JPH04357608A - Dielectric porcelain composition - Google Patents
Dielectric porcelain compositionInfo
- Publication number
- JPH04357608A JPH04357608A JP3131000A JP13100091A JPH04357608A JP H04357608 A JPH04357608 A JP H04357608A JP 3131000 A JP3131000 A JP 3131000A JP 13100091 A JP13100091 A JP 13100091A JP H04357608 A JPH04357608 A JP H04357608A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- composition
- point
- dielectric constant
- dielectric ceramic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000203 mixture Substances 0.000 title claims abstract description 41
- 229910052573 porcelain Inorganic materials 0.000 title abstract description 5
- 239000000919 ceramic Substances 0.000 claims description 22
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 18
- IATRAKWUXMZMIY-UHFFFAOYSA-N strontium oxide Chemical compound [O-2].[Sr+2] IATRAKWUXMZMIY-UHFFFAOYSA-N 0.000 claims description 10
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 claims description 7
- 239000010955 niobium Substances 0.000 claims description 6
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 claims description 5
- 239000000292 calcium oxide Substances 0.000 claims description 5
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 abstract description 3
- 239000002245 particle Substances 0.000 abstract 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 16
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Chemical compound [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 15
- 230000015556 catabolic process Effects 0.000 description 14
- 239000013078 crystal Substances 0.000 description 12
- 238000009413 insulation Methods 0.000 description 10
- 238000005259 measurement Methods 0.000 description 9
- 239000000843 powder Substances 0.000 description 9
- 235000010215 titanium dioxide Nutrition 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 239000002994 raw material Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 4
- 238000005245 sintering Methods 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- PLDDOISOJJCEMH-UHFFFAOYSA-N neodymium oxide Inorganic materials [O-2].[O-2].[O-2].[Nd+3].[Nd+3] PLDDOISOJJCEMH-UHFFFAOYSA-N 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- LEDMRZGFZIAGGB-UHFFFAOYSA-L strontium carbonate Chemical compound [Sr+2].[O-]C([O-])=O LEDMRZGFZIAGGB-UHFFFAOYSA-L 0.000 description 3
- 229910000018 strontium carbonate Inorganic materials 0.000 description 3
- 238000006467 substitution reaction Methods 0.000 description 3
- 239000004408 titanium dioxide Substances 0.000 description 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 229910002113 barium titanate Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010304 firing Methods 0.000 description 2
- VASIZKWUTCETSD-UHFFFAOYSA-N manganese(II) oxide Inorganic materials [Mn]=O VASIZKWUTCETSD-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- -1 CaC O3 Chemical compound 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 235000010216 calcium carbonate Nutrition 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- UFQXGXDIJMBKTC-UHFFFAOYSA-N oxostrontium Chemical compound [Sr]=O UFQXGXDIJMBKTC-UHFFFAOYSA-N 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical class [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は高い誘電率を有しかつ誘
電損失が小さく、さらに絶縁破壊電圧,絶縁抵抗が大き
く、また結晶粒径が小さい誘電体磁器組成物に関するも
のである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dielectric ceramic composition having a high dielectric constant, low dielectric loss, high dielectric breakdown voltage and high insulation resistance, and small crystal grain size.
【0002】0002
【従来の技術】従来から、高い誘電率を有する誘電体磁
器組成物として、BaTiO3にBaO,CaO,Ti
O2,ZrO2などを適当量添加したものが知られてい
る。[Prior Art] Conventionally, as a dielectric ceramic composition having a high dielectric constant, BaO, CaO, and Ti are used in BaTiO3.
It is known that suitable amounts of O2, ZrO2, etc. are added.
【0003】0003
【発明が解決しようとする課題】しかし、これらの誘電
体磁器組成物は結晶粒径が10〜20μmと大きく、気
孔率も高いため、積層セラミックコンデンサのように誘
電体厚みが薄い製品への応用は、誘電損失が大きくなる
、絶縁破壊電圧が低い、外部電極を形成するメッキ処理
時の絶縁破壊電圧および絶縁抵抗が低下するなどの課題
があった。[Problems to be Solved by the Invention] However, these dielectric ceramic compositions have large crystal grain sizes of 10 to 20 μm and high porosity, so they cannot be applied to products with thin dielectric materials such as multilayer ceramic capacitors. However, there were problems such as increased dielectric loss, low dielectric breakdown voltage, and decreased dielectric breakdown voltage and insulation resistance during the plating process for forming the external electrodes.
【0004】0004
【課題を解決するための手段】これらの課題を解決する
ために本発明の誘電体磁器組成物は、一般式としてxB
aO・yTiO2・zNdO3/2で表され、式中のバ
リウム酸化物(BaO)をストロンチウム酸化物(Sr
O)またはカルシウム酸化物(CaO)で置換し、その
置換率mがストロンチウム酸化物(SrO)で0.00
5≦m≦0.100、カルシウム酸化物(CaO)で0
.005≦m≦0.200の範囲にある組成を有し、か
つx,yおよびzはモル比を表し、x+y+z=1でx
,y,zの値が、
aはx=0.430、y=0.525、z=0.045
、
bはx=0.475、y=0.490、z=0.035
、
cはx=0.490、y=0.505、z=0.005
、
dはx=0.450、y=0.545、z=0.005
、
で示すa,b,c,dで囲まれるモル比の範囲にある組
成を有するものである。[Means for Solving the Problems] In order to solve these problems, the dielectric ceramic composition of the present invention has the general formula xB
It is expressed as aO・yTiO2・zNdO3/2, and barium oxide (BaO) in the formula is replaced with strontium oxide (Sr
O) or calcium oxide (CaO), and the substitution rate m is 0.00 with strontium oxide (SrO).
5≦m≦0.100, 0 for calcium oxide (CaO)
.. 005≦m≦0.200, and x, y and z represent molar ratios, and x+y+z=1 and x
,y,z values are: a is x=0.430, y=0.525, z=0.045
, b is x=0.475, y=0.490, z=0.035
, c is x=0.490, y=0.505, z=0.005
, d is x=0.450, y=0.545, z=0.005
, has a composition within the molar ratio range surrounded by a, b, c, and d.
【0005】また、上記組成を主成分とし、副成分とし
てニオブがNb2O5の形に換算して0.3〜3.0重
量部添加されてなることを特徴とする誘電体磁器組成物
を提供するものである。[0005] Furthermore, there is provided a dielectric ceramic composition characterized in that the above composition is the main component, and 0.3 to 3.0 parts by weight of niobium (calculated in the form of Nb2O5) is added as a subcomponent. It is something.
【0006】[0006]
【作用】この構成により、BaOをSrOで置換するこ
とにより、誘電損失を小さくし、静電容量と絶縁抵抗の
積(CR積)を大きくすることとなる。また、BaOを
CaOで置換することにより、誘電損失を小さくするこ
ととなる。さらに副成分としてニオブを添加することに
より、CR積と絶縁破壊電圧を大きくすることとなる。
さらにまた、これらの構成により、結晶粒径を小さくす
ることとなる。[Operation] With this configuration, by replacing BaO with SrO, dielectric loss is reduced and the product of capacitance and insulation resistance (CR product) is increased. Furthermore, by replacing BaO with CaO, dielectric loss can be reduced. Furthermore, by adding niobium as a subcomponent, the CR product and dielectric breakdown voltage will be increased. Furthermore, these configurations reduce the crystal grain size.
【0007】[0007]
(実施例1)出発原料には化学的に高純度のBaCO3
,SrCO3,TiO2,Nd2O3および焼結助剤と
してのMnO2粉末を下記の(表1)に示す組成比にな
るように秤量し、めのうボールを備えたゴム内張りのボ
ールミルに純水とともに入れ、湿式混合後、脱水乾燥し
た。この乾燥粉末を高アルミナ質のルツボに入れ、空気
中で1100℃にて2時間仮焼した。この仮焼粉末を、
めのうボールを備えたゴム内張りのボールミルに純水と
ともに入れ、湿式粉砕後、脱水乾燥した。この粉砕粉末
に、有機バインダーを加え、均質とした後、32メッシ
ュのふるいを通して整粒し、金型と油圧プレスを用いて
成形圧力1t/cm2で直径15mm,厚み0.4mm
に成形した。次いで、この得られた成形円板をジルコニ
ア粉末を敷いたアルミナ質のサヤに入れ、空気中にて(
表1)に示す焼成温度で2時間焼成し、(表1)に示す
組成比の誘電体磁器組円板を得た。(Example 1) Chemically high purity BaCO3 was used as the starting material.
, SrCO3, TiO2, Nd2O3, and MnO2 powder as a sintering aid were weighed so as to have the composition ratio shown in Table 1 below, and placed in a rubber-lined ball mill equipped with an agate ball with pure water, and wet mixed. After that, it was dehydrated and dried. This dry powder was placed in a high alumina crucible and calcined in air at 1100°C for 2 hours. This calcined powder,
The mixture was placed in a rubber-lined ball mill equipped with agate balls together with pure water, wet-milled, and then dehydrated and dried. After adding an organic binder to this pulverized powder and making it homogeneous, it was sized through a 32-mesh sieve, and molded using a mold and hydraulic press at a molding pressure of 1 t/cm2 to a diameter of 15 mm and a thickness of 0.4 mm.
It was molded into. Next, the obtained molded disk was placed in an alumina pod covered with zirconia powder and heated in air (
Firing was carried out for 2 hours at the firing temperature shown in Table 1) to obtain a dielectric porcelain assembly disc having the composition ratio shown in Table 1.
【0008】[0008]
【表1】[Table 1]
【0009】このようにして得られた誘電体磁器円板は
、厚みと直径を測定し、誘電率,誘電損失,静電容量温
度特性測定用試料は、誘電体磁器円板の両面全体に銀電
極を焼き付け、絶縁破壊電圧および絶縁抵抗測定用試料
は、誘電体磁器円板の外周より内側に1mmの幅で銀電
極のない部分を設け、銀電極を焼き付けた。そして、誘
電率,誘電損失,静電容量温度特性は、横河・ヒューレ
ット・パッカード(株)製デジタルLCRメータのモデ
ル4274Aを使用し、測定温度20℃,測定電圧1V
rms,測定周波数1kHzでの測定より求めた。The thickness and diameter of the dielectric ceramic disk thus obtained were measured, and the samples for measuring the dielectric constant, dielectric loss, and capacitance temperature characteristics were coated with silver on both sides of the dielectric ceramic disk. A sample for measuring dielectric breakdown voltage and insulation resistance was prepared by baking a dielectric ceramic disk with a 1 mm wide portion without a silver electrode inside the outer periphery, and baking a silver electrode thereon. The dielectric constant, dielectric loss, and capacitance temperature characteristics were measured using a Yokogawa-Hewlett-Packard digital LCR meter model 4274A at a measurement temperature of 20°C and a measurement voltage of 1V.
rms, and was determined by measurement at a measurement frequency of 1 kHz.
【0010】なお、静電容量温度変化率は、20℃を基
準温度とし、−25℃〜+85℃の温度範囲内で適当に
選んだ測定温度における静電容量との変化率で表すこと
とし、変化率は次式より求めた。[0010] The temperature change rate of capacitance is expressed as the rate of change in capacitance at a measurement temperature appropriately selected within the temperature range of -25°C to +85°C, with 20°C as a reference temperature. The rate of change was calculated using the following formula.
【0011】dC=(CT−CO)/CO×100dC
:静電容量温化変化率
CT:T℃での静電容量(pF)
CO:20℃での静電容量(pF)
そして、誘電率は次式より求めた。dC=(CT-CO)/CO×100dC
: Capacitance temperature change rate CT: Capacitance at T°C (pF) CO: Capacitance at 20°C (pF)
Then, the dielectric constant was determined from the following formula.
【0012】K=143.8×C0×t×D2K:誘電
率
C0:20℃での静電容量(pF)
D:誘電体磁器円板の直径(mm)
t:誘電体磁器円板の厚み(mm)
また、絶縁破壊電圧は菊水電子工業(株)製の高圧直流
電源PHS35K−3形を使用し、試料をシリコンオイ
ル中に入れ、昇圧速度50V/sにより測定し、次式よ
り誘電体1mm当たりの絶縁破壊強度として求めた。K=143.8×C0×t×D2K: Dielectric constant C0: Capacitance at 20°C (pF) D: Diameter of dielectric ceramic disk (mm) t: Thickness of dielectric ceramic disk (mm) The dielectric breakdown voltage was measured using a high-voltage DC power supply PHS35K-3 manufactured by Kikusui Electronics Co., Ltd. by placing the sample in silicone oil and increasing the voltage at a voltage increase rate of 50 V/s. It was determined as dielectric breakdown strength per 1 mm.
【0013】B1=B0/t
B1:絶縁破壊強度(kV/mm)
B0:絶縁破壊電圧(kV)
さらに、絶縁抵抗は、タケダ理研(株)製の高抵抗計を
使用し、測定電圧50V.DC,測定時間1分間による
測定より求め、CR積として次式より求めた。B1=B0/t B1: Dielectric breakdown strength (kV/mm) B0: Dielectric breakdown voltage (kV) Furthermore, insulation resistance was measured using a high resistance meter manufactured by Takeda Riken Co., Ltd. at a measurement voltage of 50 V. It was determined by measurement using DC and a measurement time of 1 minute, and the CR product was determined from the following formula.
【0014】CR=C0×R0/1012CR:CR積
(MΩ・μF)
C0:20℃での静電容量(F)
R0:絶縁抵抗(Ω)
さらにまた、結晶粒径は、倍率400での光学顕微鏡観
察より求めた。CR=C0×R0/1012CR: CR product (MΩ・μF) C0: Capacitance at 20°C (F) R0: Insulation resistance (Ω) Furthermore, the crystal grain size is the optical Obtained from microscopic observation.
【0015】上記測定結果を試料番号1〜10別に(表
2)に示す。The above measurement results are shown in Table 2 for sample numbers 1 to 10.
【0016】[0016]
【表2】[Table 2]
【0017】また、図1は本発明にかかる主成分の組成
範囲を示す三元図であり、主成分の組成範囲を限定した
理由を図1を参照しながら説明する。すなわち、A領域
では誘電率が小さく、実用的でなくなる。また、B領域
ではキュリー点がマイナス側に大きくなりすぎ、温度特
性の静電容量温度変化率がプラス側に大きくはずれ実用
的でなくなる。さらにC領域では焼結が著しく困難であ
る。さらにまた、D領域では誘電率が小さく、実用的で
なくなる。FIG. 1 is a ternary diagram showing the composition range of the main components according to the present invention, and the reason for limiting the composition range of the main components will be explained with reference to FIG. That is, in region A, the dielectric constant is small, making it impractical. Further, in region B, the Curie point becomes too large on the negative side, and the capacitance temperature change rate of the temperature characteristic deviates too much on the positive side, making it impractical. Furthermore, sintering is extremely difficult in the C region. Furthermore, the dielectric constant is small in the D region, making it impractical.
【0018】また、BaOをSrOで置換することによ
り、誘電率,絶縁破壊電圧を大きく変えることなしに誘
電損失を小さくし、静電容量と絶縁抵抗の積(CR側)
を大きくする効果を有しているが、その置換率mが0.
005未満では効果はなく、一方0.100を超えると
誘電率が低下し実用的でなくなる。[0018] Furthermore, by replacing BaO with SrO, the dielectric loss can be reduced without significantly changing the dielectric constant and dielectric breakdown voltage, and the product of capacitance and insulation resistance (CR side) can be reduced.
However, when the substitution rate m is 0.
If it is less than 0.005, there will be no effect, while if it exceeds 0.100, the dielectric constant will decrease and become impractical.
【0019】さらに、結晶粒径を5〜10μmと小さく
することができる。
(実用例2)実施例1の原料の中で高純度のSrCO3
粉末に代えて、高純度のCaCO3粉末を用いて下記の
(表3)に示す組成比になるように秤量し、以降の工程
を実施例1と同様に処理して(表3)の試料番号11〜
20に示す組成比の誘電体磁器円板を得、実施例1と同
様に処理して電気特性および結晶粒径を測定した結果を
試料番号11〜20別に(表4)に示す。Furthermore, the crystal grain size can be reduced to 5 to 10 μm. (Practical example 2) High purity SrCO3 among the raw materials of Example 1
In place of the powder, high-purity CaCO3 powder was used and weighed to have the composition ratio shown in Table 3 below, and the subsequent steps were performed in the same manner as in Example 1 to obtain the sample number of (Table 3). 11~
Dielectric ceramic disks having the composition ratio shown in Example 20 were obtained, treated in the same manner as in Example 1, and the electrical properties and crystal grain sizes were measured. The results are shown in Table 4 for sample numbers 11 to 20.
【0020】[0020]
【表3】[Table 3]
【0021】[0021]
【表4】[Table 4]
【0022】また、図2は本発明にかかる主成分の組成
範囲を示す三元図であり、主成分の組成範囲を限定した
理由を図2に参照しながら説明する。すなわち、A領域
では誘電率が小さく、実用的でなくなる。また、B領域
ではキュリー点がマイナス側に大きくなりすぎ、温度特
性の静電容量温度変化率がプラス側に大きくはずれ実用
的でなくなる。さらにC領域では焼結が著しく困難であ
る。さらにまた、D領域では誘電率が小さく、実用的で
なくなる。FIG. 2 is a ternary diagram showing the composition range of the main component according to the present invention, and the reason for limiting the composition range of the main component will be explained with reference to FIG. That is, in region A, the dielectric constant is small, making it impractical. Further, in region B, the Curie point becomes too large on the negative side, and the capacitance temperature change rate of the temperature characteristic deviates too much on the positive side, making it impractical. Furthermore, sintering is extremely difficult in the C region. Furthermore, the dielectric constant is small in the D region, making it impractical.
【0023】また、BaOをCaOで置換することによ
り、誘電率,絶縁破壊電圧およびCR積を大きく変える
ことなしに誘電損失を小さくする効果を有しているが、
その置換率mが0.005未満では効果はなく、一方0
.200を超えると焼結性が悪くなり、誘電率が低下し
実用的でなくなる。[0023] Also, by replacing BaO with CaO, it has the effect of reducing dielectric loss without significantly changing the dielectric constant, dielectric breakdown voltage, and CR product.
If the substitution rate m is less than 0.005, there is no effect; on the other hand, 0
.. When it exceeds 200, sintering properties deteriorate and the dielectric constant decreases, making it impractical.
【0024】さらに、結晶粒径を5〜10μmと小さく
することができる。
(実施例3)実施例1に示す原料に高純度のNb2O5
粉末を加えて、下記の(表5)に示す組成比になるよう
に秤量し、以降の工程を実施例1と同様に処理して(表
5)の試料番号21〜30に示す組成比の誘電体磁器円
板を得、実施例1と同様に処理して電気特性および結晶
粒径を測定した結果を試料番号21〜30別に(表6)
に示す。Furthermore, the crystal grain size can be reduced to 5 to 10 μm. (Example 3) High purity Nb2O5 was used as the raw material shown in Example 1.
Powder was added and weighed to obtain the composition ratio shown in Table 5 below, and the subsequent steps were performed in the same manner as in Example 1 to obtain the composition ratio shown in sample numbers 21 to 30 in Table 5. Dielectric ceramic disks were obtained, treated in the same manner as in Example 1, and the electrical properties and crystal grain sizes were measured. The results are shown for each sample number 21 to 30 (Table 6)
Shown below.
【0025】[0025]
【表5】[Table 5]
【0026】[0026]
【表6】[Table 6]
【0027】ここで、主成分の組成範囲を限定した理由
は実施例1と同様であるので説明は省略する。Here, the reason for limiting the composition range of the main components is the same as in Example 1, so the explanation will be omitted.
【0028】そして、主成分に対し、副成分としてのN
b2O5を含有することにより静電容量と絶縁抵抗の積
(CR積)と絶縁破壊電圧を向上させる効果を有してい
るが、その含有量が主成分100重量部に対し、0.3
重量部未満では含有効果はなく、一方3.0重量部を超
えるとキュリー点がマイナス側にずれ、誘電率を低下さ
せ実用的でなくなる。[0028] Then, with respect to the main component, N as a subcomponent
Containing b2O5 has the effect of improving the product of capacitance and insulation resistance (CR product) and dielectric breakdown voltage, but the content is 0.3 parts by weight per 100 parts by weight of the main component.
If the content is less than 3.0 parts by weight, there will be no effect, while if it exceeds 3.0 parts by weight, the Curie point will shift to the negative side, lowering the dielectric constant and making it impractical.
【0029】また、結晶粒径を3〜8μmと小さくする
ことができる。
(実施例4)実施例2に示す原料に高純度のNb2O5
粉末を加えて、下記の(表7)に示す組成比になるよう
に秤量し、以降の工程を実施例1と同様に処理して(表
7)の試料番号31〜40に示す組成比の誘電体磁器円
板を得、実施例1と同様に処理して電気特性および結晶
粒径を測定した結果を試料番号31〜40別に(表8)
に示す。Furthermore, the crystal grain size can be reduced to 3 to 8 μm. (Example 4) High purity Nb2O5 was used as the raw material shown in Example 2.
Powder was added and weighed to obtain the composition ratio shown in Table 7 below, and the subsequent steps were carried out in the same manner as in Example 1 to obtain the composition ratio shown in sample numbers 31 to 40 in Table 7. Dielectric ceramic discs were obtained, treated in the same manner as in Example 1, and the electrical properties and crystal grain sizes were measured. The results are shown for each sample number 31 to 40 (Table 8)
Shown below.
【0030】[0030]
【表7】[Table 7]
【0031】[0031]
【表8】[Table 8]
【0032】ここで、主成分の組成範囲を限定した理由
は実施例2と同様であるので説明は省略する。Here, the reason for limiting the composition range of the main components is the same as in Example 2, so the explanation will be omitted.
【0033】そして、主成分に対し、副成分としてのN
b2O5を含有することにより、静電容量と絶縁抵抗の
積(CR積)と絶縁破壊電圧を向上させる効果を有して
いるが、その含有量が主成分100重量部に対し、0.
3重量部未満では含有効果はなく、一方3.0重量部を
超えるとキュリー点がマイナス側にずれ、誘電率を低下
させ実用的でなくなる。[0033] Then, with respect to the main component, N as a subcomponent
By containing b2O5, it has the effect of improving the product of capacitance and insulation resistance (CR product) and dielectric breakdown voltage, but the content is 0.00% per 100 parts by weight of the main component.
If the content is less than 3 parts by weight, there will be no effect, while if it exceeds 3.0 parts by weight, the Curie point will shift to the negative side, lowering the dielectric constant and making it impractical.
【0034】また、結晶粒径を3〜8μmと小さくする
ことができる。なお、上記実施例における誘電体磁器組
成物の作製方法では、BaCO3,SrCO3,CaC
O3,TiO2,Nd2O3,Nb2O5およびMnO
2を使用したが、この方法に限定されるものではなく、
所望の組成比になるようにBaTiO3などの化合物、
あるいは炭酸塩,水酸化物など空気中での加熱により、
BaO,SrO,CaO,TiO2,Nd2O3,Nb
2O5およびMnO2となる化合物を使用しても実施例
と同程度の特性を得ることができる。Furthermore, the crystal grain size can be reduced to 3 to 8 μm. In addition, in the method for producing the dielectric ceramic composition in the above example, BaCO3, SrCO3, CaC
O3, TiO2, Nd2O3, Nb2O5 and MnO
2 was used, but it is not limited to this method,
Compounds such as BaTiO3 to achieve the desired composition ratio,
Or by heating carbonates, hydroxides, etc. in the air.
BaO, SrO, CaO, TiO2, Nd2O3, Nb
Characteristics comparable to those of the examples can be obtained even when compounds forming 2O5 and MnO2 are used.
【0035】また、一般に使用されている工業用BaT
iO3のBa/Ti比は0.98以上であり、BaTi
O3を出発原料として使用した場合、不足分のBaOま
たはTiO2を添加しても実施例と同程度の特性を得る
ことができる。[0035] Also, commonly used industrial BaT
The Ba/Ti ratio of iO3 is 0.98 or more, and BaTi
When O3 is used as a starting material, properties comparable to those of the examples can be obtained even if BaO or TiO2 is added to compensate for the shortage.
【0036】さらに、主成分をあらかじめ仮焼し、副成
分を添加しても実施例と同程度の特性を得ることができ
る。Furthermore, even if the main component is calcined in advance and subcomponents are added, properties comparable to those of the examples can be obtained.
【0037】さらにまた、誘電体磁器用として一般に使
用される工業用原料の二酸化チタン、例えばチタン工業
(株)製二酸化チタンKA−10、古河鉱業(株)製二
酸化チタンFA−55Wには最大0.45重量%のNb
2O5が含まれるが、これらの二酸化チタンを使用して
主成分の誘電体磁器を作成しても主成分100重量%に
対して、Nb2O5の含有量は最大で0.17重量%で
あり、本発明の範囲外であるが、工業用原料の酸化チタ
ン中のNb2O5量を考慮し、不足分のNb2O5を含
有させることにより、実施例と同程度の特性を得ること
ができる。Furthermore, titanium dioxide, an industrial raw material commonly used for dielectric ceramics, such as titanium dioxide KA-10 manufactured by Titan Kogyo Co., Ltd. and titanium dioxide FA-55W manufactured by Furukawa Mining Co., Ltd., has a maximum of 0. .45% by weight Nb
2O5 is included, but even if these titanium dioxides are used to create dielectric porcelain as the main component, the content of Nb2O5 is at most 0.17% by weight relative to 100% by weight of the main component. Although it is outside the scope of the invention, properties comparable to those of the examples can be obtained by taking into consideration the amount of Nb2O5 in titanium oxide, which is an industrial raw material, and adding the insufficient amount of Nb2O5.
【0038】そして、上述の基本組成のほかに、MnO
2,ZnO,SiO2,Fe2O3など、一般にフラッ
クスと考えられている塩類,酸化物などを特性を損なわ
ない範囲で加えることもできる。In addition to the above basic composition, MnO
2. Salts, oxides, etc., which are generally considered to be fluxes, such as ZnO, SiO2, and Fe2O3, can also be added within a range that does not impair the properties.
【0039】[0039]
【発明の効果】以上のように本発明よれば、高い誘電率
を有しかつ誘電損失が小さく、さらに絶縁破壊電圧、絶
縁抵抗が大きく、また結晶粒径が小さい誘電体磁器が得
られるため誘電体厚みを薄くでき、製品の小型化,大容
量化が可能である。As described above, according to the present invention, a dielectric ceramic having a high dielectric constant, low dielectric loss, high dielectric breakdown voltage, high insulation resistance, and small crystal grain size can be obtained. The body thickness can be reduced, making it possible to downsize the product and increase capacity.
【図1】本発明の一実施例における誘電体磁器組成物の
主成分の組成範囲を示す三元図FIG. 1 is a ternary diagram showing the composition range of the main components of a dielectric ceramic composition in one embodiment of the present invention
【図2】本発明の他の実施例における誘電体磁器組成物
の主成分の組成範囲を示す三元図FIG. 2 is a ternary diagram showing the composition range of the main components of a dielectric ceramic composition in another embodiment of the present invention.
Claims (4)
rO)m]・yTiO2・zNdO3/2で表され、m
の値が0.005≦m≦0.100の範囲にある組成を
有し、かつx,yおよびzはモル比を表し、x+y+z
=1でx,y,zの値が、 aはx=0.430、y=0.525、z=0.045
、 bはx=0.475、y=0.490、z=0.035
、 cはx=0.490、y=0.505、z=0.005
、 dはx=0.450、y=0.545、z=0.005
、 で示すa,b,c,dで囲まれるモル比の範囲からなる
組成を有することを特徴とする誘電体磁器組成物。Claim 1: In general, x[(BaO)(1-m)(S
rO)m]・yTiO2・zNdO3/2, m
has a composition in which the value of is in the range of 0.005≦m≦0.100, and x, y and z represent the molar ratio, and x+y+z
= 1 and the values of x, y, z are: a is x = 0.430, y = 0.525, z = 0.045
, b is x=0.475, y=0.490, z=0.035
, c is x=0.490, y=0.505, z=0.005
, d is x=0.450, y=0.545, z=0.005
, A dielectric ceramic composition having a composition having a molar ratio range surrounded by a, b, c, and d.
ム酸化物がCaOの形に換算してmの値が0.005≦
m≦0.200の範囲からなる組成を有することを特徴
とする請求項1記載の誘電体磁器組成物。Claim 2: Instead of strontium oxide, calcium oxide has a value of m of 0.005≦ in terms of CaO form.
The dielectric ceramic composition according to claim 1, having a composition in the range of m≦0.200.
算して0.3〜3.0重量部添加されてなることを特徴
とする請求項1記載の誘電体磁器組成物。3. The dielectric ceramic composition according to claim 1, wherein 0.3 to 3.0 parts by weight of niobium in the form of Nb2O5 is added as a subcomponent.
算して0.3〜3.0重量部添加されてなることを特徴
とする請求項2記載の誘電体磁器組成物。4. The dielectric ceramic composition according to claim 2, wherein 0.3 to 3.0 parts by weight of niobium in the form of Nb2O5 is added as a subcomponent.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3131000A JPH04357608A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3131000A JPH04357608A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04357608A true JPH04357608A (en) | 1992-12-10 |
Family
ID=15047606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3131000A Pending JPH04357608A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04357608A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0882688A1 (en) * | 1997-05-29 | 1998-12-09 | Ngk Spark Plug Co., Ltd | Microwave dielectric porcelain composition |
-
1991
- 1991-06-03 JP JP3131000A patent/JPH04357608A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0882688A1 (en) * | 1997-05-29 | 1998-12-09 | Ngk Spark Plug Co., Ltd | Microwave dielectric porcelain composition |
US5977005A (en) * | 1997-05-29 | 1999-11-02 | Ngk Spark Plug Co., Ltd. | Microwave dielectric porcelain composition |
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