JP2977189B2 - Conductive contact pin - Google Patents
Conductive contact pinInfo
- Publication number
- JP2977189B2 JP2977189B2 JP8032738A JP3273896A JP2977189B2 JP 2977189 B2 JP2977189 B2 JP 2977189B2 JP 8032738 A JP8032738 A JP 8032738A JP 3273896 A JP3273896 A JP 3273896A JP 2977189 B2 JP2977189 B2 JP 2977189B2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- probe
- electrode
- tip
- battery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Tests Of Electric Status Of Batteries (AREA)
- Secondary Cells (AREA)
- Measuring Leads Or Probes (AREA)
Description
【0001】[0001]
【産業上の利用分野】この発明は、電池等電気部品の電
極に接触してこれを他の電気部品と電気的に接続するた
めの導電接触ピンに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a conductive contact pin for contacting an electrode of an electric component such as a battery and electrically connecting the electrode to another electric component.
【0002】[0002]
【従来の技術】リチウムイオン電池等の2次電池の充放
電試験を行う際は、電池本体の温度を計測することが必
要であり、従来は、電池の胴体に温度センサを密着させ
て試験を行っていた。しかしこの方法では、温度センサ
の取付けに占めるスペースが大きく、多数並べた電池を
同時にテストするには向いていない。2. Description of the Related Art When conducting a charge / discharge test of a secondary battery such as a lithium ion battery, it is necessary to measure the temperature of the battery body. Conventionally, a temperature sensor is closely attached to the body of the battery to perform the test. I was going. However, this method occupies a large space in mounting the temperature sensor and is not suitable for testing a large number of batteries at the same time.
【0003】[0003]
【発明が解決しようとする課題】この発明は、このよう
な問題を解消するために、温度センサを組み込んだ導電
接触ピンを提供することを目的とする。SUMMARY OF THE INVENTION An object of the present invention is to provide a conductive contact pin incorporating a temperature sensor in order to solve such a problem.
【0004】[0004]
【課題を解決するための手段】この発明の導電接触ピン
は、先端が電気部品の電極との接触面になっている筒状
の接触子本体の中に、軸方向にスライドできるように温
度プローブを嵌装する。温度プローブの内部にはサーミ
スタ等の温度センサーを組み込む。そして、温度プロー
ブを前方に付勢するスプリングを設ける。SUMMARY OF THE INVENTION A conductive probe according to the present invention is provided with a temperature probe so that it can slide in the axial direction into a cylindrical contact body whose tip is a contact surface with an electrode of an electric component. Is fitted. A temperature sensor such as a thermistor is incorporated inside the temperature probe. Then, a spring for urging the temperature probe forward is provided.
【0005】[0005]
【作用】接触子本体の先端を電池等の電極に押し当てる
だけで、接触子に繋がる他の電気回路と電池を電気的に
接続できる。また同時に、温度プローブもスプリングに
よって先端が電池の電極に押し当てられ、電気部品の温
度を計測することができる。The battery can be electrically connected to another electric circuit connected to the contact simply by pressing the tip of the contact body against the electrode of the battery or the like. At the same time, the tip of the temperature probe is pressed against the battery electrode by the spring, and the temperature of the electric component can be measured.
【0006】[0006]
【実施例】この発明の導電接触ピンを図1および図2で
説明すると、取付用スリーブ2の中に接触子本体3をス
ライド自在にはめ込む。接触子本体3は、先端が電池5
との接触面6になっている。接触子本体3の後部に雌ね
じ7を刻んでおき、これに螺合したナット8を締め付け
てラグ端子10を取り付ける。ラグ端子10に繋がる導
線11は負荷(充電時は電流源)に接続する。1 and 2, a contact body 3 is slidably fitted in a mounting sleeve 2. FIG. The contact body 3 has a battery 5
Contact surface 6. A female screw 7 is cut in the rear part of the contact body 3, and a nut 8 screwed to the female screw 7 is tightened to attach the lug terminal 10. The conductor 11 connected to the lug terminal 10 is connected to a load (current source during charging).
【0007】接触子本体3の頭部3aと取付用スリーブ
2の間にコイルスプリング12を縮設する。接触子本体
3は、このスプリングで前方に向けて付勢され、先端接
触面6が電池に密着する。A coil spring 12 is contracted between the head 3a of the contact body 3 and the mounting sleeve 2. The contact body 3 is urged forward by this spring, so that the tip contact surface 6 comes into close contact with the battery.
【0008】接触子本体3は中空に形成しておき、その
中に電圧プローブ13を前後にスライドできるようには
め込む。電圧プローブ13を接触子本体3から電気的に
絶縁するために、両者の間に絶縁スリーブ15を置く。
電圧プローブ13の後部には雌ねじ16を刻んでおき、
これにナット17を螺合してラグ端子18を取り付け
る。符号19は絶縁ワッシャである。ラグ端子18に繋
がる導線20は電圧計に導く。The contact body 3 is formed hollow, and the voltage probe 13 is fitted therein so that it can slide back and forth. In order to electrically insulate the voltage probe 13 from the contact body 3, an insulating sleeve 15 is placed between them.
A female screw 16 is cut in the rear of the voltage probe 13.
A lug terminal 18 is attached by screwing a nut 17 to this. Reference numeral 19 denotes an insulating washer. The conductor 20 connected to the lug terminal 18 leads to a voltmeter.
【0009】電圧プローブの後方に段部21を形成し、
この段部21と絶縁スリーブ15の間にコイルスプリン
グ22を縮設する。電圧プローブ13はこのスプリング
で前に向けて付勢され、先端接触面が電池に密着する。
(電池がない場合は、図2に示すように、接触子本体3
の先端からわずかに突出する。)A step 21 is formed behind the voltage probe,
A coil spring 22 is contracted between the step 21 and the insulating sleeve 15. The voltage probe 13 is urged forward by this spring, and the tip contact surface comes into close contact with the battery.
(If there is no battery, as shown in FIG.
Projecting slightly from the tip of )
【0010】電圧プローブ13もまた中空に形成されて
おり、その中に温度プローブ23を前後に摺動自在に収
める。符号28は絶縁スリーブである。温度プローブ2
3は、図2に詳細を示すように、銅製のキャップ24に
温度センサ(例えば、サーミスタ)を収めたものであ
り、温度センサから延びるリード線26は電圧プローブ
13の中を通って後端から引き出し、温度計測回路に導
かれる。The voltage probe 13 is also formed to be hollow, and houses the temperature probe 23 slidably back and forth. Reference numeral 28 denotes an insulating sleeve. Temperature probe 2
3, a temperature sensor (for example, a thermistor) is accommodated in a copper cap 24 as shown in detail in FIG. 2, and a lead wire 26 extending from the temperature sensor passes through the voltage probe 13 from the rear end. It is led out to the temperature measurement circuit.
【0011】温度プローブ23の下端と電圧プローブ1
3の段部27の間にコイルスプリング29を縮設する。
温度プローブ23はこのスプリングで前に向けて付勢さ
れ、先端が電池電極に密着する。(電池がない場合は、
図2に鎖線で示すように、電圧プローブの先端からわず
かに突出する。)The lower end of the temperature probe 23 and the voltage probe 1
The coil spring 29 is contracted between the third step portions 27.
The temperature probe 23 is urged forward by this spring, and the tip comes into close contact with the battery electrode. (If you do n’t have a battery,
As shown by the dashed line in FIG. 2, it slightly protrudes from the tip of the voltage probe. )
【0012】図3はこの導電接触ピンを用いた電池試験
装置の概要を示すものであり、電池トレー30に多数の
凹部31が形成されており、試験すべき電池5をこれら
凹部に入れて並べる。上下の電極支持板32、32に
は、上述の導電接触ピン32が電池5と同じ間隔で取り
付けられている。なお、上側の電極支持板に取り付ける
導電接触ピンには温度プローブを組み込む必要はない。FIG. 3 shows an outline of a battery test apparatus using the conductive contact pins. The battery tray 30 has a number of recesses 31 formed therein, and the batteries 5 to be tested are put in these recesses and arranged. . The above-mentioned conductive contact pins 32 are attached to the upper and lower electrode support plates 32 at the same intervals as the battery 5. It is not necessary to incorporate a temperature probe into the conductive contact pins attached to the upper electrode support plate.
【0013】試験を行うときは、ケース30に並べた電
池5を上下の電極支持板32で挟む。こうすれば、導電
接触ピン31の先端が対応する電池5の電極に押し当て
られる。 ここで注目すべきは、接触子本体3、電圧プ
ローブ13および温度プローブ23のそれぞれが、独自
のスプリング12、22、29を備えており、その弾発
力で前に押し出され、先端が電池の電極に密着するよう
になっていることである。特に、電圧プローブ13が電
池電極に密着する結果、充放電電流による電圧降下の影
響を受けずに電池の電圧を正確に測定することが可能に
なる。また、同時に、温度プローブ23で電池自体の温
度を計測することができる。When performing the test, the batteries 5 arranged in the case 30 are sandwiched between the upper and lower electrode support plates 32. In this case, the tip of the conductive contact pin 31 is pressed against the corresponding electrode of the battery 5. It should be noted here that each of the contact body 3, the voltage probe 13 and the temperature probe 23 are provided with their own springs 12, 22, and 29, and are pushed forward by their resilient force, and the tip of the battery is That is, it comes into close contact with the electrode. In particular, as a result of the voltage probe 13 being in close contact with the battery electrode, it is possible to accurately measure the battery voltage without being affected by the voltage drop due to the charging / discharging current. At the same time, the temperature of the battery itself can be measured by the temperature probe 23.
【0014】なお、上述の実施例では、電圧プローブ1
3の中に温度プローブ23を設けたが、電圧プローブは
設けずに、接触子本体3の中に温度プローブを設けるこ
ともできる。In the above embodiment, the voltage probe 1
Although the temperature probe 23 is provided in the contact 3, the temperature probe may be provided in the contact body 3 without providing the voltage probe.
【0015】[0015]
【発明の効果】以上説明したようにこの導電接触ピン
は、接触子本体の中に温度プローブを組み込んだので、
電気的接続と被検電気部品の温度測定が同時に可能にな
り、温度センサの取付けスペースが不用になるので、多
数の電池を並べて充放電テストを行うような場合に好適
である。また、温度プローブをスプリングで前方に付勢
するようにしたので、温度プローブの先が電池に密着
し、正確な温度測定ができる。As described above, this conductive contact pin incorporates a temperature probe in the contact body,
Since the electrical connection and the temperature measurement of the electric component to be tested can be simultaneously performed, and a space for mounting the temperature sensor is not required, it is suitable for a case where a large number of batteries are arranged and a charge / discharge test is performed. In addition, since the temperature probe is biased forward by the spring, the tip of the temperature probe comes into close contact with the battery, and accurate temperature measurement can be performed.
【0016】なお、接触子本体の中に電圧プローブを設
け、電圧プローブの中に温度プローブを設けてもよく、
こうすれば、接触子本体に大きな電流が流れる場合に
も、電圧プローブで、電圧降下の影響を受けずに、試験
中の電気部品の電圧の測定が可能である。A voltage probe may be provided in the contact body, and a temperature probe may be provided in the voltage probe.
In this way, even when a large current flows through the contact body, the voltage of the electrical component under test can be measured by the voltage probe without being affected by the voltage drop.
【図1】 導電接触ピンの使用状態立面図であり、右半
分は断面で示す。FIG. 1 is an elevational view of a use state of a conductive contact pin, in which a right half is shown in cross section.
【図2】 同じく頭部断面図である。FIG. 2 is a sectional view of the head similarly.
【図3】 電池の試験装置の説明図である。FIG. 3 is an explanatory diagram of a battery test apparatus.
3 接触子本体 5 電池 13 電圧プローブ 22 スプリング 23 温度プローブ 25 温度センサ 29 スプリング 3 Contact Body 5 Battery 13 Voltage Probe 22 Spring 23 Temperature Probe 25 Temperature Sensor 29 Spring
フロントページの続き (56)参考文献 特開 昭59−99271(JP,A) (58)調査した分野(Int.Cl.6,DB名) H01M 10/48 G01R 1/067 G01R 31/36 Continuation of the front page (56) References JP-A-59-99271 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) H01M 10/48 G01R 1/067 G01R 31/36
Claims (2)
になっている筒状の接触子本体(3)と、該接触子本体
の中に軸方向にスライドできるように嵌装され、内部に
温度センサー(25)を組み込んだ温度プローブ(2
3)と、該温度プローブの先端が電気部品の電極に接触
するようにこれを前方に付勢するスプリング(29)か
らなる導電接触ピン。1. A cylindrical contact main body (3) having a tip serving as a contact surface with an electrode of an electric component (5), and fitted into the contact main body so as to be slidable in the axial direction. , A temperature probe (2) incorporating a temperature sensor (25) inside
3) and a conductive contact pin comprising a spring (29) for urging the temperature probe forward so that the tip of the temperature probe contacts the electrode of the electric component.
になっている筒状の接触子本体(3)と、該接触子本体
の中に軸方向にスライドできるように、しかも、該接触
子本体と電気的に絶縁された状態で嵌装された電圧プロ
ーブ(13)と、該電圧プローブの先端が電気部品の電
極に接触するように前方に付勢するスプリング(22)
と、該電圧プローブの中に軸方向にスライドできるよう
に嵌装され、内部に温度センサー(25)を組み込んだ
温度プローブ(23)と、該温度プローブの先端が電気
部品の電極に接触するように前方に付勢するスプリング
(29)からなる導電接触ピン。2. A cylindrical contact main body (3) having a tip serving as a contact surface with an electrode of an electric component (5), and an axially slidable slide in the contact main body. A voltage probe (13) fitted in a state of being electrically insulated from the contact body, and a spring (22) for urging forward so that a tip of the voltage probe contacts an electrode of an electric component;
A temperature probe (23) fitted in the voltage probe so as to be slidable in the axial direction and having a temperature sensor (25) incorporated therein; and a tip of the temperature probe coming into contact with an electrode of an electric component. A conductive contact pin consisting of a spring (29) biasing forward.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8032738A JP2977189B2 (en) | 1996-01-26 | 1996-01-26 | Conductive contact pin |
PCT/JP1998/002468 WO1999062924A1 (en) | 1996-01-26 | 1998-06-04 | D-labeled 5'-ribonucleotide and process for producing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8032738A JP2977189B2 (en) | 1996-01-26 | 1996-01-26 | Conductive contact pin |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09204939A JPH09204939A (en) | 1997-08-05 |
JP2977189B2 true JP2977189B2 (en) | 1999-11-10 |
Family
ID=12367183
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8032738A Expired - Fee Related JP2977189B2 (en) | 1996-01-26 | 1996-01-26 | Conductive contact pin |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2977189B2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5064462B2 (en) * | 2009-09-26 | 2012-10-31 | アスカ電子株式会社 | Temperature measuring device for testing electronic parts |
JP6213382B2 (en) * | 2014-06-04 | 2017-10-18 | 三菱電機株式会社 | measuring device |
JP2017009449A (en) * | 2015-06-23 | 2017-01-12 | 三菱電機株式会社 | Contact probe type temperature detector, evaluation device of semiconductor device and evaluation method of semiconductor device |
CN106468725A (en) * | 2015-08-14 | 2017-03-01 | 致茂电子股份有限公司 | Probe structure |
DE102016206666A1 (en) * | 2016-04-20 | 2017-10-26 | Robert Bosch Gmbh | Temperature sensor, battery system and method of mounting a battery system |
CN109148332B (en) * | 2018-07-18 | 2024-03-01 | 凯盛光伏材料有限公司 | Reverse current overload test bench for testing photovoltaic module |
CN110927578B (en) * | 2019-12-16 | 2021-10-22 | 深圳市欧米加智能科技有限公司 | Microneedle test module |
CN111721695A (en) * | 2020-06-19 | 2020-09-29 | 中车青岛四方机车车辆股份有限公司 | Corrosion resistance rapid nondestructive testing device and testing method |
AT524291B1 (en) * | 2020-10-01 | 2022-10-15 | Avl List Gmbh | DEVICE FOR TESTING AT LEAST ONE BATTERY CELL |
-
1996
- 1996-01-26 JP JP8032738A patent/JP2977189B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH09204939A (en) | 1997-08-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |