JPH0464572B2 - - Google Patents
Info
- Publication number
- JPH0464572B2 JPH0464572B2 JP60284187A JP28418785A JPH0464572B2 JP H0464572 B2 JPH0464572 B2 JP H0464572B2 JP 60284187 A JP60284187 A JP 60284187A JP 28418785 A JP28418785 A JP 28418785A JP H0464572 B2 JPH0464572 B2 JP H0464572B2
- Authority
- JP
- Japan
- Prior art keywords
- package
- sensing fluid
- fluid
- cavity
- sensing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Examining Or Testing Airtightness (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28418785A JPS62147337A (ja) | 1985-12-17 | 1985-12-17 | 電子部品パッケージの密閉度試験方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28418785A JPS62147337A (ja) | 1985-12-17 | 1985-12-17 | 電子部品パッケージの密閉度試験方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62147337A JPS62147337A (ja) | 1987-07-01 |
JPH0464572B2 true JPH0464572B2 (enrdf_load_stackoverflow) | 1992-10-15 |
Family
ID=17675298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28418785A Granted JPS62147337A (ja) | 1985-12-17 | 1985-12-17 | 電子部品パッケージの密閉度試験方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62147337A (enrdf_load_stackoverflow) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007218745A (ja) * | 2006-02-16 | 2007-08-30 | Denso Corp | 気密漏れ検査方法及び装置 |
JP4895184B2 (ja) * | 2006-07-31 | 2012-03-14 | 京セラキンセキ株式会社 | 電子部品パッケージの気密検査方法と気密検査装置 |
JP5194243B2 (ja) * | 2007-09-28 | 2013-05-08 | アキム株式会社 | センサ用リーク検査装置およびセンサのリーク検査方法 |
US11885716B2 (en) * | 2017-10-10 | 2024-01-30 | Mitsubishi Electric Corporation | Test method of a semiconductor device and manufacturing method of a semiconductor device |
JP6381848B1 (ja) * | 2018-06-06 | 2018-08-29 | 三菱電機株式会社 | 半導体装置の試験方法、および半導体装置の製造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5091378A (enrdf_load_stackoverflow) * | 1973-12-12 | 1975-07-22 | ||
JPS56157659U (enrdf_load_stackoverflow) * | 1980-04-22 | 1981-11-25 | ||
JPS58140621A (ja) * | 1982-02-16 | 1983-08-20 | Rigaku Denki Kogyo Kk | 放射線検出用シンチレ−タ検査装置 |
JPS6010131A (ja) * | 1983-06-30 | 1985-01-19 | Fujitsu Ltd | 漏洩ガスの検知方法 |
JPS60176156U (ja) * | 1984-04-30 | 1985-11-21 | 株式会社島津製作所 | リ−クテスト装置 |
-
1985
- 1985-12-17 JP JP28418785A patent/JPS62147337A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS62147337A (ja) | 1987-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4920785A (en) | Hermeticity testing method and system | |
CN107677335B (zh) | 测量物体体积和孔隙率的装置和方法及真空气体密封方法 | |
US8544315B2 (en) | At rest vacuum state for vacuum decay leak testing method and system | |
US4918975A (en) | Method and apparatus for testing fluid-filled systems for leaks | |
JP6457813B2 (ja) | 検査ガスの添加無しの、寸法的に安定な/緩んだパッケージの漏れの迅速な検出 | |
US5131263A (en) | Device and a method for detecting leaks | |
KR0171635B1 (ko) | 가스 누출 검사 장치 및 방법 | |
WO2006093935A2 (en) | Apparatus and process for leak-testing and qualification of fluid dispensing vessels | |
US3578758A (en) | Orifice gross leak tester | |
KR102574722B1 (ko) | 동적 진공 감쇠 누출 탐지 방법 및 장치 | |
CN101151514A (zh) | 用于流体分配容器的泄漏测试和鉴定的设备及方法 | |
EP3431949B1 (en) | Leakage inspection method and leakage inspection device for container to be inspected | |
CA2100739C (en) | Leakage measurement into a gas-charged container | |
CN109932141A (zh) | 一种用于航天低温复合材料贮箱的渗漏性测试装置 | |
JPH0464572B2 (enrdf_load_stackoverflow) | ||
US3805595A (en) | Apparatus for testing leakage | |
CN209570302U (zh) | 一种用于航天低温复合材料构件的渗漏性测试装置 | |
Davy | Model calculations for maximum allowable leak rates of hermetic packages | |
CN109932140A (zh) | 一种用于航天低温复合材料构件的渗漏性测试装置 | |
CN209570303U (zh) | 一种用于航天低温复合材料贮箱的渗漏性测试装置 | |
JP4288006B2 (ja) | 比較的薄い壁を有する試験体で積分法によるリークテストを実施する方法 | |
JPH09144998A (ja) | ハロゲン化物ガス漏洩検査装置 | |
JPH01131428A (ja) | 半導体装置の気密度の測定方法 | |
Niemeyer | LEAK TESTING ENCAPSULATED RADIOACTIVE SOURCES. | |
JPH0253736B2 (enrdf_load_stackoverflow) |