JPH04221774A - Wiring jig for inspecting wiring of high density board - Google Patents

Wiring jig for inspecting wiring of high density board

Info

Publication number
JPH04221774A
JPH04221774A JP2413262A JP41326290A JPH04221774A JP H04221774 A JPH04221774 A JP H04221774A JP 2413262 A JP2413262 A JP 2413262A JP 41326290 A JP41326290 A JP 41326290A JP H04221774 A JPH04221774 A JP H04221774A
Authority
JP
Japan
Prior art keywords
wiring
probe
board
jig
density board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2413262A
Other languages
Japanese (ja)
Inventor
Katsuhiro Akino
勝広 秋野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Original Assignee
Tanaka Kikinzoku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP2413262A priority Critical patent/JPH04221774A/en
Publication of JPH04221774A publication Critical patent/JPH04221774A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To perform reliable inspection of the wiring of a board brought into a high density state without adjoining probes making contact with each other. CONSTITUTION:A number of holes are formed at intervals of a given distance in a non-conductive plate supported to the board by means of a pin. A probe body is vertically movably held in each of a number of the holes, a probe cylinder part the upper outer periphery of which is caulked is pressed in and locked, and a lead wire is connected to the lower end of the probe cylinder part.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、高密度プリント基板の
品質保証の為に布線検査を行うのに用いる布線治具に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring jig used to inspect wiring for quality assurance of high-density printed circuit boards.

【0002】0002

【従来の技術】従来の布線治具は、図3に示す如く基盤
BにピンPにて支持されたベーク材、アクリル材、ガラ
スエポキシ材等の非導電性の板1に図4に示す如く穿設
された穴2にソケット3が圧入され、そのソケット3に
プローブ4の本体4aを上下動可能に保持した筒部4b
が差し込まれ、ソケット3の下方からプローブ4の筒体
4bにリード線5が結線されてなるものである。
2. Description of the Related Art A conventional wiring jig uses a non-conductive board 1 made of baking material, acrylic material, glass epoxy material, etc., supported by pins P on a base board B as shown in FIG. A socket 3 is press-fitted into the hole 2 drilled in the same manner as shown in FIG.
is inserted, and a lead wire 5 is connected to the cylindrical body 4b of the probe 4 from below the socket 3.

【0003】この布線治具6にて基板を検査するには、
その布線治具6の上に基板を載せ、プレスすることによ
り、プローブ4の本体4aの先端が基板のパッド部に接
触し、検査が行われるものである。
[0003] In order to inspect the board with this wiring jig 6,
By placing the substrate on the wiring jig 6 and pressing it, the tip of the main body 4a of the probe 4 comes into contact with the pad portion of the substrate, and inspection is performed.

【0004】0004

【発明が解決しようとする課題】ところで、上記布線治
具6は、ベーク材又はアクリル材の板1に穿設された穴
2にソケット3が圧入される為、穴2の直径が大きいこ
と、またソケット3の鍔3aの外形寸法に公差があるこ
と、さらにソケット3の圧入時に鍔部3aが押される為
、外径が圧入する前に比べて大きくなること等によって
、プローブ4間の隙間が殆んど無くなる為、高密度化に
よってパッドピッチ0.5mm、パッド長さ1.0mm
の基板の布線検査では、隣接するプローブ4が接触し、
ショートすることがある。即ち、上記基板に対応するソ
ケット3の外径が0.74mm、プローブ4の外径が0
.5mmの布線治具6では、プローブ4間の隙間が0.
78mmとなり、ソケット3間の隙間は最大で40ミク
ロンとなる為、ショートし、布線検査ができなくなるこ
とがある。
By the way, in the above-mentioned wiring jig 6, the diameter of the hole 2 is large because the socket 3 is press-fitted into the hole 2 drilled in the board 1 made of baking material or acrylic material. In addition, there are tolerances in the outer dimensions of the flange 3a of the socket 3, and since the flange 3a is pressed when the socket 3 is press-fitted, the outer diameter becomes larger than before press-fitting, so the gap between the probes 4 is reduced. is almost eliminated, so by increasing the density, the pad pitch is 0.5 mm and the pad length is 1.0 mm.
In wiring inspection of the board, adjacent probes 4 touch,
There may be a short circuit. That is, the outer diameter of the socket 3 corresponding to the above board is 0.74 mm, and the outer diameter of the probe 4 is 0.74 mm.
.. In the wiring jig 6 of 5 mm, the gap between the probes 4 is 0.
Since the gap between the sockets 3 is 78 mm and the maximum gap is 40 microns, a short circuit may occur and wiring inspection may not be possible.

【0005】因みにショートしない為の隙間は0.15
mm程度必要とされている。
[0005] Incidentally, the gap to prevent short circuit is 0.15.
About mm is required.

【0006】そこで本発明は、隣接するプローブが接触
することなく、高密度化された基板の布線検査を確実に
行うことができるようにした布線治具を提供しようとす
るものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a wiring jig that can reliably inspect wiring on a high-density board without causing adjacent probes to come into contact with each other.

【0007】[0007]

【課題を解決するための手段】上記課題を解決するため
の本発明の高密度基板布線検査用布線治具は、基盤にピ
ンにて支持された非導電性の板に多数の穴が所要の間隔
に穿設され、この多数の穴に夫々内部にプローブ本体を
上下動可能に保持し上部外周にかしめを入れたプローブ
筒部が圧入係止され、プローブ筒部の下端にリード線が
結線されてなるものである。
[Means for Solving the Problems] In order to solve the above problems, the wiring jig for high-density board wiring inspection of the present invention has many holes in a non-conductive plate supported by pins on the base. The probe tubes, which hold the probe bodies movably up and down and are caulked on the upper outer periphery, are press-fitted into the numerous holes, which are drilled at required intervals, and the lead wires are attached to the lower ends of the probe tubes. It is made by connecting wires.

【0008】[0008]

【作用】上記のように本発明の高密度基板布線検査用布
線治具は、ソケットを用いることなくプローブ筒部をベ
ーク材又はアクリル材の板に穿設された穴に圧入係止し
てプローブ本体を立てているので、プローブ間のピッチ
が狭くなっても、ソケットの無い分だけ隙間を確保でき
る。従って高密度基板の布線検査に於いてプローブがシ
ョートすることがない。
[Function] As described above, the wiring jig for high-density board wiring inspection of the present invention press-fits and locks the probe tube into a hole drilled in a baking material or acrylic material plate without using a socket. Since the probe body is erected, even if the pitch between the probes becomes narrower, there is still enough space to compensate for the lack of a socket. Therefore, the probe will not be short-circuited during wiring inspection of a high-density board.

【0009】[0009]

【実施例】本発明の高密度基板布線検査用布線治具の一
実施例を図によって説明すると、図3と同様に基盤Bに
ピンPにて支持された図1に示すベーク材よりなる厚さ
6.4mm、縦250mm、横200mmの板1に、密
な部分として0.78mm千鳥ピッチにて直径0.5m
mの穴2が8個穿設され、これ以外の粗の部分に直径0
.5mmの穴が198個穿設され、これら多数の穴2に
、図2に示す如く内部にプローブ4の本体4aを上下動
可能に保持し上部外周にラジオペンチ7等によりかしめ
8を入れたプローブ4の筒部4bが圧入係止され、プロ
ーブ筒部4bの下端にリード線5が結線されている。
[Example] An embodiment of the wiring jig for high-density board wiring inspection of the present invention will be explained with reference to the drawings.The baking material shown in FIG. A plate 1 with a thickness of 6.4 mm, a length of 250 mm, and a width of 200 mm has a diameter of 0.5 m at a staggered pitch of 0.78 mm as a dense part.
Eight m-sized holes 2 are drilled, and the other rough parts have a diameter of 0.
.. 198 holes 2 of 5 mm are drilled, and the main body 4a of the probe 4 is held inside the holes 2 so as to be movable up and down, as shown in FIG. 4 is press-fitted and locked, and a lead wire 5 is connected to the lower end of the probe cylinder section 4b.

【0010】このように構成された布線治具6′にて高
密度基板を布線検査すべく布線治具6′の上に高密度基
板を載せ、プレスすることにより、プローブ本体4aの
先端が高密度基板のパッド部に接触し、布線検査が行わ
れる。この布線検査の際、プローブ本体4aが下降して
もプローブ筒部4bは穴2より脱落することがない。ま
た上述の如く実施例の布線治具はソケットを用いること
なくプローブ筒部4bがベーク材又はアクリル材の板に
穿設された穴2に圧入係止されてプローブ本体4aが立
てられているので、プローブ本体4a間のピッチFが0
.65mmまで狭くなっても隙間を確保できる。従って
、前記布線検査に於いてプローブ4がショートすること
がない。
In order to inspect the wiring of a high-density board using the wiring jig 6' constructed as described above, the high-density board is placed on the wiring jig 6' and pressed, thereby making it possible to inspect the wiring of the probe body 4a. The tip comes into contact with the pad portion of the high-density board, and wiring inspection is performed. During this wiring inspection, the probe tube portion 4b does not fall out of the hole 2 even if the probe body 4a descends. Further, as described above, in the wiring jig of the embodiment, the probe tube portion 4b is press-fitted into the hole 2 drilled in the baking material or acrylic material plate without using a socket, and the probe body 4a is erected. Therefore, the pitch F between the probe bodies 4a is 0.
.. A gap can be secured even if the width is as narrow as 65 mm. Therefore, the probe 4 will not be short-circuited during the wiring inspection.

【0011】因みに本発明の布線治具は、プローブ4の
ピッチが0.4mmのものまで製作できる。
Incidentally, the wiring jig of the present invention can be manufactured with probes 4 having a pitch of up to 0.4 mm.

【0012】0012

【発明の効果】以上の通り本発明の高密度基板布線検査
用布線治具は、プローブ間のピッチが狭くなってもソケ
ットが無い分だけ隙間を確保でき、従って高密度基板の
布線検査に於いて、プローブがショートすることがなく
、確実に検査できて、信頼性が向上する。
Effects of the Invention As described above, the wiring jig for high-density board wiring inspection of the present invention can secure a gap corresponding to the lack of a socket even if the pitch between the probes becomes narrower, and therefore the wiring jig for high-density board wiring can be secured. During inspection, the probe does not short-circuit, and inspection can be performed reliably, improving reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の高密度基板布線検査用布線治具の要部
縦断面図である。
FIG. 1 is a longitudinal sectional view of a main part of a wiring jig for high-density board wiring inspection according to the present invention.

【図2】図1の布線治具のプローブの筒部の上部外周に
かしめを入れる手段を示す図である。
2 is a diagram showing a means for caulking the upper outer periphery of the cylindrical portion of the probe of the wiring jig shown in FIG. 1; FIG.

【図3】従来の基板布線検査用布線治具の斜視図である
FIG. 3 is a perspective view of a conventional wiring jig for inspecting board wiring.

【図4】図3の布線治具の要部縦断面図である。4 is a vertical sectional view of a main part of the wiring jig shown in FIG. 3; FIG.

【符号の説明】[Explanation of symbols]

B  基盤 P  ピン 1  板 2  穴 4  プローブ 4a  本体 4b  筒部 5  リード線 B. Foundation P pin 1 board 2 Hole 4 Probe 4a Main body 4b Cylinder part 5 Lead wire

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  基盤にピンにて支持された非導電性の
板に多数の穴が所要の間隔に穿設され、この多数の穴に
夫々内部にプローブ本体を上下動可能に保持し上部外周
にかしめを入れたプローブ筒部が圧入係止され、プロー
ブ筒部の下端にリード線が結線されてなる高密度基板布
線検査用布線治具。
Claim 1: A non-conductive plate supported by pins on a base plate has a large number of holes drilled at required intervals, each of which holds a probe body vertically movably, A wiring jig for high-density board wiring inspection, in which a caulked probe tube is press-fitted and a lead wire is connected to the lower end of the probe tube.
JP2413262A 1990-12-22 1990-12-22 Wiring jig for inspecting wiring of high density board Pending JPH04221774A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2413262A JPH04221774A (en) 1990-12-22 1990-12-22 Wiring jig for inspecting wiring of high density board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2413262A JPH04221774A (en) 1990-12-22 1990-12-22 Wiring jig for inspecting wiring of high density board

Publications (1)

Publication Number Publication Date
JPH04221774A true JPH04221774A (en) 1992-08-12

Family

ID=18521940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2413262A Pending JPH04221774A (en) 1990-12-22 1990-12-22 Wiring jig for inspecting wiring of high density board

Country Status (1)

Country Link
JP (1) JPH04221774A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017223453A (en) * 2016-06-13 2017-12-21 三菱電機株式会社 Inspection jig

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017223453A (en) * 2016-06-13 2017-12-21 三菱電機株式会社 Inspection jig

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