JPH02168164A - Probe - Google Patents
ProbeInfo
- Publication number
- JPH02168164A JPH02168164A JP63324312A JP32431288A JPH02168164A JP H02168164 A JPH02168164 A JP H02168164A JP 63324312 A JP63324312 A JP 63324312A JP 32431288 A JP32431288 A JP 32431288A JP H02168164 A JPH02168164 A JP H02168164A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- measuring
- measured
- terminals
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title claims abstract description 18
- 238000005259 measurement Methods 0.000 claims description 37
- 239000000126 substance Substances 0.000 abstract 1
- 238000009966 trimming Methods 0.000 description 5
- 239000012212 insulator Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Laser Beam Processing (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
皮血欠1
本発明はプローブに関し、特にレーザトリミング用プロ
ーブに関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a probe, and more particularly to a probe for laser trimming.
疋米及韮
従来、レーザトリミング用プローブにおいては、被測定
物(電作など)に接触させて抵抗値などの電気的特性を
測定するJl’l定端子全端子しが有していなかった。Previously, laser trimming probes did not have a constant terminal for measuring electrical characteristics such as resistance by contacting the object to be measured (such as electrical work).
また、レーザトリミング用プローブを用いてレーザトリ
ミングか行われるハイブリッドICのパターンは、近年
より一層B&絹化しつつあり、測定用の電極も非常に小
さくなってきている。Furthermore, the patterns of hybrid ICs that are laser trimmed using laser trimming probes are becoming more and more B&S patterns in recent years, and the measurement electrodes are also becoming much smaller.
このような従来のレーザトリミング用プローブでは、被
測定物に接触する測定端子が1つのみとなっているので
、低抵抗測定時など同一電極に2カ所の測定場所が必要
な場合、2本のプローブを用いなければならず、ハイブ
リッドICのパターンのlfi&![1化に伴って同一
電極に2カ所の測定場所が必要な場合等の作業に手間と
時間がかかるという欠点がある。Conventional laser trimming probes like this have only one measurement terminal that comes into contact with the object to be measured, so if two measurement locations are required on the same electrode, such as when measuring low resistance, two Probes must be used to detect lfi&! of the hybrid IC pattern. [With integration into one, there is a drawback that it takes time and effort to perform work such as when two measurement locations are required for the same electrode.
発明の目的
本発明は上記のような従来のものの欠点を除去すべくな
されたもので、同一電極に2カ所の測定場所が必要な場
合等の作業を容易に行うことができるプローブの撞供を
目的とする。Purpose of the Invention The present invention has been made in order to eliminate the drawbacks of the conventional ones as described above, and provides a probe that can be easily used when two measurement locations are required for the same electrode. purpose.
免叫ム旦蔦
本発明によるプローブは、被測定物の電気的特性を測定
するための第1および第2の測定端子を同一保持部材内
に有し、前記保持部材内において前記第1の測定端子を
中心とする同心円上に前記第2の測定端子を配設するよ
うにしたことを特徴とする。The probe according to the present invention has first and second measurement terminals in the same holding member for measuring the electrical characteristics of an object to be measured, and the first measurement terminal is provided in the holding member. The second measurement terminal is arranged on a concentric circle centered on the terminal.
K監贋
次に、本発明の一′実施例について図面を参照して説明
する。Next, a first embodiment of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例の構成を示す斜視図である。FIG. 1 is a perspective view showing the configuration of an embodiment of the present invention.
図において、針状の測定端子1はソケット3の中心に配
設され、筒状のa1定端子2は測定端子1を中心とする
同心円上に、すなわち測定端子1の外側に配設されてお
り、これら測定端子1゜2とソケット3との間には夫々
絶縁体4.5が配設されている。また、測定端子1.2
には夫々測定ゲーブル6,7が接続されている。In the figure, the needle-shaped measurement terminal 1 is arranged at the center of the socket 3, and the cylindrical A1 constant terminal 2 is arranged on a concentric circle centered on the measurement terminal 1, that is, on the outside of the measurement terminal 1. , insulators 4.5 are provided between the measurement terminals 1.degree.2 and the sockets 3, respectively. In addition, measurement terminal 1.2
Measuring cables 6 and 7 are connected to the respective measuring cables 6 and 7.
ソケット3は図示せぬプローブカードに取付けられたグ
ローブハンド8に固定されている。The socket 3 is fixed to a glove hand 8 attached to a probe card (not shown).
第2図はYS1図のソケット3の断面図であり、第3図
は第1図の測定端子1.2が被測定物に接触した状態の
断面図である。これらの図において、測定端子1はスプ
リング9により、また測定端子2はスプリングloa、
10bにより被測定物(電極)11に一定圧力で接触す
るようになっている。FIG. 2 is a cross-sectional view of the socket 3 shown in FIG. YS1, and FIG. 3 is a cross-sectional view of the measuring terminal 1.2 shown in FIG. 1 in contact with an object to be measured. In these figures, the measuring terminal 1 is connected to the spring 9, and the measuring terminal 2 is connected to the spring loa,
10b, it is brought into contact with the object to be measured (electrode) 11 with a constant pressure.
したがって、測定端子1.2を被測定!tallに接触
させることにより、測定端子1.2各々によって、すな
わち2カ所で被測定物11のill定を行うことができ
、同一の被測定物11に2カ所の測定場所が必要な場合
等の作業を容易に行うことができる。Therefore, the measurement terminals 1 and 2 are to be measured! By contacting the tall, illumination of the object to be measured 11 can be performed using each of the measurement terminals 1 and 2, that is, at two locations, which is useful when two measurement locations are required for the same object to be measured. Work can be done easily.
また、」1定端子1.2を被測定物11に接触させた状
態で、測定端子1.2間に電流を流すことにより、プロ
ーブが被測定物11に接触しているかどうかを検出する
ことができる。In addition, it is possible to detect whether the probe is in contact with the object to be measured 11 by flowing a current between the measurement terminals 1 and 2 while the constant terminals 1 and 2 are in contact with the object to be measured 11. Can be done.
すなわち、測定端子1.2を被測定物11に接触させた
状態で、測定端子1.2間に電圧をかけたとき、プロー
ブが被測定物11に接触している場合には、測定端子1
.2間の抵抗はほぼゼロとなり、プローブが被測定物1
1に接触していない場合(被J!1定!Nilとグロー
ブとの位置がずれている場合も含む)には、測定端子1
.2間の抵抗は無限大となる。That is, when a voltage is applied between the measurement terminals 1.2 with the measurement terminals 1.2 in contact with the object to be measured 11, if the probe is in contact with the object to be measured 11, the measurement terminal 1.
.. The resistance between 2 becomes almost zero, and the probe connects to the object to be measured 1.
If the measurement terminal 1 is not in contact (including the case where the position of the target J!1 constant!Nil and the glove is misaligned),
.. The resistance between the two becomes infinite.
よって、プローブが被測定物11に対して接触不良を起
こしていることなどを検出することができる。Therefore, it is possible to detect that the probe is causing poor contact with the object to be measured 11.
このように、針状の測定端子1をソケット3の中心に配
設し、筒状の測定端子2を測定端子1を中心とする同心
円上に配設するようにすることによって、1本のプロー
ブで2カ所の測定を同時に行うことかできる。よって、
小さい電極などにおいて2カ所の測定場所が必要な場合
等の作業を容易に行うことができる。In this way, by arranging the needle-shaped measurement terminal 1 at the center of the socket 3 and arranging the cylindrical measurement terminal 2 on a concentric circle centered on the measurement terminal 1, one probe can be used. It is possible to measure two locations at the same time. Therefore,
Work can be easily carried out when two measurement locations are required for small electrodes, etc.
また、測定端子1.2と被測定物11との接触状態の検
出も行えるので、レーザトリミングを行うときの準備時
間を短縮することができる。Furthermore, since the contact state between the measurement terminal 1.2 and the object to be measured 11 can be detected, the preparation time for laser trimming can be shortened.
尚、本発明の一実施例では針状の測定端子1を中心とす
る同心円上に筒状の測定端子2を配設置るようにしたが
、針状の測定端子1を中心とする同心円上に複数の針状
の測定端子を配設するようにしてもよく、これに限定さ
れない。In one embodiment of the present invention, the cylindrical measuring terminal 2 is arranged on a concentric circle centered on the needle-shaped measuring terminal 1. A plurality of needle-shaped measurement terminals may be provided, but the present invention is not limited thereto.
九肌座1】
以上説明したように本発明によれば、同一保持部材内に
おいて第1の測定端子を中心とする同心円上に第2の測
定端子を配設するようにすることによって、同一電極に
2カ所の測定場所が必要な場合等の作業を容易に行うこ
とができるという効果がある。As explained above, according to the present invention, by arranging the second measurement terminal on a concentric circle centered on the first measurement terminal within the same holding member, the same electrode This has the effect that work can be easily carried out when two measurement locations are required.
第1図は本発明の一実施例の構成を示すブロック図、第
2図は第1図のソケットの断面図、第3図は第1図の測
定端子が被(i!ll定物に接触した状態の断面図であ
る。
主要部分の符号の説明
1・・・・・・針状の測定端子
2・・・・・・筒状のJl定端子
3・・・・・・ソケット
4.5・・・・・・絶縁体
6.7・・・・・・測定ケーブルFig. 1 is a block diagram showing the configuration of an embodiment of the present invention, Fig. 2 is a sectional view of the socket shown in Fig. 1, and Fig. 3 shows the measurement terminal in Fig. 1 in contact with a fixed object. It is a cross-sectional view of the state in which the main parts are explained. 1... Needle-shaped measurement terminal 2... Cylindrical Jl constant terminal 3... Socket 4.5 ...Insulator 6.7...Measurement cable
Claims (1)
び第2の測定端子を同一保持部材内に有し、前記保持部
材内において前記第1の測定端子を中心とする同心円上
に前記第2の測定端子を配設するようにしたことを特徴
とするプローブ。(1) First and second measurement terminals for measuring the electrical characteristics of the object to be measured are provided in the same holding member, and the first and second measurement terminals are arranged on a concentric circle centered on the first measurement terminal within the holding member. A probe characterized in that the second measurement terminal is provided.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324312A JPH02168164A (en) | 1988-12-22 | 1988-12-22 | Probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324312A JPH02168164A (en) | 1988-12-22 | 1988-12-22 | Probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02168164A true JPH02168164A (en) | 1990-06-28 |
Family
ID=18164395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63324312A Pending JPH02168164A (en) | 1988-12-22 | 1988-12-22 | Probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02168164A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02133280U (en) * | 1989-04-06 | 1990-11-06 | ||
EP0773445A3 (en) * | 1995-11-10 | 1999-08-25 | OHT Inc. | Inspection apparatus of conductive patterns |
WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
JP2005127752A (en) * | 2003-10-21 | 2005-05-19 | Murata Mfg Co Ltd | Characteristic measuring device of chip type electronic component |
JP2006250546A (en) * | 2005-03-08 | 2006-09-21 | Hioki Ee Corp | Short circuit detector |
JP2014102193A (en) * | 2012-11-21 | 2014-06-05 | Toshiba Corp | Remaining life assessment probe and measuring device |
-
1988
- 1988-12-22 JP JP63324312A patent/JPH02168164A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02133280U (en) * | 1989-04-06 | 1990-11-06 | ||
EP0773445A3 (en) * | 1995-11-10 | 1999-08-25 | OHT Inc. | Inspection apparatus of conductive patterns |
WO2002063314A1 (en) * | 2001-02-02 | 2002-08-15 | Tokyo Electron Limited | Probe |
JP2005127752A (en) * | 2003-10-21 | 2005-05-19 | Murata Mfg Co Ltd | Characteristic measuring device of chip type electronic component |
JP2006250546A (en) * | 2005-03-08 | 2006-09-21 | Hioki Ee Corp | Short circuit detector |
JP2014102193A (en) * | 2012-11-21 | 2014-06-05 | Toshiba Corp | Remaining life assessment probe and measuring device |
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