CN212849122U - Detection connector - Google Patents
Detection connector Download PDFInfo
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- CN212849122U CN212849122U CN202020826531.7U CN202020826531U CN212849122U CN 212849122 U CN212849122 U CN 212849122U CN 202020826531 U CN202020826531 U CN 202020826531U CN 212849122 U CN212849122 U CN 212849122U
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- sleeve
- probe
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Abstract
The utility model discloses a detection connector, which comprises a first sleeve; the first insulating column is fixed in the inner hole of the first sleeve and provided with a first through hole; the conductive pin is fixed in the first through hole of the first insulating column; the inner conductor of the coaxial line is electrically connected with the conductive needle; a second sleeve in interference fit with the first sleeve; the circuit board is fixed in the inner hole of the second sleeve, and the input end of the circuit board is electrically connected with the conductive pin; the second insulating column is fixed in an inner hole of the second sleeve, is positioned below the circuit board and is provided with a second through hole; the probe is fixed on the second through hole of the second insulating column, and the output end of the circuit board is electrically connected with the probe. Compared with the prior art, the test board can be matched with a board-to-board connector, and a plurality of radio frequency signal terminals on the board-to-board connector can be tested simultaneously.
Description
Technical Field
The utility model relates to a radio frequency signal tests technical field, especially relates to a board is to detection connector of board connector.
Background
The active conduction calibration test of present industry mobile phone motherboard mainly carries out the power reception calibration test of single channel through the radio frequency signal test head of the radio frequency signal switch test socket connector cooperation single channel of single channel, when active power launches the switch test socket position from mobile phone motherboard, test socket and test head are mutually joined in marriage, the elastic terminal in the middle of its probe backs down, the signal comes on transmitting the probe in the middle of the radio frequency signal test from the elastic terminal, transmit the power size of confirming on the calibration equipment by the probe again. Due to the introduction of the 5G era, the application of integration of a plurality of radio frequency channels is promoted, and at the moment, a board-to-board connector is produced.
The disadvantages are as follows: current probe connectors are not capable of testing multi-channel board-to-board connectors.
SUMMERY OF THE UTILITY MODEL
The embodiment of the application provides a survey connector, can with the board to the board connector cooperation, test a plurality of radio frequency signal terminals on the board to the board connector.
In order to realize the purpose, the utility model discloses the technical scheme who takes is:
a probe connector, comprising:
a first sleeve;
the first insulating column is fixed in the inner hole of the first sleeve and provided with a first through hole;
the conductive pin is fixed in the first through hole of the first insulating column;
the inner conductor of the coaxial line is electrically connected with the conductive needle;
a second sleeve in interference fit with the first sleeve;
the circuit board is fixed in the inner hole of the second sleeve, and the input end of the circuit board is electrically connected with the conductive pin;
the second insulating column is fixed in an inner hole of the second sleeve, is positioned below the circuit board and is provided with a second through hole;
the probe is fixed on the second through hole of the second insulating column, and the output end of the circuit board is electrically connected with the probe.
Preferably, the sleeve further comprises a third sleeve, the outer peripheral surface of the first sleeve is in interference fit with the inner hole of the second sleeve, and the inner hole of the third sleeve is in interference fit with the outer peripheral surface of the second sleeve.
Preferably, the flange is provided with a sliding hole, the sliding hole is in sliding connection with the outer peripheral surface of the third sleeve, the outer peripheral surface of the third sleeve is fixedly connected with the upper limiting block, the upper limiting block is located above the flange, and one end of the spring is abutted to the flange.
Preferably, the other end of the spring abuts against the second sleeve.
Preferably, the other end of the spring abuts against the third sleeve.
Preferably, the lower limiting block is further included, the lower limiting block is fixedly connected with the outer peripheral surface of the second sleeve, and the other end of the spring is abutted to the lower limiting block.
Preferably, the upper limiting block and the third sleeve are of an integrated structure, and the lower limiting block and the second sleeve are of an integrated structure.
Preferably, the conductive needle and the probe are both conductive pogo pins.
Preferably, the first sleeve and the second sleeve are made of conductive metal materials, the first sleeve is electrically connected with the second sleeve, the first sleeve and the second sleeve are matched to form a shielding layer, the shielding layer is grounded, the outer conductor of the coaxial line is electrically connected with the first sleeve, and the first sleeve is grounded or the second sleeve is grounded.
Preferably, the number of the conductive pins is the same as that of the probes, and the number of the conductive pins is at least two, wherein one conductive pin is electrically connected with one probe, the distance between two adjacent probes is smaller than the distance between two conductive pins electrically connected with the two probes, and the diameter of each probe is smaller than that of the conductive pin.
The beneficial effects of the utility model reside in that: through probe electric connection in circuit board, the probe can set up the optional position at the circuit board promptly, can set up a plurality of probes moreover to in the signal of telecommunication transmission to check out test set that detects of probe through conducting pin and coaxial line, realize the test to the board of multichannel to the board connector.
Drawings
FIG. 1 is a cross-sectional view of a first embodiment of the present invention;
FIG. 2 is a cross-sectional view taken along line X-X of FIG. 1;
fig. 3 is a schematic structural view of a first insulating column and a second insulating column according to a first embodiment of the present invention;
fig. 4 is a schematic structural position diagram of the conductive pin, the circuit board and the probe according to the first embodiment of the present invention;
fig. 5 is a cross-sectional view of a second embodiment of the present invention;
FIG. 6 is a cross-sectional view taken along line Y-Y of FIG. 5;
fig. 7 is a perspective view of a second embodiment of the present invention.
Detailed Description
The embodiment of the application solves the technical problem that a multi-channel board-to-board connector cannot be tested in the prior art by providing the probe connector.
In order to solve the technical problems, the general idea of the embodiment of the application is as follows:
through probe electric connection in circuit board, the probe can set up the optional position at the circuit board promptly, can set up a plurality of probes moreover to in the signal of telecommunication transmission to check out test set that detects of probe through conducting pin and coaxial line, realize the test to the board of multichannel to the board connector.
In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention can be embodied in many different forms other than those specifically described herein, and it will be apparent to those skilled in the art that similar modifications can be made without departing from the spirit and scope of the invention, and it is therefore not to be limited to the specific embodiments disclosed below.
As shown in fig. 1 to 4, a probe connector according to a first embodiment of the present invention includes a first sleeve 110, a first insulating post 120, a conductive pin 130, a coaxial wire 140, a second sleeve 150, a circuit board 160, a second insulating post 170, and a probe 180.
The inner hole 111 of the first sleeve 110 is in interference fit with the outer peripheral surface of the first insulating column 120, so that the inner hole of the first sleeve is fixedly connected with the first insulating column.
The first insulating pillar 120 is made of insulating engineering plastic, and is typically made of a high frequency material with a low dielectric constant, such as LCP.
The first insulating column 120 is provided with a first through hole 121, and the first through hole 121 is in interference fit with the outer peripheral surface of the conductive pin 130, so that the first insulating column 120 and the conductive pin 130 are fixedly connected. It can also be: the first insulating column 120 is provided with two (120A,120B), the first through hole 121 is provided with a first step surface 122, the first step surface 122 is in contact with the upper end surface of the conductive pin 130, and the first step surface 122 is in contact with the lower end surface of the conductive pin 130, so that the first insulating column 120 and the conductive pin 130 are fixedly connected.
The conductive pin 130 is made of copper.
The inner conductor 141 of the coaxial line 140 is welded to the conductive pin 130, so that the inner conductor 141 of the coaxial line is electrically connected to the conductive pin 130.
This coaxial line 140 and the up end welding of first sleeve 110 realize coaxial line and first sleeve fixed connection, and is preferred, and the up end of this first sleeve 110 is the ladder face, makes things convenient for the welding.
The inner hole 151 of the second sleeve 150 is in interference fit with the outer peripheral surface of the first sleeve 110, so that the second sleeve 150 is fixedly connected with the first sleeve 110.
The inner bore 151 of the second sleeve 150 is provided with a second step surface 152.
The circuit board 160 is fixed to the second step surface 152 by pins 161.
The circuit board 160 is provided with a connection circuit (not shown), an input end of the connection circuit is located on the top surface of the circuit board 160, an output end of the connection circuit is located on the bottom surface of the circuit board 160, and a lower end of the conductive pin 130 is welded to the input end of the circuit board 160, so as to achieve the electrical connection between the conductive pin and the input end of the circuit board, or the conductive pin 130 is a conductive pogo pin, and a first conductive sheet (not shown) is welded to the input end of the circuit board 160, and the conductive pogo pin abuts against the first conductive sheet, so as to achieve the electrical connection between the conductive pin and the input end of.
A second insulating column 170, made of insulating engineering plastic, typically a low dielectric constant high frequency material such as LCP, is located below the circuit board 160.
This second insulating column 170 and the inner bore 151 interference fit of second sleeve 150 realize second insulating column 170 and second sleeve 150 fixed connection, and this second insulating column 170 is equipped with second through-hole 171, and this second through-hole 171 and probe 180's outer peripheral face interference fit realize second insulating column 170 and probe 180 fixed connection. It can also be: the second insulating column 170 is provided with two (170A,170B), the second through hole 171 is provided with a third step surface 172, the third step surface 172 is in contact with the upper end surface of the probe 180, and the third step surface 172 is in contact with the lower end surface of the probe 180, so that the second insulating column 170 is fixedly connected with the probe 180.
The upper end of the probe 180 is welded to the output end of the circuit board 160 to electrically connect the probe to the output end of the circuit board, or the probe 180 is a conductive pogo pin, and the output end of the circuit board 160 is welded with a second conductive sheet (not shown), and the conductive pogo pin abuts against the second conductive sheet to electrically connect the probe to the output end of the circuit board.
The first sleeve 110 and the second sleeve 150 are made of conductive metal, the first sleeve 110 is electrically connected with the second sleeve 150, the first sleeve 110 and the second sleeve 150 are matched to form a shielding layer, and the shielding layer is grounded. Preferably, the first sleeve 110 is welded to the outer conductor 142 of the coaxial line 140. Alternatively, the first sleeve 110 is electrically connected to a grounding wire (not shown), and the second sleeve 150 is electrically connected to a grounding wire (not shown).
The lower port 152 of the second sleeve 150 is a mating port that mates with a board-to-board connector to be tested.
The working principle of the embodiment of the application is as follows: during the test, check out test set's transmission line and coaxial line electric connection, through manipulator or artificial action first sleeve, make first sleeve remove to the board connector, until probe and board to the signal terminal contact circular telegram of board connector, this signal terminal's signal of telecommunication passes through the circuit board from the probe, then pass through the conductive pin again, the conductive pin passes through the coaxial line, transmit the check out test set through the transmission line at last, test, this conductive pin and probe can set up a plurality ofly, thereby test a plurality of radio frequency signal terminals simultaneously on to the board connector, detect radio frequency signal's power size.
Preferably, the number of the conductive pins 130 is the same as that of the probes 180, and the number of the conductive pins 130 is at least two, in this embodiment, the number of the conductive pins 130 is three, where one conductive pin 130 is electrically connected to one probe 180, and a distance C between two adjacent probes is smaller than a distance D between two conductive pins electrically connected to the two probes. The circuit board 160 is used for switching, so that the distance between the probes can be set smaller, and the method is suitable for testing of smaller board-to-board connectors.
The diameter of the probe 180 is smaller than the diameter of the conductive pin 130. This reduces the footprint of the probe, so that the probe-to-probe spacing can be set smaller.
Fig. 5 to 7 show a second embodiment of the present application, which differs from the first embodiment in that: the outer circumferential surface of the first sleeve 110 is in interference fit with the inner hole 151 of the second sleeve 150, the inner hole of the third sleeve 190 is in interference fit with the outer circumferential surface of the second sleeve 150, the flange 210 is provided with a sliding through hole (not shown) which is in sliding connection with the outer circumferential surface of the third sleeve 190, the outer circumferential surface of the third sleeve 190 is fixedly connected with the upper limiting block 230, and preferably, the upper limiting block 230 and the third sleeve 190 are of an integrated structure; the upper limiting block 230 is located above the flange 210, and one end of the spring 220 abuts against the flange 210; the other end of the spring 220 is abutted against the second sleeve 150 or the other end of the spring 220 is abutted against the third sleeve 190, preferably, the lower limiting block 240 is fixedly connected with the outer peripheral surface of the second sleeve 150, preferably, the lower limiting block 240 is integrated with the second sleeve 150, preferably, the other end of the spring 220 is abutted against the lower limiting block 240. In the structure, the detection connector of the embodiment of the application is installed in the driving mechanism through the flange and used for realizing detection; the flange can remove by the third sleeve relatively, and the flange has the cushioning effect with the spring cooperation, avoids actuating mechanism drive the detection connector process of this application embodiment to exert oneself too big and lead to the product damage that awaits measuring. The matching port of the second sleeve 150 has a guiding surface 153, and the guiding surface 153 is an inclined surface, so as to be conveniently matched with a product to be tested.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express the embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A probe connector, comprising:
a first sleeve;
the first insulating column is fixed in the inner hole of the first sleeve and provided with a first through hole;
the conductive pin is fixed in the first through hole of the first insulating column;
the inner conductor of the coaxial line is electrically connected with the conductive needle;
a second sleeve in interference fit with the first sleeve;
the circuit board is fixed in the inner hole of the second sleeve, and the input end of the circuit board is electrically connected with the conductive pin;
the second insulating column is fixed in an inner hole of the second sleeve, is positioned below the circuit board and is provided with a second through hole;
the probe is fixed on the second through hole of the second insulating column, and the output end of the circuit board is electrically connected with the probe.
2. A probe connector as recited in claim 1, wherein: the outer peripheral surface of the first sleeve is in interference fit with the inner hole of the second sleeve, and the inner hole of the third sleeve is in interference fit with the outer peripheral surface of the second sleeve.
3. A probe connector as recited in claim 2, wherein: the flange is provided with a sliding hole, the sliding hole is in sliding connection with the outer peripheral face of the third sleeve, the outer peripheral face of the third sleeve is fixedly connected with the upper limiting block, the upper limiting block is located above the flange, and one end of the spring is abutted to the flange.
4. A probe connector as recited in claim 3, wherein: the other end of the spring is abutted against the second sleeve.
5. A probe connector as recited in claim 3, wherein: the other end of the spring is abutted against the third sleeve.
6. The probe connector of claim 4, wherein: the lower limiting block is fixedly connected with the outer peripheral surface of the second sleeve, and the other end of the spring is abutted against the lower limiting block.
7. A probe connector as recited in claim 6, wherein: the upper limiting block and the third sleeve are of an integrated structure, and the lower limiting block and the second sleeve are of an integrated structure.
8. A probe connector as recited in claim 1, wherein: the conductive needle and the probe are conductive spring needles.
9. A probe connector as recited in claim 1, wherein: the first sleeve and the second sleeve are made of conductive metal materials, the first sleeve is electrically connected with the second sleeve, the first sleeve and the second sleeve are matched to form a shielding layer, the shielding layer is grounded, the outer conductor of the coaxial line is electrically connected with the first sleeve, and the first sleeve is grounded or the second sleeve is grounded.
10. A probe connector as recited in claim 1, wherein: the number of the conductive pins is the same as that of the probes, the number of the conductive pins is at least two, one conductive pin is electrically connected with one probe, the distance between every two adjacent probes is smaller than the distance between every two conductive pins electrically connected with the two probes, and the diameter of each probe is smaller than that of the corresponding conductive pin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020826531.7U CN212849122U (en) | 2020-05-18 | 2020-05-18 | Detection connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020826531.7U CN212849122U (en) | 2020-05-18 | 2020-05-18 | Detection connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212849122U true CN212849122U (en) | 2021-03-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020826531.7U Active CN212849122U (en) | 2020-05-18 | 2020-05-18 | Detection connector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212849122U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848351A (en) * | 2021-08-16 | 2021-12-28 | 昆山德普福电子科技有限公司 | High frequency detection assembly |
| CN116482494A (en) * | 2023-03-22 | 2023-07-25 | 广东微容电子科技有限公司 | Chip type multilayer ceramic capacitor test fixture |
-
2020
- 2020-05-18 CN CN202020826531.7U patent/CN212849122U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113848351A (en) * | 2021-08-16 | 2021-12-28 | 昆山德普福电子科技有限公司 | High frequency detection assembly |
| CN116482494A (en) * | 2023-03-22 | 2023-07-25 | 广东微容电子科技有限公司 | Chip type multilayer ceramic capacitor test fixture |
| CN116482494B (en) * | 2023-03-22 | 2023-11-21 | 广东微容电子科技有限公司 | Chip type multilayer ceramic capacitor test fixture |
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