CA1098984A - Low-profile test clip adapter - Google Patents
Low-profile test clip adapterInfo
- Publication number
- CA1098984A CA1098984A CA320,477A CA320477A CA1098984A CA 1098984 A CA1098984 A CA 1098984A CA 320477 A CA320477 A CA 320477A CA 1098984 A CA1098984 A CA 1098984A
- Authority
- CA
- Canada
- Prior art keywords
- electrical
- flat cable
- electrical connection
- conductors
- contact means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/59—Fixed connections for flexible printed circuits, flat or ribbon cables or like structures
- H01R12/65—Fixed connections for flexible printed circuits, flat or ribbon cables or like structures characterised by the terminal
- H01R12/67—Fixed connections for flexible printed circuits, flat or ribbon cables or like structures characterised by the terminal insulation penetrating terminals
- H01R12/675—Fixed connections for flexible printed circuits, flat or ribbon cables or like structures characterised by the terminal insulation penetrating terminals with contacts having at least a slotted plate for penetration of cable insulation, e.g. insulation displacement contacts for round conductor flat cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
- H01R13/502—Bases; Cases composed of different pieces
- H01R13/506—Bases; Cases composed of different pieces assembled by snap action of the parts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
- H01R13/502—Bases; Cases composed of different pieces
- H01R13/508—Bases; Cases composed of different pieces assembled by a separate clip or spring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/24—Connections using contact members penetrating or cutting insulation or cable strands
- H01R4/2416—Connections using contact members penetrating or cutting insulation or cable strands the contact members having insulation-cutting edges, e.g. of tuning fork type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
- H01R4/24—Connections using contact members penetrating or cutting insulation or cable strands
- H01R4/2416—Connections using contact members penetrating or cutting insulation or cable strands the contact members having insulation-cutting edges, e.g. of tuning fork type
- H01R4/242—Connections using contact members penetrating or cutting insulation or cable strands the contact members having insulation-cutting edges, e.g. of tuning fork type the contact members being plates having a single slot
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
- Connector Housings Or Holding Contact Members (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Multi-Conductor Connections (AREA)
Abstract
LOW-PROFILE TEST CLIP ADAPTER
Abstract of the Disclosure A low-profile test clip adapter allowing electrical connection to the terminals of a dual-inline-package (DIP) while it remains in its normal operating environment is disclosed.
Abstract of the Disclosure A low-profile test clip adapter allowing electrical connection to the terminals of a dual-inline-package (DIP) while it remains in its normal operating environment is disclosed.
Description
Background of the Invention In the testing of electronic equipment containing a number of circuit boards including integrated circuits mounted in DIP's it is desirable to make test connections to the various terminals of the DIP's. In many cases it is best to test the electrical circuits while they are operating.
Normally, circuit boards are removed from their normal operating environment and connected to a conventional e~tender board and connections are made to the DIP terminals using a conventional test probe or clip. In some cases, especially those involving high-frequency signals, the use of an extender board may introduce electrical interference into the circuit; thereby unacceptably altering the electrical characteristics of the circui~ under test.
Summary of the Invention -This invention relates to electrical connectors for making electrical connections to electronic circuits packaged in a DIP. More particularly, it relates to an electrical connector for making electrical connection to these circuits while they are in their normal operatin~
environment.
The invention is realiæed by a device comprised of a low-profile test clip connected to a flat cable term-inated with an electrical connector. In use, the test clip is electrically connected to a DIP moun-ted on a circuit board that has been removed from the equipment. The height of the test clip is such that the circuit board may be reinstalled in the equipment while the test clip is still connected to the DIP, without interferring with adjacent circuit boards. The flat cable is of such length that the electrical connector extends beyond the physical con~ines .. ~ ,~ ,, ;
of the equipment and is accessible to conventional test probes.
The object of the present invention is to provide a means for electrically connecting to DIP's.
Another object of the present invention is to provide a means for electrically connecting to DIP's mounted on circuit boards that are installed in their normal operating environment inside the electronic equipment.
In accordance with an aspect of the invention there is provided a low-profile device for making electrical connection to the terminals of an electronic component for testing the circuitry thereof, said device comprising:
a flat cable containing a plurality of insulated conductors for carrying electrical signals; a body having spaced electrlcal contact means mounted therein, said electrical contact means including terminal~contact sections for electrical connection with terminals and conductor-connecting sections for electrical connection with electrical conductors of said flat cable; means for gripping the electronic component and for insulating and protecting said terminal-contact sections of said electrical contact means; means for retaining and spring biasing said grippin~
means to said body; a cap to cover and electrically insulate exposed portions of said conductor-connecting sections of said electrical contact means and to retain said contact means in electrical connection with the electrical conductors in said flat cable; and means for electrically connecting between the electrical conductor~ in said flat cable and a test instrument.
The foregoing and other objects and advantages of the present invention will become apparent from the following detailed description of the preferred embodiment thereof and from the attached drawing.
Brief Description of the Drawing Figure 1 is a block diagram showing the low-profile test clip adapter in a typical application;
Figure 2 is an exploded view of the low-profile test clip adapter showing the component parts thereof; and Figure 3 shows an assembled low-profile test clip.
Detailed Description of the Invention Turning now to the drawings, a typical test situation using the present invention is shown in Figure 1.
Shown are a piece of electronic equipment 2, circuit boards 4 therein, and low-profile test clip 6 electrically connected to a DIP 7 on circuit board 4. A flat cable 8 connects-test clip 6 to terminal block 10. Conventional test probe 12 is connected to a connector pin in terminal block 10 and carries signals to test instrument 14.~ With this arrangement the electrical characteristics of circuit board 4 may be deter-mined while it is operating within electronic equipment 2.
In order to enable circuit board 4 to be operated within instrument 2 during tests instead of on a conventional extender board, low--profile test clip 6 is of such height as to allow circuit board 4 to be placed inside equipment 2 without interferring with adjacent circuit boards 4.
Low-profile test clip 6 as shown in Figure 2 contains several parts including, a body 20 r a pair of arms 22, and a cap 24. ~ody 20 is molded of a suitable plastic material and carries a plurality of gold-plated beryllium copper cantil.ever spring contacts 26 that provide electrical contact between the terminals of the DIP being tested and the conductors of flat cable 8. Figures 2 and 3 depict a total of sixteen spring contacts 26; however, it is obvious that any number of contacts may be carried by body 20 to accomodate the various configurations of DIPIs.
The top portion of each spring contact 26 is fork shaped so as to puneture and displace the insulation sur-rounding the conductors of flat eable 8 when it is fitted into place over spring contacts 26. Thus, electrica]
contact is made between the conductors of flat cable 8 and spring contacts 26. The bottom portion of each spring contact 26 springably engages and makes electrical contact with a respective terminal of the DIP being tested. The bottom portion of each eontact 26 is provided with in~ardly-direeted arcuate-shaped projeetions 26a to enable the contact to easily engage a respective terminal of the DIP.
The two arms 22 are identical and they include C-shaped sections 21 which springably engage cylindrical projections 23 of body 20 so t-hat arms 22 are pivotally mounted on body 20 as shown in Figure 2. The bottom portion of each arm 22 contains spaeed fingers 25 that are disposed between adjaeent spring contacts to grip the body of the DIP; thereby ensuring good electrical contact between spring contacts 26 and the DIP terminals. Fingers 25 also protect and prevent the spring contacts from shorting to one another.
The middle portion of each arm 22 covers and provides elec-trieal insulation for spring contacts 26. The top portion of arms 22 are to be engaged to pivotally move the arms away from contacts 26 so that the eontacts ean easily engage the DIP terminals.
Arms 22 are pivotally mounted on body 20 via sections 21 and projections 23 so as to permit them to be pivoted toward and away from spring contacts 26; thus, - 3a -~9 51~8~
allowing spring contacts 26 to fit over the DIP terminals.After arms 22 are pivotally mounted onto body 20, an O-ring 30 ,~ .
: .
- 3b -is mounted within grooves 27 of arms 22 thereby maintaining arms 22 in position on body 20 and providing spring bias to arms 22.
Body 20 contains latching arms 32 which include latching surfaces 34. I_atching arms 32 extend through openings 36 in cap 24 when cap 24 is positioned on body 20. Latching surfaces 34 engage a mating surface of cap 24 as a result of the outwardly-directed spring action of arms 32 thereby latching cap 2~ in position, insulating any exposed section of contacts 26, and retaining the electr.ical conductors of flat cable 8 in electrical contact with spring contacts 26.
D Flat cable 8 contains a plurality of insulated conductors, sixteen such conductors are shown in Figure 2. It is obvious, however, that any number of conductors may be included in flat cable 8 in order to accomodate the various configurations of DlP's. Flat cable 8 extends the signals carried by spring contacts 26 from the DIP terminals out beyond the physical confines of equipment 2.
Flat cable ~ is terminated with a conventional terminal block 10 surrounded by housing 35 which contains a plurality of connector pins 33.
Sixteen connector pins are shown, but it is obvious that any number may be used in order to accomodate the corresponding number of conductors in flat cable 8. Conventional ~est probe 12 ~rom test instrument 14 may be connected ~o connector pins 33 to perform electrical testing on electronic circuits within the DIP. Alternately, flat cable ~ may be terminated in a conventional connector designed to plug directly into test instrument 14 without need of test probe 12.
While an embodiment of the present invention has been shown and described, it will be apparent to those skilled in the art that changes and modifications may be made without departing from the present invention in its broad aspects. The appended claims are therefore intended to cover ali such changes and modifications as fall within the true spirit and scope of the invention.
Normally, circuit boards are removed from their normal operating environment and connected to a conventional e~tender board and connections are made to the DIP terminals using a conventional test probe or clip. In some cases, especially those involving high-frequency signals, the use of an extender board may introduce electrical interference into the circuit; thereby unacceptably altering the electrical characteristics of the circui~ under test.
Summary of the Invention -This invention relates to electrical connectors for making electrical connections to electronic circuits packaged in a DIP. More particularly, it relates to an electrical connector for making electrical connection to these circuits while they are in their normal operatin~
environment.
The invention is realiæed by a device comprised of a low-profile test clip connected to a flat cable term-inated with an electrical connector. In use, the test clip is electrically connected to a DIP moun-ted on a circuit board that has been removed from the equipment. The height of the test clip is such that the circuit board may be reinstalled in the equipment while the test clip is still connected to the DIP, without interferring with adjacent circuit boards. The flat cable is of such length that the electrical connector extends beyond the physical con~ines .. ~ ,~ ,, ;
of the equipment and is accessible to conventional test probes.
The object of the present invention is to provide a means for electrically connecting to DIP's.
Another object of the present invention is to provide a means for electrically connecting to DIP's mounted on circuit boards that are installed in their normal operating environment inside the electronic equipment.
In accordance with an aspect of the invention there is provided a low-profile device for making electrical connection to the terminals of an electronic component for testing the circuitry thereof, said device comprising:
a flat cable containing a plurality of insulated conductors for carrying electrical signals; a body having spaced electrlcal contact means mounted therein, said electrical contact means including terminal~contact sections for electrical connection with terminals and conductor-connecting sections for electrical connection with electrical conductors of said flat cable; means for gripping the electronic component and for insulating and protecting said terminal-contact sections of said electrical contact means; means for retaining and spring biasing said grippin~
means to said body; a cap to cover and electrically insulate exposed portions of said conductor-connecting sections of said electrical contact means and to retain said contact means in electrical connection with the electrical conductors in said flat cable; and means for electrically connecting between the electrical conductor~ in said flat cable and a test instrument.
The foregoing and other objects and advantages of the present invention will become apparent from the following detailed description of the preferred embodiment thereof and from the attached drawing.
Brief Description of the Drawing Figure 1 is a block diagram showing the low-profile test clip adapter in a typical application;
Figure 2 is an exploded view of the low-profile test clip adapter showing the component parts thereof; and Figure 3 shows an assembled low-profile test clip.
Detailed Description of the Invention Turning now to the drawings, a typical test situation using the present invention is shown in Figure 1.
Shown are a piece of electronic equipment 2, circuit boards 4 therein, and low-profile test clip 6 electrically connected to a DIP 7 on circuit board 4. A flat cable 8 connects-test clip 6 to terminal block 10. Conventional test probe 12 is connected to a connector pin in terminal block 10 and carries signals to test instrument 14.~ With this arrangement the electrical characteristics of circuit board 4 may be deter-mined while it is operating within electronic equipment 2.
In order to enable circuit board 4 to be operated within instrument 2 during tests instead of on a conventional extender board, low--profile test clip 6 is of such height as to allow circuit board 4 to be placed inside equipment 2 without interferring with adjacent circuit boards 4.
Low-profile test clip 6 as shown in Figure 2 contains several parts including, a body 20 r a pair of arms 22, and a cap 24. ~ody 20 is molded of a suitable plastic material and carries a plurality of gold-plated beryllium copper cantil.ever spring contacts 26 that provide electrical contact between the terminals of the DIP being tested and the conductors of flat cable 8. Figures 2 and 3 depict a total of sixteen spring contacts 26; however, it is obvious that any number of contacts may be carried by body 20 to accomodate the various configurations of DIPIs.
The top portion of each spring contact 26 is fork shaped so as to puneture and displace the insulation sur-rounding the conductors of flat eable 8 when it is fitted into place over spring contacts 26. Thus, electrica]
contact is made between the conductors of flat cable 8 and spring contacts 26. The bottom portion of each spring contact 26 springably engages and makes electrical contact with a respective terminal of the DIP being tested. The bottom portion of each eontact 26 is provided with in~ardly-direeted arcuate-shaped projeetions 26a to enable the contact to easily engage a respective terminal of the DIP.
The two arms 22 are identical and they include C-shaped sections 21 which springably engage cylindrical projections 23 of body 20 so t-hat arms 22 are pivotally mounted on body 20 as shown in Figure 2. The bottom portion of each arm 22 contains spaeed fingers 25 that are disposed between adjaeent spring contacts to grip the body of the DIP; thereby ensuring good electrical contact between spring contacts 26 and the DIP terminals. Fingers 25 also protect and prevent the spring contacts from shorting to one another.
The middle portion of each arm 22 covers and provides elec-trieal insulation for spring contacts 26. The top portion of arms 22 are to be engaged to pivotally move the arms away from contacts 26 so that the eontacts ean easily engage the DIP terminals.
Arms 22 are pivotally mounted on body 20 via sections 21 and projections 23 so as to permit them to be pivoted toward and away from spring contacts 26; thus, - 3a -~9 51~8~
allowing spring contacts 26 to fit over the DIP terminals.After arms 22 are pivotally mounted onto body 20, an O-ring 30 ,~ .
: .
- 3b -is mounted within grooves 27 of arms 22 thereby maintaining arms 22 in position on body 20 and providing spring bias to arms 22.
Body 20 contains latching arms 32 which include latching surfaces 34. I_atching arms 32 extend through openings 36 in cap 24 when cap 24 is positioned on body 20. Latching surfaces 34 engage a mating surface of cap 24 as a result of the outwardly-directed spring action of arms 32 thereby latching cap 2~ in position, insulating any exposed section of contacts 26, and retaining the electr.ical conductors of flat cable 8 in electrical contact with spring contacts 26.
D Flat cable 8 contains a plurality of insulated conductors, sixteen such conductors are shown in Figure 2. It is obvious, however, that any number of conductors may be included in flat cable 8 in order to accomodate the various configurations of DlP's. Flat cable 8 extends the signals carried by spring contacts 26 from the DIP terminals out beyond the physical confines of equipment 2.
Flat cable ~ is terminated with a conventional terminal block 10 surrounded by housing 35 which contains a plurality of connector pins 33.
Sixteen connector pins are shown, but it is obvious that any number may be used in order to accomodate the corresponding number of conductors in flat cable 8. Conventional ~est probe 12 ~rom test instrument 14 may be connected ~o connector pins 33 to perform electrical testing on electronic circuits within the DIP. Alternately, flat cable ~ may be terminated in a conventional connector designed to plug directly into test instrument 14 without need of test probe 12.
While an embodiment of the present invention has been shown and described, it will be apparent to those skilled in the art that changes and modifications may be made without departing from the present invention in its broad aspects. The appended claims are therefore intended to cover ali such changes and modifications as fall within the true spirit and scope of the invention.
Claims (6)
1. A low-profile device for making electrical connection to the terminals of an electronic component for testing the circuitry thereof, said device comprising:
a flat cable containing a plurality of insulated conductors for carrying electrical signals;
a body having spaced electrical contact means mounted therein, said electrical contact means including terminal-contact sections for electrical connection with terminals and conductor-connecting sections for electrical connection with electrical conductors of said flat cable;
means for gripping the electronic component and for insulating and protecting said terminal-contact sections of said electrical contact means;
means for retaining and spring biasing said gripping means to said body;
a cap to cover and electrically insulate exposed portions of said conductor-connecting sections of said electrical contact means and to retain said contact means in electrical connection with the electrical conductors in said flat cable; and means for electrically connecting between the electrical conductors in said flat cable and a test instrument.
a flat cable containing a plurality of insulated conductors for carrying electrical signals;
a body having spaced electrical contact means mounted therein, said electrical contact means including terminal-contact sections for electrical connection with terminals and conductor-connecting sections for electrical connection with electrical conductors of said flat cable;
means for gripping the electronic component and for insulating and protecting said terminal-contact sections of said electrical contact means;
means for retaining and spring biasing said gripping means to said body;
a cap to cover and electrically insulate exposed portions of said conductor-connecting sections of said electrical contact means and to retain said contact means in electrical connection with the electrical conductors in said flat cable; and means for electrically connecting between the electrical conductors in said flat cable and a test instrument.
2. A device according to claim I wherein said electrical contact means are cantilevered spring contacts embedded in said body.
3. A device according to claim 1 wherein said gripping means is a pair of arms pivotally mounted on said body.
4. A device according to claim 1 wherein said retaining and spring biasing means comprises an elastic O-ring.
5. A device according to claim I wherein said electrical connection means comprises a terminal block containing connector pins that are accessible to conventional test probes.
6. A device according to claim 1 wherein said electrical connection means comprises a connector that mates directly with a receptacle on a test instrument.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US88398378A | 1978-03-06 | 1978-03-06 | |
| US883,983 | 1978-03-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1098984A true CA1098984A (en) | 1981-04-07 |
Family
ID=25383721
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA320,477A Expired CA1098984A (en) | 1978-03-06 | 1979-01-30 | Low-profile test clip adapter |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS5946348B2 (en) |
| CA (1) | CA1098984A (en) |
| DE (1) | DE2907953A1 (en) |
| FR (1) | FR2419595A1 (en) |
| GB (1) | GB2016217B (en) |
| NL (1) | NL7901332A (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5747523U (en) * | 1980-09-01 | 1982-03-17 | ||
| JPS5997486U (en) * | 1982-12-21 | 1984-07-02 | 日本航空電子工業株式会社 | Locking cover for inspection |
| EP0194695A1 (en) * | 1985-03-15 | 1986-09-17 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Process and testing adapter for contacting elements for testing |
| DE3773087D1 (en) * | 1986-08-22 | 1991-10-24 | Siemens Ag | ELECTRICAL CONNECTOR FOR CONNECTING SINGLE CABLES BY MEANS OF CUTTING-CLAMPING TECHNOLOGY. |
| DE9314259U1 (en) * | 1992-09-29 | 1994-02-10 | Tektronix Inc | Probe adapter for electronic components |
| CN102148431B (en) * | 2010-02-04 | 2013-11-06 | 鸿富锦精密工业（深圳）有限公司 | Connector |
| CN102394424B (en) * | 2011-06-22 | 2013-02-13 | 上海航天科工电器研究院有限公司 | Electrical connector of self-return type sliding cover structure |
| EP3626111B1 (en) * | 2018-09-19 | 2021-05-05 | LG Electronics Inc. | Drying machine |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB191007593A (en) * | 1910-03-29 | 1911-02-16 | Thomas Edward Smith | Improved Electric Coupling Device for use-in Charging Accumulators. |
| GB1246101A (en) * | 1968-10-25 | 1971-09-15 | Electrosil Ltd | Integrated circuit testing |
| DE2046729C3 (en) * | 1970-09-22 | 1978-08-24 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Test clamp for solderless connections with integrated modules |
| DE2147377A1 (en) * | 1971-09-22 | 1973-03-29 | Siemens Ag | TEST TERMINAL WITH CONNECTING STRIP FOR LOET-FREE CONNECTIONS WITH INTEGRATED COMPONENTS |
| US3964816A (en) * | 1974-08-22 | 1976-06-22 | Thomas & Betts Corporation | Electrical contact |
-
1979
- 1979-01-08 GB GB7900565A patent/GB2016217B/en not_active Expired
- 1979-01-30 CA CA320,477A patent/CA1098984A/en not_active Expired
- 1979-02-20 NL NL7901332A patent/NL7901332A/en not_active Application Discontinuation
- 1979-02-22 JP JP54020201A patent/JPS5946348B2/en not_active Expired
- 1979-03-01 DE DE19792907953 patent/DE2907953A1/en not_active Ceased
- 1979-03-02 FR FR7905921A patent/FR2419595A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54124289A (en) | 1979-09-27 |
| NL7901332A (en) | 1979-09-10 |
| GB2016217A (en) | 1979-09-19 |
| GB2016217B (en) | 1982-08-18 |
| DE2907953A1 (en) | 1979-10-04 |
| FR2419595A1 (en) | 1979-10-05 |
| JPS5946348B2 (en) | 1984-11-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4190311A (en) | Low-profile test clip adapter | |
| US8465312B2 (en) | Socket cartridge and socket cartridge assembly | |
| US5010446A (en) | Multi-edge extender board | |
| US6828768B2 (en) | Systems and methods for wideband differential probing of variably spaced probe points | |
| KR20040005828A (en) | High performance tester interface module | |
| US4223968A (en) | High-frequency etched circuit board connector | |
| JP2709570B2 (en) | Positioning device for electric test probe | |
| CA1098984A (en) | Low-profile test clip adapter | |
| US5808475A (en) | Semiconductor probe card for low current measurements | |
| CA2589353C (en) | Measuring tip for high-frequency measurement | |
| US20190157780A1 (en) | Electrical conductor connection | |
| US5061892A (en) | Electrical test probe having integral strain relief and ground connection | |
| US3601699A (en) | Lead separator and mounting socket for microminiature devices | |
| US4487466A (en) | Series/parallel electrical connector, particularly for use with chassis-mounted printed circuit cards | |
| US6831452B2 (en) | Systems and methods for wideband single-end probing of variabily spaced probe points | |
| US10126328B1 (en) | Electrical measurement test fixture | |
| EP0418525B1 (en) | Device under test interface board and test electronic card interconnection in semiconductor test system | |
| US3231843A (en) | Grounding connector | |
| US5556290A (en) | Self-switching connector for electronic systems | |
| US4820203A (en) | Multicontact connector | |
| CA1160707A (en) | Flat cable pitch transition connector | |
| KR100217068B1 (en) | Test instrument interface | |
| GB2112221A (en) | Testing apparatus for electrical testing at series terminals | |
| GB2336948A (en) | BNC test connector | |
| JPH06258373A (en) | Conduction inspection device for connector housing terminal |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |