JPH0518067B2 - - Google Patents
Info
- Publication number
- JPH0518067B2 JPH0518067B2 JP59256419A JP25641984A JPH0518067B2 JP H0518067 B2 JPH0518067 B2 JP H0518067B2 JP 59256419 A JP59256419 A JP 59256419A JP 25641984 A JP25641984 A JP 25641984A JP H0518067 B2 JPH0518067 B2 JP H0518067B2
- Authority
- JP
- Japan
- Prior art keywords
- counter
- signal
- output
- decoder
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59256419A JPS61134683A (ja) | 1984-12-06 | 1984-12-06 | 集積化テスト回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59256419A JPS61134683A (ja) | 1984-12-06 | 1984-12-06 | 集積化テスト回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61134683A JPS61134683A (ja) | 1986-06-21 |
| JPH0518067B2 true JPH0518067B2 (enrdf_load_html_response) | 1993-03-10 |
Family
ID=17292404
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59256419A Granted JPS61134683A (ja) | 1984-12-06 | 1984-12-06 | 集積化テスト回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61134683A (enrdf_load_html_response) |
-
1984
- 1984-12-06 JP JP59256419A patent/JPS61134683A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61134683A (ja) | 1986-06-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6041417A (en) | Method and apparatus for synchronizing data received in an accelerated graphics port of a graphics memory system | |
| EP0157701B1 (en) | Phase synchronization circuit | |
| WO1996026451A1 (en) | Bit error measuring instrument | |
| JPH027530B2 (enrdf_load_html_response) | ||
| EP0739512B1 (en) | Self-resetting bypass control for scan test | |
| JP2641276B2 (ja) | ２段式同期装置 | |
| US20050036577A1 (en) | Systems for synchronizing resets in multi-clock frequency applications | |
| JPH031760A (ja) | 受信テレビジョン信号再生装置 | |
| US6449738B1 (en) | Apparatus for bus frequency independent wrap I/O testing and method therefor | |
| JPH0518067B2 (enrdf_load_html_response) | ||
| US4270116A (en) | High speed data logical comparison device | |
| JP2985056B2 (ja) | Ｉｃ試験装置 | |
| US4741005A (en) | Counter circuit having flip-flops for synchronizing carry signals between stages | |
| JP2936807B2 (ja) | 集積回路 | |
| US6378092B1 (en) | Integrated circuit testing | |
| US7519494B2 (en) | Integrated circuit with signature computation | |
| JP2849007B2 (ja) | 半導体集積回路 | |
| JPH05134007A (ja) | 半導体集積論理回路 | |
| US5867050A (en) | Timing generator circuit | |
| KR19980046816A (ko) | 프로그램 가능한 펄스 발생기 | |
| JP3025551B2 (ja) | 直流特性試験回路 | |
| JPS62254582A (ja) | テレビジヨン信号メモリ書込回路 | |
| JP2885126B2 (ja) | 入力試験回路 | |
| JP2903548B2 (ja) | 論理回路診断システム | |
| JPH075701Y2 (ja) | トリガ検出回路 |