JPH0320782Y2 - - Google Patents

Description

[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to electrical measurement probes used, for example, in oscilloscopes and other measuring instruments.
In particular, it relates to probes used to check the operation of circuits and measure characteristics when ICs, LSIs, and other components are mounted on printed circuit boards.

(Prior Art) A conventional probe of this type will be explained based on FIG.

Conventional probes have an insulating probe body 1.
a push button (not shown) that is relatively reciprocatable on the rear end of the probe body 1;
A conductive lead pipe 3 inside, a wire-like conductor 4 slidably inserted into the lead pipe 3 and having its rear end fixed in the push button, and the push button always connected to the rear of the probe body 1. It is equipped with a spring (not shown) that biases it toward the side. A pair of clamping portions 4b are provided at the tip of the conductor 4.

In this probe, when the push button is moved toward the probe body 1 side against the spring by manual finger operation, the pair of clamping portions 4b are projected outward from the tip of the lead pipe 3, and each They open each other due to the elastic force (positions shown by imaginary lines). Further, when the push button is moved to the rear side of the probe body 1 by the force of the spring, the pair of clamping parts 4b are drawn into the inside of the lead pipe 3 and are closed to each other by the lead pipe 3 (at the positions indicated by solid lines). ).

As mentioned above, when the pair of clamping parts 4b close,
The clamping portions 4b can clamp the terminals T of, for example, an LSI or an IC, and can maintain the state of engagement with the terminals T by their respective elastic forces and the elastic force of the spring.

Furthermore, a base of one pin connector (not shown) that contacts the lead pipe 3 is buried in the end of the probe body 1 on the push button side.

(Problems to be solved by the invention) The conventional probe described above is suitable for measuring small parts such as ICs.

However, in recent years, the pitch between terminals in parts of telecommunications equipment has become gradually narrower as parts become smaller. In order to prevent a short circuit between terminals due to the portion 4b touching an adjacent terminal, the power to the component is often turned off before mounting. Therefore, it takes time and effort to operate the power supply, making measurement work inefficient.

The present invention has been made to solve these conventional problems, and its purpose is to provide an electrical measurement probe that does not cause short circuits between closely spaced terminals.

(Means for solving the problems) The present invention solves the above-mentioned conventional probe.
An elastic insulating thin film part that can be opened and closed is provided at the tip of the probe body, and this insulating thin film part is in a reduced diameter state when the pair of clamping parts are drawn into the inside of the lead pipe. The insulating thin film part protrudes toward the tip side from the clamping part, and when the clamping part protrudes to the outside of the lead pipe and is expanded, the diameter of the insulating thin film part is expanded by the clamping part to insulate the outside thereof. This is an electrical measurement probe that has the following features.

(Function) The thin film portion prevents the pair of clamping portions from touching unintended terminals, thereby preventing short circuits between the terminals.

(Example) Hereinafter, the present invention will be described in detail based on an example shown in FIGS. 1 to 4.

In each figure, the probe of the present invention is equipped with a pipe-shaped probe body 11 made of an insulating material such as plastic, as in the conventional case. A push button 12 is fitted to the rear end of the probe body 11 so as to be slidable in the longitudinal direction of the probe body 11.

A conductive lead pipe 13 is fitted and fixed inside the probe body 11. For example, a pair or one wire-like conductor 14 is slidably inserted into the lead pipe 13.
The rear end portion 14a is fixed to the inside of the push button 12 by being embedded therein. At the tip of the conductor 14,
A pair of elastic clamping parts 14b that can be opened and closed are provided.

Further, a spring 15 is interposed between the push button 12 and the probe body 11 to always urge the push button 12 toward the rear side of the probe body 11.

In the probe of the present embodiment, when the push button 12 is moved toward the probe body 11 against the spring 15 by manual finger operation as in the conventional case (the imaginary line position in FIG. 1), the pair of clamping portions 14b
are projected to the outside from the tip of the lead pipe 13, and are opened to each other by their respective elastic forces (imaginary line position). And push button 12 is spring 1
When the probe body 11 is moved to the rear side by the force of 5 (solid line position in FIG. 1), the pair of clamping parts 1
4b are drawn into the lead pipe 13 and are closed to each other by the lead pipe 13 (solid line position). An appropriate stopper means is provided to prevent the push button 12 from separating from the probe body 11, and in this embodiment, the inner tapered surface 12a of the push button 12 and the outer tapered surface 11a of the probe body 11 engage with each other. This prevents the push button 12 from falling off.

Further, in the embodiment of the present invention, a plurality of (two
The base portions 16a of pin connectors 16 (more than one pin) are buried in contact with the lead pipes 13, respectively. Free ends of the pin connectors 16 are each surrounded by a cylindrical hood portion 11b projecting from the probe body 11. Hood part 1
1b is fitted with another corresponding connector (not shown), and the pin connector 16 is electrically connected to, for example, an oscilloscope lead wire (not shown).

Next, according to the main feature of the present invention, the tip of the probe body 11 is provided with an elastic insulating thin film part 17 that can be opened and closed. The thin film portion 17 is for covering at least the outside of the pair of clamping portions 14b when the pair of clamping portions 14b protrude from the tip of the lead pipe 13, and is provided integrally with the probe body 11. Alternatively, it may be divided into a plurality of (two) projecting pieces as shown in the figure, or it may be formed into a skirt shape so as to cover the entire circumference of the holding portion 14b. If it is skirt-shaped, the thin film part 1
7 is provided with a desired number of slits through which the terminals T can be inserted.

The state in which the probe configured as described above is used is shown in FIG. 4, and as with the conventional probe, when the pair of clamping portions 14b are opened and then closed, the terminal T of the centipede-shaped IC 18, for example, is It is held in place and maintained in the engaged state with the terminal T by its own elastic force and the force of the spring 15. In this state, the terminal T, the clamping portion 14b, the conductor 14, and the pin connector 16 are energized, and a desired measurement is performed.

In this way, when the terminal T is held between the pair of holding parts 14b, in the present invention, the thin film 17 is attached to both the terminal T to be measured and the adjacent unintended terminal T by the holding parts 14b.
4b to prevent a short circuit from occurring between the two. Therefore, even when measuring a component in which the terminals T are extremely crowded, there is no need to turn off the power.

Furthermore, since this embodiment is equipped with two or more pin connectors 16, two or more lead wires can be drawn out from the same measurement location (same terminal T) under exactly the same conditions, and there is no phase delay. Accurate measurement of waveforms, etc. can be performed.

(Effects of the invention) As explained above, according to the invention, the distal end of the probe body is provided with an elastic insulating material that can be opened and closed and covers at least the outside of the pair of clamping parts exposed from the distal end of the lead pipe. Since the thin film portion is provided, when the conductive portion of the electronic component is held between the pair of gripping portions of this electrical measurement probe, the insulating thin film protruding in a reduced diameter state from the tip of the probe body is used. Insert the lead pipe between the electronic parts where the conductive part is located, and in this state, when the clamping part is extended to the outside of the lead pipe, the diameter of the insulating thin film part is expanded by the clamping part, and the diameter of the insulating thin film part is expanded by the clamping part. Since the outside is insulated, it is possible to prevent short circuit accidents due to contact between the clamping parts.

Therefore, even if there is a conductive part to be clamped in a narrow place where parts are crowded around it, the diameter of the insulating thin film part can be reduced so that the tip can be inserted into the narrow space, and the clamping part can be inserted into the narrow place. When expanding and holding a predetermined conductive part, the other adjacent conductive parts are spread out while the outside is insulated by the insulating thin film part. There is no risk of short-circuiting occurring between the terminals, and it is possible to save time and effort such as turning off the power to components provided with each terminal.

[Brief explanation of drawings]

FIG. 1 is a longitudinal cross-sectional view of a probe according to an embodiment of the present invention, FIG. 2 is a cross-sectional view taken along the - line in FIG. 1, FIG. 3 is a bottom view of FIG. 1, and FIG. FIG. 5 is a perspective view showing the state of use of the conventional probe, and FIG. 5 is a longitudinal sectional view of the main parts of the conventional probe. Explanation of symbols, 11...Probe body, 12...
...Push button, 13...Lead pipe, 14...Conductor,
14a... Rear end portion, 14b... Clamping portion, 15...
Spring, 16...Pin connector, 16a...
Base, 17... Thin film part, 18... IC or LSI, T
...Terminal.

Claims (1)

[Scope of utility model registration request] A pipe-shaped probe body made of insulating material,
A push button fitted to the rear end of the probe body so as to be slidable in the longitudinal direction of the probe body, a conductive lead pipe fitted and fixed inside the probe body; a wire-like conductor that is slidably inserted into a lead pipe and whose rear end is fixed inside the push button; and a spring that always biases the push button toward the rear side of the probe body; is provided with a pair of clamping parts at the tip of the lead pipe, and when the push button is moved toward the probe body against the spring, the pair of clamping parts protrude outward from the tip of the lead pipe. , open each other due to their respective elastic forces, and when the push button is moved toward the rear side of the probe body due to the force of the spring, the pair of clamping portions are drawn into the inside of the lead pipe, and the lead pipe The base of a pin connector that contacts the lead pipe is buried in the end of the probe body on the push button side, and the tip of the probe body has an elastic insulator that can be opened and closed. When the pair of clamping parts are drawn into the lead pipe, the insulating thin film part projects from the clamping parts to the distal end side in a reduced diameter state, and the insulating thin film part An electric measuring probe characterized in that the diameter of the thin film part is expanded by the clamping part when the clamping part protrudes to the outside of the lead pipe and is expanded, so that the outer side of the thin film part is insulated.