JPH0452905B2 - - Google Patents
Info
- Publication number
- JPH0452905B2 JPH0452905B2 JP59019782A JP1978284A JPH0452905B2 JP H0452905 B2 JPH0452905 B2 JP H0452905B2 JP 59019782 A JP59019782 A JP 59019782A JP 1978284 A JP1978284 A JP 1978284A JP H0452905 B2 JPH0452905 B2 JP H0452905B2
- Authority
- JP
- Japan
- Prior art keywords
- differential amplifier
- voltage
- stage
- transistor
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 7
- 230000003321 amplification Effects 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59019782A JPS60164269A (ja) | 1984-02-06 | 1984-02-06 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59019782A JPS60164269A (ja) | 1984-02-06 | 1984-02-06 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60164269A JPS60164269A (ja) | 1985-08-27 |
JPH0452905B2 true JPH0452905B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-08-25 |
Family
ID=12008893
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59019782A Granted JPS60164269A (ja) | 1984-02-06 | 1984-02-06 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60164269A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6197581A (ja) * | 1984-10-19 | 1986-05-16 | Fujitsu Ltd | 論理集積回路及び論理集積回路システム |
JP2588164B2 (ja) * | 1985-09-30 | 1997-03-05 | 株式会社東芝 | 反転増幅器 |
JP2596041Y2 (ja) * | 1991-12-20 | 1999-06-07 | 横河電機株式会社 | Icテスタ |
JP3490165B2 (ja) * | 1994-12-15 | 2004-01-26 | 株式会社アドバンテスト | ドライバ回路 |
JPH1166890A (ja) * | 1997-08-12 | 1999-03-09 | Mitsubishi Electric Corp | 半導体集積回路装置 |
-
1984
- 1984-02-06 JP JP59019782A patent/JPS60164269A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60164269A (ja) | 1985-08-27 |
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