JPH031822Y2 - - Google Patents

Description

[Detailed description of the invention] a. Industrial application field The present invention relates to an electrical measurement probe, particularly a probe used to check the operation and measure the characteristics of a circuit with ICs, LSIs, and other components mounted on a printed circuit board. Regarding probes for operation.

b. Prior Art A conventional probe has an elongated tube made of an electrically insulating covering material, and a bifurcated support section that extends from the outer surface of the tube, and a conductive pipe is run along the inner wall of the tube. At the bifurcated support part, a conductive pin is attached so as to protrude into the support part, and a push button made of electrically insulating material is superimposed on the tail end of the tube body, and the push button is inserted into the inner diameter of the conductive pipe, A probe-like end whose tip is a clamping piece is fixed to the inner diameter of the push button, and an extension spring is stretched on the axis of the probe strip whose end is fixed to the tail end of the tube body and the push button, By operating the bifurcated support portion and the push button, the clamping piece of the probe strip is brought out from the tip of the tube body to clamp the object to be measured.

c. Problems to be solved by the invention In conventional probes of this type, the part to be electrically measured is generally narrow, and when the clamping operation is performed using the probe strip, the clamping piece often Since contact with objects other than the object to be measured may result in measurement errors, an electrically insulating coating is placed around the gripping piece of the probe to prevent measurement even if the gripping piece touches other objects. This has been improved to prevent errors and to securely hold the object to be measured so that the desired measurement can be carried out.

d Means for Solving the Problems The present invention has a cross-sectional shape as shown in Figure 1 of the drawings, and the bifurcated support parts 2 and 3 are sandwiched between the index and middle fingers.
When the push button 5 is pressed with the thumb, the spring 13 in the tail end 4 of the tube body 1 is contracted, and the tip clamping pieces 9a and 10a of the probe strips 9 and 10 are pressed against the tip of the tube body 1 as shown in FIG. The terminal T is protruded more protrudingly into a clamping state to clamp the terminal T, but since the electrical insulation coatings 11 and 12 are wrapped around the clamping pieces 9a and 10a, when the terminal T is clamped, the terminal T is clamped as shown in FIG. Terminal T of the conductive pipe 6 slightly protruding from the tip of the tube body 1
The configuration is such that the clamping operation can be continued by bringing the clamping pieces 9a and 10a into contact with each other, and the probe operation can be carried out without worrying about the contact of other parts of the clamping pieces 9a and 10a, as shown in FIG.

e Function The present invention allows the probe probe function to be performed in the same way as in the past, but the contact with the terminal T of the object to be measured can be reliably clamped, and even if the clamping pieces 9a and 10a of the probe come into contact with other objects, they will not be electrically affected. It has an insulated coating, and contact with the terminal T is made at the protruding tip portion of the conductive pipe 6, and while maintaining this contact state, the clamping pieces 9a and 10a are housed within the tip of the tube body 1 while remaining in the clamped state. Therefore, energization is carried out by the conductive pins 7 and 8 in the bifurcated support parts 2 and 3 connected to the conductive pipe 6, and the measurement operation connected thereto is optionally carried out.

f Example An example of the present invention will be explained with reference to the drawings.
As an example, as shown in the embodiment diagram shown in FIG. The tip of the probe strip 9a, 1 is pressed by
Various characteristics are measured by arbitrarily holding the terminal T between the holding pieces 9a and 10a. This is to make electrical contact between the conductive pipe 6 slightly protruding from the tip of the conductive pipe 6 and the terminal T to be measured.

g. Effects of the invention As described above, the present invention has the following effects when operating the probe:
No matter how narrow the tip is inserted, even if it comes into contact with an adjacent object during the clamping operation, it is electrically insulated, so there is no risk of measurement errors, and the clamping is safe and secure. It has some practical effects.

[Brief explanation of the drawing]

The drawings show an embodiment of the present invention; FIG. 1 is a longitudinal side view of the entire probe, FIG. 2 is a bottom view, FIG. 3 is a side view of the tip of the tube, and FIG. 4 is a clamped state. The vertical sectional view and FIG. 5 are illustrations of an embodiment. Explanation of symbols, 1... tube body, 2, 3... bifurcated support part, 4... tail end of tube body, 5... push button, 6... conductive pipe, 7, 8... conductive pin, 9, 10 ... Probe strip, 11, 12 ... Electrical insulation coating.

Claims (1)

[Scope of utility model registration request] The tip of the conductive pipe 6 housed in the electrically insulating tube 1 is made to slightly protrude from the tube 1, and
An electrical measurement probe comprising electrically insulating coatings 11 and 12 applied to clamping pieces 9a and 10a, which are the tips of probe strips 9 and 10, which are slidably inserted into the inner diameter of the conductive pipe 6.