JPH0450623Y2 - - Google Patents
Info
- Publication number
- JPH0450623Y2 JPH0450623Y2 JP17918887U JP17918887U JPH0450623Y2 JP H0450623 Y2 JPH0450623 Y2 JP H0450623Y2 JP 17918887 U JP17918887 U JP 17918887U JP 17918887 U JP17918887 U JP 17918887U JP H0450623 Y2 JPH0450623 Y2 JP H0450623Y2
- Authority
- JP
- Japan
- Prior art keywords
- hda
- model
- management information
- memory
- disk assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 238000007726 management method Methods 0.000 description 17
- 101100123574 Arabidopsis thaliana HDA19 gene Proteins 0.000 description 4
- 101150083200 HDA1 gene Proteins 0.000 description 4
- 101100297422 Schizosaccharomyces pombe (strain 972 / ATCC 24843) phd1 gene Proteins 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000011990 functional testing Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 101100123577 Caenorhabditis elegans hda-1 gene Proteins 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17918887U JPH0450623Y2 (US06312121-20011106-C00033.png) | 1987-11-24 | 1987-11-24 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17918887U JPH0450623Y2 (US06312121-20011106-C00033.png) | 1987-11-24 | 1987-11-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0181782U JPH0181782U (US06312121-20011106-C00033.png) | 1989-05-31 |
JPH0450623Y2 true JPH0450623Y2 (US06312121-20011106-C00033.png) | 1992-11-30 |
Family
ID=31470764
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17918887U Expired JPH0450623Y2 (US06312121-20011106-C00033.png) | 1987-11-24 | 1987-11-24 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0450623Y2 (US06312121-20011106-C00033.png) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2897797B2 (ja) * | 1992-09-17 | 1999-05-31 | 株式会社クボタ | 自動販売機の生産時期管理装置 |
-
1987
- 1987-11-24 JP JP17918887U patent/JPH0450623Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPH0181782U (US06312121-20011106-C00033.png) | 1989-05-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS58196100A (ja) | 多素子組込製品 | |
JPH0450623Y2 (US06312121-20011106-C00033.png) | ||
US6058335A (en) | Automated technique for manufacturing hard disk drive | |
US5872738A (en) | Semiconductor integrated circuit device for enabling easy confirmation of discrete information | |
US20030136840A1 (en) | Method and system for managing integrated circuit test programs using bar codes | |
KR100223651B1 (ko) | 제조공정 합격판정기 및 그를 이용한 제조공정방법 | |
KR100403040B1 (ko) | 하드 디스크 드라이브 제조공정의 수율향상 방법 | |
JP2583056B2 (ja) | Icテストシステム | |
JPH0447762Y2 (US06312121-20011106-C00033.png) | ||
JP2870001B2 (ja) | 論理回路パッケージ | |
JPS61105798A (ja) | P rom ic | |
JPH06119721A (ja) | 外部記憶装置 | |
JPH0312800B2 (US06312121-20011106-C00033.png) | ||
JPH01146394U (US06312121-20011106-C00033.png) | ||
JPH08160106A (ja) | 情報保持機能を持つicテスタ用テストボード | |
JPH03288373A (ja) | 記録媒体検査機能付き磁気ディスク装置 | |
JP2002022806A (ja) | 回路基板検査装置 | |
Rogers | A laboratory data acquisition system utilizing the SDS-920 computer | |
JPH0714033B2 (ja) | 複合集積回路の検査装置 | |
JPS63249978A (ja) | 磁気デイスク装置の検査方式 | |
DE19937575A1 (de) | Hauptleiterplatte | |
JPH02143542A (ja) | Icへのグレード別マーキング方法 | |
JPH0831247B2 (ja) | 記憶装置 | |
JPH04153852A (ja) | 記憶装置の試験方式 | |
US20060195841A1 (en) | Method and apparatus for scheduling maintenance and repair |