JPH04368137A - Packaging method for semiconductor element - Google Patents

Packaging method for semiconductor element

Info

Publication number
JPH04368137A
JPH04368137A JP14473491A JP14473491A JPH04368137A JP H04368137 A JPH04368137 A JP H04368137A JP 14473491 A JP14473491 A JP 14473491A JP 14473491 A JP14473491 A JP 14473491A JP H04368137 A JPH04368137 A JP H04368137A
Authority
JP
Japan
Prior art keywords
resin
semiconductor element
ultraviolet
cured
curable resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14473491A
Other languages
Japanese (ja)
Other versions
JP2966578B2 (en
Inventor
Koichiro Nakamura
中村 宏一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP14473491A priority Critical patent/JP2966578B2/en
Publication of JPH04368137A publication Critical patent/JPH04368137A/en
Application granted granted Critical
Publication of JP2966578B2 publication Critical patent/JP2966578B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To avoid the increse of cost and prevent the decrease of packaging density, when a semiconductor element is resin-sealed and packaged. CONSTITUTION:While ultraviolet-curing resin 5 is spread on the outer peripheral part S2 and the inner peripheral part S1 of a semiconductor element 2, firstly the outer peripheral part S2 only is irradiate with ultraviolet radiation and cured. Secondly the whole surface containing at least the inner peripheral part S1 is irradiated with ultraviolet radiation, and the whole part of the ultraviolet- curing resin 5 is cured.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、ICなどの半導体素子
を紫外線硬化樹脂で封止する半導体素子の実装方法に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for packaging semiconductor elements such as ICs by sealing them with ultraviolet curing resin.

【0002】0002

【従来の技術】ICなどの半導体素子を半導体装置とし
て完成させるには、チップ状の半導体素子を外部雰囲気
から保護するため、適当な保護材料でもって封止して実
装する必要がある。この保護材料としては通常、作業性
,コスト,気密性などの点で優れている樹脂が広く用い
られている。
2. Description of the Related Art In order to complete a semiconductor device such as an IC as a semiconductor device, it is necessary to seal and mount the chip-shaped semiconductor device with an appropriate protective material in order to protect it from the external atmosphere. As this protective material, resin is usually widely used because it is excellent in terms of workability, cost, airtightness, etc.

【0003】このような樹脂を用いて半導体素子を実装
する従来の方法として、予め樹脂の流出防止用のダム枠
を設けたリードフレームを用意し、このリードフレーム
の所望面に半導体素子を接続しさらにワイヤボンディン
グを行った後、トランスファモールド技術によって前記
半導体素子及び一部のリードフレームを含む領域を金型
で囲んで、この領域に樹脂を流し込む方法が実施されて
いる。
[0003] As a conventional method for mounting semiconductor elements using such resin, a lead frame is prepared in advance with a dam frame for preventing resin from flowing out, and a semiconductor element is connected to a desired surface of this lead frame. Furthermore, after wire bonding is performed, a method is implemented in which a region including the semiconductor element and a part of the lead frame is surrounded by a mold using a transfer molding technique, and a resin is poured into this region.

【0004】あるいは他の方法として、配線基板上に半
導体素子を接続しさらにワイヤボンディングを行った後
、半導体素子を完全に覆う厚さとなるように広い面積で
樹脂を塗布する方法が実施されている。
Another method is to connect a semiconductor element onto a wiring board, perform wire bonding, and then apply resin over a wide area to a thickness that completely covers the semiconductor element. .

【0005】[0005]

【発明が解決しようとする課題】ところで従来の半導体
素子の実装方法では、各々次のような問題が存在してい
る。
However, the following problems exist in each of the conventional semiconductor element mounting methods.

【0006】先ず、前者のリードフレームを用いて樹脂
をトランスファモールドする方法では、樹脂の流出防止
用のダム枠を含む複雑な形状のパターンにリードフレー
ムを加工しなければならないので、コストアップが避け
られない。
First, in the former method of transfer molding resin using a lead frame, the lead frame must be processed into a complicated pattern including a dam frame to prevent the resin from flowing out, which increases costs. I can't do it.

【0007】次に、後者の樹脂を塗布する方法では、半
導体素子を完全に覆うようにするために広い面積で樹脂
を塗布する必要があるので、実装密度が低下してしまう
ことになる。
Next, in the latter method of applying resin, it is necessary to apply the resin over a wide area in order to completely cover the semiconductor element, resulting in a reduction in packaging density.

【0008】本発明は以上のような問題に対処してなさ
れたもので、コストアップを避けると共に実装密度の低
下を防止するようにした半導体素子の実装方法を提供す
ることを目的とするものである。
The present invention has been made in response to the above-mentioned problems, and it is an object of the present invention to provide a method for mounting semiconductor elements that avoids an increase in cost and a decrease in packaging density. be.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するため
に本発明は、基板上に接続した半導体素子を紫外線硬化
樹脂で封止する半導体素子の実装方法において、前記半
導体素子の外周部及び内周部を覆うように紫外線硬化樹
脂を塗布しながら、前記外周部のみに紫外線を照射して
紫外線硬化樹脂を部分的に硬化する工程と、次に少なく
とも前記内周部の紫外線硬化樹脂に紫外線を照射して紫
外線硬化樹脂の全体を硬化する工程とを含むことを特徴
とするものである。
[Means for Solving the Problems] In order to achieve the above object, the present invention provides a semiconductor device mounting method in which a semiconductor device connected to a substrate is sealed with an ultraviolet curing resin. applying ultraviolet curable resin so as to cover the periphery, irradiating ultraviolet rays only to the outer periphery to partially cure the ultraviolet curable resin, and then applying ultraviolet rays to at least the inner periphery. The method is characterized by including a step of curing the entire ultraviolet curable resin by irradiating the resin.

【0010】0010

【作用】先ず、半導体素子の外周部及び内周部を覆うよ
うに紫外線硬化樹脂を塗布しながら、前記外周部のみに
紫外線を照射することにより、この部分の紫外線硬化樹
脂のみが部分的に硬化する。次に、少なくとも前記内周
部に紫外線を照射することにより、残りの部分の紫外線
硬化樹脂が硬化するので、結果として全体の紫外線硬化
樹脂が硬化する。これによって複雑な形状のパターンの
リードフレームは不要なのでコストアップを避けること
ができ、また、最小限の面積で紫外線硬化樹脂を塗布す
るので実装密度の低下を防止することができる。
[Operation] First, while applying ultraviolet curable resin to cover the outer and inner periphery of the semiconductor element, only the outer periphery is irradiated with ultraviolet rays, so that only the ultraviolet curable resin in this area is partially cured. do. Next, by irradiating at least the inner peripheral portion with ultraviolet rays, the remaining portion of the ultraviolet curable resin is cured, and as a result, the entire ultraviolet curable resin is cured. This eliminates the need for a lead frame with a complicated pattern, thereby avoiding an increase in cost, and since the ultraviolet curable resin is applied over a minimum area, it is possible to prevent a decrease in packaging density.

【0011】[0011]

【実施例】以下図面を参照して本発明の実施例を説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the present invention will be described below with reference to the drawings.

【0012】図1乃至図3は本発明の半導体素子の実装
方法を工程順に説明する断面図で、半導体素子としてI
Cチップを用いる例で示している。
FIGS. 1 to 3 are cross-sectional views illustrating the method of mounting a semiconductor element according to the present invention in the order of steps.
An example using a C chip is shown.

【0013】図1に示したように、所望の配線が施され
ている基板1に半導体素子2(ICチップ)を接続した
後、半導体素子2上の電極2Aと基板1上の配線間を金
線などのワイヤ3を用いてボンディングを行う。
As shown in FIG. 1, after a semiconductor element 2 (IC chip) is connected to a substrate 1 on which desired wiring is provided, gold is connected between the electrode 2A on the semiconductor element 2 and the wiring on the substrate 1. Bonding is performed using a wire 3 such as a wire.

【0014】続いて、図2に示したように、半導体素子
2の外周部S2及び内周部S1を覆うように紫外線硬化
樹脂5を塗布しながら、外周部S2のみに紫外線4を照
射する。これによって外周部S2に相当した紫外線硬化
樹脂5Aのみが部分的に硬化する。
Subsequently, as shown in FIG. 2, while applying the ultraviolet curing resin 5 to cover the outer circumferential portion S2 and the inner circumferential portion S1 of the semiconductor element 2, only the outer circumferential portion S2 is irradiated with ultraviolet rays 4. As a result, only the ultraviolet curing resin 5A corresponding to the outer peripheral portion S2 is partially cured.

【0015】この場合に紫外線硬化樹脂5を塗布しなが
ら紫外線を照射する樹脂塗布装置としては、図4及び図
5、あるいは図6に示したような構成の装置を用いるこ
とができる。
In this case, as a resin coating device for irradiating ultraviolet rays while coating the ultraviolet curable resin 5, an apparatus having a configuration as shown in FIGS. 4 and 5, or FIG. 6 can be used.

【0016】図4及び図5は第1の樹脂塗布装置7を示
す側面図及び平面図で、この第1の樹脂塗布装置7は、
筒状支持体8と、この筒状支持体8の環状空間部の底面
8Aで支持され前記外周面S2で焦点を結ぶリング状レ
ンズ9と、筒状支持体8の上部8Bで円周方向に沿って
支持されている複数の紫外線ランプ10と、筒状支持体
8の中央孔部11内に配置された樹脂ディスペンサ12
とから構成されている。
FIGS. 4 and 5 are a side view and a plan view showing the first resin coating device 7, and this first resin coating device 7 includes:
A cylindrical support 8, a ring-shaped lens 9 that is supported on the bottom surface 8A of the annular space of the cylindrical support 8 and focuses on the outer circumferential surface S2, and A plurality of ultraviolet lamps 10 are supported along the line, and a resin dispenser 12 is disposed within the central hole 11 of the cylindrical support 8.
It is composed of.

【0017】また、樹脂ディスペンサ12は、樹脂供給
源に接続された供給パイプ13と、供給された樹脂を貯
える貯留部14と、樹脂を排出するノズル部15とから
構成されている。
The resin dispenser 12 also includes a supply pipe 13 connected to a resin supply source, a storage section 14 for storing the supplied resin, and a nozzle section 15 for discharging the resin.

【0018】このような構成の第1の樹脂塗布装置7を
用い、図4及び図5のようにその樹脂ディスペンサ12
のノズル部15を半導体素子2のほぼ中央部の直上に位
置させた状態で、図示しない駆動部によってノズル部1
5から樹脂を排出させて、半導体素子2の外周部S2及
び内周部S1に塗布する。また、これと同時に、図示し
ない駆動回路によって前記複数の紫外線ランプ10を点
灯させて、外周部S2に紫外線を照射する。これによっ
て前記のように、この外周部S2に相当した紫外線硬化
樹脂5Aのみを硬化することができる。
Using the first resin applicator 7 having such a configuration, the resin dispenser 12 is installed as shown in FIGS. 4 and 5.
With the nozzle part 15 located directly above the substantially central part of the semiconductor element 2, the nozzle part 1 is moved by a drive part (not shown).
The resin is discharged from 5 and applied to the outer circumferential portion S2 and inner circumferential portion S1 of the semiconductor element 2. At the same time, the plurality of ultraviolet lamps 10 are turned on by a drive circuit (not shown) to irradiate the outer circumference S2 with ultraviolet rays. As a result, as described above, only the ultraviolet curable resin 5A corresponding to this outer peripheral portion S2 can be cured.

【0019】図6は第2の樹脂塗布装置17を示す斜視
図で、この第2の樹脂塗布装置17は、モータ18と、
このモータ18によってギヤ19を介して回転可能な円
板状支持体20と、この円板状支持体20の中央孔部2
1内に配置された樹脂ディスペンサ12と、円板状支持
体20を挿通する光ファイバ22が接続され円板状支持
体20と一体に回転可能な円筒状支持体23とから構成
されている。
FIG. 6 is a perspective view showing the second resin coating device 17, which includes a motor 18,
A disc-shaped support 20 rotatable by the motor 18 via a gear 19, and a central hole 2 of the disc-shaped support 20.
1, and a cylindrical support 23 which is connected to an optical fiber 22 that passes through the disc-shaped support 20 and is rotatable together with the disc-shaped support 20.

【0020】また、円筒上支持体23の中間部で支持さ
れ底部23Aの光ファイバ22の一端22Aで焦点を結
ぶレンズ24と、円筒状支持体23の上部23Bで支持
されている紫外線ランプ10とから構成されている。
Further, a lens 24 is supported at the middle part of the cylindrical support 23 and focuses on one end 22A of the optical fiber 22 at the bottom 23A, and an ultraviolet lamp 10 is supported at the upper part 23B of the cylindrical support 23. It consists of

【0021】このような構成の第2の樹脂塗布装置17
を用い、図6のようにその樹脂ディスペンサ12のノズ
ル部15を半導体素子2のほぼ中央部の直上に位置させ
た状態で、図示しない駆動部によりノズル部15から樹
脂を排出させて、半導体素子2の外周部S2及び内周部
S1に塗布する。また、これと同時に、図示しない駆動
回路によって前記紫外線ランプ10を点灯させて、光フ
ァイバ22の他端22Bから外周部S2に紫外線4を照
射する。さらに、これと同時に、モータ18によってギ
ヤ19を介して円板状支持体20を回転させる。
Second resin coating device 17 configured as above
As shown in FIG. 6, with the nozzle part 15 of the resin dispenser 12 positioned directly above the substantially central part of the semiconductor element 2, the resin is discharged from the nozzle part 15 by a drive part (not shown) to remove the semiconductor element. Coat the outer peripheral part S2 and inner peripheral part S1 of No. 2. At the same time, the ultraviolet lamp 10 is turned on by a drive circuit (not shown) to irradiate the outer peripheral portion S2 with ultraviolet rays 4 from the other end 22B of the optical fiber 22. Furthermore, at the same time, the disc-shaped support 20 is rotated by the motor 18 via the gear 19.

【0022】これによって、光ファイバ22からは前記
第1の樹脂塗布装置7の場合と同様に、外周部S2に相
当した紫外線硬化樹脂5Aのみを硬化することができる
[0022] Thereby, as in the case of the first resin coating device 7, only the ultraviolet curing resin 5A corresponding to the outer peripheral portion S2 can be cured from the optical fiber 22.

【0023】次に、図2に続いて図3に示したように、
紫外線硬化樹脂5の全面に対して矢印のように紫外線4
を照射する。これによって少なくとも前記内周部S1を
含む全面が紫外線照射を受けるので、結果として全体の
紫外線硬化樹脂5が硬化する。よって半導体素子2の封
止が完成する。
Next, as shown in FIG. 3 following FIG. 2,
Ultraviolet rays 4 are applied to the entire surface of the ultraviolet curing resin 5 as shown by the arrow.
irradiate. As a result, the entire surface including at least the inner peripheral portion S1 is irradiated with ultraviolet rays, and as a result, the entire ultraviolet curable resin 5 is cured. Thus, the sealing of the semiconductor element 2 is completed.

【0024】このように本実施例によれば、先ず半導体
素子の外周部にのみ紫外線照射を行ってその紫外線硬化
樹脂5を部分的に硬化した後、残りの内周部S1を含む
全面に対して紫外線照射を行って紫外線硬化樹脂5の全
体を硬化するように、2段階に分けて硬化処理を行うよ
うにしたので、複雑な形状のパターンのリードフレーム
は不要となってコストアップを避けることができる。
According to this embodiment, first, only the outer circumferential portion of the semiconductor element is irradiated with ultraviolet rays to partially cure the ultraviolet curing resin 5, and then the entire surface including the remaining inner circumferential portion S1 is irradiated with ultraviolet rays. Since the curing process is carried out in two stages such that the entire ultraviolet curing resin 5 is cured by irradiating it with ultraviolet rays, a lead frame with a complicated pattern is not required, thereby avoiding an increase in cost. Can be done.

【0025】また、半導体素子2の外周部の紫外線硬化
樹脂5を硬化した後、この硬化部分内の内周部S1の紫
外線硬化樹脂5を硬化することにより、先に硬化した外
周部S2の外側には紫外線硬化樹脂5は広がらないので
、最小限の面積で紫外線硬化樹脂5を塗布できるので、
実装密度の低下を防止することができる。
Further, after the ultraviolet curing resin 5 on the outer peripheral part of the semiconductor element 2 is cured, by curing the ultraviolet curing resin 5 on the inner circumferential part S1 in this cured part, the outside of the outer peripheral part S2 that has been cured previously can be cured. Since the ultraviolet curing resin 5 does not spread, the ultraviolet curing resin 5 can be applied to the minimum area.
A decrease in packaging density can be prevented.

【0026】なお、本文実施例では半導体素子2として
はICチップを用いた例で説明したが、ICに限らず樹
脂封止を目的とするものであれば他の半導体素子に対し
ても同様に適用することができる。
[0026]Although the embodiments in this text have been explained using an IC chip as the semiconductor element 2, the same applies to other semiconductor elements as long as they are not limited to ICs but are intended for resin sealing. Can be applied.

【0027】[0027]

【発明の効果】以上述べたように本発明によれば、半導
体素子を封止すべき紫外線硬化樹脂の外周部を先に硬化
した後、内周部を硬化するようにしたので、コストアッ
プを避けると共に実装密度の低下を防止することができ
る。
As described above, according to the present invention, the outer circumferential portion of the ultraviolet curing resin for sealing the semiconductor element is first cured, and then the inner circumferential portion is cured, thereby reducing cost. At the same time, it is possible to prevent the packaging density from decreasing.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の半導体素子の実装方法の一工程を示す
断面図である。
FIG. 1 is a cross-sectional view showing one step of the semiconductor device mounting method of the present invention.

【図2】本発明の半導体素子の実装方法の他の工程を示
す断面図である。
FIG. 2 is a cross-sectional view showing another step of the semiconductor device mounting method of the present invention.

【図3】本発明の半導体素子の実装方法のその他の工程
を示す断面図である。
FIG. 3 is a cross-sectional view showing other steps of the semiconductor device mounting method of the present invention.

【図4】本発明の実施に用いられる第1の樹脂塗布装置
を示す側面図である。
FIG. 4 is a side view showing a first resin coating device used for implementing the present invention.

【図5】本発明の実施に用いられる第1の樹脂塗布装置
を示す平面図である。
FIG. 5 is a plan view showing a first resin coating device used for implementing the present invention.

【図6】本発明の実施に用いられる第2の樹脂塗布装置
を示す斜視図である。
FIG. 6 is a perspective view showing a second resin coating device used for implementing the present invention.

【符号の説明】[Explanation of symbols]

2  半導体素子 4  紫外線 5  紫外線硬化樹脂 7  第1の樹脂塗布装置 9,24  レンズ 10  紫外線ランプ 12  樹脂ディスペンサ 17  第2の樹脂塗布装置 20  円板状支持体 22  光ファイバ 2 Semiconductor element 4 Ultraviolet rays 5 Ultraviolet curing resin 7 First resin coating device 9, 24 Lens 10 Ultraviolet lamp 12 Resin dispenser 17 Second resin coating device 20 Disk-shaped support 22 Optical fiber

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  基板上に接続した半導体素子を紫外線
硬化樹脂で封止する半導体素子の実装方法において、前
記半導体素子の外周部及び内周部を覆うように紫外線硬
化樹脂を塗布しながら、前記外周部のみに紫外線を照射
して紫外線硬化樹脂を部分的に硬化する工程と、次に少
なくとも前記内周部の紫外線硬化樹脂に紫外線を照射し
て紫外線硬化樹脂の全体を硬化する工程とを含むことを
特徴とする半導体素子の実装方法。
1. A method for mounting a semiconductor element in which a semiconductor element connected to a substrate is sealed with an ultraviolet curable resin, in which the ultraviolet curable resin is applied so as to cover an outer peripheral part and an inner peripheral part of the semiconductor element; The method includes a step of partially curing the ultraviolet curable resin by irradiating only the outer periphery with ultraviolet rays, and a step of irradiating at least the inner periphery of the ultraviolet curable resin with ultraviolet rays to cure the entire ultraviolet curable resin. A method for mounting a semiconductor element, characterized by:
JP14473491A 1991-06-17 1991-06-17 Semiconductor element mounting method Expired - Fee Related JP2966578B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14473491A JP2966578B2 (en) 1991-06-17 1991-06-17 Semiconductor element mounting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14473491A JP2966578B2 (en) 1991-06-17 1991-06-17 Semiconductor element mounting method

Publications (2)

Publication Number Publication Date
JPH04368137A true JPH04368137A (en) 1992-12-21
JP2966578B2 JP2966578B2 (en) 1999-10-25

Family

ID=15369105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14473491A Expired - Fee Related JP2966578B2 (en) 1991-06-17 1991-06-17 Semiconductor element mounting method

Country Status (1)

Country Link
JP (1) JP2966578B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2793069A1 (en) * 1999-04-28 2000-11-03 Gemplus Card Int METHOD FOR MANUFACTURING PORTABLE ELECTRONIC DEVICE WITH INTEGRATED CIRCUIT PROTECTED BY PHOTOSENSITIVE RESIN
JP2009259977A (en) * 2008-04-15 2009-11-05 Yaskawa Electric Corp Underfill equipment and underfill method using the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2793069A1 (en) * 1999-04-28 2000-11-03 Gemplus Card Int METHOD FOR MANUFACTURING PORTABLE ELECTRONIC DEVICE WITH INTEGRATED CIRCUIT PROTECTED BY PHOTOSENSITIVE RESIN
WO2000067316A2 (en) * 1999-04-28 2000-11-09 Gemplus Method for producing a portable electronic device with an integrated circuit protected by a photosensitive resin
WO2000067316A3 (en) * 1999-04-28 2001-03-29 Gemplus Card Int Method for producing a portable electronic device with an integrated circuit protected by a photosensitive resin
US6613609B1 (en) 1999-04-28 2003-09-02 Gemplus Method for producing a portable electronic device with an integrated circuit protected by a photosensitive resin
JP2009259977A (en) * 2008-04-15 2009-11-05 Yaskawa Electric Corp Underfill equipment and underfill method using the same

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