JPS645174U - - Google Patents
Info
- Publication number
- JPS645174U JPS645174U JP9896787U JP9896787U JPS645174U JP S645174 U JPS645174 U JP S645174U JP 9896787 U JP9896787 U JP 9896787U JP 9896787 U JP9896787 U JP 9896787U JP S645174 U JPS645174 U JP S645174U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- mounting member
- notch
- semiconductor
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9896787U JPS645174U (zh) | 1987-06-27 | 1987-06-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9896787U JPS645174U (zh) | 1987-06-27 | 1987-06-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS645174U true JPS645174U (zh) | 1989-01-12 |
Family
ID=31325696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9896787U Pending JPS645174U (zh) | 1987-06-27 | 1987-06-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS645174U (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126851A (ja) * | 1991-05-22 | 1993-05-21 | Tokyo Electron Yamanashi Kk | 半導体デバイスの検査装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4947568B1 (zh) * | 1970-02-23 | 1974-12-17 | ||
| JPS6258779B2 (zh) * | 1986-03-27 | 1987-12-08 | Satake Eng Co Ltd |
-
1987
- 1987-06-27 JP JP9896787U patent/JPS645174U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4947568B1 (zh) * | 1970-02-23 | 1974-12-17 | ||
| JPS6258779B2 (zh) * | 1986-03-27 | 1987-12-08 | Satake Eng Co Ltd |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126851A (ja) * | 1991-05-22 | 1993-05-21 | Tokyo Electron Yamanashi Kk | 半導体デバイスの検査装置 |