JPH0513258B2 - - Google Patents

Info

Publication number
JPH0513258B2
JPH0513258B2 JP58250304A JP25030483A JPH0513258B2 JP H0513258 B2 JPH0513258 B2 JP H0513258B2 JP 58250304 A JP58250304 A JP 58250304A JP 25030483 A JP25030483 A JP 25030483A JP H0513258 B2 JPH0513258 B2 JP H0513258B2
Authority
JP
Japan
Prior art keywords
image
diffraction
analog
diffraction image
digital
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58250304A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60143749A (ja
Inventor
Osamu Furukimi
Makoto Imanaka
Osamu Usui
Katsuyasu Aikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP58250304A priority Critical patent/JPS60143749A/ja
Publication of JPS60143749A publication Critical patent/JPS60143749A/ja
Publication of JPH0513258B2 publication Critical patent/JPH0513258B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58250304A 1983-12-29 1983-12-29 電子線回折像自動測定装置 Granted JPS60143749A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58250304A JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58250304A JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Publications (2)

Publication Number Publication Date
JPS60143749A JPS60143749A (ja) 1985-07-30
JPH0513258B2 true JPH0513258B2 (enrdf_load_stackoverflow) 1993-02-22

Family

ID=17205912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58250304A Granted JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Country Status (1)

Country Link
JP (1) JPS60143749A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02268262A (ja) * 1989-04-11 1990-11-01 Nippon Steel Corp 結晶方位解析方法および装置
JPH06249799A (ja) * 1993-02-25 1994-09-09 Natl Res Inst For Metals 電子線回折強度迅速精密計測装置
US11114275B2 (en) * 2019-07-02 2021-09-07 Fei Company Methods and systems for acquiring electron backscatter diffraction patterns

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5871444A (ja) * 1981-10-23 1983-04-28 Jeol Ltd 電子線回折装置

Also Published As

Publication number Publication date
JPS60143749A (ja) 1985-07-30

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