JPH02223874A - Socket for measurement - Google Patents

Abstract

PURPOSE:To electrically execute a connection to one piece of lead of an element to be measured and to prevent a problem for a measurement caused by a large contact resistance, etc. by allowing a measurement use socket to have plural terminals connected electrically, respectively and insulated from each other with respect to one piece of lead of the element to be measured. CONSTITUTION:A pair of terminals (electrical connecting points) 2 are formed in a socket mother body 1, and these terminals 2 are insulated from each other by an insulator 3. Also, a flat type IC 6 for a flat IC measurement is set by bringing an external lead 7 of the IC 6 into contact with the terminal 2 in the socket mother body 1, covered with a cap 4 of the socket, and fixed onto the mother body 1 by locking a socket cap 5 by its cap 4. In such a case, the external lead 7 of the IC 6 conducts to the terminal 2 in plural points with respect to one piece of lead. In such a way, an increase of a contact resistance caused by deterioration of the socket and a contact failure caused by a lead breakage of a terminal to be measured are detected in an early stage.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a measuring socket, and more particularly to a measuring socket for electrically sorting and measuring electronic devices.

[Conventional technology]

Conventionally, this type of measuring socket has been used, for example, D-*P
(Dual-In-Line Package) I
In the case of the C socket, there were multiple electrical connection points for one lead of the IC under test, but the multiple electrical connection points were electrically conductive to each other ( (See Figure 3). In addition, for flat package IC sockets,
The electrical connection point was singular (see Figure 4).

[Problem to be solved by the invention]

With the above-mentioned conventional measurement socket, if you repeatedly perform measurements such as sorting the elements to be measured, the terminals of the socket will deteriorate and the contact resistance will increase, causing a good product to be judged as defective. When carrying out reliability tests, this is a problem as it appears in the form of spurious characteristic fluctuations of the device under test.

[Means to solve the problem]

The measurement socket of the present invention is a measurement socket consisting of a terminal for electrically connecting with a lead of a device under test and a base body for holding the terminal. It is characterized by having a plurality of terminals each electrically connected and insulated from each other.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a sectional view of one embodiment of the present invention.

This embodiment is a DIP type I type side C measurement socket. ■
2 is the base of the socket, 2 is a terminal (electrical connection point), and 3 is an insulator for insulating the pair of terminals 2 from each other. FIG. 2 is a sectional view of another embodiment of the invention. This embodiment is an example of a socket for flat IC measurement. flat IC
(Gull wing type) 6 is set by contacting the external lead 7 of the flat type IC 6 with the terminal 2 on the socket base l, and putting the socket cap 4 on top, and the socket cap 4 is connected to the hook 5 of the socket cap.
By locking, it is fixed on the base l of the socket.

At this time, the external lead 7 of C6 is electrically connected to the terminal 2 at a plurality of points for one lead. In general, measurement testers use contact resistance during measurement to improve measurement accuracy.
By using the measurement socket according to the present invention, which has sense and force functions (current flows through two of the four terminals, and voltage is measured with the remaining two terminals), the tester described above can be used. The sense and force functions can be effectively utilized, and it is possible to quickly detect increased contact resistance due to socket defects or poor contact due to broken leads of the device under test. Further, in the case of the measurement socket according to the present invention, a simple open/short check can be performed between one of the elements to be measured and a plurality of mutually insulated terminals of the lead.

〔Effect of the invention〕

As explained above, the present invention has a plurality of mutually insulated terminals (electrical connection points) for electrical connection to one lead of the device under test. Effective in preventing measurement problems such as high contact resistance.

[Brief explanation of the drawing]

Fig. 1 is a plan view of the DIP type I type side C measuring socket of one embodiment of the present invention, and Fig. 2 is a plan view of the socket for measuring DIP type I side C of another embodiment of the present invention.
FIGS. 3 and 4 are sectional views of a socket for conventional C measurement, respectively, corresponding to FIGS. 1 and 2. 1... Socket base, 2... Terminal,
3... Insulator, 4... Socket cap, 5... Socket cap hook, 6...
...Flat type IC17...External lead of flat type IC6, 8...Hook 5
A bottle for fixing to the base body 1. Agent Patent Attorney Susumu Uchihara 1: Socket's 8th rest 2: Terminal 3: Map's return 7° to the bare socket of the parent Itako socket of the Kikin socket. 2 Type IC6 7F part lead 8,
Pins for fixing to F, 7, 5 and 8, 1 Figure 3

Claims (1)

[Claims] A measurement socket consisting of a terminal for electrically connecting to the lead of the device under test and a base body for holding the terminal, each electrically connected to one lead of the device under test and mutually connected. A measurement socket characterized by having multiple insulated terminals.