JPH0428442U - - Google Patents

Info

Publication number
JPH0428442U
JPH0428442U JP6869890U JP6869890U JPH0428442U JP H0428442 U JPH0428442 U JP H0428442U JP 6869890 U JP6869890 U JP 6869890U JP 6869890 U JP6869890 U JP 6869890U JP H0428442 U JPH0428442 U JP H0428442U
Authority
JP
Japan
Prior art keywords
probe
support substrate
probes
wiring
insulating ring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6869890U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6869890U priority Critical patent/JPH0428442U/ja
Publication of JPH0428442U publication Critical patent/JPH0428442U/ja
Pending legal-status Critical Current

Links

JP6869890U 1990-06-28 1990-06-28 Pending JPH0428442U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6869890U JPH0428442U (zh) 1990-06-28 1990-06-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6869890U JPH0428442U (zh) 1990-06-28 1990-06-28

Publications (1)

Publication Number Publication Date
JPH0428442U true JPH0428442U (zh) 1992-03-06

Family

ID=31603357

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6869890U Pending JPH0428442U (zh) 1990-06-28 1990-06-28

Country Status (1)

Country Link
JP (1) JPH0428442U (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008093465A1 (ja) * 2007-01-29 2008-08-07 Advantest Corporation 試験装置およびプローブカード

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008093465A1 (ja) * 2007-01-29 2008-08-07 Advantest Corporation 試験装置およびプローブカード
US7960991B2 (en) 2007-01-29 2011-06-14 Advantest Corporation Test apparatus and probe card

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