被覆する被覆ワイヤーを通し
前記被接合物に押し付けて接合するツールと、このツー
ルを上下方向に移動させるボンディングヘッドと、この
ボンディングヘッドを水平方向に移動させるXYテーブ
ルと、前記ボンディングステージに配置されるとともに
前記ツールのボンディング動作に入る前に前記ツールを
洗浄する機構とを備えることを特徴とするワイヤーボン
ディング装置。
1. A bonding stage on which an object to be bonded is placed, a tool for pressing and bonding the metal thin wire to the object to be bonded through a coated wire covering the thin metal wire with an insulator, and a bonding head for vertically moving the tool. A wire bonding apparatus comprising: an XY table for horizontally moving the bonding head; and a mechanism arranged on the bonding stage for cleaning the tool before starting a bonding operation of the tool.
JP3315892A 1991-11-29 1991-11-29 Wire bonding apparatus Pending JPH05211195A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3315892A JPH05211195A (en) 1991-11-29 1991-11-29 Wire bonding apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3315892A JPH05211195A (en) 1991-11-29 1991-11-29 Wire bonding apparatus

Publications (1)

Publication Number Publication Date
JPH05211195A true JPH05211195A (en) 1993-08-20

Family

ID=18070864

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3315892A Pending JPH05211195A (en) 1991-11-29 1991-11-29 Wire bonding apparatus

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JP (1) JPH05211195A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9825000B1 (en) * 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
US9833818B2 (en) 2004-09-28 2017-12-05 International Test Solutions, Inc. Working surface cleaning system and method
US10195648B2 (en) 2009-12-03 2019-02-05 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
US11035898B1 (en) 2020-05-11 2021-06-15 International Test Solutions, Inc. Device and method for thermal stabilization of probe elements using a heat conducting wafer
US11211242B2 (en) 2019-11-14 2021-12-28 International Test Solutions, Llc System and method for cleaning contact elements and support hardware using functionalized surface microfeatures
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9833818B2 (en) 2004-09-28 2017-12-05 International Test Solutions, Inc. Working surface cleaning system and method
US10239099B2 (en) 2004-09-28 2019-03-26 International Test Solutions, Inc. Working surface cleaning system and method
US10195648B2 (en) 2009-12-03 2019-02-05 International Test Solutions, Inc. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
US9825000B1 (en) * 2017-04-24 2017-11-21 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
US10361169B2 (en) 2017-04-24 2019-07-23 International Test Solutions, Inc. Semiconductor wire bonding machine cleaning device and method
US11211242B2 (en) 2019-11-14 2021-12-28 International Test Solutions, Llc System and method for cleaning contact elements and support hardware using functionalized surface microfeatures
US11318550B2 (en) 2019-11-14 2022-05-03 International Test Solutions, Llc System and method for cleaning wire bonding machines using functionalized surface microfeatures
US11035898B1 (en) 2020-05-11 2021-06-15 International Test Solutions, Inc. Device and method for thermal stabilization of probe elements using a heat conducting wafer

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