JPH0460299B2 - - Google Patents
Info
- Publication number
- JPH0460299B2 JPH0460299B2 JP61311809A JP31180986A JPH0460299B2 JP H0460299 B2 JPH0460299 B2 JP H0460299B2 JP 61311809 A JP61311809 A JP 61311809A JP 31180986 A JP31180986 A JP 31180986A JP H0460299 B2 JPH0460299 B2 JP H0460299B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- particle beam
- introduction tube
- primary particle
- irradiation surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000007788 liquid Substances 0.000 claims description 20
- 239000011164 primary particle Substances 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 29
- 150000002500 ions Chemical class 0.000 description 12
- 229910001220 stainless steel Inorganic materials 0.000 description 7
- 239000010935 stainless steel Substances 0.000 description 7
- 239000012488 sample solution Substances 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 4
- 238000004949 mass spectrometry Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61311809A JPS63168957A (ja) | 1986-12-27 | 1986-12-27 | 質量分析装置用イオン源 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61311809A JPS63168957A (ja) | 1986-12-27 | 1986-12-27 | 質量分析装置用イオン源 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63168957A JPS63168957A (ja) | 1988-07-12 |
JPH0460299B2 true JPH0460299B2 (enrdf_load_stackoverflow) | 1992-09-25 |
Family
ID=18021683
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61311809A Granted JPS63168957A (ja) | 1986-12-27 | 1986-12-27 | 質量分析装置用イオン源 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63168957A (enrdf_load_stackoverflow) |
-
1986
- 1986-12-27 JP JP61311809A patent/JPS63168957A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS63168957A (ja) | 1988-07-12 |
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