JPH0414722B2 - - Google Patents

Info

Publication number
JPH0414722B2
JPH0414722B2 JP60176401A JP17640185A JPH0414722B2 JP H0414722 B2 JPH0414722 B2 JP H0414722B2 JP 60176401 A JP60176401 A JP 60176401A JP 17640185 A JP17640185 A JP 17640185A JP H0414722 B2 JPH0414722 B2 JP H0414722B2
Authority
JP
Japan
Prior art keywords
package
prism
soldered
circuit board
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60176401A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6236509A (ja
Inventor
Moritoshi Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17640185A priority Critical patent/JPS6236509A/ja
Publication of JPS6236509A publication Critical patent/JPS6236509A/ja
Publication of JPH0414722B2 publication Critical patent/JPH0414722B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
JP17640185A 1985-08-10 1985-08-10 形状検査方法およびその装置 Granted JPS6236509A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17640185A JPS6236509A (ja) 1985-08-10 1985-08-10 形状検査方法およびその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17640185A JPS6236509A (ja) 1985-08-10 1985-08-10 形状検査方法およびその装置

Publications (2)

Publication Number Publication Date
JPS6236509A JPS6236509A (ja) 1987-02-17
JPH0414722B2 true JPH0414722B2 (esLanguage) 1992-03-13

Family

ID=16013026

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17640185A Granted JPS6236509A (ja) 1985-08-10 1985-08-10 形状検査方法およびその装置

Country Status (1)

Country Link
JP (1) JPS6236509A (esLanguage)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4888982A (esLanguage) * 1972-02-23 1973-11-21
US4377238A (en) * 1980-08-27 1983-03-22 The United States Of America As Represented By The United States Department Of Energy Flaw detection and evaluation
DE3038477A1 (de) * 1980-10-11 1982-05-06 Manfred Ing.(grad.) 2000 Hamburg Eickhorst Refraktometer zur edelsteinuntersuchung

Also Published As

Publication number Publication date
JPS6236509A (ja) 1987-02-17

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