JPS6256659B2 - - Google Patents
Info
- Publication number
- JPS6256659B2 JPS6256659B2 JP56188626A JP18862681A JPS6256659B2 JP S6256659 B2 JPS6256659 B2 JP S6256659B2 JP 56188626 A JP56188626 A JP 56188626A JP 18862681 A JP18862681 A JP 18862681A JP S6256659 B2 JPS6256659 B2 JP S6256659B2
- Authority
- JP
- Japan
- Prior art keywords
- wire
- tool
- clamper
- cut
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims abstract description 10
- 239000008188 pellet Substances 0.000 abstract description 7
- 238000004299 exfoliation Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
- H01L2224/48472—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78301—Capillary
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8512—Aligning
- H01L2224/85148—Aligning involving movement of a part of the bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は第1ボンド点である半導体のペレツト
と第2ボンド点である外部リードとの間をワイヤ
ボンデイング装置のツールに挿通されたワイヤで
接続するワイヤボンデイング方法、特にワイヤ切
断方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wire bonding method in which a semiconductor pellet serving as a first bonding point and an external lead serving as a second bonding point are connected by a wire inserted through a tool of a wire bonding apparatus. This invention relates to a wire cutting method.
従来のワイヤボンデイング方法は第1図に示す
ようにして行われる。即ち、同図aに示すように
ペレツト1と外部リード2とをツール3に挿通さ
れたワイヤ4で接続する。次に同図bに示すよう
にツール3が上昇し、その後クランパー5が閉じ
る。続いて同図cに示すようにツール3を後方に
移動させてワイヤ4を切断する。なお、図中、6
は一端にツール3を保持した超音波発振ホーン
で、図示しないボンデイングヘツドに取付けられ
ている。 A conventional wire bonding method is performed as shown in FIG. That is, as shown in FIG. 1A, the pellet 1 and the external lead 2 are connected by a wire 4 inserted through a tool 3. Next, as shown in FIG. 3B, the tool 3 is raised, and then the clamper 5 is closed. Subsequently, the tool 3 is moved backward to cut the wire 4, as shown in FIG. In addition, in the figure, 6
is an ultrasonic oscillation horn holding a tool 3 at one end, which is attached to a bonding head (not shown).
このように従来は単にツール3を後方に移動さ
せてワイヤ4を切断するので、ワイヤネツク4a
の強度の強弱により、同図bの状態から同図cの
状態にツール3が移動した時に、ワイヤ4が切断
される前にボンデイング部分が剥離するものがあ
り、ボンデイング不良が生じる。またワイヤネツ
ク4aの強度の違いによりワイヤ切断位置が異な
つてツールの先端下のテール長さを一定に保つこ
とが困難であつた。 In this way, conventionally, the wire 4 is cut by simply moving the tool 3 backward, so the wire neck 4a
When the tool 3 is moved from the state shown in FIG. 3B to the state shown in FIG. Furthermore, the wire cutting position varies due to the difference in strength of the wire neck 4a, making it difficult to maintain a constant tail length under the tip of the tool.
本発明は上記従来技術の欠点に鑑みなされたも
ので、良好なボンデイングを得ることができると
共に、常に一定のテール長さを保つことができる
ワイヤボンデイング方法を提供することを目的と
する。 The present invention was made in view of the above-mentioned drawbacks of the prior art, and it is an object of the present invention to provide a wire bonding method that can obtain good bonding and always maintain a constant tail length.
以下、本発明を図示の実施例により説明する。 Hereinafter, the present invention will be explained with reference to illustrated embodiments.
第2図は本発明になるワイヤボンデイング方法
の一実施例を示す動作説明図である。本発明は従
来と同様に第1図a,bの動作を行う。即ち、第
1図aに示すようにペレツト1と外部リード2と
をツール3に挿通されたワイヤ4で接続する。次
に第1図bに示すようにツール3が上昇し、その
後クランパー5が閉じる。 FIG. 2 is an operational explanatory diagram showing an embodiment of the wire bonding method according to the present invention. The present invention performs the operations shown in FIGS. 1a and 1b in the same manner as in the prior art. That is, as shown in FIG. 1a, the pellet 1 and the external lead 2 are connected by a wire 4 inserted through a tool 3. Next, the tool 3 is raised as shown in FIG. 1b, and then the clamper 5 is closed.
次に第2図aに示すようにワイヤ4のネツク部
分4aを中心にツール3とクランパー5が後方に
円弧を描いて下降する。これにより、ワイヤ4が
ネツク部分4aを中心に回転するため、ネツク部
分4aが切れ易くなる。そして、ツール3先端下
のワイヤ4が外部リード2の上面に接触する直前
に第2図bに示すようにツール3とクランパー5
を後方に移動し、ワイヤ4をネツク部分4aより
切断する。この状態においては、ツール3の先端
下にワイヤ4が既に繰出された状態にある。次に
第2図cに示すようにツール3が上昇し、その後
ツール3は次にボンデイングするペレツトのパツ
ド上に移動し、上記した動作を繰返すことによつ
て1個の半導体部品のワイヤボンデイングが完了
する。 Next, as shown in FIG. 2a, the tool 3 and the clamper 5 descend in a backward arc around the neck portion 4a of the wire 4. As a result, the wire 4 rotates around the neck portion 4a, making it easier to break the neck portion 4a. Then, just before the wire 4 under the tip of the tool 3 contacts the upper surface of the external lead 2, the tool 3 and the clamper 5 are connected to each other as shown in FIG. 2b.
is moved backward and the wire 4 is cut from the neck portion 4a. In this state, the wire 4 has already been paid out under the tip of the tool 3. Next, as shown in FIG. 2c, the tool 3 is raised, and then moved onto the pad of the next pellet to be bonded, and by repeating the above operations, wire bonding of one semiconductor component is completed. Complete.
なお、上記実施例においては、第1図bから第
2図aの動作においてツール3が円弧を描いて下
降したが、斜め後方に直線的に下降させてもよ
い。また第2図bのようにワイヤ4を切断後、直
ちに第2図cに示すようにツール3を上昇させた
が、ワイヤ切断後、ツール3先端下のワイヤテー
ルを成形させるためにツール3を下降させて外部
リード2にワイヤ3をはさみ込む形で接地させ、
その後ツール3を上昇させてもよい。 In the above embodiment, the tool 3 descends in an arc in the operations from FIG. 1b to FIG. 2a, but it may be lowered linearly diagonally backward. Immediately after cutting the wire 4 as shown in Fig. 2b, the tool 3 was raised as shown in Fig. 2c. Lower it and ground it by sandwiching the wire 3 between the external leads 2 and
The tool 3 may then be raised.
以上の説明から明らかな如く、本発明になるワ
イヤボンデイング方法によれば、第2ボンデイン
グ後、ツールを上昇させ、その後クランパーを閉
じ、続いてツールを後方に円弧を描いて、又は直
線的に下降させ、ネツク部分を切れ易くし、ツー
ル先端下のワイヤが被ボンデイング試料に接地す
る直前でツールを後方に移動させてワイヤを切断
するので、ボンデイング部分が剥離することがな
く、またツール先端下のテールのバラツキも少な
くなる。 As is clear from the above description, according to the wire bonding method of the present invention, after the second bonding, the tool is raised, the clamper is closed, and the tool is then lowered in a backward arc or in a straight line. The wire under the tip of the tool is moved backwards to cut the wire just before the wire under the tip of the tool touches the bonded sample, so the bonding portion does not peel off and the wire under the tip of the tool is cut easily. The variation in the tail is also reduced.
図はワイヤボンデイング方法を示し、第1図a
〜cは従来例の動作説明図、第2図a〜cは本発
明の一実施例を示す動作説明図である。
1……ペレツト、2……外部リード、3……ツ
ール、4……ワイヤ、5……クランパー。
The figure shows the wire bonding method;
2 to 2c are explanatory diagrams of the operation of the conventional example, and FIGS. 2a to 2c are explanatory diagrams of the operation of an embodiment of the present invention. 1... Pellet, 2... External lead, 3... Tool, 4... Wire, 5... Clamper.
Claims (1)
ボンデイング装置のツールに挿通されたワイヤで
接続するワイヤボンデイング方法において、第2
ボンド点にボンデイングした後、ツールを上昇さ
せ、その後クランパーを閉じ、続いてツールを後
方に円弧を描いて下降又は斜め下後方に直線的に
下降させ、ツール先端下のワイヤが被ボンデイン
グ試料に接地する直前にツールを後方に移動させ
てワイヤを引張つてワイヤを切断するワイヤボン
デイング方法。1 In a wire bonding method in which a first bond point and a second bond point are connected by a wire inserted through a tool of a wire bonding device, the second bond point is
After bonding to the bonding point, the tool is raised, then the clamper is closed, and then the tool is lowered in a backward arc or diagonally downward in a straight line, so that the wire under the tip of the tool is grounded to the bonded sample. A wire bonding method in which the tool is moved backwards and pulled to cut the wire just before the wire is cut.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56188626A JPS5889833A (en) | 1981-11-25 | 1981-11-25 | Wire bonding method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56188626A JPS5889833A (en) | 1981-11-25 | 1981-11-25 | Wire bonding method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5889833A JPS5889833A (en) | 1983-05-28 |
JPS6256659B2 true JPS6256659B2 (en) | 1987-11-26 |
Family
ID=16226976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56188626A Granted JPS5889833A (en) | 1981-11-25 | 1981-11-25 | Wire bonding method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5889833A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6442830A (en) * | 1987-08-11 | 1989-02-15 | Marine Instr Co Ltd | Wire bonding |
JPH0244744A (en) * | 1988-08-05 | 1990-02-14 | Marine Instr Co Ltd | Wire bonding |
JPH0244743A (en) * | 1988-08-05 | 1990-02-14 | Marine Instr Co Ltd | Wire bonding |
JP5734236B2 (en) * | 2011-05-17 | 2015-06-17 | 株式会社新川 | Wire bonding apparatus and bonding method |
KR101598999B1 (en) | 2012-11-16 | 2016-03-02 | 가부시키가이샤 신가와 | Wire bonding device and method for manufacturing semiconductor device |
-
1981
- 1981-11-25 JP JP56188626A patent/JPS5889833A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5889833A (en) | 1983-05-28 |
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