JPH04357619A - Dielectric porcelain composition - Google Patents
Dielectric porcelain compositionInfo
- Publication number
- JPH04357619A JPH04357619A JP3130998A JP13099891A JPH04357619A JP H04357619 A JPH04357619 A JP H04357619A JP 3130998 A JP3130998 A JP 3130998A JP 13099891 A JP13099891 A JP 13099891A JP H04357619 A JPH04357619 A JP H04357619A
- Authority
- JP
- Japan
- Prior art keywords
- point
- rare earth
- weight
- dielectric
- nb2o5
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 239000000203 mixture Substances 0.000 title claims abstract description 37
- 229910052573 porcelain Inorganic materials 0.000 title abstract description 4
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims abstract description 40
- 229910052777 Praseodymium Inorganic materials 0.000 claims abstract description 16
- 229910052746 lanthanum Inorganic materials 0.000 claims abstract description 16
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 16
- 229910052779 Neodymium Inorganic materials 0.000 claims abstract description 15
- 239000010955 niobium Substances 0.000 claims abstract description 14
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 13
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims abstract description 13
- GNTDGMZSJNCJKK-UHFFFAOYSA-N divanadium pentaoxide Chemical compound O=[V](=O)O[V](=O)=O GNTDGMZSJNCJKK-UHFFFAOYSA-N 0.000 claims description 31
- 239000000919 ceramic Substances 0.000 claims description 25
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 11
- 229910052715 tantalum Inorganic materials 0.000 claims description 6
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 6
- 229910052720 vanadium Inorganic materials 0.000 claims description 6
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 abstract description 19
- 229910052772 Samarium Inorganic materials 0.000 abstract description 3
- 150000001875 compounds Chemical class 0.000 abstract description 3
- 239000002245 particle Substances 0.000 abstract 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 abstract 1
- 230000015556 catabolic process Effects 0.000 description 19
- 238000009413 insulation Methods 0.000 description 18
- 235000010215 titanium dioxide Nutrition 0.000 description 9
- 230000000694 effects Effects 0.000 description 8
- 239000000843 powder Substances 0.000 description 8
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- QVQLCTNNEUAWMS-UHFFFAOYSA-N barium oxide Inorganic materials [Ba]=O QVQLCTNNEUAWMS-UHFFFAOYSA-N 0.000 description 6
- -1 T iO2 Inorganic materials 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 description 4
- PLDDOISOJJCEMH-UHFFFAOYSA-N neodymium oxide Inorganic materials [O-2].[O-2].[O-2].[Nd+3].[Nd+3] PLDDOISOJJCEMH-UHFFFAOYSA-N 0.000 description 4
- FKTOIHSPIPYAPE-UHFFFAOYSA-N samarium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Sm+3].[Sm+3] FKTOIHSPIPYAPE-UHFFFAOYSA-N 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- 239000004408 titanium dioxide Substances 0.000 description 4
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 4
- 229910002637 Pr6O11 Inorganic materials 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- NLQFUUYNQFMIJW-UHFFFAOYSA-N dysprosium(III) oxide Inorganic materials O=[Dy]O[Dy]=O NLQFUUYNQFMIJW-UHFFFAOYSA-N 0.000 description 3
- CMIHHWBVHJVIGI-UHFFFAOYSA-N gadolinium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Gd+3].[Gd+3] CMIHHWBVHJVIGI-UHFFFAOYSA-N 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum oxide Inorganic materials [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- KTUFCUMIWABKDW-UHFFFAOYSA-N oxo(oxolanthaniooxy)lanthanum Chemical compound O=[La]O[La]=O KTUFCUMIWABKDW-UHFFFAOYSA-N 0.000 description 1
- SOQBVABWOPYFQZ-UHFFFAOYSA-N oxygen(2-);titanium(4+) Chemical class [O-2].[O-2].[Ti+4] SOQBVABWOPYFQZ-UHFFFAOYSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は電子機器用固定磁器コン
デンサの誘電体磁器組成物に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dielectric ceramic composition for a fixed ceramic capacitor for electronic equipment.
【0002】0002
【従来の技術】以下に従来の誘電体磁器組成物について
説明する。誘電体磁器組成物として下記のような系が知
られている。BACKGROUND OF THE INVENTION Conventional dielectric ceramic compositions will be explained below. The following systems are known as dielectric ceramic compositions.
【0003】BaO・TiO2・Nd2O3系BaO・
TiO2・Sm2O3系
例えば0.09BaO・0.56TiO2・0.35N
dO3/2の組成比からなる誘電体磁器組成物を使用し
、誘電体磁器円板を作製し、電気特性を測定すると、誘
電率:67,静電容量温度係数:N40ppm/℃,Q
:3000,絶縁抵抗:8.0×1012Ω,絶縁破壊
強度:30kv/mmの値が得られた。[0003] BaO・TiO2・Nd2O3 system BaO・
TiO2/Sm2O3 system e.g. 0.09BaO/0.56TiO2/0.35N
A dielectric ceramic disk was prepared using a dielectric ceramic composition having a composition ratio of dO3/2, and its electrical properties were measured. Dielectric constant: 67, capacitance temperature coefficient: N40 ppm/℃, Q
: 3000, insulation resistance: 8.0×10 12 Ω, and dielectric breakdown strength: 30 kv/mm.
【0004】0004
【発明が解決しようとする課題】しかしながら、上記の
従来の構成では、絶縁抵抗が小さく、絶縁破壊強度も小
さいという問題点を有していた。However, the above-mentioned conventional structure has the problems of low insulation resistance and low dielectric breakdown strength.
【0005】本発明は上記従来の問題点を解決するもの
で、絶縁抵抗,絶縁破壊強度が大きい誘電体磁器を得る
ことができる誘電体磁器組成物を提供することを目的と
する。The present invention solves the above-mentioned conventional problems, and aims to provide a dielectric porcelain composition capable of obtaining dielectric porcelain having high insulation resistance and dielectric breakdown strength.
【0006】[0006]
【課題を解決するための手段】この課題を解決するため
に本発明の誘電体磁器組成物は、一般式x[(BaO)
(1−m)(MgO)m]・yTiO2・z(R(1−
t)Met)O3/2で表され、式中RはLa,Pr,
Nd,Smから選ばれる1種以上の希土類元素で、Me
はLa,Pr,Nd,Smを除く希土類元素から選ばれ
る1種以上の希土類元素であり、mおよびtの値が0.
01≦m≦0.50および0.01≦t≦0.20なる
範囲にある組成を有し、かつx,yおよびzはモル比を
表し、x+y+z=1でx,y,zの値が、
aはx=0.15、y=0.50、z=0.35、bは
x=0.16、y=0.61、z=0.23、cはx=
0.10、y=0.67、z=0.23、dはx=0.
09、y=0.60、z=0.31、eはx=0.02
、y=0.58、z=0.40、fはx=0.02、y
=0.52、z=0.46、で示すa,b,c,d,e
,fで囲まれるモル比の範囲にある組成を有する主成分
100重量部、およびニオブをNb2O5の形に換算し
て0.3〜5.0重量部からなるものである。[Means for Solving the Problem] In order to solve this problem, the dielectric ceramic composition of the present invention has the general formula x[(BaO)
(1-m)(MgO)m]・yTiO2・z(R(1-
t)Met)O3/2, where R is La, Pr,
One or more rare earth elements selected from Nd, Sm, Me
is one or more rare earth elements selected from rare earth elements excluding La, Pr, Nd, and Sm, and the values of m and t are 0.
It has a composition in the range of 01≦m≦0.50 and 0.01≦t≦0.20, and x, y, and z represent the molar ratio, and the values of x, y, and z are x+y+z=1. , a is x=0.15, y=0.50, z=0.35, b is x=0.16, y=0.61, z=0.23, c is x=
0.10, y=0.67, z=0.23, d is x=0.
09, y=0.60, z=0.31, e is x=0.02
, y=0.58, z=0.40, f is x=0.02, y
=0.52, z=0.46, a, b, c, d, e
, f, and 0.3 to 5.0 parts by weight of niobium in the form of Nb2O5.
【0007】また、ニオブに代えて、タンタルがTa2
O5の形に換算して0.1〜10.0重量部含有されて
なるものである。[0007] Also, instead of niobium, tantalum can be used as Ta2.
It is contained in an amount of 0.1 to 10.0 parts by weight in terms of O5 form.
【0008】さらには、ニオブに代えて、バナジウムが
V2O5の形に換算して0.005〜1.000重量部
含有されてなるものである。Furthermore, instead of niobium, vanadium is contained in an amount of 0.005 to 1.000 parts by weight in the form of V2O5.
【0009】さらにまた、ニオブに代えて、ニオブ,タ
ンタル,バナジウムから選ばれる2種以上がNb2O5
,Ta2O5,V2O5の形に換算して合計で0.00
1〜0.010モル部含有されてなるものである。Furthermore, in place of niobium, two or more selected from niobium, tantalum, and vanadium are Nb2O5.
, Ta2O5, V2O5 in total is 0.00
It contains 1 to 0.010 mole part.
【0010】0010
【作用】この構成によって、RをLa,Pr,Nd,S
mから選ぶことにより、La,Pr,Nd,Smの順で
静電容量温度係数をプラス方向に移行することとなる。[Operation] With this configuration, R can be changed to La, Pr, Nd, S
By selecting from m, the capacitance temperature coefficient shifts in the positive direction in the order of La, Pr, Nd, and Sm.
【0011】また、La,Pr,Nd,Smから選ばれ
る1種以上の希土類元素の一部を、La,Pr,Nd,
Smを除く希土類元素から選ばれる1種以上の希土類元
素で置換することにより、Qを大きくすることとなる。[0011] Further, a part of one or more rare earth elements selected from La, Pr, Nd, and Sm may be replaced by La, Pr, Nd,
Q can be increased by substituting with one or more rare earth elements selected from rare earth elements other than Sm.
【0012】さらに、BaOをMgOで置換することに
より、静電容量温度係数をプラス方向に移行させ、絶縁
抵抗を大きくすることとなる。Furthermore, by substituting BaO with MgO, the temperature coefficient of capacitance is shifted to the positive direction, and the insulation resistance is increased.
【0013】そして、ニオブ,タンタル,バナジウムも
しくはそれらから選ばれる2種以上を副成分として含有
させることにより、絶縁抵抗,絶縁破壊強度を大きくす
ることとなる。By containing niobium, tantalum, vanadium, or two or more selected from these as subcomponents, the insulation resistance and dielectric breakdown strength can be increased.
【0014】[0014]
【実施例】以下、本発明の一実施例について説明する。[Embodiment] An embodiment of the present invention will be described below.
【0015】(実施例1)出発原料には化学的に高純度
のNb2O5,La2O3,Pr6O11,Nd2O3
,Sm2O3,CeO2,Gd2O3,Dy2O3,T
iO2,MgOおよびBaCO3粉末を下記の(表1)
に示す組成比になるように秤量し、めのうボールを備え
たゴム内張りのボールミルに純水とともに入れ、湿式混
合後、脱水乾燥した。この乾燥粉末を高アルミナ質のル
ツボに入れ、空気中で1100℃にて2時間仮焼した。
この仮焼粉末を、めのうボールを備えたゴム内張りのボ
ールミルに純水とともに入れ、湿式粉砕後、脱水乾燥し
た。この粉砕粉末に、有機バインダーを加え、均質とし
た後、32メッシュのふるいを通して整粒し、金型と油
圧プレスを用いて成形圧力1ton/cm2で直径15
mm,厚み0.4mmに成形した。次いで、こうして得
られた成形円板をジルコニア粉末を敷いたアルミナ質の
サヤに入れ、空気中にて(表1)に示す焼成温度で2時
間焼成し、(表1)の試料番号1〜10に示す組成比の
誘電体磁器円板を得た。(Example 1) Chemically high-purity Nb2O5, La2O3, Pr6O11, Nd2O3 are used as starting materials.
, Sm2O3, CeO2, Gd2O3, Dy2O3, T
iO2, MgO and BaCO3 powders as shown below (Table 1)
The mixture was weighed so as to have the composition ratio shown in , and put into a rubber-lined ball mill equipped with agate balls together with pure water, and after wet mixing, it was dehydrated and dried. This dry powder was placed in a high alumina crucible and calcined in air at 1100°C for 2 hours. This calcined powder was put into a rubber-lined ball mill equipped with agate balls together with pure water, wet-pulverized, and then dehydrated and dried. After adding an organic binder to this pulverized powder and making it homogeneous, it was sized through a 32-mesh sieve, and the diameter was 15 mm using a mold and a hydraulic press at a molding pressure of 1 ton/cm2.
mm, thickness 0.4 mm. Next, the thus obtained molded disks were placed in an alumina pod covered with zirconia powder, and fired in air at the firing temperatures shown in Table 1 for 2 hours. A dielectric ceramic disk having the composition ratio shown in was obtained.
【0016】[0016]
【表1】[Table 1]
【0017】このようにして得られた誘電体磁器円板は
、厚みと直径を測定し、誘電率,Q,静電容量温度係数
測定用試料は、誘電体磁器円板の両面全体に銀電極を焼
き付け、絶縁抵抗,絶縁破壊強度測定用試料は、誘電体
磁器円板の外周より内側に1mmの幅で銀電極のない部
分を設け、銀電極を焼き付けた。そして、誘電率,Q,
静電容量温度係数は、横河・ヒューレット・パッカード
(株)社製デジタルLCRメータのモデル4275Aを
使用し、測定温度20℃,測定電圧1.0Vrms,測
定周波数1MHzでの測定より求めた。なお、静電容量
温度係数は、20℃と85℃の静電容量を測定し、次式
により求めた。The thickness and diameter of the dielectric ceramic disk thus obtained were measured, and a sample for measuring the dielectric constant, Q, and capacitance temperature coefficient was prepared using silver electrodes on both sides of the dielectric ceramic disk. A sample for measuring insulation resistance and dielectric breakdown strength was prepared by providing a 1 mm wide portion without a silver electrode inside the outer periphery of a dielectric ceramic disk, and baking a silver electrode thereon. And the dielectric constant, Q,
The capacitance temperature coefficient was determined using a digital LCR meter model 4275A manufactured by Yokogawa-Hewlett-Packard Co., Ltd. at a measurement temperature of 20° C., a measurement voltage of 1.0 Vrms, and a measurement frequency of 1 MHz. The capacitance temperature coefficient was determined by measuring capacitance at 20° C. and 85° C. using the following formula.
【0018】
TC=(C−Co)/Co×1/65×106TC:静
電容量温度係数(ppm/℃)Co:20℃での静電容
量(pF)
C:85℃での静電容量(pF)
また、誘電率は次式より求めた。TC=(C-Co)/Co×1/65×106TC: Temperature coefficient of capacitance (ppm/°C) Co: Capacitance at 20°C (pF) C: Capacitance at 85°C (pF) Further, the dielectric constant was determined from the following formula.
【0019】K=143.8×Co×t/D2K:誘電
率
Co:20℃での静電容量(pF)
D:誘電体磁器の直径(mm)
t:誘電体磁器の厚み(mm)
さらに、絶縁抵抗は、横河・ヒューレット・パッカード
(株)社製HRメータのモデル4329Aを使用し、測
定電圧50V.D.C.,測定時間1分間による測定よ
り求めた。K=143.8×Co×t/D2K: Dielectric constant Co: Capacitance at 20°C (pF) D: Diameter of dielectric ceramic (mm) t: Thickness of dielectric ceramic (mm) Further , insulation resistance was measured using Yokogawa-Hewlett-Packard Co., Ltd. HR meter model 4329A, and the measurement voltage was 50V. D. C. , was determined from measurements with a measurement time of 1 minute.
【0020】そして、絶縁破壊強度は、菊水電子工業(
株)製高電圧電源PHS35K−3形を使用し、試料を
シリコンオイル中に入れ、昇圧速度50V/secによ
り求めた絶縁破壊電圧を誘電体厚みで除算し、1mm当
たりの絶縁破壊強度とした。[0020]The dielectric breakdown strength was determined by Kikusui Electronics (
Using a high voltage power supply model PHS35K-3 manufactured by Co., Ltd., the sample was placed in silicone oil, and the dielectric breakdown voltage determined at a voltage increase rate of 50 V/sec was divided by the dielectric thickness to obtain the dielectric breakdown strength per 1 mm.
【0021】上記測定結果を試料番号1〜10別に(表
2)に示す。The above measurement results are shown separately for sample numbers 1 to 10 (Table 2).
【0022】[0022]
【表2】[Table 2]
【0023】また、図1は本発明にかかる組成物の主成
分の組成範囲を示す三元図であり、主成分の組成範囲を
限定した理由を図1を参照しながら説明する。すなわち
、A領域では焼結が著しく困難である。また、B領域で
はQが小さく実用的でなくなる。さらに、C,D領域で
は静電容量温度係数がマイナス側に大きくなりすぎて実
用的でなくなる。そして、E領域では静電容量温度係数
がプラス方向に移行するが誘電率が小さく実用的でなく
なる。また、RをLa,Pr,Nd,Smから選ぶこと
により、La,Pr,Nd,Smの順で誘電率を大きく
下げることなく、静電容量温度係数をプラス方向に移行
することが可能であり、La,Pr,Nd,Smの1種
あるいはそれらの組合せにより静電容量温度係数の調節
が可能である。FIG. 1 is a ternary diagram showing the composition range of the main components of the composition according to the present invention, and the reason for limiting the composition range of the main components will be explained with reference to FIG. That is, sintering is extremely difficult in region A. Further, in region B, Q is small and becomes impractical. Furthermore, in regions C and D, the capacitance temperature coefficient becomes too large on the negative side, making it impractical. In region E, the temperature coefficient of capacitance shifts to a positive direction, but the dielectric constant is too small to be practical. In addition, by selecting R from La, Pr, Nd, and Sm, it is possible to shift the capacitance temperature coefficient in the positive direction without significantly lowering the dielectric constant in the order of La, Pr, Nd, and Sm. , La, Pr, Nd, and Sm, or a combination thereof, the capacitance temperature coefficient can be adjusted.
【0024】さらに、La,Pr,Nd,Smから選ば
れる1種以上の希土類元素の一部を、La,Pr,Nd
,Smを除く希土類元素から選ばれる1種以上の希土類
元素で置換することにより、Qを大きくする効果を有し
ているが、その置換率tが0.01未満では置換効果は
なく、一方0.20を超えると誘電率が小さくなり実用
的でなくなる。[0024] Further, a part of one or more rare earth elements selected from La, Pr, Nd, and Sm is
, substitution with one or more rare earth elements selected from rare earth elements other than Sm has the effect of increasing Q, but if the substitution rate t is less than 0.01, there is no substitution effect; If it exceeds .20, the dielectric constant becomes too small to be practical.
【0025】そして、BaOをMgOで置換することに
より、誘電率,Q,絶縁破壊強度の値を大きく変えるこ
となく、静電容量温度係数をプラス方向に移行させ、絶
縁抵抗を大きくする効果を有しているが、その置換率m
が0.01未満では置換効果はなく、一方0.50を超
えると誘電率が小さくなり実用的でなくなる。[0025] By replacing BaO with MgO, it is possible to shift the capacitance temperature coefficient in the positive direction and increase the insulation resistance without significantly changing the dielectric constant, Q, and dielectric breakdown strength. However, the replacement rate m
If it is less than 0.01, there will be no substitution effect, while if it exceeds 0.50, the dielectric constant will be too small to be practical.
【0026】また、主成分に対し、副成分としてのNb
2O5を含有することにより、絶縁抵抗,絶縁破壊強度
を大きくする効果を有しているが、Nb2O5の含有量
が主成分100重量部に対し、0.3重量部未満はそれ
ほど絶縁破壊強度が大きくなく、この発明の範囲から除
外した。一方、Nb2O5の含有量が主成分に対し、5
.0重量部を超えるとQ,絶縁抵抗が小さくなり、静電
容量温度係数がマイナス側に大きくなり実用的でなくな
る。[0026] Also, with respect to the main component, Nb as a subcomponent
Containing 2O5 has the effect of increasing insulation resistance and dielectric breakdown strength, but if the content of Nb2O5 is less than 0.3 parts by weight per 100 parts by weight of the main component, the dielectric breakdown strength is not so high. Therefore, it is excluded from the scope of this invention. On the other hand, the content of Nb2O5 is 5% compared to the main component.
.. If the amount exceeds 0 parts by weight, the insulation resistance (Q) decreases, and the temperature coefficient of capacitance increases to the negative side, making it impractical.
【0027】(実施例2)実施例1の原料の中で高純度
のNb2O5に代えて、高純度のTa2O5粉末を用い
て下記の(表3)に示す組成比になるように秤量し、以
降の工程を実施例1と同様に処理して(表3)の試料番
号11〜20に示す組成比の誘電体磁器円板を得、実施
例1と同様に処理して特性を測定した結果を試料番号1
1〜20別に(表4)に示す。(Example 2) High-purity Ta2O5 powder was used in place of high-purity Nb2O5 in the raw materials of Example 1, and the composition ratios shown in Table 3 below were weighed. Dielectric ceramic disks having the composition ratios shown in sample numbers 11 to 20 in Table 3 were obtained by processing the steps in the same manner as in Example 1, and the results were obtained by processing in the same manner as in Example 1 and measuring the characteristics. Sample number 1
1 to 20 (Table 4).
【0028】[0028]
【表3】[Table 3]
【0029】[0029]
【表4】[Table 4]
【0030】ここで、主成分の組成範囲と構成を限定し
た理由は、実施例1と同様であるので説明は省略する。
そして、主成分に対し、副成分としてのTa2O5を含
有することにより、絶縁抵抗,絶縁破壊強度を大きくす
る効果を有しているが、Ta2O5の含有量が主成分1
00重量部に対し、0.1重量部未満はそれほど絶縁破
壊強度が大きくなく、この発明の範囲から除外した。一
方、Ta2O5の含有量が主成分に対し、10.0重量
部を超えるとQ,絶縁抵抗が小さくなり、静電容量温度
係数がマイナス側に大きくなり実用的でなくなる。[0030] Here, the reason for limiting the composition range and structure of the main components is the same as in Example 1, so the explanation will be omitted. The addition of Ta2O5 as a subcomponent to the main component has the effect of increasing insulation resistance and dielectric breakdown strength;
If the amount is less than 0.1 part by weight, the dielectric breakdown strength is not so large and it is excluded from the scope of the present invention. On the other hand, if the content of Ta2O5 exceeds 10.0 parts by weight based on the main component, the insulation resistance (Q) decreases and the temperature coefficient of capacitance increases to the negative side, making it impractical.
【0031】(実施例3)実施例1の原料の中で高純度
のNb2O5に代えて、高純度のV2O5粉末を用いて
下記の(表5)に示す組成比になるように秤量し、以降
の工程を実施例1と同様に処理して(表5)の試料番号
21〜30に示す組成比の誘電体磁器円板を得、実施例
1と同様に処理して特性を測定した結果を試料番号21
〜30別に(表6)に示す。(Example 3) High-purity V2O5 powder was used in place of high-purity Nb2O5 among the raw materials in Example 1, and the composition ratio was as shown in Table 5 below. Dielectric ceramic disks having the composition ratios shown in sample numbers 21 to 30 in Table 5 were obtained by processing the steps in the same manner as in Example 1, and the results were obtained by processing in the same manner as in Example 1 and measuring the characteristics. Sample number 21
~30 separately (Table 6).
【0032】[0032]
【表5】[Table 5]
【0033】[0033]
【表6】[Table 6]
【0034】ここで、主成分の組成範囲と構成を限定し
た理由は、実施例1と同様であるので説明は省略する。
そして、主成分に対し、副成分としてのV2O5を含有
することにより、絶縁抵抗,絶縁破壊強度を大きくする
効果を有しているが、V2O5の含有量が主成分100
重量部に対し、0.005重量部未満はそれほど絶縁破
壊強度が大きくなく、この発明の範囲から除外した。一
方、V2O5の含有量が主成分に対し、1.000重量
部を超えるとQ,絶縁抵抗が小さくなり、実用的でなく
なる。[0034] Here, the reason for limiting the composition range and structure of the main components is the same as in Example 1, so the explanation will be omitted. By containing V2O5 as a subcomponent to the main component, it has the effect of increasing insulation resistance and dielectric breakdown strength, but the content of V2O5 is 100% of the main component.
If the amount is less than 0.005 parts by weight, the dielectric breakdown strength is not so high and it is excluded from the scope of the present invention. On the other hand, if the content of V2O5 exceeds 1.000 parts by weight based on the main component, the insulation resistance will decrease, making it impractical.
【0035】(実施例4)実施例1の原料の中で高純度
のNb2O5に代えて、高純度のNb2O5,Ta2O
5およびV2O5粉末を用いて下記の(表7)に示す組
成比になるように秤量し、以降の工程を実施例1と同様
に処理して(表7)の試料番号31〜40に示す組成比
の誘電体磁器円板を得、実施例1と同様に処理して特性
を測定した結果を試料番号31〜40別に(表8)に示
す。(Example 4) In place of high-purity Nb2O5 among the raw materials of Example 1, high-purity Nb2O5, Ta2O
5 and V2O5 powder were weighed so as to have the composition ratio shown in Table 7 below, and the subsequent steps were performed in the same manner as in Example 1 to obtain the compositions shown in sample numbers 31 to 40 (Table 7). Dielectric ceramic disks of different proportions were obtained, treated in the same manner as in Example 1, and their characteristics were measured. The results are shown in Table 8 for sample numbers 31 to 40.
【0036】[0036]
【表7】[Table 7]
【0037】[0037]
【表8】[Table 8]
【0038】ここで、主成分の組成範囲と構成を限定し
た理由は、実施例1と同様であるので説明は省略する。
そして、主成分に対し、副成分としてのNb2O5,T
a2O5,V2O5を含有することにより、絶縁抵抗,
絶縁破壊強度を大きくする効果を有しているが、Nb2
O5,Ta2O5,V2O5の含有量の合計が主成分1
00重量部に対し、0.001モル部未満はそれほど絶
縁破壊強度が大きくなく、この発明の範囲から除外した
。一方、Nb2O5,Ta2O5,V2O5の含有量の
合計が主成分に対し、0.010モル部を超えるとQ,
絶縁抵抗が小さくなり、静電容量温度係数がマイナス側
に大きくなり実用的でなくなる。また、Nb2O5,T
a2O5,V2O5から選ばれる2種以上を含有するこ
とにより、Nb2O5,Ta2O5,V2O5から選ば
れる1種を含有するものに比べ、誘電率,Q,絶縁抵抗
,絶縁破壊強度が大きく、静電容量温度係数を小さくす
ることができる。[0038] Here, the reason for limiting the composition range and structure of the main components is the same as in Example 1, so the explanation will be omitted. Then, with respect to the main component, Nb2O5 and T as subcomponents
By containing a2O5 and V2O5, insulation resistance,
Although it has the effect of increasing dielectric breakdown strength, Nb2
The total content of O5, Ta2O5, and V2O5 is the main component 1
If the amount is less than 0.001 parts by mole, the dielectric breakdown strength is not so large and is excluded from the scope of the present invention. On the other hand, if the total content of Nb2O5, Ta2O5, and V2O5 exceeds 0.010 mole part based on the main components, Q,
The insulation resistance becomes small and the temperature coefficient of capacitance becomes large on the negative side, making it impractical. Also, Nb2O5,T
By containing two or more types selected from a2O5 and V2O5, the dielectric constant, Q, insulation resistance, and dielectric breakdown strength are higher than those containing one type selected from Nb2O5, Ta2O5, and V2O5, and the capacitance temperature is lower. The coefficient can be made smaller.
【0039】なお、上記実施例における誘電体磁器の作
製方法では、V2O5,Ta2O5,Nb2O5,La
2O3,Pr6O11,Nd2O3,Sm2O3,Ce
O2,Gd2O3,Dy2O3,TiO2,MgOおよ
びBaCO3を使用したが、この方法に限定されるもの
ではなく、所望の組成比になるように、BaTiO3な
どの化合物、あるいは炭酸塩,水酸化物など空気中での
加熱により、V2O5,Ta2O5,Nb2O5,La
2O3,Pr6O11,Nd2O3,Sm2O3,Ce
O2,Gd2O3,Dy2O3,TiO2,MgOおよ
びBaOとなる化合物を使用しても実施例と同程度の特
性を得ることができる。[0039] In the method for manufacturing dielectric ceramic in the above embodiment, V2O5, Ta2O5, Nb2O5, La
2O3, Pr6O11, Nd2O3, Sm2O3, Ce
Although O2, Gd2O3, Dy2O3, TiO2, MgO, and BaCO3 were used, the method is not limited to this method. Compounds such as BaTiO3, carbonates, hydroxides, etc. V2O5, Ta2O5, Nb2O5, La
2O3, Pr6O11, Nd2O3, Sm2O3, Ce
Even when compounds such as O2, Gd2O3, Dy2O3, TiO2, MgO and BaO are used, properties comparable to those of the examples can be obtained.
【0040】また、主成分をあらかじめ仮焼し、副成分
を添加しても実施例と同程度の特性を得ることができる
。Further, even if the main component is calcined in advance and subcomponents are added, properties comparable to those of the examples can be obtained.
【0041】さらに、誘電体磁器用として一般に使用さ
れる工業用原料の二酸化チタン、例えばチタン工業(株
)製二酸化チタンKA−10C、古河鉱業(株)製二酸
化チタンFA−55Wには最大0.45重量%のNb2
O5が含まれるが、これらの二酸化チタンを使用して実
施例1の主成分の誘電体磁器を作製しても主成分100
重量部に対して、Nb2O5の含有量は最大で0.23
重量部であり、この発明の範囲外であるが、工業用原料
の二酸化チタン中のNb2O5量を考慮し、不足分のN
b2O5を含有させることにより、実施例と同程度の特
性を得ることができる。Furthermore, titanium dioxide, an industrial raw material commonly used for dielectric ceramics, such as titanium dioxide KA-10C manufactured by Titan Kogyo Co., Ltd. and titanium dioxide FA-55W manufactured by Furukawa Mining Co., Ltd., has a maximum of 0. 45% by weight Nb2
Although O5 is included, even if the dielectric ceramic having the main component of Example 1 is made using these titanium dioxides, the main component is 100%.
The content of Nb2O5 is at most 0.23 in terms of parts by weight.
Although it is a part by weight and is outside the scope of this invention, considering the amount of Nb2O5 in titanium dioxide, which is an industrial raw material, the shortage of N
By containing b2O5, properties comparable to those of the examples can be obtained.
【0042】また、上述の基本組成のほかに、SiO2
,MnO2,Fe2O3,ZnO,Al2O3など、一
般にフラックスと考えられている塩類,酸化物などを、
特性を損なわない範囲で加えることもできる。[0042] In addition to the above basic composition, SiO2
, MnO2, Fe2O3, ZnO, Al2O3, and other salts and oxides that are generally considered to be fluxes.
It can also be added within a range that does not impair the characteristics.
【0043】[0043]
【発明の効果】以上の実施例の説明からも明らかなよう
に本発明は、一般式x[(BaO)(1−m)(MgO
)m]・yTiO2・z(R(1−t)Met)O3/
2で表され、式中RはLa,Pr,Nd,Smから選ば
れる1種以上の希土類元素で、MeはLa,Pr,Nd
,Smを除く希土類元素から選ばれる1種以上の希土類
元素であり、mおよびtの値が0.01≦m≦0.50
および0.01≦t≦0.20なる範囲にある組成を有
し、かつx,yおよびzはモル比を表し、x+y+z=
1でx,y,zの値が、所定の数値を示すa,b,c,
d,e,fで囲まれるモル比の範囲にある組成を主成分
とし、ニオブ,タンタル,バナジウムもしくはそれらか
ら選ばれる2種以上を副成分として含有させた誘電体磁
器組成物の構成により、誘電率,Q,絶縁抵抗,絶縁破
壊強度が大きく、静電容量温度係数が小さい誘電体磁器
を得ることができるものである。Effects of the Invention As is clear from the description of the examples above, the present invention provides the following advantages:
)m]・yTiO2・z(R(1-t)Met)O3/
2, where R is one or more rare earth elements selected from La, Pr, Nd, and Sm, and Me is La, Pr, and Nd.
, one or more rare earth elements selected from rare earth elements excluding Sm, and the values of m and t are 0.01≦m≦0.50.
and has a composition in the range of 0.01≦t≦0.20, and x, y and z represent molar ratios, and x+y+z=
1, the values of x, y, z are a, b, c, which indicate predetermined numerical values.
A dielectric ceramic composition containing niobium, tantalum, vanadium, or two or more selected from them as a subcomponent has a composition in the molar ratio range surrounded by d, e, and f as a main component. It is possible to obtain a dielectric ceramic having a large coefficient, Q, insulation resistance, and dielectric breakdown strength, and a small temperature coefficient of capacitance.
【図1】本発明の一実施例における誘電体磁器組成物の
主成分の組成範囲を説明する三元図FIG. 1 is a ternary diagram illustrating the composition range of the main components of a dielectric ceramic composition in one embodiment of the present invention.
Claims (4)
MgO)m]・yTiO2・z(R(1−t)Met)
O3/2で表され、式中RはLa,Pr,Nd,Smか
ら選ばれる1種以上の希土類元素で、MeはLa,Pr
,Nd,Smを除く希土類元素から選ばれる1種以上の
希土類元素であり、mおよびtの値が0.01≦m≦0
.50および0.01≦t≦0.20なる範囲にあり、
かつx,yおよびzはモル比を表し、x+y+z=1で
x,y,zの値が、 aはx=0.15、y=0.50、z=0.35、bは
x=0.16、y=0.61、z=0.23、cはx=
0.10、y=0.67、z=0.23、dはx=0.
09、y=0.60、z=0.31、eはx=0.02
、y=0.58、z=0.40、fはx=0.02、y
=0.52、z=0.46、で示すa,b,c,d,e
,fで囲まれるモル比の範囲にある組成を有する主成分
100重量部、およびニオブをNb2O5の形に換算し
て0.3〜5.0重量部からなる誘電体磁器組成物。Claim 1: The general formula is x[(BaO)(1-m)(
MgO)m]・yTiO2・z(R(1-t)Met)
O3/2, where R is one or more rare earth elements selected from La, Pr, Nd, and Sm, and Me is La, Pr.
, Nd, and one or more rare earth elements selected from rare earth elements excluding Sm, and the values of m and t are 0.01≦m≦0.
.. 50 and in the range of 0.01≦t≦0.20,
And x, y, and z represent the molar ratio, and the values of x, y, and z are x+y+z=1, a is x=0.15, y=0.50, z=0.35, and b is x=0. .16, y=0.61, z=0.23, c is x=
0.10, y=0.67, z=0.23, d is x=0.
09, y=0.60, z=0.31, e is x=0.02
, y=0.58, z=0.40, f is x=0.02, y
=0.52, z=0.46, a, b, c, d, e
, f, and 0.3 to 5.0 parts by weight of niobium in the form of Nb2O5.
形に換算して0.1〜10.0重量部含有されてなる請
求項1記載の誘電体磁器組成物。2. The dielectric ceramic composition according to claim 1, containing 0.1 to 10.0 parts by weight of tantalum in the form of Ta2O5 instead of niobium.
形に換算して0.005〜1.000重量部含有されて
なる請求項1記載の誘電体磁器組成物。3. The dielectric ceramic composition according to claim 1, which contains 0.005 to 1.000 parts by weight of vanadium in the form of V2O5 in place of niobium.
ジウムから選ばれる2種以上がNb2O5,Ta2O5
,V2O5の形に換算して合計で0.001〜0.01
0モル部含有されてなる請求項1記載の誘電体磁器組成
物。Claim 4: Instead of niobium, two or more selected from niobium, tantalum, and vanadium are Nb2O5, Ta2O5
, 0.001 to 0.01 in total when converted to V2O5 form
The dielectric ceramic composition according to claim 1, wherein the dielectric ceramic composition contains 0 mole part.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3130998A JPH04357619A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3130998A JPH04357619A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04357619A true JPH04357619A (en) | 1992-12-10 |
Family
ID=15047554
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3130998A Pending JPH04357619A (en) | 1991-06-03 | 1991-06-03 | Dielectric porcelain composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04357619A (en) |
-
1991
- 1991-06-03 JP JP3130998A patent/JPH04357619A/en active Pending
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