JPH0499837A - Conductive material - Google Patents

Abstract

PURPOSE:To obtain a conductive material having high conductivity and excellent in migration resistance by specifying a compsn. constituted of Zr, Zn and Cu. CONSTITUTION:This is a conductive material contg., by weight, 0.05 to 1.0% Zr and 0.1 to 5.0% Zn, or furthermore contg., as auxiliary components, total 0.01 to 3.0% of one or >= two kinds among As, Al, Ag, P, Sn, Mg, Mn, Sb, Co, Pb, B, Si and Fe and the balance Cu with inevitable impurities. The material has high conductivity and is free from the generation of migration.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a current-carrying material for electrical component materials that suppresses the occurrence of migration between terminals, connectors, and bus bars (also referred to as bus bars).

[Prior Art] In recent years, electronic and electrical equipment, etc. have become smaller and lighter, and the parts used, such as connectors, have also become smaller, and the distance between parts has also tended to become significantly shorter. Also, circuits are becoming increasingly integrated. In other words, in the past, individual electronic components were connected by lead wires to form a circuit, but as the number of components increases, circuits become more complex, so circuits are becoming smaller by integrating them. There is.

[Problem to be solved by the invention] In conventional miniaturized and integrated circuits, different circuits or wiring are separated by a small interval for miniaturization. When an electrolyte is present, an electrochemical reaction occurs, and copper ions dissolved from the copper alloy that is the material of the current-carrying part on the high-potential side are deposited on the low-potential side, and when the amount increases further, a short circuit occurs. This phenomenon is called migration, and when such migration occurs, the circuit no longer functions properly. Therefore, in recent years, there has been a strong desire for materials that have high electrical conductivity and do not cause migration.

[Means for Solving the Problems] In view of the above-mentioned problems, the present inventors have proceeded with research on migration, and have developed materials with Z r 0.05 to 10
wt%, Z n 0.1 to 5.0 wt%, or further contains ASSAl as a subcomponent.

AgSPSSnSMg, Mn, Sb, Co.

One or more types consisting of P b s B SS l % Fe in a total amount of 0. Contains 1 to 30 wt% O, balance C
It is characterized by consisting of u and inevitable impurities.

According to the present invention, the amount of each element added to Cu is determined in consideration of the following. That is, first, Zr is an element that has the effect of suppressing the migration property of copper and copper alloys by being contained in copper and copper alloys. Moreover, when Zn is contained simultaneously with Zr in copper and copper alloys, it is an element that has the effect of suppressing the migration phenomenon of copper and copper alloys compared to when only Zr is contained.

Although the mechanism for suppressing the migration phenomenon is not clear, the presence of Zr and Zn, especially Zr, reduces the amount of Cu ion elution, and the generation of compounds of Zr and Zn impedes the conduction of electricity through the precipitated Cu particles. It is presumed that the migration phenomenon between the electrodes is suppressed by this.

The reason why the Zr content is set to 0.05 to 10 wt% is that if the Zr content is less than 0.05 vt%, there is no effect of suppressing the migration phenomenon, and if it exceeds I, Ovt%, there is an effect of suppressing the migration phenomenon, but the conductivity This is because the heat dissipation rate decreases, the amount of heat generated during energization increases, and the heat dissipation performance also decreases.

Similarly, the reason why the Zn content is set to 0.1 to 50 wt% is that Z
If the n content is less than 0.1 wt%, it will not be effective in suppressing the migration phenomenon, and if it exceeds 50 wt%, it will be effective in suppressing the migration phenomenon, but the conductivity will decrease and the amount of heat generated when energized will increase. This is because the heat dissipation property is also lowered.

Furthermore, As, Al, Ag, and P as subcomponents.

Sn, MgSMn5Sb, Co, Pb, B.

0.01vt or more of one or more of St and Fe
The reason for adding 3.0 wt% is to improve the strength, but if it is less than 0.01 wt%, there is no effect, and 3.0 wt% is added.
．． This is because if it exceeds 0 wt%, the conductivity will decrease.

[Example] Specific examples of the present invention are shown below.

First, the alloys of the present invention and comparative alloys having the compositions shown in Table 1 were melted and cast in air or an inert atmosphere, hot rolled on the face side, and then cold rolled, annealed and pickled repeatedly.
After final annealing at ~600° C. for 4 hours and pickling, cold rolling was performed at a workability of 20% to obtain a plate with a thickness of 016 rAm. and,:
The surface was polished with 1200mm paper to remove scale.

These test materials were evaluated for tensile strength, elongation, electrical conductivity, and migration resistance. Migration resistance was determined by cutting the sample material into 10cm x 1001111m pieces and
As a set, they were immersed in tap water (300 cc) as shown in FIGS. 1 and 2.

Next, a DC voltage of 14 V was applied to these two test materials, and the change in current value with respect to elapsed time was measured using a recorder. A typical example of this result is shown in FIG. Also, the current value in each sample material is 1. Table 1 shows the time until OA (arrow in Figure 3).

From Table 1, alloys No. 1 to 9 of the present invention all have a conductivity of 45%lAC3 or higher, have excellent strength and migration resistance, and are electrically conductive materials that require migration resistance, such as automobile terminals, connectors, and bus bars. It turns out that it is the most suitable alloy for this purpose.

In addition, comparative alloy No. 10 has a low content of Zr and Zn, so it has poor migration resistance and low strength.

Since N0.11 has a low Zr content, it has poor migration resistance. No. 12 has too much Zr content and therefore has low conductivity. No. 13 has a high Zn content and therefore has low conductivity. No. 14 is a type of brass conventionally used for busbar materials in automobiles, and has low strength and migration resistance.

[Effects of invention with high conductivity and conductivity] The current-carrying material of the present invention has high conductivity and is a material with excellent migration resistance.

[Brief explanation of the drawing]

FIG. 1 is a perspective view of a sample material for a migration resistance test, FIG. 2 is an explanatory diagram of the test, and FIG. 3 is a graph showing the measurement results.

Claims (2)

[Claims] (1) Zr0.05-1.0wt%, Zn0.1-5.
A current-carrying material characterized by containing 0 wt% of Cu, and the remainder consisting of Cu and unavoidable impurities. (2) Zr0.05-1.0wt%, Zn0.1-5.
Contains 0wt%, and further contains As, Al, Ag, P, Sn, Mg, Mn, Sb, Co, Pb, B, as subcomponents.
One or more of Si and Fe in a total amount of 0.01
A current-carrying material characterized in that it contains up to 3.0 wt% of Cu, with the remainder consisting of Cu and unavoidable impurities.