JPS60127466A - Probe contact - Google Patents

Probe contact

Info

Publication number
JPS60127466A
JPS60127466A JP23546583A JP23546583A JPS60127466A JP S60127466 A JPS60127466 A JP S60127466A JP 23546583 A JP23546583 A JP 23546583A JP 23546583 A JP23546583 A JP 23546583A JP S60127466 A JPS60127466 A JP S60127466A
Authority
JP
Japan
Prior art keywords
contact
spiral
probe
main body
probe contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23546583A
Other languages
Japanese (ja)
Inventor
Terukazu Yamanishi
山西 輝一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YAMAICHI SEIKOU KK
Kiyota Manufacturing Co
Original Assignee
YAMAICHI SEIKOU KK
Kiyota Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YAMAICHI SEIKOU KK, Kiyota Manufacturing Co filed Critical YAMAICHI SEIKOU KK
Priority to JP23546583A priority Critical patent/JPS60127466A/en
Publication of JPS60127466A publication Critical patent/JPS60127466A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain the good contact with a measuring surface by breaking through the paste, flux or oxide film on the measuring surface, by providing a spiral part for rotating a contact element main body when said main body is adapted to the measuring surface. CONSTITUTION:The titled probe contact is constituted of a contact element main body 2 and a pipe shaped barrel part 3 for holding a part of said main body 2 in a freely slidable manner. The main body 2 has a spiral part, wherein at least a part of the main body 2 is formed into a spiral configuration, so as to impart rotary force to the main body 2 when the main body 2 is pressed to the measuring surface of a printed circuit board. Therefore, the good contact with the measuring surface can be obtained by breaking through the paste, flux or oxide film on the measuring surface.

Description

【発明の詳細な説明】 本発明はプリント配線基板の回路の導通の具合を点検す
るプリント基板検査用のプローブコンタクトに関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a probe contact for testing a printed wiring board for checking the conductivity of a circuit on a printed wiring board.

プリント基板の回路導通試験に使用されるプローブコン
タクトは、プリント基板の測定面に直接的に接触して測
定データを得るものであるため、前記接触面とプローブ
コンタクトとの間の良好な接触が確保されないと、満足
のいく試験結果が得られない。特に、プリント基板にI
C1抵抗、コンデンサ等を・・ンダ付けで取り付ける際
のノ・ンダ付けによる隆起部分に、プローブコンタクト
を押し付けて回路の導通を点検しようとする場合、該隆
起部分にはペースト、フラックス又は酸化被膜が形成さ
れていることが多く、そのような部分にプローブコンタ
クトを押し当ててもプローシコンタクトが酸化被膜等を
突き破ることができず、確実な接触が確保されない虞れ
がある。又、プリント蒸成上では、こうしたハンダ付け
による隆起部分に限らず、酸化被膜等が形成される部位
は多くあり、このような部位にプローブコンタクトを適
用しても良好な試験結果が得られない。
The probe contacts used in printed circuit board circuit continuity tests directly contact the measurement surface of the printed circuit board to obtain measurement data, ensuring good contact between the contact surface and the probe contact. Otherwise, satisfactory test results will not be obtained. In particular, I
When attempting to check the continuity of the circuit by pressing a probe contact against the raised part caused by soldering when installing a C1 resistor, capacitor, etc. by soldering, be careful not to leave paste, flux, or oxide film on the raised part. Even if a probe contact is pressed against such a portion, the probe contact will not be able to break through the oxide film, etc., and there is a risk that reliable contact will not be ensured. In addition, in print evaporation, there are many areas where oxide films are formed, not just the raised areas due to soldering, and good test results cannot be obtained even if probe contacts are applied to such areas. .

本発明は上記諸点に鑑みなされたものであって、プリン
ト基板の測定面、例えばハンダ付けによる隆起部分のよ
うな部位に酸化被膜等が形成されていてもそれを突き破
って測定面との確実な接触が確保され得るプリント基板
検査用のプローブコンタクトを提供することを目的とす
る。
The present invention has been developed in view of the above points, and even if an oxide film is formed on the measurement surface of a printed circuit board, for example, on a protruding part due to soldering, it can be penetrated to ensure reliable contact with the measurement surface. An object of the present invention is to provide a probe contact for inspecting a printed circuit board that can ensure contact.

次に本発明の好ましい具体例について図に基いて説明す
る。
Next, preferred specific examples of the present invention will be explained based on the drawings.

図において1本発明のプローブコンタクト1は、接触子
本体2と、接触子本体2を内部に摺動自在に保持してい
る円筒IQイブ状の胴部3、及び胴部3の内部に設けら
れていて、接触子本体2を一方に押しつけているコイル
バネ4とからなシ、接触子本体2及び胴部3は導電性の
材料からなる。接触子本体2は先端部5と5前記用部3
の内部に嵌入される摺動部6、及び先端部5と摺動部6
とを連結する中間部7とから構成される。先端部5はプ
リント基板の測定面と接触する先端8を有し、先端8は
測定面の状態に応じて良好な接触がなされ得るように、
図示されている円錐形状のみならず、その他所望の形状
で形成され得る。
In the figure, a probe contact 1 of the present invention includes a contact body 2, a cylindrical IQ tube-shaped body 3 that slidably holds the contact body 2 inside, and a body 3 provided inside the body 3. The contact body 2 and the body 3 are made of a conductive material. The contact body 2 has a tip portion 5 and a portion 3
The sliding part 6 that is fitted into the inside of the , and the tip part 5 and the sliding part 6
and an intermediate portion 7 that connects the two. The tip 5 has a tip 8 that comes into contact with the measurement surface of the printed circuit board, and the tip 8 has a tip 8 that is arranged so that good contact can be made depending on the condition of the measurement surface.
It can be formed not only in the conical shape shown, but also in any other desired shape.

中間部7は先端部5及び後述の摺動部6と一体的に形成
され、先端部5及び摺動部6の間にあって両者を連結し
ている。中間部7は細長い平棒状の形状を有し、その長
手方向の全長にわたって、一定方向に螺旋状に捩られて
形成され、接触子本体2の螺旋状部を構成している。こ
の中間部7が捩られる螺旋の軸は接触子本体2のその他
の部分即ち先端部5及び摺動部6の軸と一致するように
形成される。ここで中間部7は平棒状に限らず、断面三
角形、四角形等の形状であってよく、その捩シの角度は
最低45°以上あることが好ましいが、適宜設定され得
る。胴部3の接触子本体2を嵌入させている前端の部位
には平たいくびれ9が設けられておシ、くびれ9は細長
い平棒状の前記中間部7f:スムーズに出入させ得るよ
うに断面が平たく形成されている。接触子本体2の摺動
部6は円筒状の胴部3の内部に滑らかに嵌合し得るよう
に、胴部3の内径にほぼ対応する径を有して断面が円形
に形成されており、これによシ摺動部6は胴部3内を胴
部3の長手方向に摺動し得るが、前記くびれ9の存在に
よシ胴部9から抜は出ることは阻止され、胴部3内に保
持される。摺動部6の中間部7に接続する側とは反対側
の端部10には突出部11が設けられておシ、胴部3の
くびれ9とは反対側の端部12には折り返し13が形成
されていて、折シ返し13と摺動部6の前記突出部】1
の側の端部1Oの間にtよコイルバネ4が配設されてお
シ、コイルバネ4により接触子本体2は常時先端部5の
方向に押圧されていて、摺動部6の中間部7の側の端部
14がくびれ9に当接している。前記突出部11により
コイルバネ4F!、適切な位置に配置される。胴部3の
折シ返し13が形成されている端部12は開口15が設
けられている。
The intermediate portion 7 is integrally formed with the tip portion 5 and a sliding portion 6, which will be described later, and is located between the tip portion 5 and the sliding portion 6 to connect them. The intermediate portion 7 has an elongated flat rod-like shape and is twisted spirally in a fixed direction over its entire length in the longitudinal direction, thereby forming a spiral portion of the contact body 2 . The axis of the spiral around which the intermediate portion 7 is twisted is formed to coincide with the axes of the other portions of the contact body 2, that is, the tip portion 5 and the sliding portion 6. Here, the intermediate portion 7 is not limited to a flat rod shape, but may have a triangular or quadrangular cross section, and the torsion angle thereof is preferably at least 45°, but may be set as appropriate. A flat constriction 9 is provided at the front end portion of the body portion 3 into which the contact body 2 is inserted, and the constriction 9 is an elongated flat bar-shaped intermediate portion 7f: the cross section is flat so that it can be inserted and removed smoothly. It is formed. The sliding portion 6 of the contact body 2 is formed into a circular cross section with a diameter approximately corresponding to the inner diameter of the cylindrical body 3 so that it can be smoothly fitted into the interior of the cylindrical body 3. As a result, the sliding part 6 can slide inside the body part 3 in the longitudinal direction of the body part 3, but due to the presence of the constriction 9, it is prevented from coming out from the body part 9, and the sliding part 6 is prevented from coming out from the body part 9. 3. A protrusion 11 is provided at the end 10 of the sliding portion 6 opposite to the side connected to the intermediate portion 7, and a folded portion 13 is provided at the end 12 of the trunk 3 opposite to the constriction 9. is formed, and the protrusion of the folded part 13 and the sliding part 6]1
A coil spring 4 is disposed between the ends 1O on the side, and the coil spring 4 always presses the contact main body 2 in the direction of the tip 5, and the middle part 7 of the sliding part 6 The side end 14 rests against the constriction 9. Coil spring 4F due to the protrusion 11! , placed in the appropriate position. An opening 15 is provided at the end portion 12 of the body portion 3 where the fold 13 is formed.

(以下余白) 上述のように構成されているゾロ−シコンタクトlの使
用に際して、プローブコンタクト1は、プリント基板検
査機のテストヘッドと指称される取付板16を貫通して
取付板16に溶層又は接着によシ取フ付けられているン
ケツ)17内に胴部3を嵌入させて、プリント基板検査
機に装着される。ソケット17は導電性材料によシ形成
され、端子18を有しており、端子18にはハンダ付け
などによりリード線が接続される。このようにソケット
17に嵌め込まれてプリント基板検査機の取付板16に
固定されたプローブコンタクトlが、第3図に示される
ように、1.C,、抵抗等の電子部品又は電気部品20
をハンダ付けによって取シ付けているプリント基板21
に対して適用される時には、コンタクトプローブ1の先
端8がハンダ付けによる隆起部分22に当接する。この
時、プローブコンタクト1はプリント基板21に対して
一定以上の圧力で押しつけられているため、接触子本体
2の摺動部6が胴部3内に押し込まれてコイルノ9ネ4
は収縮する。従って、接触子本体2の先端8は隆起部分
22を一定以上の力で押圧し、その押圧力は反作用とし
て逆に接触子本体2に対し作用する。
(Left below) When using the Zoroshi contact 1 configured as described above, the probe contact 1 passes through the mounting plate 16, which is referred to as the test head of a printed circuit board inspection machine, and forms a molten layer on the mounting plate 16. Alternatively, the body part 3 is fitted into the socket 17 which is attached with an adhesive, and the body part 3 is mounted on a printed circuit board inspection machine. The socket 17 is made of a conductive material and has a terminal 18, to which a lead wire is connected by soldering or the like. As shown in FIG. 3, the probe contact l fitted into the socket 17 and fixed to the mounting plate 16 of the printed circuit board inspection machine is 1. C. Electronic or electrical components such as resistors 20
The printed circuit board 21 is attached by soldering.
When applied to the contact probe 1, the tip 8 of the contact probe 1 abuts against the soldered raised portion 22. At this time, since the probe contact 1 is pressed against the printed circuit board 21 with a pressure above a certain level, the sliding part 6 of the contact body 2 is pushed into the body part 3, and the coil no.
contracts. Therefore, the tip 8 of the contact body 2 presses the raised portion 22 with a force greater than a certain level, and this pressing force acts on the contact body 2 as a reaction.

反作用によシ接触子本体2に対し加えられる前記力は、
f&触子本体2の軸方向に作用し、接触子本体2の軸方
向に作用する力は、螺旋状に捩られて形成され、螺旋状
部を構成している中間部7において、中間部7が前記の
ように螺旋状に捩られている方向への力に変化する。こ
れによシ接触子本体2に対して回転力が付与される。
The force applied to the contact body 2 due to the reaction is:
The force acting in the axial direction of the contact body 2 is applied to the intermediate portion 7 which is twisted in a spiral shape and forms a spiral portion. changes into a force in the spirally twisted direction as described above. As a result, a rotational force is applied to the contact body 2.

即ち、プローブコンタクト1の接触子本体2はプリント
基板21に対し一定以上の力で当接することによシ、先
端8がその力に対応する度合だけB方向に回転して、前
記隆起部分22を覆っているペースト及びフラックス並
びに酸化被膜を確実に突き破シ、先端8と隆起部分22
との良好な接触を確保し得る。また、従来のプローブコ
ンタクトによれば胴部の中に相当に強いばねを配設しな
いと、測定面の酸化被膜、スラックス等を破って良好な
接触を得ることが不可能であったのに対し、本発明のプ
ローブコンタクトはプリント基板の測定面に押しつけら
れた時に、測定面に当接する先端が回転するように構成
されているため、接触子本体を保持している胴部内にさ
ほど強いばねを配設する必要がなく、表面の酸化被膜を
容易罠突き破ることができる。また、強いばねを使用す
ることでプリント基板を破損する危険も防止できる。
That is, when the contact main body 2 of the probe contact 1 comes into contact with the printed circuit board 21 with a force above a certain level, the tip 8 rotates in the direction B by an amount corresponding to the force, thereby causing the raised portion 22 to rotate. The tip 8 and the raised portion 22 reliably break through the covering paste, flux, and oxide film.
to ensure good contact with the In addition, with conventional probe contacts, it was impossible to break through the oxide film, slack, etc. on the measurement surface and obtain good contact unless a fairly strong spring was installed inside the body. Since the probe contact of the present invention is configured so that the tip that contacts the measurement surface rotates when it is pressed against the measurement surface of the printed circuit board, it is not necessary to install a very strong spring inside the body that holds the contact body. It does not need to be installed and can easily break through the oxide film on the surface. Also, by using a strong spring, the risk of damaging the printed circuit board can be prevented.

尚、接触子本体2を回転させるための螺旋状部は、上述
の具体例において、螺旋状に捩られて形成された細長い
平棒状の中間部7によシ構成されている力ζこ九に限ら
ず、中間部7を丸棒状に形成し、螺旋状部を丸棒の表面
に刻設された螺旋状の溝として構成して、この溝に係合
する突起を胴部3の内部に設けてもよい。
In addition, the spiral portion for rotating the contactor main body 2 is formed by the force ζ, which is formed by the intermediate portion 7 in the form of a long and thin flat bar twisted spirally in the above-mentioned specific example. However, the intermediate portion 7 may be formed into a round bar shape, the spiral portion may be configured as a spiral groove carved on the surface of the round bar, and a protrusion that engages with this groove may be provided inside the body portion 3. It's okay.

又、胴部3の内表面に螺旋状の溝を形成してこれによシ
螺旋状部を構成し、接触子本体2に胴部3の内側に形成
された前記溝と係合する突起を設けることによっても充
分に目的を達し得る。
Further, a spiral groove is formed on the inner surface of the body part 3 to thereby constitute a spiral part, and a protrusion that engages with the groove formed on the inside of the body part 3 is provided on the contact body 2. The purpose can also be sufficiently achieved by providing the following.

上述のように本発明のプローブコンタクトは、プリント
基板の測定面に適用される時に、接触子本体を回転させ
るような螺旋状部を有してなるため、測定面の表面のペ
ースト、7ラツクス及び酸化被膜等を突き破って測定面
との良好な接触を得られる。
As mentioned above, the probe contact of the present invention has a spiral portion that rotates the contact body when applied to the measurement surface of a printed circuit board, so that the paste, 7lux and Good contact with the measurement surface can be obtained by breaking through oxide films, etc.

【図面の簡単な説明】[Brief explanation of drawings]

第1図ノはプリント基板検査機に装着されている本発明
のプローブコンタクトの縦断面説明図、第2図は第1図
に示されるプローブコンタクトのJL−II線断面図、
第3図は第1図に示されるプローブコンタクトがプリン
ト基板に適用されている状態を示す説明図である。 1・・・プローブコンタクト、2・・・接触子本体、3
・・・胴部、4・・・コイルバネ、 訃・・先端部、6・・・摺動部、 7・・・中間部、 8・・・先端、 9・・・くびれ。 f日lii人l「り士今 村 几
FIG. 1 is an explanatory longitudinal cross-sectional view of the probe contact of the present invention installed in a printed circuit board inspection machine, and FIG. 2 is a cross-sectional view taken along the JL-II line of the probe contact shown in FIG.
FIG. 3 is an explanatory diagram showing a state in which the probe contact shown in FIG. 1 is applied to a printed circuit board. 1... Probe contact, 2... Contact body, 3
... body part, 4 ... coil spring, butt part ... tip part, 6 ... sliding part, 7 ... middle part, 8 ... tip, 9 ... constriction. f day lii person l ``Rishima Mura 几

Claims (1)

【特許請求の範囲】 fil 接触子本体と接触子本体の1部を内部に摺動自
在に保持するノ(イブ状の胴部とからなり、接触子本体
がプリント基板の測定面に押しつけられたときに、接触
子本体に回転力を付与すべく、接触子本体は接触子本体
の少なくとも1部が螺旋状に形成された螺旋状部を有し
ているプローブコンタクト。 (2)接触子本体が先端部と、胴部の内部に摺動自在に
保持される摺動部、及び先端部と摺動部との間にあって
両者を連結している中間部とからなシ、螺旋状部が中間
部に形成されている特許請求の範囲第1項に記載のプロ
ーブコンタクト。 (3)中間部が中間部の長手方向の全長にわたつて螺旋
状に捩られて形成された細長い平棒状の螺旋状部からな
る特許請求の範囲第2項に記載のプローブコンタクト。 (4)中間部が丸棒で形成され、螺旋状部が胴部の内側
に設けられた突起に係合すべく前記丸棒に形成されてい
る螺旋状の溝からなる特許請求の範囲第2項に記載のプ
ローブコンタクト。 (5)胴部が一端にくびれを有しておシ、該くびれは細
長い平棒状の螺旋状部が形成されている中 −間部を滑
らかに出入させるべく断面が平たく形成されている特許
請求の範囲第3項に記載のプローブコンタクト。 C6) 接触子本体と接触子本体の1部を内部に摺動自
在に保持するパイプ状の胴部とからなシ、接触子本体が
プリント基板の測定面に押しつけられたときに、接触子
本体に回転力を付与すべく、胴部は胴部の少なくとも1
部が螺旋状に形成された螺旋状部を有しているプローブ
コンタクト。 (7) 螺旋状部が、接触子本体に設けられた突起に係
合すべく、胴部の内側に形成された螺旋状の溝からなる
特許請求の範囲第6項に記載のプローブコンタクト。
[Scope of Claims] fil Consists of a contact body and a rib-shaped body that slidably holds a part of the contact body inside, and the contact body is pressed against the measurement surface of the printed circuit board. In some cases, a probe contact is used in which the contact body has a spiral portion in which at least a portion of the contact body is formed in a spiral shape in order to apply a rotational force to the contact body. The tip part, the sliding part that is slidably held inside the body part, and the middle part that is between the tip part and the sliding part and connects them, and the spiral part is the middle part. The probe contact according to claim 1, which is formed in the following: (3) an elongated flat rod-shaped helical portion formed by twisting the intermediate portion in a spiral manner over the entire length in the longitudinal direction of the intermediate portion; The probe contact according to claim 2, comprising: (4) an intermediate portion formed of a round bar, and a spiral portion formed on the round bar to engage with a protrusion provided inside the body portion; (5) The body has a constriction at one end, and the constriction is formed by an elongated flat bar-shaped spiral portion. The probe contact according to claim 3, wherein the probe contact is formed to have a flat cross section so that the intermediate portion of the probe can be smoothly moved in and out. The body has a pipe-like body that freely holds the body, and the body has at least one part of the body that applies rotational force to the contact body when the contact body is pressed against the measurement surface of the printed circuit board.
A probe contact having a spiral portion. (7) The probe contact according to claim 6, wherein the spiral portion is a spiral groove formed inside the body so as to engage with a protrusion provided on the contact body.
JP23546583A 1983-12-14 1983-12-14 Probe contact Pending JPS60127466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23546583A JPS60127466A (en) 1983-12-14 1983-12-14 Probe contact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23546583A JPS60127466A (en) 1983-12-14 1983-12-14 Probe contact

Publications (1)

Publication Number Publication Date
JPS60127466A true JPS60127466A (en) 1985-07-08

Family

ID=16986490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23546583A Pending JPS60127466A (en) 1983-12-14 1983-12-14 Probe contact

Country Status (1)

Country Link
JP (1) JPS60127466A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03251769A (en) * 1989-12-04 1991-11-11 Everett Charles Contact Prod Inc Contact tip of electric test probe
JPH03269264A (en) * 1989-11-03 1991-11-29 Everett Charles Contact Prod Inc Electric test probe provided with rotating controller of probe shaft
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US5731710A (en) * 1993-12-24 1998-03-24 Nippondenso Co., Ltd. Contact probe apparatus used in electric tests for a circuit board
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03269264A (en) * 1989-11-03 1991-11-29 Everett Charles Contact Prod Inc Electric test probe provided with rotating controller of probe shaft
JPH03251769A (en) * 1989-12-04 1991-11-11 Everett Charles Contact Prod Inc Contact tip of electric test probe
US5227718A (en) * 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US5731710A (en) * 1993-12-24 1998-03-24 Nippondenso Co., Ltd. Contact probe apparatus used in electric tests for a circuit board
US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
US5942906A (en) * 1994-11-18 1999-08-24 Virginia Panel Corporation Interface system utilizing engagement mechanism

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