JPH0436796B2 - - Google Patents

Info

Publication number
JPH0436796B2
JPH0436796B2 JP58138131A JP13813183A JPH0436796B2 JP H0436796 B2 JPH0436796 B2 JP H0436796B2 JP 58138131 A JP58138131 A JP 58138131A JP 13813183 A JP13813183 A JP 13813183A JP H0436796 B2 JPH0436796 B2 JP H0436796B2
Authority
JP
Japan
Prior art keywords
brazing
external lead
lead terminals
present
silver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58138131A
Other languages
Japanese (ja)
Other versions
JPS6029434A (en
Inventor
Yoshihiro Hosoi
Minobu Kunitomo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP13813183A priority Critical patent/JPS6029434A/en
Publication of JPS6029434A publication Critical patent/JPS6029434A/en
Publication of JPH0436796B2 publication Critical patent/JPH0436796B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Lead Frames For Integrated Circuits (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明はロウ付け用材料に関し、より詳細には
電子部品における外部リード端子のロウ付けに使
用されるロウ材の改良に関するものである。 従来、銀70〜90Wt%、銅10〜30Wt%の合金よ
り成る銀ロウはロウ付け強度が大で使用温度範囲
(溶融温度範囲)が低く、かつ接合母材にあまり
制約を受けないことから電子部品における外部リ
ード端子のロウ付け用材料として使用されてい
る。 しかしながら、この従来の銀ロウはロウ付け
後、大気中に含まれる水分が付着すると銀ロウ中
の銅が酸化され、銅の酸化物(錆)を形成して変
色することがある。この銅の錆は導電性で、かつ
拡散しやすいという性質を有しているため多数の
外部リード端子が近接してロウ付けされている電
子部品では前記錆の拡散により隣接する外部リー
ド端子が短絡し、その結果、電子部品としての機
能に支障を来すという重大な欠点を誘発する。 本発明は上記欠点に鑑み案出されたもので、そ
の目的はロウ付け強度が大で、使用温度範囲が低
く、接合母材に制約を受けないという従来の銀ロ
ウの利点に加えて、ロウ付け後に変色や電子部品
としての機能に支障を来すような導電性の錆の発
生を解消した新規なロウ付け材料を提供すること
にある。 本発明のロウ付け材料は従来と同様に銀を主成
分とし、これにゲルマニウムを0.05乃至10Wt%
含有させたものである。 本発明者等は従来の銀ロウの銅に代わる混合成
分について種々実験研究した結果、ゲルマニウム
はロウ材のロウ付け強度を大とし、使用温度範囲
を低下させ、かつ接合母材との濡れ性を改良する
とともにロウ材の主成分である銀のマイグレーシ
ヨン(移行)を防止するために有効な成分である
ことを知見した。 本発明においては、ゲルマニウムの含有量が
0.05Wt%未満であると所望の前記性質は付与さ
れず、また10Wt%以上であるとロウ材自身がも
ろくなり、ロウ付け強度が低下するため、0.05乃
至10Wt%の範囲に特定される。 本発明は外部リード端子を有する電子部品、具
体的にはハイブリツドIC用配線基板、ICパツケ
ージ、コンデンサ、抵抗、マイクロスイツチ等
種々の外部リード端子のロウ付け材料として好適
に使用される。 次に本発明を実施例に基づいて説明する。 出発原料として直径2mmφの銀(Ag)及びゲ
ルマニウム(Ge)の顆粒を下表に示すように秤
量し、これを回転ミルにて5時間混合する。混合
終了後、これを約1000℃の温度で加熱溶融し、銀
とゲルマニウムを合金化させてロウ材試料を得
た。 なお、試料9は本発明品と比較するための比較
試料であり、従来一般に使用されている銀ロウ
(銀72Wt%、銅28Wt%)である。 かくして得られたロウ材試料を使用して内部に
半導体素子が収納される長さ22mm、幅7mm、厚さ
2.5mmのアルミナセラミツクから成る半導体パツ
ケージ20個の両側に長さ8mm、幅1.5mm、厚さ0.1
mmの外部リード端子を1mm間隔毎に9本づつ約
900℃の温度でロウ付けし(外部リード端子総数
360個)、そのロウ付け状態を顕微鏡により観察し
た。 なお、外部リード端子は42Alloyから成り、そ
の表面には金メツキが施されており、またこの外
部リード端子がロウ付けされる半導体パツケージ
の側表面にはMo−Wのメタライズ層を設けると
ともに該メタライズ層上にNiメツキ層が形成さ
れている。 また更に、各外部リード端子間に電圧17(V)
を印加しながらMIL−STD−883−1004に規定の
温湿度サイクル試験を240時間(10サイクル)行
い、その後各外部リード端子間の絶縁抵抗を測定
し、その平均値を算出した。また同時にロウ付け
部を顕微鏡により観察し、ロウ材が変色している
ものの数を調べた。 なお、外部リード端子間の絶縁抵抗はその初期
値を5×1012(Ω)に設定した。 上記の結果を表−に示す。
The present invention relates to materials for brazing, and more particularly to improvements in brazing materials used for brazing external lead terminals in electronic components. Conventionally, silver solder, which is made of an alloy of 70 to 90 Wt% silver and 10 to 30 Wt% copper, has high brazing strength, has a low operating temperature range (melting temperature range), and is not limited by the bonding base material, so it has been used electronically. It is used as a material for brazing external lead terminals in parts. However, when this conventional silver solder is exposed to moisture contained in the atmosphere after brazing, the copper in the silver solder is oxidized, forming copper oxides (rust), which may cause discoloration. This copper rust is conductive and easily diffuses, so in electronic components where many external lead terminals are brazed in close proximity, adjacent external lead terminals will short-circuit due to the diffusion of the rust. However, as a result, a serious drawback arises in that the function as an electronic component is hindered. The present invention was devised in view of the above-mentioned drawbacks, and its purpose is to add to the advantages of conventional silver solder, such as high brazing strength, low operating temperature range, and no restrictions on the bonding base material. It is an object of the present invention to provide a new brazing material that eliminates the occurrence of conductive rust that causes discoloration and impairs the function of electronic components after application. The brazing material of the present invention has silver as its main component as in the past, and germanium is added in an amount of 0.05 to 10 Wt%.
It contains. As a result of various experimental studies on mixed components to replace copper in conventional silver soldering, the present inventors found that germanium increases the brazing strength of the soldering material, lowers the operating temperature range, and improves the wettability with the bonding base material. It was discovered that it is an effective component for improving the solder metal and preventing the migration of silver, which is the main component of the brazing filler metal. In the present invention, the content of germanium is
If it is less than 0.05 Wt%, the desired properties will not be imparted, and if it is more than 10 Wt%, the brazing material itself will become brittle and the brazing strength will decrease, so it is specified in the range of 0.05 to 10 Wt%. The present invention is suitably used as a brazing material for various external lead terminals of electronic components having external lead terminals, specifically, wiring boards for hybrid ICs, IC packages, capacitors, resistors, microswitches, and the like. Next, the present invention will be explained based on examples. As starting materials, silver (Ag) and germanium (Ge) granules with a diameter of 2 mmφ are weighed as shown in the table below, and mixed in a rotary mill for 5 hours. After the mixing was completed, this was heated and melted at a temperature of approximately 1000°C to alloy silver and germanium to obtain a brazing material sample. Sample 9 is a comparative sample for comparison with the product of the present invention, and is a conventionally commonly used silver solder (72 Wt% silver, 28 Wt% copper). Using the brazing material sample obtained in this way, a material with a length of 22 mm, a width of 7 mm, and a thickness in which a semiconductor element is housed is made.
8 mm long, 1.5 mm wide, and 0.1 mm thick on both sides of 20 semiconductor package cages made of 2.5 mm alumina ceramic.
Approximately 9 external lead terminals at 1 mm intervals
Brazed at a temperature of 900℃ (total number of external lead terminals)
360 pieces), and their brazing conditions were observed using a microscope. The external lead terminal is made of 42Alloy, and its surface is plated with gold, and the side surface of the semiconductor package to which this external lead terminal is brazed is provided with a Mo-W metallized layer and the metallized layer. A Ni plating layer is formed on the layer. Furthermore, the voltage between each external lead terminal is 17 (V).
A temperature/humidity cycle test specified in MIL-STD-883-1004 was performed for 240 hours (10 cycles) while applying a voltage, and then the insulation resistance between each external lead terminal was measured and the average value was calculated. At the same time, the brazed portions were observed using a microscope to determine the number of discolored brazing materials. Note that the initial value of the insulation resistance between the external lead terminals was set to 5×10 12 (Ω). The above results are shown in Table.

【表】 *を付した試料番号のものは本発明の範囲外のもので
ある。
上記実験結果からも判るように、従来の銀ロウ
は錆の発生による変色率が93%であり、かつ外部
リード端子間の絶縁抵抗も9X106(Ω)にまで低
下してしまうのに対し、本発明のロウ付け用材料
は変色率は2%以下と少なく、外部リード端子間
の絶縁抵抗も1.2X1012(Ω)以上とほとんど劣化
していない。 次に前記試料番号2乃至7及び9のロウ付け用
試料を使用して長さ10mm、幅2mm、厚さ0.25mmの
42Alloyから成る20個の外部リード端子の先端部
3mmをアルミナセラミツクから成る基板上に850
℃の温度でロウ付けするとともに外部リード端子
の他端に垂直方向の外力を加えて引張りテストを
行ない、外部リード端子が剥れた個数及び外部リ
ード端子が切れた個数を調べた。 なお、外部リード端子がロウ付けされるセラミ
ツク基板の表面にはMo−Wのメタライズ層及び
Niメツキ層が施されている。 その結果を表−に示す。
[Table] Sample numbers marked with * are outside the scope of the present invention.
As can be seen from the above experimental results, conventional silver solder has a discoloration rate of 93% due to rust, and the insulation resistance between external lead terminals drops to 9X10 6 (Ω). The brazing material of the present invention has a low discoloration rate of 2% or less, and the insulation resistance between external lead terminals is 1.2X10 12 (Ω) or more, showing almost no deterioration. Next, using the brazing samples of sample numbers 2 to 7 and 9, the brazing samples were made into a shape with a length of 10 mm, a width of 2 mm, and a thickness of 0.25 mm.
The 3 mm tips of 20 external lead terminals made of 42 Alloy were placed on a substrate made of alumina ceramic.
While brazing at a temperature of .degree. C., a tensile test was performed by applying a vertical external force to the other end of the external lead terminal, and the number of external lead terminals that peeled off and the number of external lead terminals that broke were determined. Note that the surface of the ceramic substrate to which the external lead terminals are brazed is coated with a Mo-W metallized layer and
A Ni plating layer is applied. The results are shown in Table.

【表】【table】

【表】 上記実験結果からも判るように試料番号2乃至
7のロウ付け用材料は3Kgの引張りテストでも外
部リード端子の剥れがほとんど無く、従来の銀ロ
ウ(試料番号9)と接着強度においてほぼ同等の
ものである。 従つて、本発明のロウ付け用材料は電子部品の
外部リード端子のロウつけ用材料として従来の銀
ロウを凌駕するものであり、極めて有用である。 なお、本発明は上述した実施例に限定されるも
のではなく、銀に対し、ゲルマニウムの他に各種
の目的に応じた成分を添加してもよく、銀とゲル
マニウムの粉末をアクリル系樹脂等の適当な結合
剤中に添加混合しペースト状と成してもよい。
[Table] As can be seen from the above experimental results, the brazing materials of sample numbers 2 to 7 showed almost no peeling of the external lead terminals even in a 3 kg tensile test, and had a similar adhesive strength to conventional silver solder (sample number 9). They are almost equivalent. Therefore, the brazing material of the present invention surpasses conventional silver solder and is extremely useful as a material for brazing external lead terminals of electronic components. It should be noted that the present invention is not limited to the above-mentioned embodiments, and other components besides germanium may be added to silver depending on various purposes. It may also be mixed into a suitable binder to form a paste.

Claims (1)

【特許請求の範囲】[Claims] 1 銀にゲルマニウムを0.05乃至10.0Wt%含有さ
せた電子部品における外部リード端子のロウ付け
用材料。
1 A material for brazing external lead terminals in electronic components, containing 0.05 to 10.0 Wt% of germanium in silver.
JP13813183A 1983-07-27 1983-07-27 Brazing filler metal Granted JPS6029434A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13813183A JPS6029434A (en) 1983-07-27 1983-07-27 Brazing filler metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13813183A JPS6029434A (en) 1983-07-27 1983-07-27 Brazing filler metal

Publications (2)

Publication Number Publication Date
JPS6029434A JPS6029434A (en) 1985-02-14
JPH0436796B2 true JPH0436796B2 (en) 1992-06-17

Family

ID=15214705

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13813183A Granted JPS6029434A (en) 1983-07-27 1983-07-27 Brazing filler metal

Country Status (1)

Country Link
JP (1) JPS6029434A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0342962U (en) * 1989-09-01 1991-04-23
JPH0387160U (en) * 1989-09-07 1991-09-04
JP2001192753A (en) * 1999-10-29 2001-07-17 Kyocera Corp Silver alloy
DE102008013281A1 (en) * 2008-03-08 2009-09-17 Forschungszentrum Jülich GmbH Sealing arrangement for high temperature fuel cell stacks
JP5268717B2 (en) * 2009-03-10 2013-08-21 日本発條株式会社 Brazing material and bonded body for air bonding
WO2016151839A1 (en) * 2015-03-26 2016-09-29 株式会社山森製作所 Silver alloy and silver alloy accessory
WO2019198328A1 (en) * 2018-04-12 2019-10-17 パナソニックIpマネジメント株式会社 Mounting structure and nanoparticle mounting material

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745461A (en) * 1980-09-03 1982-03-15 Hitachi Ltd Analytical apparatus of liquid sample
JPS5887241A (en) * 1981-11-19 1983-05-25 Tanaka Kikinzoku Kogyo Kk Sliding contact material
JPS58110641A (en) * 1981-12-24 1983-07-01 Tanaka Kikinzoku Kogyo Kk Sliding contact material

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5745461A (en) * 1980-09-03 1982-03-15 Hitachi Ltd Analytical apparatus of liquid sample
JPS5887241A (en) * 1981-11-19 1983-05-25 Tanaka Kikinzoku Kogyo Kk Sliding contact material
JPS58110641A (en) * 1981-12-24 1983-07-01 Tanaka Kikinzoku Kogyo Kk Sliding contact material

Also Published As

Publication number Publication date
JPS6029434A (en) 1985-02-14

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