JPS60143749A - 電子線回折像自動測定装置 - Google Patents

電子線回折像自動測定装置

Info

Publication number
JPS60143749A
JPS60143749A JP58250304A JP25030483A JPS60143749A JP S60143749 A JPS60143749 A JP S60143749A JP 58250304 A JP58250304 A JP 58250304A JP 25030483 A JP25030483 A JP 25030483A JP S60143749 A JPS60143749 A JP S60143749A
Authority
JP
Japan
Prior art keywords
image
analog
diffraction
diffraction image
spot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58250304A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0513258B2 (enrdf_load_stackoverflow
Inventor
Osamu Furukimi
修 古君
Makoto Imanaka
誠 今中
Osamu Usui
臼井　修
Katsuyasu Aikawa
相川　勝保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIREKO KK
JFE Steel Corp
Original Assignee
NIREKO KK
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIREKO KK, Kawasaki Steel Corp filed Critical NIREKO KK
Priority to JP58250304A priority Critical patent/JPS60143749A/ja
Publication of JPS60143749A publication Critical patent/JPS60143749A/ja
Publication of JPH0513258B2 publication Critical patent/JPH0513258B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58250304A 1983-12-29 1983-12-29 電子線回折像自動測定装置 Granted JPS60143749A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58250304A JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58250304A JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Publications (2)

Publication Number Publication Date
JPS60143749A true JPS60143749A (ja) 1985-07-30
JPH0513258B2 JPH0513258B2 (enrdf_load_stackoverflow) 1993-02-22

Family

ID=17205912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58250304A Granted JPS60143749A (ja) 1983-12-29 1983-12-29 電子線回折像自動測定装置

Country Status (1)

Country Link
JP (1) JPS60143749A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02268262A (ja) * 1989-04-11 1990-11-01 Nippon Steel Corp 結晶方位解析方法および装置
JPH06249799A (ja) * 1993-02-25 1994-09-09 Natl Res Inst For Metals 電子線回折強度迅速精密計測装置
JP2021009148A (ja) * 2019-07-02 2021-01-28 エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ 電子後方散乱回折パターンを取得するための方法およびシステム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5871444A (ja) * 1981-10-23 1983-04-28 Jeol Ltd 電子線回折装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5871444A (ja) * 1981-10-23 1983-04-28 Jeol Ltd 電子線回折装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02268262A (ja) * 1989-04-11 1990-11-01 Nippon Steel Corp 結晶方位解析方法および装置
JPH06249799A (ja) * 1993-02-25 1994-09-09 Natl Res Inst For Metals 電子線回折強度迅速精密計測装置
JP2021009148A (ja) * 2019-07-02 2021-01-28 エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ 電子後方散乱回折パターンを取得するための方法およびシステム

Also Published As

Publication number Publication date
JPH0513258B2 (enrdf_load_stackoverflow) 1993-02-22

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