JPH045123B2 - - Google Patents

Info

Publication number
JPH045123B2
JPH045123B2 JP58147248A JP14724883A JPH045123B2 JP H045123 B2 JPH045123 B2 JP H045123B2 JP 58147248 A JP58147248 A JP 58147248A JP 14724883 A JP14724883 A JP 14724883A JP H045123 B2 JPH045123 B2 JP H045123B2
Authority
JP
Japan
Prior art keywords
signal
edge
slicer
video signal
edge position
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58147248A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6038609A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP58147248A priority Critical patent/JPS6038609A/ja
Publication of JPS6038609A publication Critical patent/JPS6038609A/ja
Publication of JPH045123B2 publication Critical patent/JPH045123B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP58147248A 1983-08-10 1983-08-10 板形状測定装置 Granted JPS6038609A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58147248A JPS6038609A (ja) 1983-08-10 1983-08-10 板形状測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58147248A JPS6038609A (ja) 1983-08-10 1983-08-10 板形状測定装置

Publications (2)

Publication Number Publication Date
JPS6038609A JPS6038609A (ja) 1985-02-28
JPH045123B2 true JPH045123B2 (enExample) 1992-01-30

Family

ID=15425930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58147248A Granted JPS6038609A (ja) 1983-08-10 1983-08-10 板形状測定装置

Country Status (1)

Country Link
JP (1) JPS6038609A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0749937B2 (ja) * 1988-03-22 1995-05-31 工業技術院長 形状測定方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50111941A (enExample) * 1974-02-12 1975-09-03
JPS5744806A (en) * 1980-08-29 1982-03-13 Sumitomo Metal Ind Ltd Method of two-dimensional measurement for pattern
JPS58160305U (ja) * 1982-04-20 1983-10-25 株式会社東芝 形状検出装置

Also Published As

Publication number Publication date
JPS6038609A (ja) 1985-02-28

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