JPH04366776A - Ic testing device - Google Patents

Abstract

PURPOSE:To make efficient the self-diagnostic function of an IC testing device. CONSTITUTION:Input signals are input from a CPU 5 to a measuring portion 8 via line A to line A1 and signals output from the measuring portion 8 are returned to the CPU 5 via the line A1 to the line A and ICs to be tested by the measuring portion 8 are judged as to whether they are conforming or nonconforming articles and the result of the judgement is output to an external automatic selecting device or the like by the route of line B to line B1. A predetermined time or a predetermined number of times of tests are preset by a setting circuit 6 and as the time elapses or each time a test is completed a switching signal is output from the setting circuit 6 and input to a switching circuit 2 and the line A is switched from the line A1 side to the line A2 side. Also at a judgement output circuit 4 the line B is switched from the line B1 side to the line B2 side in response to the switching signal. Under these conditions samples 7 to be checked are tested and the result of the judgement on the samples 7 is input to an alarm generating circuit 3 via line B to line B, and when the result of the judgement conforms with the conformity or nonconformity of the samples 7 to be checked the function of the testing device is judged to be normal.

Description

[Detailed description of the invention]

0001

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC testing device.

0002

[Prior Art] Conventional IC testing equipment is equipped with a check program as a self-diagnosis function of the equipment itself, and by executing this program, it is determined whether or not the testing equipment is normal. There is.

[0003]Also, tests are conducted on a simulated circuit to check whether the IC to be tested operates according to a predetermined function when it is actually incorporated into a circuit together with other accessory parts as a product. Many of the equipment that performs this test (hereinafter referred to as IC packaging testing equipment) are not equipped with a self-diagnosis program, and these equipment
It is necessary to perform tests on samples of defective products and check the equipment.

0004

[Problem to be Solved by the Invention] In the above-mentioned conventional IC testing equipment or IC mounting testing equipment, the test is usually performed using a device that automatically supplies and selects the IC to be tested to the testing equipment. Furthermore, when testing samples of good or defective products to check the devices themselves, it is necessary to separate these devices and replace parts in response to manual measurements. Therefore, there is a disadvantage that extra time and man-hours are required for the preparation of the test and the reconnection of the device after checking.

[0005]

[Means for Solving the Problems] The IC testing device of the present invention measures the electrical characteristics of an IC and determines the quality of the IC. The system is equipped with samples for checking, including non-defective or defective products.

[0006]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a block diagram showing one embodiment of the present invention. As shown in FIG. 1, the IC testing apparatus 1 of this embodiment includes a switching circuit 2, an alarm generation circuit 3, a determination output circuit 4, a CPU 5, and a setting circuit 6, corresponding to the measurement section 8. , and a check sample 7.

In FIG. 1, during normal testing,
The input signal for the test is inputted from the CPU 5 to the measuring unit 8 via line A → line A1, and the output signal from the measuring unit 8 is inputted to the CPU via line A1 → line A.
Returned to 5. As a result, in the CPU 5, the measurement unit 8 determines whether the IC to be tested is good or defective, and the determination result is output to an external automatic sorting device, etc. (not shown) along the route from line B to line B1. Ru.

On the other hand, by setting a predetermined time or the number of tests in advance in the setting circuit 6, a switching signal is output from the setting circuit 6 to the line C each time the time elapses or each test is completed. Ru. This switching signal is input to a switching circuit 2 configured using a multiplexer or the like, and the line A is switched from the line A1 side to the line A2 side. Similarly, in the judgment output circuit 4,
In response to a switching signal input via line C, line B is switched from the line B1 side to the line B2 side. In this state, the CPU 5 performs a test on the check sample 7. As a result, the judgment result for check sample 7 is line B → line B2.
The signal is input to the alarm generation circuit 3 via. In this case, if this determination result matches the conformity/defectiveness of the check sample 7, it is determined that the function of the test device is normal, and normal measurement is resumed. Also,
When a non-defective product is determined to be defective, or when a defective product is determined to be non-defective, an alarm is generated from the alarm generation circuit 3, and it is determined that the test device is abnormal. .

0010

[Effects of the Invention] As explained above, the present invention includes a check sample containing a non-defective product or a defective product,
By determining whether a product is good or defective using this check sample, it is possible to automatically and efficiently diagnose whether there is an abnormality in the test device.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing one embodiment of the present invention.

[Explanation of symbols]

1 IC test equipment 2 Switching circuit 3 Alarm generation circuit 4 Judgment output circuit 5 CPU 6 Setting circuit 7. Sample for checking 8 Measurement part

Claims (1)

[Claims] [Claim 1] Measuring the electrical characteristics of an IC,
An IC testing device for determining the quality of an IC, characterized in that the IC testing device is equipped with a check sample containing a non-defective product or a defective product for self-diagnosis of the IC testing device itself.
C test equipment.