JPH0460201B2 - - Google Patents
Info
- Publication number
- JPH0460201B2 JPH0460201B2 JP15679084A JP15679084A JPH0460201B2 JP H0460201 B2 JPH0460201 B2 JP H0460201B2 JP 15679084 A JP15679084 A JP 15679084A JP 15679084 A JP15679084 A JP 15679084A JP H0460201 B2 JPH0460201 B2 JP H0460201B2
- Authority
- JP
- Japan
- Prior art keywords
- pins
- light
- pin
- bending
- bent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005452 bending Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 10
- 230000000007 visual effect Effects 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 238000003780 insertion Methods 0.000 description 4
- 230000037431 insertion Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15679084A JPS6135302A (ja) | 1984-07-27 | 1984-07-27 | ピンの曲りを検出する方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15679084A JPS6135302A (ja) | 1984-07-27 | 1984-07-27 | ピンの曲りを検出する方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6135302A JPS6135302A (ja) | 1986-02-19 |
JPH0460201B2 true JPH0460201B2 (ko) | 1992-09-25 |
Family
ID=15635359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15679084A Granted JPS6135302A (ja) | 1984-07-27 | 1984-07-27 | ピンの曲りを検出する方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6135302A (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0776754B2 (ja) * | 1986-06-25 | 1995-08-16 | 日立テクノエンジニアリング株式会社 | Icリード曲り検出方法 |
JPS63281007A (ja) * | 1987-05-13 | 1988-11-17 | Sumitomo Metal Mining Co Ltd | 不良品アノ−ドの検出方法 |
JP6848425B2 (ja) * | 2016-12-27 | 2021-03-24 | 富士通株式会社 | 線形部品検査装置及び線形部品検査方法 |
-
1984
- 1984-07-27 JP JP15679084A patent/JPS6135302A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6135302A (ja) | 1986-02-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0501683B1 (en) | Technique for enhanced two-dimensional imaging | |
US5125741A (en) | Method and apparatus for inspecting surface conditions | |
US5101442A (en) | Three-dimensional imaging technique using sharp gradient of illumination | |
KR100605051B1 (ko) | 대상물을 외관적으로 검사하기 위한 장치, 공구 및 방법 | |
JP2011158363A (ja) | Pga実装基板の半田付け検査装置 | |
JPH0514904U (ja) | 異物検査装置 | |
KR102069173B1 (ko) | 플렉서블 기판 찍힘 불량 검출 장치 | |
JP3480176B2 (ja) | ガラス基板の表裏欠陥識別方法 | |
JPH0460201B2 (ko) | ||
JPH07117388B2 (ja) | 外観検査方法 | |
JPH0511573B2 (ko) | ||
JPS59192902A (ja) | 基板取付部品の位置検査装置 | |
JPH04221705A (ja) | 外観検査装置 | |
JPH0756446B2 (ja) | 棒状突起物体の検査方法 | |
JPH0711410B2 (ja) | 部品検査装置 | |
GB2364119A (en) | Circuit board testing | |
JP2525261B2 (ja) | 実装基板外観検査装置 | |
JP2739739B2 (ja) | 位置ずれ検査装置 | |
JP3399468B2 (ja) | 実装済みプリント基板の検査装置 | |
JP3754144B2 (ja) | リード浮きの検査方法 | |
JP3232811B2 (ja) | 実装済みプリント基板の検査方法 | |
KR100204827B1 (ko) | 아이씨 패키지의 리드핀 검사장치 및 검사방법 | |
JPS62299706A (ja) | パタ−ン検査装置 | |
JPH05187846A (ja) | 半導体集積装置リードの検査装置 | |
JPH01202608A (ja) | Icのリード曲がり検査装置 |