CN111458540A

CN111458540A - Connecting device and electronic apparatus

Info

Publication number: CN111458540A
Application number: CN202010445881.3A
Authority: CN
Inventors: 盘龙; 戴路; 许维全
Original assignee: Shanghai Dianlian Xusheng Communication Technology Co ltd
Current assignee: Shanghai Dianlian Xusheng Communication Technology Co ltd
Priority date: 2020-05-22
Filing date: 2020-05-22
Publication date: 2020-07-28

Abstract

The invention provides a connecting device and electronic equipment, which relate to the technical field of electric element detection tools and comprise: a fixed body and a test probe; a plurality of accommodating channels are arranged in the fixing main body, and the test probes are inserted into the accommodating channels; the fixing body is configured to shield an interference signal between the test probes. Through set up the holding passageway that can hold the test probe in fixed main part, every holding passageway all is provided with the test probe, and fixed main part can shield the signal interference between each test probe, guarantees signal quality, and it is poor to have alleviated the connecting device signal isolation who exists among the prior art, and the easy mutual interference of signal influences the technical problem of final test result.

Description

Connecting device and electronic apparatus

Technical Field

The invention relates to the technical field of electric element detection tools, in particular to a connecting device and electronic equipment.

Background

With the development of automatic control technology, various control chips, board-to-board connectors and other electrical components have a huge share in the market. In order to ensure that the accuracy and performance of the chips are consistent, detailed testing is required before electrical components are introduced to the market.

The existing electric element testing device is a socket made of plastic materials, and a plurality of metal probes are assembled in the socket made of the plastic materials.

However, the plastic socket has poor signal isolation, and signals are easily coupled and interfered with each other among multiple channels.

Disclosure of Invention

The invention aims to provide a connecting device and electronic equipment, and solves the technical problems that in the prior art, the signal isolation degree of the connecting device is poor, signals are easy to interfere with each other, and the accuracy of a final test result is influenced.

In a first aspect, the present invention provides a connection device comprising: a fixed body and a test probe;

a plurality of accommodating channels are formed in the fixing main body, and the test probes are inserted into the accommodating channels;

the fixing body is configured to shield an interference signal between the test probes.

In an alternative embodiment of the method of the present invention,

the fixing main body is provided with a plurality of through holes;

the accommodating channels are formed in the through holes, and any two adjacent through holes are isolated by metal materials.

In an alternative embodiment of the method of the present invention,

the connection device further comprises an isolation member;

the isolation component is arranged in the accommodating channel and sleeved outside the test probe, and the isolation component is configured to isolate the electrical contact between the test probe and the fixing main body.

In an alternative embodiment of the method of the present invention,

the isolation member is made of a plastic material.

In an alternative embodiment of the method of the present invention,

taking one end of the connecting device, which is used for contacting the object to be tested, as a first end;

a first step structure is arranged on the inner wall of the through hole close to the first end;

the isolating component is provided with a first notch structure which is matched with the first step structure and is close to the first end.

In an alternative embodiment of the method of the present invention,

the end part of the isolation component close to the first end is provided with a second step structure;

a second gap structure is arranged at the end part of the test probe close to the first end;

the second notch structure of the test probe is lapped on the second step structure of the isolation member.

In an alternative embodiment of the method of the present invention,

taking one end of the connecting device, which is deviated from the object to be detected, as a second end;

the second end of the connecting device is connected with an adapter component, and each test probe is connected with the adapter component.

In an alternative embodiment of the method of the present invention,

the adapter component is arranged as an adapter plate;

the adapter plate is provided with a plurality of signal feed-in structures, and the plurality of test probes are connected with the plurality of signal feed-in structures in a one-to-one correspondence mode.

In an alternative embodiment of the method of the present invention,

the patch member includes a plurality of patch cords;

the plurality of patch cords are connected with the plurality of test probes in a one-to-one correspondence manner.

In an alternative embodiment of the method of the present invention,

the first end of the fixed main body is provided with a containing groove for containing an object to be tested, and the end part corresponding to the test probe is contacted with the object to be tested in the state that the object to be tested is assembled in the containing groove.

In a second aspect, the invention provides an electronic device comprising the connecting device.

The invention provides a connecting device, comprising: a fixed body and a test probe; a plurality of accommodating channels are arranged in the fixing main body, and the test probes are inserted into the accommodating channels; the fixing body is configured to shield an interference signal between the test probes. Through set up the holding passageway that can hold the test probe in fixed main part, every holding passageway all is provided with the test probe, and fixed main part can shield the signal interference between each test probe, guarantees signal quality, and it is poor to have alleviated the connecting device signal isolation who exists among the prior art, and the easy mutual interference of signal influences the technical problem of final test result accuracy nature.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a cross-sectional view of an overall structure of a connector with an interposer according to an embodiment of the present invention;

fig. 2 is a schematic overall structure diagram of a connector with an interposer according to an embodiment of the present invention;

FIG. 3 is a cross-sectional view of an overall structure of a connector device with a patch cord according to an embodiment of the present invention;

fig. 4 is a schematic overall structure diagram of a connector device with a patch cord according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a connection device according to an embodiment of the present invention from a first viewing angle.

Icon: 100-a stationary body; 110-a through hole; 120-a first step structure; 200-a test probe; 210-a second gap structure; 300-an isolation member; 310-a second stepped structure; 410-an adapter plate; 420-patch cord; 500-test substance.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships that the products of the present invention are conventionally placed in use, and are only used for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.

Furthermore, the terms "horizontal", "vertical", "overhang" and the like do not imply that the components are required to be absolutely horizontal or overhang, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.

In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Some embodiments of the invention are described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.

As shown in fig. 1 to 4, the present embodiment provides a connection device including: a fixing body 100 and a test probe 200; a plurality of accommodating channels are formed in the fixing body 100, and the test probes 200 are inserted into the accommodating channels; the fixing body 100 is configured to shield interference signals between the test probes 200.

Specifically, all be provided with a test probe 200 in every holding passageway, the quantity one-to-one setting of holding passageway and test probe 200, the test probe 200 in every holding passageway is wrapped up by fixed main part 100, and fixed main part 100 chooses for use the material that can shield the signal to make fixed main part 100 can shield the interference signal between each test probe 200, improve test probe 200's test signal quality, reduce test error.

On the basis of the above embodiments, as shown in fig. 5, wherein the first viewing angle is a viewing angle looking at the hole wall of the through hole 110, in the first viewing angle, in an alternative embodiment, the fixing body 100 in the connecting device provided in this embodiment is provided with a plurality of through holes 110; an accommodating channel is formed in each through hole 110, and any two adjacent through holes 110 are isolated by a metal material.

The above-mentioned "any two adjacent through holes 110 are isolated from each other by a metal material" is not limited to the entire fixing body 100 being made of a metal material, but may be partially made of a metal material, and a part of the metal material may be provided between any two adjacent test probes 200.

For example: the annular region surrounding the through-holes 110 is made of a metal material, and may be a metal circular tube, and further, each metal circular tube is inserted into the plurality of through-holes 110 to wrap each test probe 200 therein, so that each test probe 200 is isolated by the metal circular tube.

For example, a rectangular region surrounding the through-hole 110 may be made of a metal material, and may be a square steel tube inserted into the through-hole 110 to shield an interference signal between the test probes 200.

For convenience of description, a region between any two adjacent through holes 110 separated by a metal material is simply referred to as an isolation region hereinafter.

It should be noted that, since the isolation region is made of a metal material, the test probe 200 is also made of a metal material, and the metal material are in direct contact, which may cause a short circuit problem. To avoid the occurrence of short-circuit problems, in an alternative embodiment, the connection device further comprises an isolation member 300; the isolation member 300 is disposed in the receiving channel and sleeved outside the test probe 200, and the isolation member 300 is configured to isolate the electrical contact between the test probe 200 and the fixing body 100.

In an alternative embodiment, the isolation member 300 is made of a plastic material.

The isolation member 300 is sleeved on the test probe 200, so that the isolation member 300 is clamped between the fixing body 100 and the test probe 200, more specifically, the isolation member 300 is specifically set to be a plastic circular tube, which is attached to the wall of the metal circular tube, the isolation member 300 can also be a plastic square tube, the plastic square tube is attached to the inner wall of the square steel tube, and the test probe 200 is isolated from the isolation region made of metal material.

In order to limit the position of the isolation member 300, in an alternative embodiment, the end of the connection device for contacting the object 500 is a first end in the connection device provided in this embodiment; the inner wall of the through hole 110 near the first end is provided with a first step structure 120; the spacer member 300 is provided with a first notch structure adjacent to the first end to mate with the first step structure 120.

Specifically, first stair structure 120 specifically sets up the boss for the pore wall direction at through-hole 110, and isolation component 300 stretches into through-hole 110 in, and isolation component 300 specifically divide into the different big sleeve pipes of diameter, forms first breach structure in the junction between big sleeve pipe and the little sleeve pipe, and the bottom surface of big sleeve and the top surface butt of boss, and then with isolation component 300 overlap joint on first stair structure 120, avoid isolation component 300 to wear out from through-hole 110, with isolation component 300 restriction in through-hole 110.

To achieve the spacing of the test probe 200 and the spacer member 300, in an alternative embodiment, the end of the spacer member 300 near the first end is provided with a second step structure 310; the end of the test probe 200 near the first end is provided with a second notch structure 210; the second notch structure 210 of the test probe 200 overlaps the second step structure 310 of the isolation member 300.

Specifically, the second step structure is formed by arranging a boss on the inner wall of the isolation member 300, and the second notch structure 210 is overlapped on the top surface of the boss, so that the test probe 200 is prevented from falling out of the isolation member 300, the test probe 200 can be fixed in the isolation member 300, and the test process is guaranteed to be smoothly performed.

It should be noted that the test probe 200 specifically includes a first probe and a second probe connected to each other, the diameter of the second probe is greater than that of the first probe, a second notch structure 210 is formed at a joint of the second probe and the first probe, the second probe is overlapped on the second step structure 310, the first probe is disposed on one side of the second probe close to the object 500 to be tested, a spring is disposed in the second probe, the spring is connected to the first probe, when the object 500 to be tested contacts the first probe, the first probe retracts into the second probe, the spring is in a compressed state, and when the object 500 to be tested does not contact the first probe, the spring is in an extended state, so that the first probe extends out.

In addition, coaxial structures may be disposed between the test probe 200, the isolation member 300 and the fixing body 100, in which the ends of the test probe 200 and the isolation member 300 may both penetrate through the through hole 110, and in the test process, the object 500 to be tested contacts the test probe 200, and the test probe 200 and the isolation member 300 are retracted into the through hole 110.

On the basis of the foregoing embodiment, in an optional implementation manner, in the connection device provided in this embodiment, one end of the connection device, which is away from the object 500 to be tested, is taken as a second end; the second end of the connector device is connected to an adapting member to which each of the test probes 200 is connected.

Specifically, one end of the fixing body 100, which is far away from the object 500 to be tested, is provided with a switching member, each test probe 200 is electrically connected with the switching member, a test signal of each test probe 200 is transmitted to the external processing device through the switching member, the external processing device processes the test signal, reads test data and displays the test data, so that related workers can know related data of the object 500 to be tested.

In an alternative embodiment, the adapter member is provided as an adapter plate 410; the interposer 410 is provided with a plurality of signal feeding structures, and the plurality of test probes 200 are correspondingly connected to the plurality of signal feeding structures one by one.

Specifically, the adapter plate 410 can be tightly attached to the fixing body 100 and integrated with the fixing body 100, the adapter plate 410 can be specifically set to be a PCB circuit board and a connecting wire, a test signal on the test probe 200 is transmitted through a signal feed-in structure on the PCB circuit board, a plurality of test signals are collected, the PCB circuit board is connected with external processing equipment through the connecting wire, the test signal is transmitted to the external processing equipment, and the external processing equipment processes and displays the test signal.

In an alternative embodiment, the transition member includes a plurality of transition wires 420; the plurality of patch cords 420 are connected to the plurality of test probes 200 in a one-to-one correspondence.

Specifically, the patch cord 420 is connected with one end of the test probe 200, which is far away from the object 500 to be tested, one patch cord 420 is correspondingly arranged on each test probe 200, one end of the patch cord 420, which is far away from the test probe 200, is electrically connected with external processing equipment, the test signal in the test probe 200 is transmitted to the external processing equipment through the patch cord 420, the arrangement of the patch cord 420 can directly transmit the test signal on the test probe 200 to the external processing equipment, the use of the patch panel 410 is replaced, and the overall occupied space of the connecting device is reduced.

In an alternative of this embodiment, it is preferable that the first end of the fixing body 100 is provided with a receiving groove for receiving the object 500, and the corresponding end of the test probe 200 contacts the object 500 in a state that the object 500 is mounted in the receiving groove.

Specifically, the holding tank is seted up to the one end that fixed main part 100 is close to determinand 500, and determinand 500 can be placed in the holding tank, and the test probe 200 in the fixed main part 100 of being convenient for contacts with determinand 500, can reduce the length that test probe 200 stretches out fixed main part 100 simultaneously, guarantees when the test, and in fixed main part 100 was arranged in completely to test probe 200, shields the interference signal between each test probe 200, guarantees test quality, improves the accuracy of data.

When the object 500 to be tested is mounted in the accommodating groove, the object 500 to be tested is in contact with the test probe 200 located in the accommodating groove, the object 500 to be tested generates force on the test probe 200 in the process that the object 500 to be tested gradually extends into the accommodating groove, the test probe 200 gradually retracts into the through hole 110, and when the object 500 to be tested completely extends into the accommodating groove, the test probe 200 is completely placed in the through hole 110 to start testing.

The electronic device provided by the embodiment comprises the connecting device.

Since the technical effect of the electronic device provided by the embodiment is the same as that of the connecting device, the details are not repeated herein.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A connector device, comprising: a fixing body (100) and a test probe (200);

a plurality of accommodating channels are arranged in the fixing main body (100), and the test probes (200) are inserted into the accommodating channels;

the fixing body (100) is configured to shield interference signals between the test probes (200).

2. The connection device of claim 1,

the fixing body (100) is provided with a plurality of through holes (110);

the accommodating channel is formed in the through holes (110), and any two adjacent through holes (110) are isolated by metal materials.

3. The connection device of claim 2,

the connection device further comprises an isolation member (300);

the isolation member (300) is disposed in the receiving channel and sleeved outside the test probe (200), and the isolation member (300) is configured to isolate the electrical contact between the test probe (200) and the fixing body (100).

4. Connection device according to claim 3,

the isolation member (300) is made of a plastic material.

5. Connection device according to claim 3,

one end of the connecting device, which is used for contacting the object to be tested (500), is taken as a first end;

a first step structure (120) is arranged on the inner wall of the through hole (110) close to the first end;

the isolating component (300) is provided with a first notch structure matched with the first step structure (120) close to the first end.

6. The connection device of claim 5,

the end part of the isolation component (300) close to the first end is provided with a second step structure (310);

a second notch structure (210) is arranged at the end part of the test probe (200) close to the first end;

the second notch structure (210) of the test probe (200) overlaps the second step structure (310) of the isolation member (300).

7. The connection device of claim 6,

taking one end of the connecting device, which is deviated from the object to be detected (500), as a second end;

the second end of the connecting device is connected with an adapting component, and each test probe (200) is connected with the adapting component.

8. The connection device of claim 7,

the adapter member is provided as an adapter plate (410);

the adapter plate (410) is provided with a plurality of signal feed-in structures, and the plurality of test probes (200) are correspondingly connected with the plurality of signal feed-in structures one by one.

9. The connection device of claim 7,

the transition member includes a plurality of transition wires (420);

the plurality of patch cords (420) are correspondingly connected with the plurality of test probes (200) one by one.

10. The connection device of claim 5,

the first end of the fixing main body (100) is provided with a containing groove for containing an object to be tested (500), and the end part corresponding to the test probe (200) is in contact with the object to be tested (500) in a state that the object to be tested (500) is assembled in the containing groove.

11. An electronic device, characterized in that it comprises a connection device according to any one of claims 1-10.