JPH0512776Y2 - - Google Patents
Info
- Publication number
- JPH0512776Y2 JPH0512776Y2 JP1988020657U JP2065788U JPH0512776Y2 JP H0512776 Y2 JPH0512776 Y2 JP H0512776Y2 JP 1988020657 U JP1988020657 U JP 1988020657U JP 2065788 U JP2065788 U JP 2065788U JP H0512776 Y2 JPH0512776 Y2 JP H0512776Y2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- plate
- circuit board
- probe plate
- lifting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 78
- 238000012360 testing method Methods 0.000 description 9
- 230000003028 elevating effect Effects 0.000 description 7
- 230000006835 compression Effects 0.000 description 5
- 238000007906 compression Methods 0.000 description 5
- 230000001105 regulatory effect Effects 0.000 description 3
- 238000000926 separation method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988020657U JPH0512776Y2 (de) | 1988-02-19 | 1988-02-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1988020657U JPH0512776Y2 (de) | 1988-02-19 | 1988-02-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01129672U JPH01129672U (de) | 1989-09-04 |
JPH0512776Y2 true JPH0512776Y2 (de) | 1993-04-02 |
Family
ID=31237211
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1988020657U Expired - Lifetime JPH0512776Y2 (de) | 1988-02-19 | 1988-02-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0512776Y2 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4583890B2 (ja) * | 2004-11-17 | 2010-11-17 | 日本電子株式会社 | プローブ装置及びそれを備えた試料検査装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6053067B2 (ja) * | 1977-03-30 | 1985-11-22 | 大日本インキ化学工業株式会社 | 着色されたポリエステル組成物 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57205073U (de) * | 1981-06-25 | 1982-12-27 | ||
JPS6053067U (ja) * | 1983-09-20 | 1985-04-13 | 株式会社富士通ゼネラル | 回路基板の検査装置 |
-
1988
- 1988-02-19 JP JP1988020657U patent/JPH0512776Y2/ja not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6053067B2 (ja) * | 1977-03-30 | 1985-11-22 | 大日本インキ化学工業株式会社 | 着色されたポリエステル組成物 |
Also Published As
Publication number | Publication date |
---|---|
JPH01129672U (de) | 1989-09-04 |
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