JPS6311660Y2 - - Google Patents

Info

Publication number
JPS6311660Y2
JPS6311660Y2 JP11979882U JP11979882U JPS6311660Y2 JP S6311660 Y2 JPS6311660 Y2 JP S6311660Y2 JP 11979882 U JP11979882 U JP 11979882U JP 11979882 U JP11979882 U JP 11979882U JP S6311660 Y2 JPS6311660 Y2 JP S6311660Y2
Authority
JP
Japan
Prior art keywords
stylus
knobs
spring
test clip
flux
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11979882U
Other languages
Japanese (ja)
Other versions
JPS5925473U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11979882U priority Critical patent/JPS5925473U/en
Publication of JPS5925473U publication Critical patent/JPS5925473U/en
Application granted granted Critical
Publication of JPS6311660Y2 publication Critical patent/JPS6311660Y2/ja
Granted legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

【考案の詳細な説明】 本考案は電子部品のチエツク等に使用するテス
トクリツプに関する。
[Detailed Description of the Invention] The present invention relates to a test clip used for checking electronic parts.

従来の、この種テストクリツプとして第1図及
び第2図で示す構造のものがあつた。図面におい
て、A1,A2は一対のツマミで、このツマミA1
A2は平板状の絶縁体B1,B2内にバネ性を有する
複数本の導体Cを並列に埋設し、絶縁体B1,B2
の下端から突出した導体Cの端部を触針Dとした
ものである。そして、この一対のツマミA1とA2
は中央部を支軸Eで連結して、両ツマミA1,A2
の触針Dを開閉自在とする。又、支軸Eより上方
の両ツマミA1,A2間には圧縮形のバネFを介在
して両触針Dを常時、閉成状態に付勢している。
A conventional test clip of this type has a structure shown in FIGS. 1 and 2. In the drawing, A 1 and A 2 are a pair of knobs;
A 2 has a plurality of conductors C having spring properties embedded in parallel in flat insulators B 1 and B 2 , and insulators B 1 and B 2
The end of the conductor C protruding from the lower end of the stylus D is used as the stylus D. And this pair of knobs A 1 and A 2
connect the center part with the support shaft E, and connect both knobs A 1 , A 2
The stylus D can be opened and closed freely. Further, a compression spring F is interposed between the knobs A 1 and A 2 above the support shaft E to always bias the stylus D to the closed state.

次に、上記のクリツプの使用例を第3図及び第
4図を参照して説明する。図中、Gはプリント配
線板で、Hは該プリント配線板Gに実装された
LSI等の電子部品、H1は該電子部品Hのリードで
ある。
Next, an example of the use of the above-mentioned clip will be explained with reference to FIGS. 3 and 4. In the figure, G is a printed wiring board, and H is mounted on the printed wiring board G.
An electronic component such as an LSI, H1 is a lead of the electronic component H.

そこで、先ず両ツマミA1,A2の上端部を摘ま
んで内方向に力を加えると、バネFの弾力性に抗
して触針Dの間隔が広がる。次いで、両触針Dを
電子部品HのリードH2の外側に対応させてツマ
ミA1,A2に対する力を解除すれば、バネFの復
元力によつて両触針DはリードH1を挾着する。
Therefore, when the upper ends of both knobs A 1 and A 2 are pinched and force is applied inward, the distance between the stylus D increases against the elasticity of the spring F. Next, by aligning both stylus D with the outside of lead H 2 of electronic component H and releasing the force on knobs A 1 and A 2 , both stylus D will touch lead H 1 due to the restoring force of spring F. to clamp.

しかし、従来のテストクリツプでは第4図で示
すように触針DがリードH1に対して面的に圧着
されるので、リードH1の表面にハンダ付け時の
フラツクスIが付着していると、このフラツクス
Iのために触針DとリードH1とは接触せず電気
的に導通しないことがあり、作業の妨げとなつて
いた。そこで、この欠点をカバーするためにフラ
ツクスIを洗い落すと、それだけ作業が遅延す
る。
However, in the conventional test clip, as shown in Fig. 4, the stylus D is pressure-bonded to the lead H1 , so if the flux I from soldering is attached to the surface of the lead H1 . Because of this flux I, the stylus D and the lead H1 may not come into contact with each other and may not be electrically conductive, which hinders the work. Therefore, if Flux I is washed away to cover this defect, the work will be delayed accordingly.

本考案は上記のような欠点を解決しようとする
もので、開閉自在に連結された両ツマミの触針を
内方向に折曲すると共に、電子部品を押える押え
部を上下動自在に設け、この押え部をバネで下方
向に付勢することによつて、触針を電子部品の被
接触物と線的に圧着すると共に摺動させ、これに
よつて良好な接触状態が得られるテストクリツプ
を提供するのが目的である。
The present invention attempts to solve the above-mentioned drawbacks by bending the stylus of both knobs connected to each other so that they can be opened and closed inward, and also providing a presser part that presses the electronic component so that it can move up and down. By biasing the holding part downward with a spring, the stylus is linearly crimped and slid against the electronic component to be contacted, thereby creating a test clip that achieves good contact. The purpose is to provide.

以下、本考案を図面の実施例に基ずいて説明す
ると、第5図は本考案に係るテストクリツプの正
面図で、第6図は同側面図、第7図は同平面図で
ある。
Hereinafter, the present invention will be explained based on the embodiments shown in the drawings. FIG. 5 is a front view of a test clip according to the present invention, FIG. 6 is a side view thereof, and FIG. 7 is a plan view thereof.

上記の図面において、1A,1Bは一対のツマ
ミで、このツマミ1A,1Bは平板状の絶縁体2
A,2B内にバネ性を有する複数本の導体3を並
列に埋設し、絶縁体2A,2Bの下端から突出し
た導体3の端部を触針3a,3bとしたものであ
る。上記の両ツマミ1Aと1Bは中央部を、連結
体4を介して支軸5により連結し、両ツマミ1
A,1Bの触針3a,3bを開閉自在とする。そ
して、両触針3a,3bはその先端部が互に内側
に向くように折曲する。又、連結体4より上方の
両ツマミ1A,1B間には圧縮形のバネ6を介在
して、両触針3a,3bを常に内方向に付勢して
いる。更に、連結体4の中央部には2個の押え部
7を上下動自在に配置して、その先端部7aを両
触針3a,3bの中央に位置させると共に、該押
え部7にバネ8を設けて先端部7aを下方向に付
勢している。9は押え部7の上端部に嵌合したス
トツパ用の座金である。
In the above drawing, 1A and 1B are a pair of knobs, and these knobs 1A and 1B are connected to a flat insulator 2.
A plurality of conductors 3 having spring properties are buried in parallel in A and 2B, and the ends of the conductors 3 protruding from the lower ends of the insulators 2A and 2B are used as stylus 3a and 3b. The above-mentioned two knobs 1A and 1B are connected at the center by a support shaft 5 via a connecting body 4, and both knobs 1
The stylus A, 1B stylus 3a, 3b can be opened and closed freely. Then, both the stylus needles 3a and 3b are bent so that their tips face inward. Further, a compression spring 6 is interposed between the knobs 1A and 1B above the connecting body 4 to constantly urge both the stylus 3a and 3b inward. Further, two presser parts 7 are disposed in the center of the connecting body 4 so as to be movable up and down, and their tips 7a are positioned in the center of both the stylus 3a, 3b, and a spring 8 is attached to the presser parts 7. is provided to urge the tip portion 7a downward. Reference numeral 9 denotes a stopper washer fitted to the upper end of the presser portion 7.

10はプリント配線板で、11はLSI等の電子
部品、12は電子部品11のリード等の被接触体
である。
10 is a printed wiring board, 11 is an electronic component such as an LSI, and 12 is a contact object such as a lead of the electronic component 11.

次に、本考案の使用例について、第8図及び第
9図を参照して説明する。
Next, an example of the use of the present invention will be described with reference to FIGS. 8 and 9.

先ず、両ツマミ1A,1Bの上端部をつまみ内
方向に押圧力を加えると、バネ6の弾性力を抗し
て両触針3a,3bの間隔が広がる。次いで、両
触針3a,3bを電子部品11の被接触体12の
外側に対応させると共に、両触針3a,3bの先
端部をプリント配線板10の表面に当接すれば、
押え部7の先端部7aは電子部品11と当接しバ
ネ8の弾性力に抗して上昇する。そこで、両ツマ
ミ1A,1Bの押圧力を解除すれば、両触針3
a,3bの先端部は被接触体12を挾着し線的に
圧着すると共に、バネ8の復元力によつてツマミ
1A,1Bが少し上昇するので、両触針3a,3
bの先端部は被接触体12を摺動する。このよう
に触針3a,3bは被接触体12に対し線的に圧
着しながら摺動するので、被接触体12にフラツ
クス13が付着している場合には、触針3a,3
b自体が、このフラツクス13をかき落すことに
なり、フラツクス13による接触不良が無くな
る。
First, when the upper ends of the knobs 1A, 1B are pressed inward and a pressing force is applied inward, the distance between the stylus 3a, 3b increases against the elastic force of the spring 6. Next, if both the stylus needles 3a and 3b are made to correspond to the outside of the object to be contacted 12 of the electronic component 11, and the tips of both the stylus needles 3a and 3b are brought into contact with the surface of the printed wiring board 10,
The tip 7a of the holding portion 7 comes into contact with the electronic component 11 and rises against the elastic force of the spring 8. Therefore, if the pressing force of both knobs 1A and 1B is released, both stylus 3
The tips of the stylus a, 3b clamp the object 12 and press it linearly, and the knobs 1A, 1B rise slightly due to the restoring force of the spring 8, so that both the stylus 3a, 3
The tip of b slides on the object 12 to be contacted. In this way, the stylus 3a, 3b slides while linearly compressing the object 12, so if the flux 13 is attached to the object 12, the stylus 3a, 3b
b itself scrapes off this flux 13, eliminating poor contact caused by the flux 13.

尚、上記の実施例では複数本の触針3a,3b
が並列したものを示したが、この触針3a,3b
の数は単数でもよく、この場合にはラツピング端
子等のテストクリツプとして使用できる。又、押
え部7と、バネ8を用いたが、ゴムやスポンジ等
の弾性体を使用しても同様の効果が得られる。
In addition, in the above embodiment, a plurality of stylus needles 3a, 3b are used.
are shown in parallel, but these stylus 3a, 3b
The number may be singular, and in this case, it can be used as a test clip for wrapping terminals, etc. Further, although the presser portion 7 and the spring 8 are used, the same effect can be obtained by using an elastic body such as rubber or sponge.

本考案は叙上のように、絶縁体2A,2Bの端
部から触針3a,3bを突設した一対のツマミ1
A,1Bを支軸5により両触針3a,3bが開閉
自在なるよう連結すると共に、バネ6により両触
針3a,3bが閉成するよう付勢したテストクリ
ツプにおいて、上記の触針3a,3bの先端部を
互に内方向に折曲し、両ツマミ1A,1Bの中央
には電子部品11を圧着する押え部7を設けたの
で、触針3a,3bの先端部は電子部品11の被
接触体12に対して線的に圧着すると共に摺動す
る。従つて、被接触体12にフラツクス13が付
着していても、このフラツクス13を触針3a,
3b自体で除去するので、フラツクス13による
接触不良が皆無となり、フラツクス除去の作業が
不要となる。
As mentioned above, the present invention consists of a pair of knobs 1 with stylus 3a, 3b protruding from the ends of insulators 2A, 2B.
In a test clip in which both the stylus A and 1B were connected by a support shaft 5 so that both stylus needles 3a and 3b could be opened and closed, and both the stylus needles 3a and 3b were urged to close by a spring 6, the stylus needles 3a and 3b were The tips of the stylus 3b are bent inwardly, and a presser portion 7 for crimping the electronic component 11 is provided at the center of both knobs 1A, 1B. It linearly presses against the object 12 and slides on it. Therefore, even if the flux 13 is attached to the object to be contacted 12, this flux 13 can be removed by the stylus 3a,
Since the flux 3b itself is removed, there is no contact failure due to the flux 13, and there is no need for flux removal work.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来例のテストクリツプの正面図で、
第2図は同側面図、第3図及び第4図は従来例の
使用説明図、第5図は本考案に係るテストクリツ
プの正面図で、第6図は同側面図、第7図は同平
面図で、第8図及び第9図は本考案に係るテスト
クリツプの使用説明図である。 1A,1B……ツマミ、2A,2B……絶縁
体、3a,3b……触針、7……押え部、8……
バネ。
Figure 1 is a front view of a conventional test clip.
FIG. 2 is a side view of the same, FIGS. 3 and 4 are explanatory views of the conventional example, FIG. 5 is a front view of the test clip according to the present invention, FIG. 6 is a side view of the same, and FIG. In the same plan view, FIGS. 8 and 9 are illustrations for explaining the use of the test clip according to the present invention. 1A, 1B...knob, 2A, 2B...insulator, 3a, 3b...stylus, 7...presser section, 8...
Spring.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 絶縁体の端部から触針を突設した一対のツマミ
を支軸により触針が開閉自在なるよう連結すると
共に、バネにより両触針が閉成するよう付勢した
テストクリツプにおいて、上記両触針の先端部を
内方向に折曲し、両ツマミの中央には電子部品に
圧着する押え部を設けたことを特徴とするテスト
クリツプ。
In a test clip, a pair of knobs with stylus protruding from the end of an insulator were connected by a support shaft so that the stylus could be opened and closed, and a spring was used to urge both stylus needles to close. This test clip is characterized by having the tip of the needle bent inward, and a presser part for crimping electronic components in the center of both knobs.
JP11979882U 1982-08-06 1982-08-06 test clip Granted JPS5925473U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11979882U JPS5925473U (en) 1982-08-06 1982-08-06 test clip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11979882U JPS5925473U (en) 1982-08-06 1982-08-06 test clip

Publications (2)

Publication Number Publication Date
JPS5925473U JPS5925473U (en) 1984-02-17
JPS6311660Y2 true JPS6311660Y2 (en) 1988-04-05

Family

ID=30274801

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11979882U Granted JPS5925473U (en) 1982-08-06 1982-08-06 test clip

Country Status (1)

Country Link
JP (1) JPS5925473U (en)

Also Published As

Publication number Publication date
JPS5925473U (en) 1984-02-17

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