JPH0424459Y2 - - Google Patents

Description

[Detailed Description of the Invention] (1) Technical Field of the Invention The present invention relates to a socket for measuring integrated circuits with a heater.

(2) Background of the technology Before shipment, each semiconductor integrated circuit package (hereinafter abbreviated as IC) undergoes an electrical guarantee test for temperature characteristics using an IC socket. Conventionally, tests were performed by making a connection (contact) with the IC socket in which the IC was placed in a thermostatic chamber and then running a wire to the tester. The temperature inside the constant temperature chamber is usually maintained at a temperature in the range of 100°C to 150°C, although it varies depending on the type of IC, and only a deviation of ±2°C is allowed during guarantee tests. For this purpose, as mentioned above, the test is performed while the ICs (in some cases numbering as many as several hundred) are left in a thermostatic chamber.

(3) Prior art and problems In the above-mentioned guarantee test, if the IC is bipolar, a considerable amount of current will flow through it, and although improvements have been made to the grounding wire, there is a problem that noise will be introduced. To solve this problem, I would like to shorten the line from the IC socket to the tester. for that purpose,
Place the tester near the thermostatic oven, and immediately place the IC taken out from the thermostatic oven into the IC socket.
It has been proposed to connect the IC socket to the tester using a short wire to perform the test.

However, when an IC taken out of the above-mentioned constant temperature bath at a temperature of 100° C. to 150° C. is placed in a room temperature atmosphere, cooling begins rapidly. Also, some recent ICs have around 200 pins, and if you pull out connection lines from these many pins through the IC socket,
The amount of heat that escapes through the connecting wires is also considerable,
It becomes extremely difficult to test the temperature characteristics within the above-mentioned tolerance of temperature deviation of ±2°C. It has also been proposed to place a handler in a thermostatic chamber and connect this handler to a tester, but there is a problem that this would take too much time. As mentioned above, IC
Since guarantee testing is always performed on each IC, a slight increase in the time required to test one IC results in a significant loss of time as many tests are repeated.

(4) Purpose of the invention In view of the above-mentioned conventional problems, the present invention has been developed to perform electrical guarantee tests on the temperature characteristics of ICs by performing temperature deviations of ±2 outside the thermostatic oven instead of conducting the tests inside the thermostatic oven. Provides an IC measurement socket that allows accurate electrical testing of IC temperature characteristics within the temperature tolerance and without increasing the length of the connection line between the IC socket and the tester. The purpose is to

(5) Structure of the Invention According to the present invention, the present invention comprises a socket for measuring integrated circuits and a socket heater integrally combined with the socket, and a semiconductor integrated circuit package to be tested is housed in the recess of the socket. The socket heater is formed as a frame for receiving the socket, and the frame is provided with at least one heater for heating the socket and a temperature sensor for detecting the temperature of the socket, and these heaters and temperature sensors are connected to a temperature controller. This is achieved by providing a socket for measuring integrated circuits with a heater, which is characterized by the following characteristics.

(6) Examples of the invention Embodiments of the present invention will be described in detail below with reference to the drawings.

The attached drawing is an exploded perspective view of the IC measurement socket with heater according to the present invention, in which 1 is
IC socket, 11 indicates a socket heater.

A recess 2 for placing an IC is formed approximately in the center of the IC socket, and an IC (not shown) is placed there.
Each element is connected to a contact pin 3, and the contact pin 3 is connected to a tester (not shown) via a performance board 5 schematically shown in the figure. The illustrated IC socket 1 is assembled with a socket heater 11, and for this purpose, a screw hole 4 for fixing the socket is provided. A screw hole 4 is similarly provided on the opposite side, but it is in the shadow of the socket body. Except for this point,
The IC socket 1 has the same structure as a conventional IC socket and performs the same function.

The socket heater 11 is formed as a substantially rectangular frame capable of receiving an IC socket, and a pair of opposing sides of the frame are provided with socket fixing screws corresponding to the socket fixing screw holes 4 of the IC socket 1 described above. Holes 12 are drilled. screw hole 1
A heater 13 is provided approximately in the center of each of a pair of opposing sides where 2 is not provided,
The heater 13 is connected to a temperature controller 14, while the temperature controller is connected to one side of the frame.
A temperature sensor 15 provided at the terminal is connected. The heater is 100℃ to 150℃ above the IC socket.
The temperature sensor 15 should have a capacity that can maintain the temperature within the temperature range of .degree. C., and a commercially available one can be used as the temperature sensor 15. The temperature sensor 14 is provided with a temperature indicator 14a and a knob 14b for adjusting the temperature of the heater 13.
The temperature inside the IC socket 1 is monitored and maintained within the above-mentioned temperature deviation tolerance of ±2°C. Although two heaters 13 and one temperature sensor are illustrated, the present invention is not limited to that case, and the number thereof can be appropriately selected depending on the type of IC and the content of the guarantee test.

In use, screws are inserted into the screw holes 4 and 12 to integrate the IC socket 1 and the socket heater 11, and the performance board 5 is connected to a tester (not shown). The IC taken out from the constant temperature bath (not shown) is placed in the recess 2, and after checking the temperature with the temperature indicator 14a, a guarantee test using a tester is performed. Since the performance board 5 is directly connected to a tester (not shown), the length of the line between the contact pin 3 and the tester is kept to a minimum, and the IC is kept at a predetermined measurement temperature as described above. Therefore, the temperature characteristics of the IC can be electrically tested accurately without noise.

(7) Effects of the invention As explained in detail above, according to the invention,
Since the electrical guarantee test of the temperature characteristics of the IC can be accurately performed within a short period of time, it is highly effective in improving the manufacturing yield of the IC.

[Brief explanation of drawings]

The accompanying drawing is an exploded perspective view of an embodiment of the present invention. 1...IC socket, 2...recess, 3...contact pin, 4...socket fixing screw hole, 13
... Heater, 14 ... Temperature controller, 14
a...Temperature display, 14b...Knob, 15...
Temperature sensor.

Claims (1)

[Scope of utility model registration request] It consists of a socket for measuring integrated circuits and a socket heater integrally combined with the socket, a semiconductor integrated circuit package to be tested is housed in a recess of the socket, and the socket heater is formed as a frame for receiving the socket, and is attached to the frame. A socket for measuring an integrated circuit with a heater, characterized in that at least one heater for heating the socket and a temperature sensor for detecting the temperature of the socket are provided, and these heaters and temperature sensors are connected to a temperature controller.