JPH0428068Y2 - - Google Patents

Description

[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to an electronic component inspection jig suitable for electrically inspecting an electronic component having terminals provided along its side surfaces.

(Prior technology) Highly densely arranged printed circuit board circuit patterns and ICs mounted on these circuit patterns
In order to test the electrical characteristics of other electronic components, various measurement tests are performed by simultaneously bringing a large number of contact probes into contact with a large number of appropriate test points on circuit patterns, electronic components, and the like.

(Problems to be solved by the invention) By the way, the conventional electronic component inspection jig moves the contact probe vertically relative to the printed circuit board, etc., as shown in Fig. 7, for example.
A contact probe is brought into contact with horizontal inspection points P, P, etc., such as the shoulders of a large number of terminals 2, 2, etc. of an electronic component 1, such as an IC. However, in recent years,
In some electronic components 3 such as ICs, terminals 4, 4, . . . are provided closely along the electronic component 3 from the side surface to the bottom surface of the main body of the electronic component 3, as shown in FIG. This is suitable for bonding the electronic component 3 to the printed circuit board with adhesive, and
This is to achieve even higher density packaging. Here, with the conventional electronic component inspection jig, there is a problem in that the contact probe cannot be brought into contact with the terminals 4, 4 of the electronic component 3 as shown in FIG. 8, and measurement and inspection cannot be performed.

The purpose of this invention was to solve the above-mentioned problems with the conventional electronic component inspection jig. To provide an electronic component inspection jig that does not crush and destroy components.

(Means for Solving the Problem) In order to achieve the above object, the electronic component inspection jig of the present invention is a movable inspection jig that moves through a recess into which an electronic component having a large number of terminals can be inserted and fitted. elastic contact members are arranged on the inner periphery of the recess facing the side surface of the electronic component so as to be in elastic contact with the terminals of the electronic component from the lateral direction, and the movable inspection jig is slid. The electronic component is arranged so as to be movable up and down so as not to be separated from the dynamic support base, and is elastically biased in the direction of separation by a coil spring, and a conductive telescoping probe that is vertically extendable and retractable is brought into contact with the elastic member. The electronic component is fitted into the recess by relative movement in the proximal direction with the sliding support base, and the elastic contact member is brought into elastic contact with the terminal from the lateral direction, thereby making a conductive connection via the conductive telescoping probe. is configured to do so.

(Function) A recess into which an electronic component can be inserted and fitted is formed in the movable inspection jig, and elastic contact members are arranged on the inner periphery of the recess so as to make elastic contact from the lateral direction, corresponding to each of the many terminals of the electronic component. Since the movable inspection jig was installed on the sliding support base so that it could move up and down and was elastically biased in the separation direction, the sliding support base could be relatively moved to fit the electronic component into the recess. , elastic contact members can be brought into elastic contact with the terminals of electronic components from the lateral direction, and by appropriately connecting these elastic contact members to an inspection device, it is possible to measure electronic components with terminals provided along the sides. Can be inspected. Moreover, the moving inspection jig and the sliding support base can absorb the relative movement distance that is longer than required to fit the electronic component into the recess by being close to each other against the elastic force, thereby crushing the electronic component. There is nothing to destroy. Furthermore, since the conductive telescopic probe, which can be expanded and contracted up and down, is brought into contact with the elastic contact member to establish a conductive connection, the elastic contact member can be evenly pressed by the conductive telescopic probe, and the movable inspection jig and sliding support are connected. Vertical movement can be performed smoothly without applying force such as prying when moving relative to the base.

(Description of Embodiments) Hereinafter, embodiments of the present invention will be described with reference to FIGS. 1 to 3. FIG. 1 is a plan view of a sliding support base constituting the electronic component inspection jig of the present invention, and FIG. 2 is a cross-sectional view of the electronic component inspection jig of the present invention taken along line A-A in FIG. FIG. 3 is a cross-sectional view of
FIG. 3 is a partially cutaway perspective view of the conductive terminal tongue piece and frame of FIG. 2;

1 to 3, the electronic component inspection jig 10 has a support hole 1 in the center of a sliding support base 11.
A support column 13 having an enlarged portion at the head is inserted through the support hole 12 and planted in the movable inspection jig 20, and the movable inspection jig 20 is attached to a sliding support base. 11 so as to be vertically movable with an appropriate movement width so as not to separate. In addition, the sliding support base 11
Positioning holes 14, 14 are bored in the movable inspection jig 20, and the upper portions of the positioning pins 15, 15 inserted into the movable inspection jig 20 are inserted into the positioning holes 14, 14 so as to be vertically slidable, and the movable inspection jig 20 is slid. It is possible to move only in the vertical direction with respect to the support base 11 without shifting in the lateral direction. Further, bottomed holes 16, 16 are provided on the lower surface of the sliding support base 11, and these bottomed holes 16, 1
6 and the moving inspection jig 20, a coil spring 17,
17 is contracted to elastically urge the movable inspection jig 20 downward from the sliding support base 11 in the separation direction.

The movable inspection jig 20 has a frame body 22 made of insulating resin fixed to a jig base 21 made of insulating resin with screws or the like. The inner circumferential shape of this frame 22 is formed to be slightly larger than the planar shape of the electronic component 3 so as to surround the side periphery of the electronic component 3, and is formed to penetrate in the vertical direction, and the inner circumferential shape of the lower part is enlarged. An enlarged portion 23 is provided, and grooves 25, 25, . The conductive terminal tongue pieces 26, 26, which are inserted into the grooves 25, 25, and held between the frame body 22 and the jig base 21, are made of a sheet metal having good conductivity and are elastic. It is bent at the inner end thereof and hangs down along the inner circumferential wall of the frame body 22 to form an inverted L-shape. Furthermore, the conductive terminal tongue pieces 26, 26
Arc-shaped abutting portions 27, 27 that protrude inwardly facing the enlarged portion 23 of the frame body 22 at the hanging ends of the...
form. Then, an insertion fixing member 28 made of insulating resin is inserted into the inside of the frame 22, and the hanging portions of the conductive terminal tongues 26, 26, . Clamp and fix the contact parts 27, 27... so that the positions do not shift. In addition, the jig base 21 and the insertion fixing member 2
8 and insert and fix the other ends of the positioning pins 15 and 15 to position the recess formed by the frame body 22 and the insertion fixing member 28 with respect to the sliding support base 11. Numerals 29 and 29 are setscrews for fixing the insertion fixing member 28 to the jig base 21.

Further, the conductive terminal tongue pieces 26 inserted into the grooves 25, 25, . . . in the jig base 21 of the movable inspection jig 20,
26... facing the probe insertion holes 30, 30...
are provided, and conductive telescopic probes 31, 31..., which are vertically extendable and retractable, are inserted and fixed into the sliding support base 11 in correspondence with the probe insertion holes 30, 30..., and are inserted into the conductive terminal tongue pieces 26, 26... bring it into contact. As is conventionally known, these conductive telescopic probes 31, 31... are provided in a conductive protective tube so that the plunger can slide freely so as not to fall off, and a coil spring enclosed in the protective tube makes the plunger elastic in the projecting direction. It has a structure in which the tip of the plunger is pressed into elastic contact with the conductive terminal tongue pieces 16, 16, . . . .
Then, lead wires 32, 32, . . . are soldered to the conductive telescopic probes 31, 31, .

The sliding support base 11 is moved relative to the electronic component 3 mounted on a printed circuit board or the like by moving the jig mounting base 34, which is fixed with screws 33, 33, in the proximity direction, to move the movable inspection jig 20. The electronic component 3 is inserted and fitted in the recess so as to surround it. Then, the conductive terminal tongue piece 2
The abutting parts 27, 27... of 6, 26... are enlarged parts 2
The terminals 3 are elastically deformed and come into elastic contact with the terminals 4, 4, . . . from the lateral direction. As a result, the terminals 4, 4, . Terminals 4, 4 along the side...
It is possible to measure and inspect the electronic component 3 provided with. Moreover, the relative movement distance in the proximity direction is longer than that required to fully insert and fit the electronic component 3 into the recess of the movable inspection jig 20.
7, the movable inspection jig 20 and the sliding support base 11 approach each other, and the conductive telescopic probe 3
1, 31... can be contracted and absorbed, and the electronic component 3 will not be crushed and destroyed. Furthermore, the elasticity of the conductive telescopic probes 31, 31... that come into elastic contact with the conductive terminal tongues 26, 26... is uniform, and the relative movement between the movable inspection jig 20 and the sliding support base 11 is caused by forces such as prying. Vertical movement can be performed smoothly without any interference.

4 to 6 show other embodiments of the electronic component inspection jig of the present invention. FIG. 4 is a longitudinal sectional view of another embodiment of the electronic component inspection jig of the present invention,
FIG. 5 is a sectional view of one embodiment of the contact pin, and FIG. 6 is a sectional view of another embodiment of the contact pin. In FIG. 4, the same members as those in FIGS. 1 to 3 are given the same reference numerals, and redundant explanations will be omitted.

In FIG. 4, the electronic component inspection jig 40 includes a movable inspection jig 50 arranged under the sliding support base 11 by the support pillar 13 so as to be able to move up and down with an appropriate movement width.
Further, the positioning pins 15, 15 allow movement only in the vertical direction without shifting in the lateral direction, and furthermore, the coil springs 17, 17 elastically bias it downward.

The movable inspection jig 50 has a recess 52 formed on the lower surface of an inspection jig stand 51 molded with insulating resin, into which the electronic component 3 can be inserted and fitted, and which surrounds the lateral periphery, and is opposed to the electronic component 3. On the inner periphery of the recess 52, contact pins 53, 53, .
Array. These contact pins 53, 53...
For example, as shown in FIG. 5, a coil spring 55 is enclosed in a metal outer cylinder 54, and the elasticity of the coil spring 55 causes a steel ball 56 to partially protrude from a small hole provided at one end of the outer cylinder 54. The steel ball 56 is elastically biased so as to come into contact with the terminals 4, 4, . . . of the electronic component 3. Alternatively, as shown in FIG. 6, a protrusion member 57 that protrudes from a small hole provided at one end of the outer cylinder 54 is elastically biased by a coil spring 55, and this protrusion member 57 is elastically applied to the terminals 4, 4, . It is designed so that it is in contact with the

Furthermore, probe insertion holes 58, 58... are provided in the inspection jig stand 51 of the movable inspection jig 50 facing the contact pins 53, 53..., and probe insertion holes 58, 58... Conductive telescopic probes 31, 31, which are vertically telescopic, are mounted on the support base 11.
is inserted and fixed, and brought into contact with the contact pins 53, 53...

In this configuration, the jig mounting base 34 on which the sliding support base 11 is fixed to the electronic component 3 mounted on a printed circuit board or the like is relatively moved in the proximity direction to fit into the recess 52 of the movable inspection jig 50. The electronic component 3 is inserted and fitted. Then, the contact pin 53,
The steel balls 56, 56... or the protruding members 57, 57... of 53... come into elastic contact with the terminals 4, 4... of the electronic component 3, respectively, thereby connecting the terminals 4, 4... to the contact pins 53, 53... and conductive telescopic probe 31,3
1... and lead wires 32, 32... can be electrically connected to the inspection device. Moreover, the relative movement distance of the jig mounting base 34 is longer than necessary for the moving inspection jig 5.
0 and the sliding support base 11 come close to each other, the conductive telescopic probes 31, 31... can be contracted and absorbed, and the electronic component 3 will not be crushed and destroyed. Here, the steel balls 56, 56... of the contact pins 53, 53... or the protruding members 57, 57...
... is only capable of reciprocating movement in the protrusion direction, and by positioning the movable inspection jig 50 in the recess 52 with respect to the electronic component 3, the contact pins 53, 53... can be reliably brought into elastic contact with the terminals 4, 4... be able to.

In the above embodiment, the conductive terminal tongue pieces 26, 26... and the contact pins 53, 53... are shown as elastic contact members that come into elastic contact with the terminals 4, 4... of the electronic component 3 from the lateral direction. However, it is of course not limited to these. In addition, in the above embodiment, the conductive telescopic probe 31 is mounted on the sliding support base 11.
31... was fixed, but the movable inspection jig 20, 50
Conductive telescopic probes 31, 31... electrically connected to the conductive terminal tongues 26, 26... or contact pins 53, 53... are fixed as appropriate, and the terminal pieces to which the lead wires 32, 32... are connected are fixed. It may also be configured such that it is fixed to the sliding support base 11 and the conductive telescoping probes 31, 31, . . . are brought into contact with this terminal piece. Further, the object to be measured and inspected by the electronic component inspection jig of the present invention may be any electronic component having terminals along its side surface, and is of course not limited to ICs.

(Effect of the invention) As explained above, according to the electronic component inspection jig of the present invention, a recess into which an electronic component can be inserted and fitted is formed in the movable inspection jig, and a large number of electronic components are mounted on the inner periphery of this recess. The elastic contact members are arranged so as to make elastic contact from the lateral direction corresponding to the terminals of the electronic By relatively moving the sliding support base so as to fit the component into the recess, the elastic contact members can be brought into elastic contact with the terminals of the electronic component from the lateral direction, and the elastic members can be connected to the inspection device as appropriate. By making a conductive connection to the terminal, it is possible to measure and inspect an electronic component provided with terminals along the side surface.
Moreover, the moving inspection jig and the sliding support base can absorb the relative movement distance that is longer than required to fit the electronic component into the recess by being close to each other against the elastic force, thereby crushing the electronic component. There is nothing to destroy. Furthermore, since the conductive telescopic probe, which can be expanded and contracted up and down, is brought into contact with the elastic contact member to establish a conductive connection, the conductive telescopic probe can be evenly pressed against the elastic contact member, and the movable inspection jig and sliding support are connected. It has the excellent effect of being able to smoothly move up and down without applying force such as prying when moving relative to the base.

[Brief explanation of the drawing]

FIG. 1 is a plan view of a sliding support base constituting the electronic component inspection jig of the present invention, and FIG.
3 is a cross-sectional view of the electronic component inspection jig of the present invention taken along line A-A in the figure; FIG. 3 is a partially cutaway perspective view of the conductive terminal tongue piece and frame of FIG. The figure is a longitudinal sectional view of another embodiment of the electronic component inspection jig of the present invention, FIG. 5 is a sectional view of one embodiment of the contact pin, and FIG. 6 is a sectional view of another embodiment of the contact pin. FIG. 7 is a cross-sectional view of an embodiment, and FIG. 7 is a perspective view of an electronic component such as an IC with terminals protruding from the side. FIG. FIG. 2 is a perspective view of an electronic component such as an IC along which terminals are provided. 1, 3...Electronic component, 2, 4...Terminal, 10,
40...Electronic component inspection jig, 11...Sliding support base, 13...Support column, 17...Coil spring, 2
0,50...Moving inspection jig, 21...Jig base,
22...Frame body, 26...Continuity terminal tongue piece, 30,5
8... Probe insertion hole, 31... Conductive telescopic probe, 51... Inspection jig stand, 52... Recess, 53...
...Contact pin.

Claims (1)

[Scope of utility model registration request] A movable inspection jig is formed with a recess into which an electronic component with a large number of terminals can be inserted and fitted along the side.
Elastic contact members are arranged on the inner periphery of the recess facing the side surface of the electronic component so as to be in elastic contact with the terminals of the electronic component from the lateral direction, and the movable inspection jig is mounted on a sliding support base. The electrically conductive telescopic probe, which can be vertically extended and retracted, is brought into contact with the elastic contact member, and the electronic component and the sliding support Fitting the electronic component into the recess by relative movement in a proximal direction with the base, and bringing the elastic member into elastic contact with the terminal from a lateral direction;
An electronic component inspection jig, characterized in that it is configured to be electrically connected via the conductive telescoping probe.