JPH048374Y2 - - Google Patents

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a contact probe for electrically testing electronic components mounted on the surface of a circuit board.

[Conventional technology]

Conventionally, when electrically testing electronic components mounted on a circuit board, a plunger is slidably disposed within a cylindrical sleeve with a contact pin protruding, and the plunger is A contact probe, which is biased outward by a spring, is inserted into the probe mounting plate of the inspection device, and the contact pin of this contact probe is attached to the inspection point of the circuit board or the solder joint between the electronic component and the circuit board. A method is adopted in which people come into contact with other people.

By the way, recently there has been a trend to use chip parts in addition to disk lead parts for electronic parts mounted on circuit boards, as shown in Figure 1.
Chip component 1 has electrode portions 1a and 1b on the left and right sides, and is bonded to the surface of circuit board 2 by soldering or conductive adhesive. Therefore, when inspecting the chip component 1, it is necessary to bring contact probes into contact with the side surfaces of the electrode parts 1a and 1b.

[Problem that the invention attempts to solve]

However, with conventional contact probes, it is not possible to contact the side surface of the electrode part of the chip component, and even if you try to contact the top surface of the electrode part, the electrode area is very narrow and the position of the chip component may be misaligned. Because of this, it has been difficult to always bring the contact probe into contact with accuracy.

The present invention was devised in view of the current situation, and provides a contact probe that can accurately perform performance inspection of chip components mounted on a circuit board.

[Means for solving problems]

The present invention includes a cylindrical sleeve body, an insulating lid body having a pair of through holes fixed to one end side of the cylindrical sleeve body, and an insulating lid body disposed inside the cylindrical sleeve body in contact with the lid body. a coil spring provided therein; an insulating sliding member receiving the pressing force of the coil spring and slidably disposed within the cylindrical sleeve body; and a state in which both ends of the sliding member protrude. and a pressing column protruding from the center of the surface of the sliding member opposite to the contact surface with the coil spring;
The contact portion of the stylus protruding toward the pressing column is made to protrude further than the pressing column, and is symmetrically outwardly in a substantially dogleg shape with the pressing column as the center, with the distance between its tips being wider than the tip part. On the other hand, the stylus protruding toward the other end of the sliding member is movably inserted into a pair of through holes provided in the lid body and protrudes to the outside, and the sliding member When the cylindrical sleeve body is prevented from coming off from the body, and the tip of the pressing support is brought into contact with the upper surface of the chip component to press the cylindrical sleeve body toward the chip component, the cylindrical sleeve body is pushed against the elasticity of the coil spring. a sliding member slides within the cylindrical sleeve body;
The substantially dogleg-shaped stylus is pressed inward by the other end of the cylindrical sleeve body, and the two styluses are configured to sandwich the side electrode portion of the chip component. A feature of the present invention is that these tests can be performed easily and accurately.

〔Example〕

Hereinafter, one embodiment of the present invention will be described with reference to FIGS. 1 and 2.

In FIG. 1, 1 is a chip component and 2 is a circuit board. Reference numeral 3 denotes a probe mounting plate, which is attached to an inspection device (not shown) so as to be movable toward the circuit board.

Reference numeral 4 denotes a cylindrical sleeve body, and a lid body 5 having through holes 5a and 5b provided at regular intervals is fixed inside the upper end thereof. A recess 5c is formed in the inner center of the lid 5, and one end of the coil spring 6 is positioned therein.

A sliding member 7 made of an insulating material such as plastic is further provided via the coil spring 6 and is slidably disposed inside the cylindrical sleeve body 4, with a pressing support 7a integrally provided at the center of the lower end. and
It is prevented from falling off by a falling-off preventing portion 4a.

A pair of stylus needles 8 and 9 made of a wire rod or a strip material are fixed in the axial direction to the sliding member 7, and are made to protrude linearly toward the upper end side, with the linear portion being connected to the lid body 5. The lead wires 10, 11 protrude freely through through holes 5a, 5b provided in the
It is connected to the.

On the other hand, the other ends of the stylus 8 and 9 are connected to the sliding member 7.
The contact portions 8a and 9a are made to protrude further from the presser column 7a, and are symmetrically biased outward in a substantially dogleg shape with respect to the presser column 7a. Note that the distance l between the tips of the contact parts 8a and 9a is
The length is set to be slightly larger than the length l of the chip part 1. Further, the approximately doglegged shape of the contact portions 8a, 9a is formed to be larger than the diameter of the lower end portion of the cylindrical sleeve body 4.

Next, the effect will be explained.

FIG. 1 shows a state in which the probe mounting plate 3 is positioned upward, and the chip component 1 to be inspected and the tips of the contact portions 8a, 9a of the stylus 8, 9 are in a non-contact state. Next, when the operation starts, the stylus 7, 8, etc. descend together with the probe mounting plate 3. Next, the tip of the pressing column 7a of the sliding member 7 comes into contact with the upper surface of the chip component 1. Furthermore, probe mounting plate 3
continues to descend and the sliding member 7 stops, so the cylindrical sleeve body 4 continues to descend while the coil spring 6 is compressed, and the lower end of the cylindrical sleeve body 4 touches the contact area of the stylus 8, 9. It contacts the substantially doglegged upper portions of 8a and 9a.

Further, when the cylindrical sleeve body 4 descends, the contact portions 8a, 9a are pressed inward, and as a result, both side surfaces 1a, 1 of the chip part 1 are pressed inward as shown in FIG.
The electrode portions b are brought into contact with each other so as to be held under pressure, forming a closed circuit, and an electrical performance test is performed.

When the inspection is completed, the probe mounting plate 3 is raised to return to the state shown in FIG. 1 in order to replace it with the next circuit board.

It goes without saying that the cylindrical sleeve body 4 may have a cylindrical shape or a rectangular cylindrical shape, and the contact portions 8a, 9a of the stylus 8, 9 may be coated with insulation only on the outer periphery, thereby making it possible to Concerns about poor inspection due to accidents with contact parts are also eliminated.

Furthermore, by attaching a ring 12 made of synthetic resin to the lower end of the cylindrical sleeve body 4, the contact portion 7
It can withstand the wear of a.

[Effect of idea]

As explained above, in the present invention, after the chip component to be inspected is pressed in advance by the pressing column of the sliding member, the upper part of the contact part of the stylus formed in a substantially dogleg shape is moved to the lower end of the cylindrical sleeve body. Since the tip of the contact part presses and deforms it inward, contact continuity is established as the tip of the contact part presses against the side electrode part of the chip part, which not only allows for stable inspection, but also allows the chip part to be slightly misaligned. It is also possible to obtain effects such as being able to perform inspections without any problems.

[Brief explanation of drawings]

1 and 2 are cross-sectional views showing one embodiment of the present invention, and FIG. 1 shows the state before the start of operation,
FIG. 2 is a diagram showing a state in which a stylus is brought into contact with a component to be inspected after the start of operation. DESCRIPTION OF SYMBOLS 1... Chip component, 2... Circuit board, 3... Probe mounting plate, 4... Cylindrical sleeve body, 4a...
Removal prevention part, 5...Lid body, 5a, 5b...Through hole, 5
c... Recess, 6... Coil spring, 7... Sliding member, 7a... Pressing strut, 8, 9... Stylus, 8
a, 9a...contact part, 10, 11...lead wire,
12...Ring, l...Distance between the tips of contact parts, l ₁ ...
...Length of chip parts.

Claims (1)

[Scope of utility model registration request] A cylindrical sleeve body, an insulating lid body having a pair of through holes fixed to one end of the cylindrical sleeve body, and a coil disposed within the cylindrical sleeve body in contact with the lid body. a spring, an insulating sliding member that receives the pressing force of the coil spring and is slidably disposed within the cylindrical sleeve body, and is held in place with both ends protruding from the sliding member. A pressing column is provided protruding from the center of the surface of the sliding member opposite to the contact surface with the coil spring, and the stylus protrudes toward the pressing column. The contact portion is made to protrude further than the pressing pillar, and is symmetrically outwardly shaped like a dogleg with the pressing pillar as the center, and the distance between its tips is wider than that of the tip part, while the other part of the sliding member The stylus protruding toward the end is movably inserted into a pair of through holes provided in the lid body so as to protrude to the outside, and the sliding member is prevented from coming off from the cylindrical sleeve body, When the tip of the pressing support is brought into contact with the upper surface of the chip component and the cylindrical sleeve body is pressed toward the chip component,
The sliding member slides within the cylindrical sleeve body against the elasticity of the coil spring, and the substantially dogleg-shaped stylus is pressed inward by the other end of the cylindrical sleeve body, so that two A contact probe characterized in that the stylus is configured to grip a side electrode portion of the chip component.