JPH01161167A - Measurement rationalizing bt plate - Google Patents
Measurement rationalizing bt plateInfo
- Publication number
- JPH01161167A JPH01161167A JP62319244A JP31924487A JPH01161167A JP H01161167 A JPH01161167 A JP H01161167A JP 62319244 A JP62319244 A JP 62319244A JP 31924487 A JP31924487 A JP 31924487A JP H01161167 A JPH01161167 A JP H01161167A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- board
- test
- product
- sockets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 16
- 238000012360 testing method Methods 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 abstract 15
- 238000010586 diagram Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業−にの利用分野〕
本発明は信頼性試験用のBT板に関し、特に製品の良否
判定時に効率よく測定できるようにしたBT板に関する
。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a BT plate for reliability testing, and particularly to a BT plate that can be efficiently measured when determining the quality of a product.
従来、この種のBT板は第5図に示すように一枚の基板
26に、製品6を差し込むICソケット7と、BT試験
回路用の外付部品4とを組んでいる。Conventionally, this type of BT board has an IC socket 7 into which a product 6 is inserted, and an external component 4 for a BT test circuit assembled on a single board 26, as shown in FIG.
高温バイアス試験、高温高湿バイアス試験等を行う場合
には、BT板のICソケット7に製品6を差し込み、こ
れを恒温槽若しくは恒温恒湿槽内にセットし、ある一定
時間ごとにBT板を前記槽から出し、製品の良否判定を
選別テスタにてチエツクする必要がある。When performing a high temperature bias test, a high temperature high humidity bias test, etc., insert the product 6 into the IC socket 7 of the BT board, set it in a constant temperature chamber or constant temperature and humidity chamber, and test the BT board at regular intervals. It is necessary to remove the product from the tank and check the quality of the product using a sorting tester.
上述した従来のBT板は一枚の基板にICソケット、部
品そして配線を組んでいるため、製品の良否チエツクを
行う際に製品を1個づつICソケットからはずして測定
しなければならない。このように製品を1個づつはずさ
な番づればならないために、手間がかかること、また製
品の端子に余分なストレスを与えること、また作業時に
不純物を付けたり、静電気ストレスを加える虞れがある
等の欠点がある。Since the above-mentioned conventional BT board has an IC socket, components, and wiring assembled on a single board, when checking the quality of a product, it is necessary to remove each product from the IC socket and measure it. Having to remove and number each product one by one is time-consuming, puts extra stress on the product's terminals, and there is a risk of getting impurities or adding static electricity stress during work. There are drawbacks.
本発明の目的は前記問題点を解消したBT板を提供する
ことにある。An object of the present invention is to provide a BT board that eliminates the above-mentioned problems.
上述した従来のBT板に対し、本発明はICソケットか
ら製品を取り外すことなく、測定ができるという相違点
を有する。The present invention differs from the conventional BT board described above in that it can be measured without removing the product from the IC socket.
本発明は信頼性試験を行うBT板において、試験対象の
ICを保持する保持基板と、前記保持基板」二のICに
電気的に接続されるBT試験回路を絹込んだ試験基板と
の組を有することを特徴とする測定合理化BT板である
。The present invention provides a BT board for conducting a reliability test, which includes a holding board that holds an IC to be tested, and a test board that includes a BT test circuit that is electrically connected to the second IC of the holding board. This is a measurement rationalization BT board characterized by having the following features.
以下、本発明の実施例を図により説明する。 Embodiments of the present invention will be described below with reference to the drawings.
(実施例1−)
第1−図(a) 、 (b) 、 (c)、第2図は本
発明の実施例1を示す図である。図において、本発明は
王C(製品)6をソケット7に差込み、該IC6を保持
する保持基板5と、BT試験回路をなす外付部品4を組
込んだ試験基板1と、ICテスタに接続する測定回路(
コネクタ10を含む)を組込んだ測定基板9との組を有
し、前記試験基板1及び8111定基板9に、保持基板
5のソケット7から突き出した端子8を差込むソケッ1
〜2a、2bをそれぞれ装備したものである。(Example 1-) Figures 1-(a), (b), (c), and 2 are diagrams showing Example 1 of the present invention. In the figure, the present invention connects a IC (product) 6 to a socket 7, a holding board 5 that holds the IC 6, a test board 1 incorporating external components 4 forming a BT test circuit, and an IC tester. measurement circuit (
A socket 1 into which the terminal 8 protruding from the socket 7 of the holding board 5 is inserted into the test board 1 and the 8111 constant board 9.
~2a and 2b are respectively equipped.
3は試験1人板1に設けたコネクタとの接続端子である
。3 is a connection terminal with a connector provided on the test board 1.
実施例において、まず、保持基板5の各ソケット7に製
品であるIC6をそれぞれ差込んで保持する。In the embodiment, first, each IC 6 as a product is inserted into each socket 7 of the holding board 5 and held therein.
BT試験を実施するときには第1図(c)に示すように
保持基板5と試験基板1とを−1−下に重ね合せ、保持
基板5のソケット7の端子8を試験基板]のソケット2
aに差し込み、製品6をソケッl〜2a、7を介して試
験基板1の試験回路に接続して実装し、これを試験槽に
入れる。そして製品の良否判定をチエツクするときには
、保持基板5を試験基板1からはずし、第2図に示すよ
うに保持基板5と測定基板9とを−L下に重ね合せ、保
持基板5のソケッ1へ7の端子8を測定基板9のソケッ
1−2bに差し込み、製品6をソケッ1−2b、7を介
して測定基板9の測定回路に接続し、かつコネクタ10
にて1cテスタに接続し、製品6の良否判定のチエツク
を行う。When carrying out the BT test, as shown in FIG. 1(c), the holding board 5 and the test board 1 are placed one on top of the other, and the terminals 8 of the socket 7 of the holding board 5 are connected to the socket 2 of the test board.
a, connect the product 6 to the test circuit of the test board 1 via sockets 1 to 2a and 7, mount it, and place it in the test tank. When checking the quality of the product, remove the holding board 5 from the test board 1, stack the holding board 5 and the measuring board 9 below -L as shown in FIG. Insert the terminal 8 of 7 into the socket 1-2b of the measurement board 9, connect the product 6 to the measurement circuit of the measurement board 9 via the socket 1-2b and 7, and connect the connector 10 to the measurement circuit of the measurement board 9.
Connect to the 1c tester to check whether the product 6 is good or bad.
したがって、最初に製品をソケッ1〜に搭載した後は試
験が終Yするまで人間が製品に触れることなく、BT試
験が実施できる。Therefore, after the product is first mounted in the sockets 1 to 1, the BT test can be carried out without a person touching the product until the test is completed.
第3図は保持基板5に搭載された多数個の製品を1ケづ
つICテスタでチエツクするための簡易回路のブロック
図である。6は製品であり、12は各端子のラインを示
し、13ば切り換えスイッチ、14はスイッチシグマ1
ヘリクス、15はコントローラ、】6はテスタ(選別器
)、17は製品の端子ライン、18は製品とテスタを接
続するライン、19はテスタとコントローラとの信号ラ
イン、20は任意の製品を選択するためにスイッチング
マI〜リクス14へ送る信号ライン、21は製品の良否
結果を送る信号ライン、22は良品を示すLEDランプ
、23は不良品を示す1.、HDランプである。FIG. 3 is a block diagram of a simple circuit for checking a large number of products mounted on the holding board 5 one by one using an IC tester. 6 is the product, 12 indicates the line of each terminal, 13 is the changeover switch, 14 is the switch sigma 1
Helix, 15 is the controller, ]6 is the tester (selector), 17 is the terminal line of the product, 18 is the line connecting the product and the tester, 19 is the signal line between the tester and the controller, 20 is for selecting an arbitrary product 21 is a signal line that sends the results of the product quality, 22 is an LED lamp that indicates a good product, and 23 is a signal line that indicates a defective product. , HD lamp.
通常、BT板は製品を複数個(製品のパッケージの大き
さにより変わる)搭載するため、1枚のBT板の製品を
4111定する場合には製品の端子とテスタとを1−個
づつ切り換える必要がある。Normally, a BT board carries multiple products (depending on the size of the product's package), so when testing the products on a single BT board, it is necessary to switch the product terminal and tester one by one. There is.
その制御を行う一実施例を第3図に示す。第3図におい
て、テスタ側から測定開始の信号を受けて、スイッチン
クマ1〜リクス14で任意の製品を選択し、テスタ16
と任意の製品6とを接続しテスタで測定し、その良否結
果を1.1:Dランプ22で示し、次の製品測定に移る
。An embodiment for carrying out this control is shown in FIG. In Fig. 3, upon receiving a measurement start signal from the tester side, any product is selected using switches 1 to 14, and the tester 16
and an arbitrary product 6 are connected and measured with a tester, the pass/fail result is indicated by the 1.1:D lamp 22, and the next product measurement is started.
尚、基板に搭載した製品のチエツクが終了すると、その
結果がL IE Dランプで示されているため、不良が
発生した場合にはマニュアル操作でスイソチングマ1ヘ
リクス14から不良品を選択し、再測定が行えるという
ものである。When the check of the product mounted on the board is completed, the result is indicated by the LIE D lamp, so if a defect occurs, manually select the defective product from Swiss Chingma 1 Helix 14 and re-measure. can be done.
(実施例2) 第4図は本発明の実施例2の測定合理化BT板である。(Example 2) FIG. 4 shows a measurement rationalization BT board according to Example 2 of the present invention.
24はテスタで測定する場合のコネクタ、25はBT試
験回路を組んだ試験基板1と保持基板5とを接続するた
めのコネクタである。24 is a connector for measuring with a tester, and 25 is a connector for connecting the test board 1 on which the BT test circuit is assembled and the holding board 5.
尚、テスタの測定はコネクタ24を測定するごとに1ケ
づつ取り換えて測定する。Note that each time the tester measures the connector 24, one connector is replaced.
この実施例では、現状の?11!l定システムで十分に
測定できる利点かある。In this example, the current state? 11! There is an advantage in that it can be adequately measured using a fixed-rate system.
以上説明したように本発明は製品個有のB T試験用回
路を組んだ試験基板と製品を搭載した保持基板とを別々
に有することにより、BT試験が終了するまで製品に触
れることなく試験と良否判定チエツクを実施でき、この
ことにより、測定時のチエツクのために製品を1ケづつ
]Cソケットから外して測定する手間が省けること、さ
らに端子に余分なス1〜レスを与えず、また静電気スト
レスを加えたり、不純物を付けたりする慮れかなくなる
という効果を有するものである。As explained above, the present invention has a test board on which a product-specific BT test circuit is assembled and a holding board on which the product is mounted, so that the test can be performed without touching the product until the BT test is completed. This allows you to perform a pass/fail judgment check, which saves you the trouble of removing the product one by one from the C socket for checking during measurement, and also eliminates unnecessary stress on the terminals. This has the effect of eliminating the possibility of applying electrostatic stress or adding impurities.
第1図(a)は本発明の実施例]における試験基板を示
す正面図、第]−図(b)は同側面図、第1図(C)は
試験基板と保持基板とを組合せた状態を示す図、第2図
はテスタ測定時の状態を示す図、第3図はBT試験した
複数個の製品を連続して測定する簡易回路を示すブロッ
ク図、第4図は本発明の実施例2を示す図、第5図は従
来例を示す図である。
]・・・製製品布のBT試験回路を組んだ試験基板2a
、 2b 、 7・ソケット 3 コネクタとの接
続端子4 ・BT試験回路用の外付部品
5・保持基板 6 製品(IC)8 ソケットの
端子 9 ・測定基板FIG. 1(a) is a front view showing a test board according to an embodiment of the present invention, FIG. 1(b) is a side view of the same, and FIG. 1(C) is a state in which the test board and holding board are combined. FIG. 2 is a diagram showing the state during tester measurement, FIG. 3 is a block diagram showing a simple circuit for continuously measuring multiple products subjected to BT testing, and FIG. 4 is an embodiment of the present invention. 2 and 5 are diagrams showing a conventional example. ]...Test board 2a with BT test circuit assembled from product fabric
, 2b, 7・Socket 3 Connection terminal with connector 4・External parts for BT test circuit 5・Holding board 6 Product (IC) 8 Socket terminal 9・Measurement board
Claims (1)
Cを保持する保持基板と、前記保持基板上のICに電気
的に接続されるBT試験回路を組込んだ試験基板との組
を有することを特徴とする測定合理化BT板。(1) In the BT board where the reliability test is performed, the I
1. A measurement rationalization BT board comprising: a holding board for holding C; and a test board incorporating a BT test circuit electrically connected to an IC on the holding board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62319244A JPH01161167A (en) | 1987-12-17 | 1987-12-17 | Measurement rationalizing bt plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62319244A JPH01161167A (en) | 1987-12-17 | 1987-12-17 | Measurement rationalizing bt plate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01161167A true JPH01161167A (en) | 1989-06-23 |
Family
ID=18108022
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62319244A Pending JPH01161167A (en) | 1987-12-17 | 1987-12-17 | Measurement rationalizing bt plate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01161167A (en) |
-
1987
- 1987-12-17 JP JP62319244A patent/JPH01161167A/en active Pending
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