JPH0244743A - Wire bonding - Google Patents

Wire bonding

Info

Publication number
JPH0244743A
JPH0244743A JP63194616A JP19461688A JPH0244743A JP H0244743 A JPH0244743 A JP H0244743A JP 63194616 A JP63194616 A JP 63194616A JP 19461688 A JP19461688 A JP 19461688A JP H0244743 A JPH0244743 A JP H0244743A
Authority
JP
Japan
Prior art keywords
wire
wedge
bonding
length
bonding part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63194616A
Other languages
Japanese (ja)
Other versions
JPH05860B2 (en
Inventor
Masahiro Aoki
青木 政浩
Yutaka Shimizu
豊 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marine Instr Co Ltd
Original Assignee
Marine Instr Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marine Instr Co Ltd filed Critical Marine Instr Co Ltd
Priority to JP63194616A priority Critical patent/JPH0244743A/en
Publication of JPH0244743A publication Critical patent/JPH0244743A/en
Publication of JPH05860B2 publication Critical patent/JPH05860B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78313Wedge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78313Wedge
    • H01L2224/78314Shape
    • H01L2224/78317Shape of other portions
    • H01L2224/78318Shape of other portions inside the capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To substantially simultaneously cut and bend a wire, and to prevent the irregular feed amount of the wire and the deviation of a bent point by relatively raising a wedge while the wire remains continued from a second bonding part, and then relatively lowering the wedge in a state that the rearward movement of the wedge to the wire is stopped. CONSTITUTION:A wedge 1 is relatively raised while a wire 2 remains continued from a second bonding part 8 to set the length of the wire 2 between the part 8 and the wedge 1 to l. Then, the wedge 1 is relatively lowered directly thereunder or obliquely downward in the forward direction in a state that the rearward movement of the wedge 1 to the wire 2 is stopped. Thus, the cutting and the bending of the wire 2 can be substantially simultaneously continued only by this operation. In this manner, the irregular feed amount of the wire 2, the deviation of the bending point, and the lateral bending of the first bonding margin do not possibly occur.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、ワイヤを挿通ずるガイド孔を先端面に対して
傾斜して備え、ワイヤが先端面下方に傾斜して繰り出さ
れるボンディングウェッジ(以下ウェッジと略)を用い
て超音波によりワイヤボンディングを行うワイヤボンデ
ィング方法に関するものである。
Detailed Description of the Invention [Industrial Application Field] The present invention relates to a bonding wedge (hereinafter referred to as a The present invention relates to a wire bonding method in which wire bonding is performed using ultrasonic waves using a wedge (abbreviated as wedge).

(従来の技術〕 従来多用されているウェッジ11は第4図(alに示す
ようにガイド孔31は先端面41に対して約30〜45
@の傾きに形成されていて、ボンディングを行うときは
ウェッジ11をボンディング部の直上部に位置せしめ、
矢印12のように真下に下降せしめて超音波振動を印加
していた。
(Prior Art) As shown in FIG. 4 (al), the wedge 11 that has been widely used in the past has a guide hole 31 with a diameter of approximately 30 to 45 mm with respect to the tip surface 41.
When bonding is performed, the wedge 11 is positioned directly above the bonding part.
The ultrasonic vibration was applied by moving it downward as shown by arrow 12.

従って、ワイヤ2の繰り出し角が約30〜45″となる
ので基板6にある電子部品などにワイヤ2が当たる場合
があり不都合であった。
Therefore, since the wire 2 is fed out at an angle of approximately 30 to 45'', the wire 2 may hit electronic components on the board 6, which is inconvenient.

この不都合は、第4回出)に示すように先端面4に対し
て例えば約60@の傾きでガイド孔3を有するウェッジ
1を用いれば少なくすることができる。
This inconvenience can be reduced by using the wedge 1 having the guide hole 3 at an inclination of, for example, about 60@ with respect to the distal end surface 4, as shown in Part 4).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、このように大きな傾きでガイド孔3を備えて
いるウェッジ1を用いてワイヤボンディングを行おうと
すれば、ワイヤ2がボンディングに所要の長さl (第
1ボンディングしろ)だけウェッジ1の先端面4から斜
めに繰り出されている状態からボンディングを行う第1
ボンディング部7のボンディングにおいては、ワイヤ2
の先端の第1ボンディングしろの第1ボンディング部7
に対する傾きもガイド孔3と同じ角の大きな傾きとなる
However, if wire bonding is to be performed using the wedge 1 having the guide hole 3 with such a large inclination, the wire 2 will extend over the tip end surface of the wedge 1 by the length l (first bonding distance) required for bonding. The first step is to perform bonding from the state where it is extended diagonally from 4.
In the bonding of the bonding part 7, the wire 2
The first bonding portion 7 of the first bonding margin at the tip of
The inclination relative to the guide hole 3 is also large and has the same angle as the guide hole 3.

従って、ウェッジ1を矢印12のように真下に下降せし
めてもワイヤ2はその先端から長さiだけ手前の部分で
折れ曲りにくく、ウェッジ1の下降に伴ってワイヤ2が
撓みながら相対的にガイド孔3の中に逃げて戻ってしま
い、ボンディングに所要の長さβのワイヤ2をウェッジ
1の先端面4と第1ボンディング部7との間に挟圧する
ことができない状態となってしまう。これを避けようと
すれば第1ボンディング部7から大きく外側にはみ出す
長さだけワイヤ2を繰り出せばよいが、そうするとはみ
出させたワイヤ先端がショートすることもあり、またワ
イヤ2も無駄になる欠点がある。
Therefore, even if the wedge 1 is lowered straight down as shown by the arrow 12, the wire 2 is difficult to bend at a distance i from the tip, and as the wedge 1 is lowered, the wire 2 is bent and relatively guided. The wire 2 escapes into the hole 3 and returns, making it impossible to clamp the wire 2 of length β required for bonding between the tip end surface 4 of the wedge 1 and the first bonding portion 7 . If you want to avoid this, you can let out the wire 2 by a length that protrudes outward from the first bonding part 7, but if you do so, the tip of the protruding wire may short-circuit, and the wire 2 is also wasted. be.

本発明者は上述の従来の問題点を解決するために特願昭
62−199039号でワイヤ先端を予め第1ボンディ
ングに要する長さだけウェッジ1の先端面に沿わしめ、
第1ボンディングしろを予め折曲形成しておく方法をa
Nしているが、本発明はそれをさらに改善しようとする
ものである。
In order to solve the above-mentioned conventional problems, the present inventor proposed in Japanese Patent Application No. 62-199039 that the tip of the wire was previously aligned along the tip surface of the wedge 1 by the length required for the first bonding.
A method of forming the first bonding margin by bending it in advance is a.
However, the present invention aims to further improve this.

(問題点を解決するための手段〕 本発明は、ウェッジを用いて基板上でワイヤボンディン
グを行うワイヤボンディング方法において、第2ボンデ
ィング部の超音波印加の終了後ウェッジを次の第1ボン
ディングに要するワイヤの長さlと同じ距離だけ前方上
方に斜めに又は真上に上昇させてウニ7ジをワイヤに対
して後退せしめて第2ボンディング部から連続している
ワイヤのその立ち上がり基部からウェッジまでのワイヤ
の長さをlとし、次いでウェッジのワイヤに対する後退
を阻止した状態でウェッジを相対的に真下に又は前方下
方に斜めに下降せしめてワイヤを前記第2ボンディング
部からの立ち上がり基部で切断しかつ先端部の長さlの
ワイヤを前記基板又は基板に固着した部材に圧接してウ
ェッジ先端面に沿わしめ、その後、ウェッジを次の第1
ボンディング部に移動せしめることを特徴とするワイヤ
ボンディング方法である。
(Means for Solving the Problems) The present invention provides a wire bonding method in which wire bonding is performed on a substrate using a wedge. The wire 7 is raised forward and upward diagonally or directly upward by a distance equal to the length l of the wire, and the sea urchin 7 is moved backward relative to the wire, and the distance from the rising base of the wire that is continuous from the second bonding part to the wedge is The length of the wire is l, and then, with the wedge prevented from retreating relative to the wire, the wedge is lowered relatively straight down or diagonally forward and downward, and the wire is cut at the base rising from the second bonding part. A wire having a length l of the tip is pressed against the substrate or a member fixed to the substrate and placed along the wedge tip surface, and then the wedge is attached to the next first wire.
This is a wire bonding method characterized by moving the wire to a bonding section.

なお、本明細書においては、第1ボンディング部から第
2ボンディング部へウェッジをボンディング移動せしめ
るときに進行方向に臨む側面をウェッジの前面とし、従
ってウェッジの前方とはこの前面の臨んだ方向をいい、
反対方向を後方という。
Note that in this specification, the front side of the wedge is the side facing the advancing direction when the wedge is bonded and moved from the first bonding part to the second bonding part, and therefore, the front of the wedge refers to the direction in which this front faces. ,
The opposite direction is called backward.

〔作 用〕[For production]

本発明は、第2ボンディング部の超音波印加の終了後ウ
ェッジを次の第1ボンディングに要するワイヤの長さl
と同じ距離だけ前方上方に斜めに又は真上に上昇させて
ウェッジをワイヤに対して後退せしめて第2ボンディン
グ部から連続しているワイヤのその立ち上がり基部から
ウェッジまでのワイヤの長さをlとし、次いでウェッジ
のワイヤに対する後退を阻止した状態でウェッジを相対
的に真下に又は前方下方に斜めに下降せしめてワイヤを
前記第2ボンディング部からの立ち上がり基部で切断し
かつ先端部の長さlのワイヤを前記基板又は基板に固着
した部材に圧接してウェッジ先端面に沿わしめ、その後
、ウェッジを次の第1ボンディング部に移動せしめるの
で、急な傾斜のガイド孔を有するウェッジを用いてボン
ディングを行うときであっても、第1ボンディング部の
ボンディングに際してウェッジを真直に下降させればワ
イヤの先端部は所定長lたけ確実に第1ボンディング部
とウェッジの先端面との間に挟圧され、確実にボンディ
ングされる。
In the present invention, after the application of ultrasonic waves to the second bonding part is completed, the wedge is connected to the length l of the wire required for the next first bonding.
The length of the wire from the rising base of the wire that is continuous from the second bonding part to the wedge is set as l by raising the wedge forward and upward diagonally or directly upward by the same distance as . Then, with the wedge prevented from retreating relative to the wire, the wedge is lowered diagonally downwardly or forwardly to cut the wire at the base rising from the second bonding part, and the length of the tip is l. Since the wire is pressure-contacted to the substrate or a member fixed to the substrate and made to run along the wedge tip surface, and then the wedge is moved to the next first bonding part, bonding is performed using a wedge having a steeply sloped guide hole. Even when bonding the first bonding part, if the wedge is lowered straight down, the tip of the wire is reliably pinched by a predetermined length l between the first bonding part and the tip surface of the wedge, Bonding is ensured.

この場合、特願昭62−199039号の発明はワイヤ
繰り出し機構でワイヤを切断し、その後ワイヤ繰り出し
機構でワイヤの繰り出しを行うものであったのでワイヤ
とガイド孔とのガタ、ワイヤ繰り出し機構のバラツキ等
により、ワイヤの繰り出し量のバラツキ、折曲点のズレ
、折曲形成した第1ボンディングしるの横方向への曲り
などが生じるおそれがあったが、本発明は第2ボンディ
ング部からワイヤを連続させたままで先ずウェッジを相
対的に上昇させることにより第2ボンディング部とウェ
ッジとの間のワイヤの長さをlとする(ワイヤは第1ボ
ンディングしろである所定長lだけウニ7ジから突出し
たこととなる)、その後ウェッジのワイヤに対する後退
を阻止した状態でウェッジを相対的に真下に又は前方下
方に斜めに下降せしめる。するとこの動作だけでワイヤ
の切断と折曲が殆ど同時に続いて起こる。従って、ワイ
ヤの繰り出し量のバラツキ、折曲点のズレ。
In this case, the invention of Japanese Patent Application No. 62-199039 cuts the wire with a wire feeding mechanism and then feeds out the wire with the wire feeding mechanism, so there is play between the wire and the guide hole and variations in the wire feeding mechanism. However, in the present invention, it is possible to cause variations in the amount of the wire to be fed out, misalignment of the bending point, and bending of the bent first bonding mark in the lateral direction. The length of the wire between the second bonding part and the wedge is set to l by first relatively raising the wedge while keeping it continuous (the wire protrudes from the sea urchin 7 by a predetermined length l which is the first bonding margin). After that, the wedge is lowered diagonally directly downward or forwardly downward while preventing the wedge from retreating relative to the wire. This action alone causes the wire to be cut and bent almost simultaneously. Therefore, variations in the amount of wire payout and deviations in the bending point.

折曲形成した第1ボンディングしろの横方向への曲りな
どが生じるおそれがなく、また所要動作も少なく、ワイ
ヤ繰り出し機構も不要である。
There is no possibility that the bent first bonding margin will be bent in the lateral direction, fewer operations are required, and there is no need for a wire feeding mechanism.

〔実施例〕〔Example〕

本発明の実施例を図面を用いて説明する。 Embodiments of the present invention will be described using the drawings.

第1〜3図において、ウェッジ1はワイヤ2を挿通ずる
ガイド孔3を先端面4に対して45′〜90°、本実施
例では例えば6o@、傾斜させて備え、従来公知の構成
の超音波ボンディング装置に取り付けられている。即ち
、ウェッジ1はホーンの先端に取り付けられており、ク
ランプ5と一体に、基板6に対して相対的に、水平面上
でのX方向移動、水平面上での、X方向と直角の方向の
Y方向移動、X、 Y方向それぞれに直角の方向のZ方
向移動(上下動)、基板6に固着したIC上の第1ボン
ディング部7と基板6上の第2ボンディング部8を結ぶ
線をY方向に一致させるθ回動が可能である。ウェッジ
1とクランプ5は上述の如く一体に運動するようにして
あれば駆動部は共通であってもそれぞれ別個に設けても
よい。またクランプ5はガイド孔3の延長線上に設けら
れている。
In FIGS. 1 to 3, a wedge 1 has a guide hole 3 through which a wire 2 is inserted, inclined at an angle of 45' to 90 degrees, for example, 6 degrees in this embodiment, with respect to the distal end surface 4, which is superior to the conventional structure. Attached to sonic bonding equipment. That is, the wedge 1 is attached to the tip of the horn, and together with the clamp 5, it can be moved in the X direction on the horizontal plane, and in the Y direction in the direction perpendicular to the X direction on the horizontal plane. direction movement, Z direction movement (up and down) perpendicular to each of the X and Y directions, and a line connecting the first bonding part 7 on the IC fixed to the board 6 and the second bonding part 8 on the board 6 in the Y direction. It is possible to rotate θ to match the angle. As long as the wedge 1 and the clamp 5 are configured to move together as described above, they may have a common drive unit or may be provided separately. Further, the clamp 5 is provided on an extension line of the guide hole 3.

なお、本実施例においては、X、Yテーブル上にボンデ
ィングヘッドが載置され、ボンディングヘッドに上下動
装置(回動装置)を備えたウェッジ1とクランプ5が上
下動可能に設けられ、基板6の方にθ回動装置が設けら
れていることとする。
In this embodiment, a bonding head is placed on an X, Y table, and a wedge 1 and a clamp 5 equipped with a vertical movement device (rotation device) are provided on the bonding head so as to be vertically movable. It is assumed that the θ rotation device is provided on the side.

ウェッジlはその前後方向がY方向に一致するように設
けられているとする。
It is assumed that the wedge l is provided so that its front-rear direction coincides with the Y direction.

次に第1〜2図に基いてボンディング動作について説明
する。
Next, the bonding operation will be explained based on FIGS. 1 and 2.

第1図(alは第2ボンディング部8の超音波印加を終
了したところを示し、第2図のA点に相当する。クラン
プ5は開である。
FIG. 1 (al indicates the point at which the application of ultrasonic waves to the second bonding portion 8 is completed, and corresponds to point A in FIG. 2. The clamp 5 is open.

クランプ5を開としたまま、ウェッジl及びクランプ5
を上下動装置により真上に又は上下動装置及びX、 Y
テーブルにより前方上方に斜めに上昇させる。このとき
次の第1ボンディング部7゜のボンディングに要する所
定のワイヤ長! (第1ボンディングしろ)が第2ボン
ディング部8のボンディングされているワイヤに連続し
たままでウェッジ1の先端面4から突出することとなる
。なおこの実施例では傾き606のワイヤ2に沿って斜
めに上昇させるように、Δzl+Δylを選んでいる。
With clamp 5 open, wedge l and clamp 5
directly above with a vertical movement device or with a vertical movement device and X, Y
The table raises it diagonally upward and forward. At this time, the predetermined wire length required for bonding the next first bonding portion 7°! The (first bonding margin) protrudes from the tip surface 4 of the wedge 1 while remaining continuous with the bonded wire of the second bonding portion 8. Note that in this embodiment, Δzl+Δyl is selected so that the wire 2 is raised obliquely with an inclination 606.

・・・第1図中)、第2図ではB点。...in Figure 1), point B in Figure 2.

クランプ5を閉とする。・・・第1図Tel、第2図で
は0点、第3図ではウェッジIC1ワイヤ2C。
Clamp 5 is closed. ...Tel in Figure 1, 0 point in Figure 2, wedge IC1 wire 2C in Figure 3.

次いでウェッジlをクランプ5とともに真下又は前方下
方へ下降させる(第1図中)においてつ工・7ジ1を斜
めに上昇させた場合は真下でも前方下方でもよいが、ウ
ェッジ1を真上に上昇させた場合は前方下方に限られる
)。こめ実施例ではΔ2゜と絶対量が同じΔ2fi、第
2ボンディング部8からのワイヤ立ち上がり基部13と
ウェッジ1のガイド孔出口部14との水平距離が長さl
より大なるようにかつ先端面4が第2ボンディング部8
から外れるように選んだΔy2だけ、矢印!Oのように
斜めに下降させている。すると、ウェッジ1はワイヤ2
をワイヤ2の先端から所定長lだけ手前の第1ボンディ
ングしろ基部9をガイド孔出口部14で曲げながら下降
し、ワイヤ立ち上がり基部13とガイド孔出口部14と
の直線距離が長さeを超えるとワイヤ2はワイヤ立ち上
がり基部13で切断される。・・・第1図fd+、第2
図ではD点、第3図ではウェッジID、ワイヤ2D。
Next, when the wedge 1 is lowered with the clamp 5 straight down or forward downward (as shown in Fig. 1), if the lever 7 is raised diagonally, it can be either straight downward or forward downward, but the wedge 1 is raised straight upward. (If you do so, it will be limited to the front and downwards). In the embodiment, the absolute amount is Δ2fi, which is the same as Δ2°, and the horizontal distance between the wire rising base 13 from the second bonding part 8 and the guide hole exit part 14 of the wedge 1 is the length l.
so that the tip surface 4 is larger than the second bonding portion 8.
Only Δy2 selected to be outside of the arrow! It is lowered diagonally like an O. Then, wedge 1 is connected to wire 2
is lowered while bending the first bonding base 9 at the guide hole outlet 14 at a predetermined length l from the tip of the wire 2, and the linear distance between the wire rising base 13 and the guide hole outlet 14 exceeds the length e. The wire 2 is cut at the wire rising base 13. ...Figure 1 fd+, 2nd
Point D in the figure, wedge ID and wire 2D in Figure 3.

さらにウェッジ1及びクランプ5の一体下降を続けてワ
イヤ先端を先端面4で基板6に押し付けると、ワイヤ2
は第1ボンディングしろ基部9で確実に折れ曲り、ウェ
ッジlの先端面4に沿って所定長lの第1ボンディング
しろが折曲形成される。・・・第1図tel、第2図で
はE点、第3図ではウェッジIE、ワイヤ2E。
Furthermore, when the wedge 1 and the clamp 5 continue to be lowered together and the tip of the wire is pressed against the substrate 6 with the tip surface 4, the wire 2
is reliably bent at the first bonding margin base 9, and a first bonding margin of a predetermined length l is formed by bending along the distal end surface 4 of the wedge l. ...tel in Figure 1, point E in Figure 2, wedge IE and wire 2E in Figure 3.

このままの状態でウェッジ1をx、  y、  z移動
せしめ、次にボンディングを行う第1ボンディング部7
1の直上部に位置を合せる。基板6は第1ボンディング
部7.と第2ボンディング部81を結ぶ線がY方向部ち
つエツジlの前後方向に一致する如くθ回動させられて
いる。・・・第1図(fl、第2図ではF点。
In this state, the wedge 1 is moved in x, y, and z, and then the first bonding section 7 performs bonding.
Align it directly above 1. The substrate 6 has a first bonding portion 7. The Y-direction portion is rotated by θ so that the line connecting the second bonding portion 81 and the second bonding portion 81 coincides with the front-rear direction of the edge l. ...Figure 1 (fl, point F in Figure 2).

次に、ウェッジ■を真下に下降せしめてウェッジ1の先
端面4と第1ボンディング部71との間に所定長eの第
1ボンディングしろを挟圧し、ウェッジ1により超音波
を印加してワイヤボンディングを行う。
Next, the wedge 1 is lowered straight down to squeeze a first bonding margin of a predetermined length e between the tip end surface 4 of the wedge 1 and the first bonding part 71, and ultrasonic waves are applied by the wedge 1 to perform wire bonding. I do.

第1図(C1から第1図(e)即ち、第2図C−Eのつ
工’7ジ1の移動を第3図に拡大して示す、このように
ウェッジICの状態からウェッジIEの状態に移動させ
るには、例えば破線矢印のように前方下方に円弧状にウ
ェッジ1を下降せしめてもよいし、ウェッジ1を実線矢
印のように前方下方に斜めに直線的に下降せしめてもよ
い。
FIG. 1 (C1 to FIG. 1(e), that is, FIG. For example, the wedge 1 may be lowered forward and downward in an arc shape as shown by the broken line arrow, or the wedge 1 may be lowered forward and downward in a straight line as shown by the solid line arrow. .

以上述べた実施例ではウェッジ1とクランプ5とを一体
的に移動させる例であったがウェッジlとクランプ5と
が相対的に移動可能な装置においては一体移動させなく
とも可能である。例えばクランプ5を閉じた状態〔第1
図(C)〕でクランプ5を基板6に対して静止させウェ
ッジ1を第1図+dltelの如く移動させることもで
きる。
In the embodiments described above, the wedge 1 and the clamp 5 are moved integrally, but in a device in which the wedge 1 and the clamp 5 are movable relative to each other, it is possible that the wedge 1 and the clamp 5 are not moved integrally. For example, when the clamp 5 is closed [first
It is also possible to keep the clamp 5 stationary relative to the substrate 6 as shown in FIG. 1(C) and move the wedge 1 as shown in FIG.

いずれにしても、ウェッジ1を相対的に真下に又は前方
下方へ斜めに下降せしめて、ワイヤ2をワイヤ立ち上が
り基部13でカントするとともに第1ボンディングしろ
基部9で折曲して第1ボンディングしろを折曲形成すれ
ばよく、例えばYZ方向移動装置が基板6の方に設けら
れている場合では基板6を移動させることもできる。
In any case, the wedge 1 is lowered relatively straight down or diagonally forward and downward, and the wire 2 is canted at the wire rising base 13 and bent at the first bonding margin base 9 to form the first bonding margin. For example, if a YZ direction moving device is provided on the substrate 6, the substrate 6 can be moved.

〔発明の効果〕〔Effect of the invention〕

本発明は第2ボンディング部からワイヤを連続させたま
まで先ずウェッジを相対的に上昇させることにより第2
ボンディング部とウェッジとの間のワイヤの長さをlと
し、その後ウェッジのワイヤに対する後退を阻止した状
態でウェッジを相対的に真下に又は前方下方に斜めに下
降せしめることによりワイヤの切断と折曲を殆ど同時に
行うので、ワイヤの繰り出し量のバラツキ、折曲点のズ
レ折曲形成した第1ボンディングしるの横方向への曲り
などが生じるおそれがなく、また動作も少なく、ワイヤ
繰り出し機構も不要である。
In the present invention, by first relatively raising the wedge while keeping the wire continuous from the second bonding part, the second
The length of the wire between the bonding part and the wedge is set to 1, and the wire is then cut and bent by lowering the wedge relatively directly downward or diagonally downward while preventing the wedge from retreating relative to the wire. Since these are carried out almost simultaneously, there is no risk of variations in the amount of wire being fed out, deviations in the bending point, or lateral bending of the formed first bonding seal, etc. Also, there is little movement and there is no need for a wire feeding mechanism. It is.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(al〜fflは動作説明図、第2図はタイムチ
ャート、第3図は動作の主要部の拡大説明図、第4図(
al (blはそれぞれ従来用いられているウェッジの
説明図である。 1.11・・・ウェッジ、2・・・ワイヤ、3.31・
・・ガイド孔、4,41・・・先端面、5・・・クラン
プ、6・・・基板、7,71・・・第1ボンディング部
、8.81・・・第2ボンディング部、9・・・第1ボ
ンディングしろ基部、10.12・・・矢印、13・・
・ワイヤ立ち上がり基部、14・・・ガイド孔出口部。 特許出朝入    海」二電機株式会社代理人弁理士 
   薬  師     稔代理人弁理士    依 
1) 孝 次 部代理人弁理士    高  木  正
  行図 (a) (b) −叶一ノ
Figure 1 (al to ffl are explanatory diagrams of operation, Figure 2 is a time chart, Figure 3 is an enlarged explanatory diagram of the main parts of operation, Figure 4 (
al (bl is an explanatory diagram of conventionally used wedges. 1.11... Wedge, 2... Wire, 3.31...
...Guide hole, 4, 41...Tip surface, 5...Clamp, 6...Substrate, 7,71...First bonding part, 8.81...Second bonding part, 9... ...First bonding clearance base, 10.12...Arrow, 13...
- Wire rising base, 14... guide hole exit part. ``Patent Departure Asairi Umi'' Nidenki Co., Ltd. Representative Patent Attorney
Pharmacist Minoru Patent Attorney Yori
1) Takatsugu Patent Attorney Masayuki Takagi (a) (b) - Kazuno Kano

Claims (1)

【特許請求の範囲】[Claims] (1)ボンディングウェッジを用いて基板上でワイヤボ
ンディングを行うワイヤボンディング方法において、第
2ボンディング部の超音波印加の終了後ボンディングウ
ェッジを次の第1ボンディングに要するワイヤの長さl
と同じ距離だけ前方上方に斜めに又は真上に上昇させて
ボンディングウェッジをワイヤに対して後退せしめて第
2ボンディング部から連続しているワイヤのその立ち上
がり基部からボンディングウェッジまでのワイヤの長さ
をlとし、次いでボンディングウェッジのワイヤに対す
る後退を阻止した状態でボンディングウェッジを相対的
に真下に又は前方下方に斜めに下降せしめてワイヤを前
記第2ボンディング部からの立ち上がり基部で切断しか
つ先端部の長さlのワイヤを前記基板又は基板に固着し
た部材に圧接してボンディングウェッジ先端面に沿わし
め、その後、ボンディングウェッジを次の第1ボンディ
ング部に移動せしめることを特徴とするワイヤボンディ
ング方法。
(1) In a wire bonding method in which wire bonding is performed on a substrate using a bonding wedge, the length l of the wire required for the next first bonding after the application of ultrasonic waves to the second bonding part is completed
The length of the wire from the rising base of the wire that is continuous from the second bonding part to the bonding wedge is determined by raising the bonding wedge forward and upward diagonally or directly upward by the same distance as . 1, and then, with the bonding wedge prevented from retreating relative to the wire, the bonding wedge is lowered relatively straight down or diagonally forward and downward to cut the wire at the base rising from the second bonding part, and cutting the wire at the base rising from the second bonding part. A wire bonding method characterized in that a wire having a length l is pressure-contacted to the substrate or a member fixed to the substrate so as to run along the tip end surface of the bonding wedge, and then the bonding wedge is moved to the next first bonding part.
JP63194616A 1988-08-05 1988-08-05 Wire bonding Granted JPH0244743A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63194616A JPH0244743A (en) 1988-08-05 1988-08-05 Wire bonding

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63194616A JPH0244743A (en) 1988-08-05 1988-08-05 Wire bonding

Publications (2)

Publication Number Publication Date
JPH0244743A true JPH0244743A (en) 1990-02-14
JPH05860B2 JPH05860B2 (en) 1993-01-06

Family

ID=16327499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63194616A Granted JPH0244743A (en) 1988-08-05 1988-08-05 Wire bonding

Country Status (1)

Country Link
JP (1) JPH0244743A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568831A (en) * 1979-06-21 1981-01-29 Shinkawa Ltd Wire bonding method
JPS5889833A (en) * 1981-11-25 1983-05-28 Shinkawa Ltd Wire bonding method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568831A (en) * 1979-06-21 1981-01-29 Shinkawa Ltd Wire bonding method
JPS5889833A (en) * 1981-11-25 1983-05-28 Shinkawa Ltd Wire bonding method

Also Published As

Publication number Publication date
JPH05860B2 (en) 1993-01-06

Similar Documents

Publication Publication Date Title
US4600138A (en) Bonding tool and clamp assembly and wire handling method
US5018658A (en) Bonding wedge
JPH0377662B2 (en)
US4597520A (en) Bonding method and means
JP2003200228A (en) Method and machine for continuous multi-stroke slotting of plate-shaped workpiece, especially, sheet metal plate
JPH0244743A (en) Wire bonding
JPH0244744A (en) Wire bonding
EP0494510A2 (en) Bonding head
US5967399A (en) Electric wire pressure welding apparatus and pressure welding method
US4645118A (en) Method and means for threading wire bonding machines
JP2537389B2 (en) Wire bonding method and apparatus thereof
JP2575048B2 (en) Wire bonding method and apparatus
JPH054814B2 (en)
JP2008270556A (en) Wire bonding method, and wire bonding device
JPH0465537B2 (en)
JPS6135698B2 (en)
JP3369764B2 (en) Torch electrode body for discharge in wire bonding equipment
JP2925392B2 (en) Ball type wire bonding method
JP3567626B2 (en) Component mounting method and device
KR20230074797A (en) Pin wire forming method, and wire bonding device
JPS6233742B2 (en)
JPS58148432A (en) Wire bonding
JP3027497U (en) Lead frame cutting device
JPS62108533A (en) Wire bonding method
JPH02114651A (en) Wire bonding