JPH0480349B2 - - Google Patents

Info

Publication number
JPH0480349B2
JPH0480349B2 JP58105715A JP10571583A JPH0480349B2 JP H0480349 B2 JPH0480349 B2 JP H0480349B2 JP 58105715 A JP58105715 A JP 58105715A JP 10571583 A JP10571583 A JP 10571583A JP H0480349 B2 JPH0480349 B2 JP H0480349B2
Authority
JP
Japan
Prior art keywords
semiconductor device
external connection
test
connection terminal
electrostatic breakdown
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58105715A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59231458A (ja
Inventor
Minoru Isaka
Kenji Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Microcomputer System Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Microcomputer System Ltd, Hitachi Ltd filed Critical Hitachi Microcomputer System Ltd
Priority to JP58105715A priority Critical patent/JPS59231458A/ja
Publication of JPS59231458A publication Critical patent/JPS59231458A/ja
Publication of JPH0480349B2 publication Critical patent/JPH0480349B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP58105715A 1983-06-15 1983-06-15 半導体装置の静電破壊試験方法 Granted JPS59231458A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58105715A JPS59231458A (ja) 1983-06-15 1983-06-15 半導体装置の静電破壊試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58105715A JPS59231458A (ja) 1983-06-15 1983-06-15 半導体装置の静電破壊試験方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2155227A Division JPH0315773A (ja) 1990-06-15 1990-06-15 半導体装置用静電破壊試験装置

Publications (2)

Publication Number Publication Date
JPS59231458A JPS59231458A (ja) 1984-12-26
JPH0480349B2 true JPH0480349B2 (ko) 1992-12-18

Family

ID=14415028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58105715A Granted JPS59231458A (ja) 1983-06-15 1983-06-15 半導体装置の静電破壊試験方法

Country Status (1)

Country Link
JP (1) JPS59231458A (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6073375A (ja) * 1983-09-30 1985-04-25 Oki Electric Ind Co Ltd 半導体装置の試験方法
JPS62145170U (ko) * 1986-03-07 1987-09-12
JPH0711556B2 (ja) * 1986-04-11 1995-02-08 沖電気工業株式会社 静電耐圧試験方法及びその装置
US4806857A (en) * 1986-04-11 1989-02-21 Oki Electric Industry Co., Ltd. Apparatus for testing semiconductor devices
JP2572816B2 (ja) * 1988-06-10 1997-01-16 株式会社日立製作所 静電破壊試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780577A (en) * 1980-11-06 1982-05-20 Mitsubishi Electric Corp Testing method of semiconductor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780577A (en) * 1980-11-06 1982-05-20 Mitsubishi Electric Corp Testing method of semiconductor

Also Published As

Publication number Publication date
JPS59231458A (ja) 1984-12-26

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