JPH0468766B2 - - Google Patents

Info

Publication number
JPH0468766B2
JPH0468766B2 JP57227086A JP22708682A JPH0468766B2 JP H0468766 B2 JPH0468766 B2 JP H0468766B2 JP 57227086 A JP57227086 A JP 57227086A JP 22708682 A JP22708682 A JP 22708682A JP H0468766 B2 JPH0468766 B2 JP H0468766B2
Authority
JP
Japan
Prior art keywords
mask
alignment
linear
image signal
alignment mark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57227086A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59119836A (ja
Inventor
Tetsuzo Tanimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57227086A priority Critical patent/JPS59119836A/ja
Publication of JPS59119836A publication Critical patent/JPS59119836A/ja
Publication of JPH0468766B2 publication Critical patent/JPH0468766B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Control Of Position Or Direction (AREA)
JP57227086A 1982-12-27 1982-12-27 アライメント方法 Granted JPS59119836A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57227086A JPS59119836A (ja) 1982-12-27 1982-12-27 アライメント方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57227086A JPS59119836A (ja) 1982-12-27 1982-12-27 アライメント方法

Publications (2)

Publication Number Publication Date
JPS59119836A JPS59119836A (ja) 1984-07-11
JPH0468766B2 true JPH0468766B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-11-04

Family

ID=16855279

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57227086A Granted JPS59119836A (ja) 1982-12-27 1982-12-27 アライメント方法

Country Status (1)

Country Link
JP (1) JPS59119836A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Also Published As

Publication number Publication date
JPS59119836A (ja) 1984-07-11

Similar Documents

Publication Publication Date Title
US20080304734A1 (en) Alignment correction prio to image sampling in inspection systems
JPH01191005A (ja) マーク検知装置及び方法
JP2985323B2 (ja) パターン検査方法及びその装置
JP2657505B2 (ja) マーク位置検出装置およびマーク配置方法
US4504148A (en) System for detecting a signal for aligning two bodies and signal _processing method
US4515481A (en) Apparatus for processing a signal for aligning
US4553845A (en) Device for and method of aligning two bodies
US4545684A (en) Alignment mark detecting apparatus and method
JPS6121671A (ja) 原稿読み取り装置
JPH0468766B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH04295748A (ja) パターン検査装置
JPH03201454A (ja) 半導体装置の位置合わせ方法
JPS63168708A (ja) 回転位置決め装置
JPH0160766B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS6356702B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH04186717A (ja) 位置合わせ装置、露光装置、及びそれらを用いた半導体素子の製造方法
JPH07151514A (ja) 重ね合わせ精度測定方法および測定装置
JP2986130B2 (ja) マークの検出処理方法
JPH04316346A (ja) パターン認識方法
JPH09115815A (ja) 位置検出方法および装置
JPS6037731A (ja) 縮小投影露光装置
JPS5984523A (ja) 位置合せマ−ク判別方式
JP2926118B2 (ja) 欠陥検出方法
JPS62137988A (ja) 2値化画像処理方法
JPS61237424A (ja) 位置合せ装置