JP3008612U - Measuring probe - Google Patents

Measuring probe

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Publication number
JP3008612U
JP3008612U JP1994012069U JP1206994U JP3008612U JP 3008612 U JP3008612 U JP 3008612U JP 1994012069 U JP1994012069 U JP 1994012069U JP 1206994 U JP1206994 U JP 1206994U JP 3008612 U JP3008612 U JP 3008612U
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JP
Japan
Prior art keywords
measurement
terminal
measuring
case
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1994012069U
Other languages
Japanese (ja)
Inventor
盛全 嶺岸
Original Assignee
マグナス電子工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by マグナス電子工業株式会社 filed Critical マグナス電子工業株式会社
Priority to JP1994012069U priority Critical patent/JP3008612U/en
Application granted granted Critical
Publication of JP3008612U publication Critical patent/JP3008612U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

(57)【要約】 【目的】 操作が容易で、かつ測定ミスや測定誤差の発
生が少ない測定プローブを提供する。 【構成】 ケース1の先端より突出された測定端子2を
測定点に接触させて測定を行う測定プローブにおいて、
上記測定端子2をケース1に出没自在に支承し、かつケ
ース1内に設けた弾機4により突出方向へ付勢すると共
に、上記ケース1内に、測定端子2の没入時接触して導
通回路を形成する接触ばね5を設けたもので、片手で操
作できるため、操作が容易であると共に、操作端子2を
測定点に押し付けた状態で測定できるため、測定ミスや
測定誤差を少なくできる。
(57) [Summary] [Purpose] To provide a measurement probe that is easy to operate and has few measurement errors and measurement errors. [Constitution] In a measurement probe for performing measurement by bringing a measurement terminal 2 protruding from a tip of a case 1 into contact with a measurement point,
The measuring terminal 2 is movably supported in the case 1, and is urged in a projecting direction by an ammunition machine 4 provided in the case 1. The measuring terminal 2 comes into contact with the case 1 when the measuring terminal 2 is retracted. Since the contact spring 5 that forms the contact point is provided and can be operated with one hand, the operation is easy and the measurement can be performed while the operation terminal 2 is pressed against the measurement point, so that measurement error and measurement error can be reduced.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

この考案は測定作業が容易な測定プローブに関する。 The present invention relates to a measurement probe that facilitates measurement work.

【0002】[0002]

【従来の技術】[Prior art]

従来測定器には、測定すべき電気機器や電子回路などの測定点へ接触させる測 定プローブが設けられている。 この測定プローブは把持しやすいよう筒状に形成された絶縁性のケースの先端 に導電性材料よりなる測定端子が設けられた構造で、ケースの基端側より延出さ れたリード線により測定器と接続するようになっている。 Conventional measuring instruments are equipped with measuring probes that come into contact with measuring points such as electrical equipment and electronic circuits to be measured. This measuring probe has a structure in which a measuring terminal made of a conductive material is provided at the tip of an insulating case that is formed in a cylindrical shape so that it can be easily gripped, and a measuring instrument is provided by a lead wire extending from the base end side of the case. It is designed to connect with.

【0003】 上記のような測定プローブを使用して測定する場合、通常は測定端子を測定点 へ接触させて測定点と測定端子を導通させた状態で測定を行うが、条件によって は、いきなり測定端子と測定点を導通させずに測定端子を測定点に接触させた後 、回路を形成して測定を行う場合がある。 このような場合従来では、測定用プローブに組込まれたスライドスイッチや押 釦スイッチを予めオフにした状態で測定端子を測定点に接続した後、スライドス イッチや押釦スイッチをオンにして測定を行っている。When the measurement probe as described above is used for measurement, the measurement terminal is normally brought into contact with the measurement point so that the measurement point and the measurement terminal are electrically connected. The measurement may be performed by forming a circuit after bringing the measurement terminal into contact with the measurement point without electrically connecting the terminal and the measurement point. In such a case, conventionally, the slide switch or pushbutton switch built into the measurement probe was turned off in advance and the measurement terminal was connected to the measurement point, and then the slide switch or pushbutton switch was turned on to perform the measurement. ing.

【0004】[0004]

【考案が解決しようとする課題】[Problems to be solved by the device]

しかしこの方法では、測定プローブの測定端子を測定点に接触させた状態でス ライドスイッチや押釦スイッチをオンにする操作が必要なため、接触不良による 測定ミスや測定誤差が発生しやすいなどの不具合がある。 また測定プローブを保持した状態でスイッチ操作を行うため、操作に両手を必 要として操作が煩雑であるなどの不具合もあった。 この考案はかかる従来の不具合を改善するためになされたもので、操作が容易 で、かつ測定ミスや測定誤差が発生することの少ない測定プローブを提供するこ とを目的とするものである。 However, with this method, it is necessary to turn on the slide switch or push-button switch while the measurement terminal of the measurement probe is in contact with the measurement point, which may cause measurement errors or errors due to poor contact. There is. Further, since the switch operation is performed while the measurement probe is held, there are problems that both hands are required for the operation and the operation is complicated. The present invention has been made in order to improve such a conventional problem, and an object thereof is to provide a measurement probe which is easy to operate and which is less likely to cause measurement error or measurement error.

【0005】[0005]

【課題を解決するための手段】[Means for Solving the Problems]

この考案は上記目的を達成するために、ケースの先端より突出された測定端子 を測定点に接触させて測定を行う測定プローブにおいて、上記測定端子をケース に出没自在に支承し、かつケース内に設けた弾機により突出方向へ付勢すると共 に、上記ケース内に、測定端子の没入時接触して導通回路を形成する接触ばねを 設けたものである。 In order to achieve the above-mentioned object, the present invention provides a measuring probe, in which a measuring terminal protruding from the tip of a case is brought into contact with a measuring point for measurement, and the measuring terminal is movably supported in and out of the case. In addition to being urged in the protruding direction by the provided ammunition, a contact spring is provided in the above-mentioned case, which comes into contact with the measurement terminal when it is retracted to form a conduction circuit.

【0006】[0006]

【作用】[Action]

上記構成により、測定端子を測定点に接触させてケースを押圧すると、測定端 子がケース内に没入して測定端子と接触ばねが接触し、導通回路が形成されるた め、片手で測定操作が可能になると共に、測定端子を測定点に押し付けた状態で 測定できるため、測定ミスや測定誤差を少なくできる。 With the above configuration, when the measurement terminal is brought into contact with the measurement point and the case is pressed, the measurement terminal is retracted into the case, the measurement terminal and the contact spring come into contact, and a conduction circuit is formed. In addition, since it is possible to perform measurement with the measurement terminal pressed against the measurement point, measurement errors and measurement errors can be reduced.

【0007】[0007]

【実施例】【Example】

この考案の一実施例を図1及び図2に示す図面を参照して詳述する。 図1は測定プローブの側面図、図2は同断面図を示す。 これら図において1は絶縁材料よりなる筒状のケースで、先端側に導体よりな る測定端子2が突出され、基端側からはリード線3が延出されている。 An embodiment of the present invention will be described in detail with reference to the drawings shown in FIGS. FIG. 1 is a side view of the measurement probe, and FIG. 2 is a sectional view of the same. In these figures, reference numeral 1 denotes a cylindrical case made of an insulating material, a measuring terminal 2 made of a conductor is projected on the tip end side, and a lead wire 3 is extended from the base end side.

【0008】 上記測定端子2は棒状をなしていて、中間部よりやや先端側に寄った位置にば ね座2aが突設されており、このばね座2aから基端側までがケース1内に収容 されていると共に、基端側はケース1内に形成された隔壁1aの小孔1bに摺動 自在に支承されている。 そして上記ばね座2aと隔壁1aの間にはコイルばねよりなる弾機4が介在さ れていて、この弾機4により測定端子2が突出方向へ付勢されている。The measuring terminal 2 has a rod-like shape, and a spring seat 2a is provided in a protruding manner at a position slightly closer to the tip end side than the middle part, and from the spring seat 2a to the base end side is inside the case 1. While being housed, the base end side is slidably supported in a small hole 1b of a partition wall 1a formed in the case 1. A bullet 4 made of a coil spring is interposed between the spring seat 2a and the partition wall 1a, and the measuring terminal 2 is biased in the projecting direction by the bullet 4.

【0009】 一方上記ケース1内には、板ばねよりなる接触ばね5が設けられている。 上記接触ばね5は、一端側に円弧状に湾曲する接触部5aが形成されていて、 この接触部5aが上記測定端子2の基端部と離間するよう中間部が固着具6によ りケース1の内面に固着されており、測定時測定端子2が弾機4に抗して没入さ れたときに、測定端子2の基端部と接触部5aが接触して、測定端子2と接触ば ね5の間が導通されるようになっている。 また接触ばね5の他端側には上記リード線3が半田付けされている。On the other hand, inside the case 1, a contact spring 5 made of a leaf spring is provided. The contact spring 5 has a contact portion 5a which is curved in an arc shape at one end side, and an intermediate portion is fixed to a case by a fixture 6 so that the contact portion 5a is separated from the base end portion of the measuring terminal 2. 1 is fixed to the inner surface of the measuring terminal 2, and when the measuring terminal 2 is immersed against the ammunition 4 at the time of measurement, the base end portion of the measuring terminal 2 and the contact portion 5a come into contact with each other to make contact with the measuring terminal 2. The gap 5 is electrically connected. The lead wire 3 is soldered to the other end of the contact spring 5.

【0010】 次に上記測定プローブの作用を説明する。 測定に当っては測定プローブをリード線3を介して図示しない測定器に接続し 、この状態でケース1を把持して測定端子2の先端を測定点に接触させる。 この状態では測定端子2の基端部と接触ばね5の接触部5aは図2に示すよう に離れているので、測定端子2と接触ばね5の間は導通しない。Next, the operation of the measurement probe will be described. In the measurement, the measuring probe is connected to a measuring device (not shown) via the lead wire 3, and in this state, the case 1 is gripped and the tip of the measuring terminal 2 is brought into contact with the measuring point. In this state, since the base end portion of the measuring terminal 2 and the contact portion 5a of the contact spring 5 are separated from each other as shown in FIG. 2, there is no conduction between the measuring terminal 2 and the contact spring 5.

【0011】 次に測定を開始する場合は測定点側へケース1を押圧する。 これによって測定端子2が弾機4に抗してケース1内へ没入されるため、測定 端子2の基端部と接触ばね5の接触部5aが接触して測定端子2と接触ばね5の 間が導通されて導通回路が形成され、測定が行えるようになる。 また測定が完了して測定端子2を測定点より離すと、弾機4の作用で測定端子 2は図1及び図2に示す元の位置へ突出される。Next, when the measurement is started, the case 1 is pressed toward the measurement point side. As a result, the measuring terminal 2 is retracted into the case 1 against the ammunition 4, so that the base end portion of the measuring terminal 2 and the contact portion 5a of the contact spring 5 come into contact with each other so that the distance between the measuring terminal 2 and the contact spring 5 is increased. Is conducted to form a conduction circuit, and measurement can be performed. Further, when the measurement is completed and the measurement terminal 2 is separated from the measurement point, the measurement terminal 2 is projected to the original position shown in FIGS. 1 and 2 by the action of the bullet 4.

【0012】 なお上記実施例では弾機4にコイルばねを使用したが、図3に示すようにスポ ンジやゴムなどの弾性体を使用しても同様な効果が得られる。Although a coil spring is used for the bullet 4 in the above embodiment, the same effect can be obtained by using an elastic body such as sponge or rubber as shown in FIG.

【0013】 また図4は接触ばね5にコイルばねを使用した他の実施例を示すもので、コイ ルばねよりなる接触ばね5の一端側に接触部5a′を設けて、この接触部5a′ が測定端子2の基端と離間するよう接触ばね5の他端側をケース1内に設けた隔 壁1cに固定したもので、測定時測定端子2が没入すると、測定端子2の基端部 が接触部5a′と接触するようになっている。FIG. 4 shows another embodiment in which a coil spring is used as the contact spring 5, and a contact portion 5a 'is provided on one end side of the contact spring 5 composed of a coil spring, and this contact portion 5a' is provided. The other end side of the contact spring 5 is fixed to a partition wall 1c provided in the case 1 so that the measurement terminal 2 is separated from the base end of the measurement terminal 2. Are in contact with the contact portion 5a '.

【0014】[0014]

【考案の効果】 この考案は以上詳述したように、測定時測定端子を測定点に接触させた状態で 、弾機に抗してケースを押圧することにより、導通回路が形成されるようにした ことから、従来のようにスライドスイッチや押釦スイッチをオンにするなどの操 作が不要となる。 これによって測定作業が片手で行えるため、操作性が格段に向上すると共に、 測定端子が測定点に押し付けられた状態で導通回路が形成されるため、測定ミス や測定誤差のない精度の高い測定が可能になる。Effect of the Invention As described in detail above, the present invention enables a conduction circuit to be formed by pressing the case against the ammunition while the measurement terminal is in contact with the measurement point during measurement. As a result, it is no longer necessary to operate the slide switch or push button switch as in the past. This allows the measurement work to be performed with one hand, greatly improving the operability and forming a conductive circuit with the measurement terminals pressed against the measurement point, which enables highly accurate measurement without measurement errors or measurement errors. It will be possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】この考案の一実施例になる測定プローブの側面
図である。
FIG. 1 is a side view of a measuring probe according to an embodiment of the present invention.

【図2】この考案の一実施例になる測定プローブの断面
図である。
FIG. 2 is a sectional view of a measurement probe according to an embodiment of the present invention.

【図3】この考案の他の実施例になる測定プローブの断
面図である。
FIG. 3 is a sectional view of a measuring probe according to another embodiment of the present invention.

【図4】この考案の他の実施例になる測定プローブの断
面図である。
FIG. 4 is a sectional view of a measurement probe according to another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 ケース 2 測定端子 4 弾機 5 接触ばね 1 case 2 measuring terminal 4 bullet 5 contact spring

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 ケース1の先端より突出された測定端子
2を測定点に接触させて測定を行う測定プローブにおい
て、上記測定端子2をケース1に出没自在に支承し、か
つケース1内に設けた弾機4により突出方向へ付勢する
と共に、上記ケース1内に、測定端子2の没入時接触し
て導通回路を形成する接触ばね5を設けてなる測定プロ
ーブ。
1. A measuring probe for measuring by contacting a measuring terminal 2 protruding from the tip of a case 1 with a measuring point, and the measuring terminal 2 is movably supported in the case 1 and provided in the case 1. And a contact spring 5 which is urged by the ammunition machine 4 in the projecting direction and which contacts with the measurement terminal 2 when the measurement terminal 2 is retracted to form a conduction circuit.
【請求項2】 弾機4をコイルばねまたは弾性体により
形成してなる請求項1記載の測定プローブ。
2. The measuring probe according to claim 1, wherein the bullet 4 is formed of a coil spring or an elastic body.
【請求項3】 接触ばね5を板ばねまたはコイルばねに
より形成してなる請求項1記載の測定プローブ。
3. The measuring probe according to claim 1, wherein the contact spring 5 is formed of a leaf spring or a coil spring.
JP1994012069U 1994-09-05 1994-09-05 Measuring probe Expired - Lifetime JP3008612U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1994012069U JP3008612U (en) 1994-09-05 1994-09-05 Measuring probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1994012069U JP3008612U (en) 1994-09-05 1994-09-05 Measuring probe

Publications (1)

Publication Number Publication Date
JP3008612U true JP3008612U (en) 1995-03-20

Family

ID=43144429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1994012069U Expired - Lifetime JP3008612U (en) 1994-09-05 1994-09-05 Measuring probe

Country Status (1)

Country Link
JP (1) JP3008612U (en)

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