JPH04199524A - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JPH04199524A
JPH04199524A JP33533290A JP33533290A JPH04199524A JP H04199524 A JPH04199524 A JP H04199524A JP 33533290 A JP33533290 A JP 33533290A JP 33533290 A JP33533290 A JP 33533290A JP H04199524 A JPH04199524 A JP H04199524A
Authority
JP
Japan
Prior art keywords
substrate
recess
semiconductor element
protrusion
bump electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33533290A
Other languages
English (en)
Inventor
Jun Shibata
潤 柴田
Hideya Yagoura
御秡如 英也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP33533290A priority Critical patent/JPH04199524A/ja
Publication of JPH04199524A publication Critical patent/JPH04199524A/ja
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16237Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bonding area disposed in a recess of the surface of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73257Bump and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体素子を基板に搭載する際の位置決め
を容易とする構成とした半導体装置に関するものである
〔従来の技術〕
従来の半導体装置において、半導体素子を基板に実装す
る方法として、一般にフェースタウンホンディング法か
用いられる。第6図は、従来のフェースダウンボンデイ
ンク法による搭載状態の半導体装置を示す断面図である
。図において、(1a)は半導体素子、(2)は半導体
素子(Ia)か搭載される基板、(3)は半導体素子(
1a)に設けられた電極、(4)は基板(2)上に設け
られた導電層、(5)は電極(3)と導電層(4)とを
接続するための突起電極である。
突起電M (5)は、半田ポールの埋め込み、めっき、
蒸着などにより形成される。基板(2)J二には、予め
半導体素子(1a)の突起電極(5)に対応するように
導電層(4)か配置される。導電層(4)は、Cu、 
Ag、八uなどの金属に要すれば、さらに半田層をメツ
キしである。ここで、半導体素子(la)を突起電8i
(5)の面を下に向けて、導電層(4)に一致するよう
に載置し、この状態で加熱炉内で突起電極(5)の半田
を溶融し、導電層(4)に融着する。
〔発明か解決しようとする課題〕
従来の半導体素子は以上のように構成されており、半導
体素子を突起電極を下にして導電層上に載置するので、
突起電極を導電層に位置合せする際、半導体素子の陰に
なって見えないために、位置合せが困難であった。この
ため、対応する突起電極と導電層か非接触状態になりた
り、突起電極が複数の導電層にまたがって接触するなど
の問題点かあフた。
この発明は上記のような問題点を解消するためになされ
たもので、半導体素子を基板トの所定の位置に容易に位
置合せできる半導体装置を得ることを目的とする。
(課題を解決するための手段) この発明に係る半導体装置は、突起電極、突起又は素子
凹部を持つ半導体素子と、これら突起電極、突起又は素
子凹部に対応する基板凹部又は突起電極を持つ基板とを
組合せて形成したものである。
(作用〕 この発明における半導体素子−ヒの突起電極、突起又は
素子凹部とそれに対応する基板上の基板凹部又は突起電
極は、相互に対応してはめ込まれることにより、容易に
正確な位置若めかなされる。
〔実施例) 第1図は、この発明の一実施例を示す半導体装置の断面
図である。図において、(la)。
(3)、(4)、(5)は第6図の従来例におけるもの
と同等であるので説明を省略する。
(2a)は、半導体素子(1a)上に設けられた突起電
極(5)に対応した基板凹部(6)を持つ基板であり、
基板凹部(6)に導電層(4)が形成されている。基板
凹部(6)の形成方法としては、導電層(4)の部分を
残してソルダーレジスト服を厚く形成する。、多層基板
の中間層に導電層(4)を形成し、その上層に穴を開け
るなどの方法でなされる。
このように構成された半導体装置において、半導体素子
(la)を基板(2a)に載置する時は、従来例と同様
に突起電極(5)を下向きにして載置するので、突起電
極(5)と導電層(4)の相対位置関係を肉眼で確認す
ることは出来ないか、突起電極(5)を基板凹部(6)
にはめ込むことによって、自動的に導電層(4)と一致
させることか出来る。突起電極(5)と基板凹部(6)
をはめ込むには、半導体素子(1a)と基板(2a)と
の相対位置を治具なとによって大まかに合せておき、わ
ずかな範囲半導体素子(1a)を動かすことで達成でき
る。位置合せ後、突起電極(5)をリフローして電極(
3〉と導電層(4)を電気的。
機械的に接続する。
第2図〜第5図は、この発明の他の実施例を示す断面図
である。図において、(3)〜(6〉は第1図に示した
ものと同等である。(1b)〜(1e)は半導体素子、
(2b)〜(2e)は基板、(7)は素子凹部、(8)
はリート、(9)は突起、(10)は接着樹脂である。
第2図では、半導体素子(Ib)に素子凹部(7)を設
け、基板(2b)の導電層(4)の上に対応する突起電
極(5)を設けたものである。電極(3)は半導体素子
(lb)の素子凹部(7)に設けられる。
第1図の実施例とは凹凸の関係か入れ代っているか、効
果は同様である。なお、素子凹部(7)は、ニーIチン
グなどによって形成する。第3図は、電極(3)と導電
層(4)との電気的接続をソート(8)によって行い半
導体素子(IC)上の突起(9)と基板凹部(6)は位
置合せと機械的接続の役目をするものである。
第4図は、第3図と同様にリード(8)によって電気的
接続を行い、基板(2d)上の突起(9)と半導体素子
(1d)の素子凹部(7)は、位置合せの役目をして、
接着樹脂(10)によって機械的接続を行ったものであ
る。第3図、第4図の場合、必要てあれば半導体素子(
Ic) 、  (Id)の裏面と電気的接続をとっても
よい。第5図は、半導体素子(1e)上の一部の突起電
極(5)にのみ、基板(2e)上に対応する基板凹部(
6)を設けて位置合せの役目をさせたものである。
〔発明の効果〕 以上のように、この発明によれば、半導体素子の上に突
起電極、突起又は素を凹部を設け、基板上にそれに対紀
・する基板凹部又は突起電極を設けて、半導体素子の突
起電極、突起又は素子凹部か基板上の基板凹部又は突起
電極に、はまり込むように構成したので、半導体素子と
基板のイη置合せか容易になり、生産性が向上する。
【図面の簡単な説明】
第1図はこの発明の一実施例による半導体装置の基板搭
載状態を示した断面図、第2図〜第5図はこの発明の他
の実施例による半導体装置の基板搭載状態の断面図、第
6図は従来の半導体装置の基板搭載状態を示す断面図で
ある。 図において(la)〜(le)は半導体素子、(3)は
電極、(4)は導電層、(5)は突起電極、(6)は基
板凹部、(7)は素子凹部、(9)は突起、(10)は
接着樹脂である。 なお、各図中、同一符号は同一、又は相当部分を示す。

Claims (1)

    【特許請求の範囲】
  1.  突起電極、突起又は素子凹部を持つ半導体素子と、上
    記突起電極、突起又は素子凹部に対応する基板凹部又は
    突起電極と持つ基板とを組合せて成ることを特徴とする
    半導体装置。
JP33533290A 1990-11-28 1990-11-28 半導体装置 Pending JPH04199524A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33533290A JPH04199524A (ja) 1990-11-28 1990-11-28 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33533290A JPH04199524A (ja) 1990-11-28 1990-11-28 半導体装置

Publications (1)

Publication Number Publication Date
JPH04199524A true JPH04199524A (ja) 1992-07-20

Family

ID=18287335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33533290A Pending JPH04199524A (ja) 1990-11-28 1990-11-28 半導体装置

Country Status (1)

Country Link
JP (1) JPH04199524A (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4446471A1 (de) * 1994-12-23 1996-06-27 Fraunhofer Ges Forschung Chipkontaktierungsverfahren und damit hergestellte elektronische Schaltung
JP2005311358A (ja) * 2004-04-19 2005-11-04 General Electric Co <Ge> 電子機器組立体並びにそれを組立てるための装置及び方法
JP2008147317A (ja) * 2006-12-08 2008-06-26 Matsushita Electric Ind Co Ltd 電子部品の実装方法
JP2013098701A (ja) * 2011-10-31 2013-05-20 Daishinku Corp 圧電振動デバイスおよび圧電振動デバイスの製造方法
WO2016143403A1 (ja) * 2015-03-10 2016-09-15 ソニー株式会社 電子部品、電子部品実装基板及び電子部品の実装方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4446471A1 (de) * 1994-12-23 1996-06-27 Fraunhofer Ges Forschung Chipkontaktierungsverfahren und damit hergestellte elektronische Schaltung
JP2005311358A (ja) * 2004-04-19 2005-11-04 General Electric Co <Ge> 電子機器組立体並びにそれを組立てるための装置及び方法
JP2008147317A (ja) * 2006-12-08 2008-06-26 Matsushita Electric Ind Co Ltd 電子部品の実装方法
JP2013098701A (ja) * 2011-10-31 2013-05-20 Daishinku Corp 圧電振動デバイスおよび圧電振動デバイスの製造方法
WO2016143403A1 (ja) * 2015-03-10 2016-09-15 ソニー株式会社 電子部品、電子部品実装基板及び電子部品の実装方法
CN107438894A (zh) * 2015-03-10 2017-12-05 索尼半导体解决方案公司 电子部件、电子部件安装基板和用于安装电子部件的方法
US10753551B2 (en) 2015-03-10 2020-08-25 Sony Semiconductor Solutions Corporation Electronic component, electronic component mounting substrate, and electronic component mounting method to facilitate positional alignment between the electronic component and the mounting substrate

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