JPH05203414A - 物体の絶対座標を探知する方法および装置 - Google Patents

物体の絶対座標を探知する方法および装置

Info

Publication number
JPH05203414A
JPH05203414A JP4258448A JP25844892A JPH05203414A JP H05203414 A JPH05203414 A JP H05203414A JP 4258448 A JP4258448 A JP 4258448A JP 25844892 A JP25844892 A JP 25844892A JP H05203414 A JPH05203414 A JP H05203414A
Authority
JP
Japan
Prior art keywords
projection
sensor
grating
light
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4258448A
Other languages
English (en)
Japanese (ja)
Inventor
Hans Steinbichler
シュタインビッヒレル ハンス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPH05203414A publication Critical patent/JPH05203414A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP4258448A 1991-09-26 1992-09-28 物体の絶対座標を探知する方法および装置 Pending JPH05203414A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE4132134 1991-09-26
DE4132134:0 1991-10-18
DE4134546A DE4134546A1 (de) 1991-09-26 1991-10-18 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objektes
DE4134546:0 1991-10-18

Publications (1)

Publication Number Publication Date
JPH05203414A true JPH05203414A (ja) 1993-08-10

Family

ID=25907763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4258448A Pending JPH05203414A (ja) 1991-09-26 1992-09-28 物体の絶対座標を探知する方法および装置

Country Status (4)

Country Link
US (1) US5289264A (enrdf_load_stackoverflow)
EP (1) EP0534284B1 (enrdf_load_stackoverflow)
JP (1) JPH05203414A (enrdf_load_stackoverflow)
DE (2) DE4134546A1 (enrdf_load_stackoverflow)

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5636025A (en) * 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
NO302055B1 (no) * 1993-05-24 1998-01-12 Metronor As Fremgangsmåte og system for geometrimåling
US5627646A (en) * 1995-07-21 1997-05-06 Ford Motor Company Method for locating flaws in a smooth surface of an object
DE19536294C2 (de) * 1995-09-29 2003-12-18 Daimler Chrysler Ag Verfahren zur geometrischen Navigation von optischen 3D-Sensoren zum dreidimensionalen Vermessen von Objekten
US6031612A (en) * 1996-02-12 2000-02-29 Massachusetts Institute Of Technology Apparatus and methods for contour measurement using movable sources
US6229619B1 (en) 1996-02-12 2001-05-08 Massachusetts Institute Of Technology Compensation for measurement uncertainty due to atmospheric effects
US6690474B1 (en) 1996-02-12 2004-02-10 Massachusetts Institute Of Technology Apparatus and methods for surface contour measurement
DE19638758A1 (de) * 1996-09-13 1998-03-19 Rubbert Ruedger Verfahren und Vorrichtung zur dreidimensionalen Vermessung von Objekten
US6873340B2 (en) 1997-05-15 2005-03-29 Visimatix, Inc. Method and apparatus for an automated reference indicator system for photographic and video images
GB2326228B (en) * 1997-06-10 2000-05-24 British Aerospace Non-contact deformation measurement
DE19743811C2 (de) * 1997-10-04 2000-01-05 Henning Wolf Meßverfahren und Meßvorrichtung zur Formbestimmung von Objekten mit drehbar gelagertem Gitterträger
DE19747061B4 (de) * 1997-10-24 2005-02-10 Mähner, Bernward Verfahren und Einrichtung zur flächenhaften, dreidimensionalen, optischen Vermessung von Objekten
USD427243S (en) * 1997-12-15 2000-06-27 Visimatix, Inc. Reference indicator patch for use in an automated reference indicator system for photographic and video images
US6252623B1 (en) * 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
AU2842500A (en) * 1998-10-16 2000-05-29 Digilens Inc. Light source locator using switchable holograms
US6084712A (en) * 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
US6317616B1 (en) 1999-09-15 2001-11-13 Neil David Glossop Method and system to facilitate image guided surgery
US6648640B2 (en) * 1999-11-30 2003-11-18 Ora Metrix, Inc. Interactive orthodontic care system based on intra-oral scanning of teeth
US7027642B2 (en) * 2000-04-28 2006-04-11 Orametrix, Inc. Methods for registration of three-dimensional frames to create three-dimensional virtual models of objects
JP2004509401A (ja) * 2000-09-13 2004-03-25 ネクストエンジン・インコーポレーテッド キャプチャファイルの忠実度を保証するように監視または制御された撮像システム
US6856407B2 (en) 2000-09-13 2005-02-15 Nextengine, Inc. Method for depth detection in 3D imaging providing a depth measurement for each unitary group of pixels
US7358986B1 (en) 2000-09-13 2008-04-15 Nextengine, Inc. Digital imaging system having distribution controlled over a distributed network
US6639684B1 (en) 2000-09-13 2003-10-28 Nextengine, Inc. Digitizer using intensity gradient to image features of three-dimensional objects
US6369879B1 (en) 2000-10-24 2002-04-09 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US6504605B1 (en) 2000-10-24 2003-01-07 The Regents Of The University Of California Method and apparatus for determining the coordinates of an object
US7233351B1 (en) 2001-02-23 2007-06-19 Nextengine, Inc. Method for high resolution incremental imaging
JP2002296020A (ja) * 2001-03-30 2002-10-09 Nidek Co Ltd 表面形状測定装置
US7061628B2 (en) * 2001-06-27 2006-06-13 Southwest Research Institute Non-contact apparatus and method for measuring surface profile
FR2830079B1 (fr) * 2001-09-26 2004-04-30 Holo 3 Procede et dispositif de mesure d'au moins une grandeur geometrique d'une surface optiquement reflechissante
DE10212364A1 (de) * 2002-03-20 2003-10-16 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts
US7286246B2 (en) * 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
DE10354078B4 (de) * 2003-11-19 2008-09-04 Daimler Ag Spannvorrichtung für Werkstücke zur dreidimensionalen optischen Oberflächenmessung
US7711179B2 (en) 2004-04-21 2010-05-04 Nextengine, Inc. Hand held portable three dimensional scanner
US20060045174A1 (en) * 2004-08-31 2006-03-02 Ittiam Systems (P) Ltd. Method and apparatus for synchronizing a transmitter clock of an analog modem to a remote clock
JP4701948B2 (ja) * 2005-09-21 2011-06-15 オムロン株式会社 パタン光照射装置、３次元形状計測装置、及びパタン光照射方法
US20070090310A1 (en) * 2005-10-24 2007-04-26 General Electric Company Methods and apparatus for inspecting an object
US7228634B1 (en) * 2005-12-19 2007-06-12 Palo Alto Research Center Inc. Using viewing-angle-sensitive visual tags to determine angular orientation and/or location
US7995834B1 (en) 2006-01-20 2011-08-09 Nextengine, Inc. Multiple laser scanner
RU2310815C1 (ru) * 2006-02-14 2007-11-20 Федеральное государственное унитарное предприятие "Московское машиностроительное производственное предприятие "САЛЮТ" (ФГУП "ММПП "САЛЮТ") Устройство для настройки комплекса бесконтактных измерений
US7595894B2 (en) * 2006-06-02 2009-09-29 General Electric Company Profilometry apparatus and method of operation
JP5943547B2 (ja) * 2007-08-17 2016-07-05 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 非接触測定を行う装置および方法
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
US7812968B2 (en) * 2008-03-05 2010-10-12 Ge Inspection Technologies, Lp Fringe projection system and method for a probe using a coherent fiber bundle
US9551575B2 (en) 2009-03-25 2017-01-24 Faro Technologies, Inc. Laser scanner having a multi-color light source and real-time color receiver
DE102009015920B4 (de) 2009-03-25 2014-11-20 Faro Technologies, Inc. Vorrichtung zum optischen Abtasten und Vermessen einer Umgebung
DE102010030833B4 (de) * 2009-07-03 2014-07-03 Koh Young Technology Inc. Vorrichtung zur Messung einer dreidimensionalen Form
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
CA2771727C (en) 2009-11-04 2013-01-08 Technologies Numetrix Inc. Device and method for obtaining three-dimensional object surface data
US9210288B2 (en) 2009-11-20 2015-12-08 Faro Technologies, Inc. Three-dimensional scanner with dichroic beam splitters to capture a variety of signals
US9113023B2 (en) 2009-11-20 2015-08-18 Faro Technologies, Inc. Three-dimensional scanner with spectroscopic energy detector
DE102009057101A1 (de) 2009-11-20 2011-05-26 Faro Technologies, Inc., Lake Mary Vorrichtung zum optischen Abtasten und Vermessen einer Umgebung
US9529083B2 (en) 2009-11-20 2016-12-27 Faro Technologies, Inc. Three-dimensional scanner with enhanced spectroscopic energy detector
US8630314B2 (en) * 2010-01-11 2014-01-14 Faro Technologies, Inc. Method and apparatus for synchronizing measurements taken by multiple metrology devices
DE112011100290T5 (de) 2010-01-20 2013-02-28 Faro Technologies Inc. Koordinatenmessgerät mit einem beleuchteten Sondenende und Betriebsverfahren
US9879976B2 (en) 2010-01-20 2018-01-30 Faro Technologies, Inc. Articulated arm coordinate measurement machine that uses a 2D camera to determine 3D coordinates of smoothly continuous edge features
US8615893B2 (en) 2010-01-20 2013-12-31 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine having integrated software controls
US9607239B2 (en) 2010-01-20 2017-03-28 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
GB2490631B (en) * 2010-01-20 2016-11-02 Faro Tech Inc Portable articulated arm coordinate measuring machine with multi-bus arm technology
US9009000B2 (en) * 2010-01-20 2015-04-14 Faro Technologies, Inc. Method for evaluating mounting stability of articulated arm coordinate measurement machine using inclinometers
US8898919B2 (en) 2010-01-20 2014-12-02 Faro Technologies, Inc. Coordinate measurement machine with distance meter used to establish frame of reference
US8677643B2 (en) 2010-01-20 2014-03-25 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US8875409B2 (en) 2010-01-20 2014-11-04 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US9628775B2 (en) 2010-01-20 2017-04-18 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US8832954B2 (en) 2010-01-20 2014-09-16 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
DE102010020925B4 (de) 2010-05-10 2014-02-27 Faro Technologies, Inc. Verfahren zum optischen Abtasten und Vermessen einer Umgebung
JP2013539541A (ja) 2010-09-08 2013-10-24 ファロ テクノロジーズ インコーポレーテッド プロジェクタを有するレーザスキャナまたはレーザ追跡装置
TW201229454A (en) * 2010-10-27 2012-07-16 Nikon Corp Profile measuring apparatus, method for manufacturing structure, and structure manufacturing system
US9168654B2 (en) 2010-11-16 2015-10-27 Faro Technologies, Inc. Coordinate measuring machines with dual layer arm
DE102012100609A1 (de) 2012-01-25 2013-07-25 Faro Technologies, Inc. Vorrichtung zum optischen Abtasten und Vermessen einer Umgebung
US8997362B2 (en) 2012-07-17 2015-04-07 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine with optical communications bus
US9513107B2 (en) 2012-10-05 2016-12-06 Faro Technologies, Inc. Registration calculation between three-dimensional (3D) scans based on two-dimensional (2D) scan data from a 3D scanner
DE102012109481A1 (de) 2012-10-05 2014-04-10 Faro Technologies, Inc. Vorrichtung zum optischen Abtasten und Vermessen einer Umgebung
US10067231B2 (en) 2012-10-05 2018-09-04 Faro Technologies, Inc. Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner
DE102015122844A1 (de) 2015-12-27 2017-06-29 Faro Technologies, Inc. 3D-Messvorrichtung mit Batteriepack
CN107655421A (zh) 2016-07-25 2018-02-02 科罗马森斯股份有限公司 采用立体扫描相机对表面进行扫描的工艺和装置
DE102017004428B4 (de) 2017-05-08 2018-11-29 Universität Stuttgart Verfahren und Anordnung zur robusten, tiefenscannenden fokussierenden Streifen-Triangulation mit mehreren Wavelets
DE102017004429B4 (de) 2017-05-08 2019-05-09 Universität Stuttgart Verfahren und Anordnung zur robusten, tiefenscannenden/fokussierenden Streifen-Triangulation
CN118010757B (zh) * 2024-01-31 2024-08-09 四川深瑞视科技有限公司 一种3d aoi检测装置及检测方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE343366C (enrdf_load_stackoverflow) *
US4212073A (en) * 1978-12-13 1980-07-08 Balasubramanian N Method and system for surface contouring
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
US4564295A (en) * 1983-03-07 1986-01-14 New York Institute Of Technology Apparatus and method for projection moire topography
US4641972A (en) * 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
US4593967A (en) * 1984-11-01 1986-06-10 Honeywell Inc. 3-D active vision sensor
JPH0615968B2 (ja) * 1986-08-11 1994-03-02 伍良 松本 立体形状測定装置
DE3817559C1 (enrdf_load_stackoverflow) * 1988-05-24 1989-12-07 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De
DE4007502A1 (de) * 1990-03-09 1991-09-12 Zeiss Carl Fa Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen

Also Published As

Publication number Publication date
US5289264A (en) 1994-02-22
EP0534284A3 (en) 1993-10-06
EP0534284A2 (de) 1993-03-31
DE59208480D1 (de) 1997-06-19
EP0534284B1 (de) 1997-05-14
DE4134546C2 (enrdf_load_stackoverflow) 1993-09-16
DE4134546A1 (de) 1993-04-08

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