JPH04334860A - 質量分析装置用の検出器 - Google Patents

質量分析装置用の検出器

Info

Publication number
JPH04334860A
JPH04334860A JP3106067A JP10606791A JPH04334860A JP H04334860 A JPH04334860 A JP H04334860A JP 3106067 A JP3106067 A JP 3106067A JP 10606791 A JP10606791 A JP 10606791A JP H04334860 A JPH04334860 A JP H04334860A
Authority
JP
Japan
Prior art keywords
detector
main body
cell
permanent magnet
wiring system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3106067A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0559540B2 (enrdf_load_html_response
Inventor
Hiromi Yamazaki
博実 山崎
Yasushi Takakuwa
高桑　保志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikkiso Co Ltd
Original Assignee
Nikkiso Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikkiso Co Ltd filed Critical Nikkiso Co Ltd
Priority to JP3106067A priority Critical patent/JPH04334860A/ja
Publication of JPH04334860A publication Critical patent/JPH04334860A/ja
Publication of JPH0559540B2 publication Critical patent/JPH0559540B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP3106067A 1991-05-10 1991-05-10 質量分析装置用の検出器 Granted JPH04334860A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3106067A JPH04334860A (ja) 1991-05-10 1991-05-10 質量分析装置用の検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3106067A JPH04334860A (ja) 1991-05-10 1991-05-10 質量分析装置用の検出器

Publications (2)

Publication Number Publication Date
JPH04334860A true JPH04334860A (ja) 1992-11-20
JPH0559540B2 JPH0559540B2 (enrdf_load_html_response) 1993-08-31

Family

ID=14424261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3106067A Granted JPH04334860A (ja) 1991-05-10 1991-05-10 質量分析装置用の検出器

Country Status (1)

Country Link
JP (1) JPH04334860A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008509513A (ja) * 2004-08-05 2008-03-27 サントル ナシオナル ドゥ ラ ルシェルシェサイアンティフィク（セエヌエールエス） 長手方向の永久磁石を具備したイオントラップ、及びこのような磁石を使用した質量分析計

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008509513A (ja) * 2004-08-05 2008-03-27 サントル ナシオナル ドゥ ラ ルシェルシェサイアンティフィク（セエヌエールエス） 長手方向の永久磁石を具備したイオントラップ、及びこのような磁石を使用した質量分析計

Also Published As

Publication number Publication date
JPH0559540B2 (enrdf_load_html_response) 1993-08-31

Similar Documents

Publication Publication Date Title
JP2674603B2 (ja) 環境走査電子顕微鏡の対物レンズ組立体
US9366736B2 (en) Sealed magic angle spinning nuclear magnetic resonance probe and process for spectroscopy of hazardous samples
JPH06509209A (ja) 粒子加速器用超伝導電磁石
CN210467753U (zh) 一种射频离子源装置
CN113358940A (zh) 磁屏蔽性能测试装置
JPH04334860A (ja) 質量分析装置用の検出器
US10768248B2 (en) NMR probe head with a backbone in the shielding tube
KR20090073524A (ko) 극저온 초단증폭기를 이용한 고감도 푸리에변환 이온싸이클로트론 공명 질량분석기
JPS6322605B2 (enrdf_load_html_response)
CN105355534B (zh) 一种实现电感耦合等离子体离子源工作在惰性气体环境的方法及装置
JPH0541196A (ja) 荷電粒子ビームモニタ
CN113820636A (zh) 蓝宝石盒型窗连接的溶融型动态核极化探头波导传输结构
JP6040736B2 (ja) リーク検査治具及びリーク検査装置
EP0250675A1 (en) Superconducting magnet
JPH07296991A (ja) マイクロ波プラズマ発生装置
JPS61100647A (ja) ガス検出用プローブ
CN223401050U (zh) 粒子束成分测量装置
JP2002359111A (ja) 水平方向磁場発生用超電導マグネット
CN115265936B (zh) 质谱检测装置和质谱检漏仪
JPH08320271A (ja) ガスリーク検知装置
JPH07260619A (ja) ガスリーク検出装置
JPH0514225B2 (enrdf_load_html_response)
Berheide et al. A new UHV setup for investigations of narrow nuclear resonances with high energy resolution ion beams
JP2511670B2 (ja) 磁気シ−ルドされた測定子
Milner A cold-cathode mass spectrometer leak detector

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19940208

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080831

Year of fee payment: 15

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110831

Year of fee payment: 18

EXPY Cancellation because of completion of term
FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110831

Year of fee payment: 18