CN211374847U - Extension test probe of test tool and test tool - Google Patents
Extension test probe of test tool and test tool Download PDFInfo
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- CN211374847U CN211374847U CN201921711515.7U CN201921711515U CN211374847U CN 211374847 U CN211374847 U CN 211374847U CN 201921711515 U CN201921711515 U CN 201921711515U CN 211374847 U CN211374847 U CN 211374847U
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Abstract
The embodiment of the application discloses an extension test probe of a test tool and the test tool. The extended test probe includes: the first connecting end is used for establishing connection with a probe of a test tool; the connecting wire is used for connecting the first connecting end and the second connecting end; the second link, with first link is connected, includes at least: the socket joint is used for establishing test connection for testing with the pin joint on the test object.
Description
Technical Field
The embodiment of the application relates to the electronic technology, in particular to but not limited to an extension test probe of a test tool and the test tool.
Background
The universal meter is a multifunctional and multi-range measuring instrument, and can measure direct current, direct voltage, alternating current, alternating voltage, resistance, audio level and the like, and can also measure alternating current, capacitance, inductance, parameters of a semiconductor and the like. In the related art, the multimeter has at least two positive and negative test pens, and the pen head is usually in the shape of a probe. When the test device is used, the meter pen is manually contacted with the terminal to be tested to form a signal path. However, in the manufacturing process of various electronic products, multi-pin array test terminals are often encountered, and because the pin connectors of the pin array test terminals are relatively close to each other, short circuits are easy to occur when a multimeter stylus is used for contact, and the operation is not easy.
Disclosure of Invention
In view of the above, the present disclosure provides an extended test probe of a test tool and a test tool.
According to a first aspect of embodiments of the present application, there is provided an elongate test probe of a test tool, comprising:
the first connecting end is used for establishing connection with a probe of a test tool;
the connecting wire is used for connecting the first connecting end and the second connecting end;
the second link, with first link is connected, includes at least: the socket joint is used for establishing test connection for testing with the pin joint on the test object.
According to a second aspect of embodiments of the present application, there is provided a test tool having at least one probe head connected to a first connection end of an elongated test probe head as described above.
In the embodiment of the application, the first connecting end matched with the probe of the test tool and the socket joint matched with the pin joint of the test object are arranged, so that the implementation mode convenient for testing the test object with the pin joint is provided, and the probability of poor contact or short circuit during testing is reduced.
Drawings
FIG. 1A is a schematic view of an extended test probe of a test tool according to an embodiment of the present disclosure;
fig. 1B is a schematic physical structure diagram of an extended test probe of a test tool according to an embodiment of the present disclosure;
FIG. 2A is a schematic view of an extended test probe of another test tool provided in an embodiment of the present application;
FIG. 2B is a schematic diagram of a physical structure of a connection hook in an extended test probe according to an embodiment of the present disclosure;
FIG. 3 is a schematic view of an extended test probe of another test tool provided in an embodiment of the present application;
FIG. 4 is a schematic view of an extended test probe of another test tool provided in an embodiment of the present application;
FIG. 5 is a schematic view of an extended test probe of another test tool provided in an embodiment of the present application;
FIG. 6 is a schematic view of a multimeter provided in an embodiment of the present application;
FIG. 7 is a schematic view of a test object with pins provided in an embodiment of the present application;
fig. 8 is a schematic physical structure diagram of an extended test probe of another test tool according to an embodiment of the present disclosure.
Detailed Description
An embodiment of the present application provides an extension test probe of a test tool, as shown in fig. 1A, the extension test probe 100 includes:
a first connection end 110 for establishing a connection with a probe 200 of a test tool;
a connection line 130 for connecting the first connection terminal 110 and the second connection terminal 120;
the second connection end 120, connected to the first connection end 110, at least includes: a socket contact 121 for establishing a test connection for testing with the pin contact 300 on the test object.
Fig. 1B shows an example of the extended test probe, and the test tool is a tool for performing an electrical test, and includes instruments, meters, and the like, for example: multimeters, oscilloscopes, voltmeters, ammeters, and the like. The probe of the testing tool is used for contacting the end to be tested and receiving the electric signal. There is provided an extended test probe for connection to a probe of a test tool and providing a connection to a terminal to be tested for receiving an electrical signal and performing a test, i.e., a test connection.
Here, the first connection end is intended to be connected to a probe head, and the first connection end is therefore provided as a mating connection with a probe head of a test tool.
The second connection terminal is intended to be connected to a test object, wherein the test object comprises at least one pin contact, for example a pin header. The sleeve joint of the second connecting end is sleeved on the needle joint to form electric connection. That is, the pin header can be inserted into the box header. In addition, the use requirement of the test probe can be prolonged by setting different lengths of the connecting wires.
So, just can test the await measuring end that has the needle-like through the testing tool to need not manual keeping connection, will cup joint the joint and cup joint on the needle-like joint, just can fix the test connection and be difficult for being disturbed by other conducting structure near, be convenient for operate and promoted the accuracy of test.
In some embodiments, the socket joint is a cylindrical structure; the outer wall of the cylindrical structure is provided with an insulating protective layer;
the inner wall of the cylindrical structure is a conductive layer which is in conductive connection with the first connection end and is used for providing an insertion hole for the pin connector.
The socket joint is of a cylindrical structure, and in order to avoid contacting other conductive structures during testing, an insulating protective layer can be arranged on the outer wall of the cylindrical structure, so that the outer part of the socket joint is insulated from the inner wall of the cylindrical structure.
The elastic sheet type inner wall of the cylindrical structure is provided with a conductive layer, and the conductive layer can be connected with the first connecting end through a conductive material, for example, a lead is connected, so that the first connecting end and the second connecting end form an extended conductive path. The pin contact of the test object is inserted into the cylindrical structure and contacts with the conductive layer on the inner wall of the cylindrical structure, and then forms conductive connection with the first connection end through the conductive layer. The inner wall of the tubular structure can be the elastic sheet type inner wall, and the metal elastic sheet has elastic force towards the center of the tubular structure. When the pin type connector is inserted into the cylindrical structure, the metal elastic sheet is tightly pressed on the metal connecting pin, so that tight contact is formed, and the conductivity is improved.
Because the outer wall of the socket joint is provided with the insulating protective layer, short circuit with nearby conductive structures can be avoided. For example, when one pin connector in the pin header is tested, the pin connector can be directly sleeved on the corresponding pin connector to prevent short circuit with other nearby pin connectors, so that the test accuracy and safety are improved.
In some embodiments, the second connection end: further comprising:
and the connecting joint is connected with the sleeve joint.
The connection connector and the socket connector are both connectors for establishing a test connection with a test object, and the connection connector includes various types or forms of connectors, which are not limited to the socket connection manner, and are within the scope as long as the connectors can be electrically connected with the connection point of the test object. Such as hook connectors, plug connectors, and connector clips.
The connecting joint and the tail part of the socket joint can be connected together, so that the switching of different connecting modes is realized.
In some embodiments, as shown in fig. 2A, the connection joint is at least one hook joint 122, and the at least one hook joint 122 is interconnected with the tail portion of the socket joint 121 for establishing a test connection with a connection ring or a connection hook on a test object for testing. The first connecting end 110 is connected to the test probe 200, and the socket contact 121 is used to establish a test connection with the pin contact 300. Fig. 2B is a schematic view of the hook connector.
To facilitate the application of the elongated test probe to different test objects, the second connection end may have at least two different types of joints, including the female joint, and a hook-shaped hook joint, etc. Since only one of the contacts is required for one test, the contacts of the second connection terminal can be connected to each other at the tail portion and to the first connection terminal through the same conductive path. In use, one of the connectors is used and the other connector may be left hanging or placed on an insulating material.
Here, the hook connector has a hook coupling structure made of a conductive material, e.g., a metal hook. When the connection structure on the test object is in the form of a ring or a hook, the connection can be performed by a hook connector.
The hook connector may also include an insulating protective sheath covering the hook connector. An elastic structure, such as an elastic sheet, a spring and the like, can be arranged between the insulating protective sleeve and the hook-shaped connecting structure, and the insulating protective sleeve and the hook-shaped connecting structure are movably arranged. When the outer wall of the insulating protective sleeve is subjected to an external force in the direction opposite to that of the hook-shaped connecting structure, the hook-shaped connecting structure can extend out of the insulating protective sleeve; when the insulating protective sleeve is not acted by the external force, the hook-shaped connecting structure retracts into the insulating protective sleeve.
Through above-mentioned structure, provide the joint that can replace and use, be applicable to different test object, effectively promoted the convenience of operation.
In some embodiments, as shown in fig. 3, the connection connector is at least one plug connector 123, and the at least one plug connector 123 is connected to a tail portion of the socket connector 121 (which may also include other types of connectors such as a hook connector 122) for establishing a test connection with a connection hole on a test object for testing. The first connecting end 110 is connected to the test probe 200, and the socket contact 121 is used to establish a test connection with the pin contact 300.
The second connection terminal may further include a plug connector for being inserted into the connection hole of the test object, and the plug connector may include a needle structure made of a conductive material, for example, a metal needle. The plug-in connector can be connected with the tail part of the socket connector for replacement, and can also be connected with the tail parts of the socket connector and the hook connector together, so that various different test connectors are provided, and the socket connector is suitable for different test objects.
In order to ensure that the metal conductor cannot touch other test objects to cause accidents when the plug connector is not used, the metal outer end of the plug connector can be sleeved with a layer of detachable insulating protective sleeve.
In some embodiments, as shown in fig. 4, the connection joint is at least one joint clip 124, and the at least one joint clip 124 is connected to a tail portion of the socket joint 121 (which may also include other types of joints such as hook joint 122, plug joint 123) for establishing a test connection with a connector protruding from a test object for testing. The first connecting end 110 is connected to the test probe 200, and the socket contact 121 is used to establish a test connection with the pin contact 300.
The second connection end may further include a connector clip for connecting to the protruding connector. For example, the connector to be tested is a metal piece, and the above-described connection methods such as the socket, hook, and plug cannot be performed.
The inner side of the clamping opening of the connector clamp is made of conductive materials, and can also be a metal clamp which is integrally made of metal. The tail of the joint clamp is connected with the tail of the sleeve joint and is connected to the first connecting end through different conductive paths.
In other embodiments, as shown in fig. 5, any connector such as connector clip 124, hook connector 122, plug connector 123 can be designed to be detachable, and can be used alternatively to socket connector 121, and can be connected to first connection terminal 110 through the same conductive path, i.e. connection line 130, so that the connector can be tested differently when different test objects are tested.
Through above-mentioned structure, can provide the multiple joint that can replace and use for same test probe, be applicable to different test object, simple structure and easy and simple to handle. In some embodiments, the test tool is a multimeter, and the probe of the test tool is a test stylus of the multimeter, wherein the first connection end of the extended test probe is used for connecting a tip of the test stylus.
The test tool can be a universal meter, the universal meter is provided with a test meter pen for connecting a test object, however, the form of the test meter pen is fixed, and the test meter pen is not suitable for all test objects, and is not suitable for a test meter pen which is capable of being sleeved and connected with a pin connector. Therefore, the first connection end of the extension test probe in any of the above embodiments is connected with the test stylus, and the test object is connected through the second connection end of the extension test probe.
In other embodiments, the extended test probe may be used in any type of probing instrument.
Embodiments of the present application provide a test tool having at least one probe for connection to a first connection end of an extended test probe of any of the above embodiments.
The test tool is used for testing electric signals, and a test probe of the test tool needs to be electrically connected with a test object. Here, the test probe of the test tool is connected to the test object by the extended test probe provided in any of the above embodiments. Because the probe structure of the test tool is fixed, the test tool is matched with the extension test probe and is connected with the extension test probe, so that the test tool can be connected with a test object by using the connector of the appropriate second connecting end according to actual requirements, and the second connecting end is provided with the sleeve joint connector which can be sleeved on the needle type connector, so that the test tool is suitable for testing the test object in the form of the pin header.
In some embodiments, the test tool is a multimeter, and as shown in FIG. 6, the test probe 200 is a test stylus of a multimeter.
The present application also provides the following examples:
when a multimeter is used for testing a test object, the following modes can be adopted:
firstly, performing point measurement by using a multimeter pen, namely manually controlling the multimeter pen to contact a test object;
secondly, using a clip type multimeter pen;
thirdly, using a hook type multimeter pen;
fourthly, a test extension line is used, one end of the test extension line is connected with a test object, and the other end of the test extension line is connected to a multimeter pen through a copper wire;
the power input end circuit of many engineering test circuit boards is a test terminal reserved with voltage/current in the form of pin header, as shown in fig. 7, for testing. However, if the first method, i.e., the multimeter stylus point measurement, is directly adopted, the operation is very inconvenient, and short circuit or poor contact is easy to occur. If the second or third mode, i.e. the clip-type multimeter pen or the hook-type multimeter pen, is adopted, the clip-type multimeter pen or the hook-type multimeter pen is difficult to be fixed on the designated pin connector to be tested, and is very easy to be short-circuited with the next pin connector, so that the test is inaccurate or a test object is damaged due to short circuit. And adopt above-mentioned fourth mode, need manually be connected copper line and universal meter pen-shape metre, it is inconvenient to operate.
Thus, the test strips described above are combined to form test extensions for the replaceable joints. The front end of the test extension line adopts a special sleeve cap matched with a multimeter pen, and can be spliced with the multimeter pen and form good conductive connection. The rear end of extension line adopts the female head of dupont line that can the disect insertion row needle, and the female head of dupont line can form good electrically conductive connection with the row needle to because the outer wall of this female head of dupont line has insulating material, reduce the probability that contacts other pin connectors of row needle, thereby reduce the emergence of short circuit, promote measuring accuracy.
Furthermore, as shown in fig. 8, the test extension may also have a plurality of test contacts 10, and the tail portions are connected to each other and connected to a special cap 20 at the front end of the test extension by the same wire for establishing connection with a test stylus 30. The plurality of test contacts 10 may include other types of contacts such as the dupont line female contacts 11, clip-type contacts 12, hook-type contacts 13, and pin contacts described above. In addition, the positive pole and the negative pole of the test extension line can be distinguished by colors, for example, a red DuPont wire female head, a clip-type joint, a hook-type joint, a lead and a sleeve cap are connected together as a group to serve as the positive test extension line; a black DuPont wire female head, a clamp-type joint, a hook-type joint, a wire and a sleeve cap are connected together to be used as a negative electrode test extension line. The design of one to many turns simultaneously reserves the joint of multiple different structures, can match different test object, has enlarged the range of application of universal meter.
It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application. The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only for the embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. An extended test probe for a test tool, the extended test probe comprising:
the first connecting end is used for establishing connection with a probe of a test tool;
the connecting wire is used for connecting the first connecting end and the second connecting end;
the second link, with first link is connected, includes at least: the socket joint is used for establishing test connection for testing with the pin joint on the test object.
2. The extension test probe of claim 1, wherein the box joint is a cylindrical structure; the outer wall of the cylindrical structure is provided with an insulating protective layer;
the inner wall of the cylindrical structure is a conductive layer which is in conductive connection with the first connection end and is used for providing an insertion hole for the pin connector.
3. The extension test probe of claim 1 or 2, wherein the second connection end: further comprising: and the connecting joint is connected with the socket joint street.
4. The extended test probe of claim 3,
the connecting joint is at least one hook joint, the at least one hook joint is mutually connected with the tail part of the socket joint and is used for establishing test connection for testing with a connecting ring or a connecting hook on a test object.
5. The extended test probe of claim 3,
the connecting joint is at least one plug-in joint, and the at least one plug-in joint is mutually connected with the tail part of the socket joint and is used for establishing test connection for testing with a connecting hole on a test object.
6. The extended test probe of claim 3, wherein the connection joint is at least one joint clip interconnected with a tail portion of the female joint for establishing a test connection with a connector raised on a test object for testing.
7. The extended test probe of claim 3, wherein:
the tail part of the connecting joint is connected with the tail part of the sleeve joint and is connected to the first connecting end through different conductive paths.
8. The extended test probe of claim 3, wherein: the head of the connecting joint is connected with the tail of the sleeve joint and is connected to the first connecting end through the same conductive path.
9. The extension test probe of claim 1, wherein the test tool is a multimeter and the test tool probe is a test stylus of the multimeter, wherein the first connection end of the extension test probe is for connecting to a tip of the test stylus.
10. A test tool having at least one probe for connection to a first connection end of an elongate test probe according to any one of claims 1 to 9.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201921711515.7U CN211374847U (en) | 2019-10-12 | 2019-10-12 | Extension test probe of test tool and test tool |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201921711515.7U CN211374847U (en) | 2019-10-12 | 2019-10-12 | Extension test probe of test tool and test tool |
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| CN211374847U true CN211374847U (en) | 2020-08-28 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834803A (en) * | 2020-12-28 | 2021-05-25 | 广东电网有限责任公司江门供电局 | Monitoring device of distribution network automation terminal protection clamp plate |
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2019
- 2019-10-12 CN CN201921711515.7U patent/CN211374847U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834803A (en) * | 2020-12-28 | 2021-05-25 | 广东电网有限责任公司江门供电局 | Monitoring device of distribution network automation terminal protection clamp plate |
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