JPH0395979A - 超伝導集積回路の良否の診断方法 - Google Patents

超伝導集積回路の良否の診断方法

Info

Publication number
JPH0395979A
JPH0395979A JP1231876A JP23187689A JPH0395979A JP H0395979 A JPH0395979 A JP H0395979A JP 1231876 A JP1231876 A JP 1231876A JP 23187689 A JP23187689 A JP 23187689A JP H0395979 A JPH0395979 A JP H0395979A
Authority
JP
Japan
Prior art keywords
electrode
oxide film
integrated circuit
wafer
anode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1231876A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0587194B2 (enrdf_load_stackoverflow
Inventor
Akira Kamishiro
暁 神代
Hiroshi Nakagawa
博 仲川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP1231876A priority Critical patent/JPH0395979A/ja
Publication of JPH0395979A publication Critical patent/JPH0395979A/ja
Publication of JPH0587194B2 publication Critical patent/JPH0587194B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
JP1231876A 1989-09-07 1989-09-07 超伝導集積回路の良否の診断方法 Granted JPH0395979A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1231876A JPH0395979A (ja) 1989-09-07 1989-09-07 超伝導集積回路の良否の診断方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1231876A JPH0395979A (ja) 1989-09-07 1989-09-07 超伝導集積回路の良否の診断方法

Publications (2)

Publication Number Publication Date
JPH0395979A true JPH0395979A (ja) 1991-04-22
JPH0587194B2 JPH0587194B2 (enrdf_load_stackoverflow) 1993-12-15

Family

ID=16930410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1231876A Granted JPH0395979A (ja) 1989-09-07 1989-09-07 超伝導集積回路の良否の診断方法

Country Status (1)

Country Link
JP (1) JPH0395979A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5691725A (en) * 1995-09-08 1997-11-25 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus capable of measuring plural distance data for calculated angle ranges
US5699150A (en) * 1995-07-14 1997-12-16 Mitsubushi Denki Kabushiki Kaisha Vehicle optical radar apparatus
US5959734A (en) * 1997-11-26 1999-09-28 Mitsubishi Denki Kabushiki Kaisha Distance measuring device
US6064471A (en) * 1997-11-26 2000-05-16 Mitsubishi Denki Kabushiki Kaisha Distance measuring device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50149975A (enrdf_load_stackoverflow) * 1974-05-22 1975-12-01

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50149975A (enrdf_load_stackoverflow) * 1974-05-22 1975-12-01

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5699150A (en) * 1995-07-14 1997-12-16 Mitsubushi Denki Kabushiki Kaisha Vehicle optical radar apparatus
US5691725A (en) * 1995-09-08 1997-11-25 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus capable of measuring plural distance data for calculated angle ranges
US5959734A (en) * 1997-11-26 1999-09-28 Mitsubishi Denki Kabushiki Kaisha Distance measuring device
US6064471A (en) * 1997-11-26 2000-05-16 Mitsubishi Denki Kabushiki Kaisha Distance measuring device

Also Published As

Publication number Publication date
JPH0587194B2 (enrdf_load_stackoverflow) 1993-12-15

Similar Documents

Publication Publication Date Title
JP3558434B2 (ja) 電気的配線検査方法及び装置
JPH0395979A (ja) 超伝導集積回路の良否の診断方法
JP4277398B2 (ja) 配線板の検査装置
JP2003100832A (ja) 半導体装置の検査方法およびプログラム
US4427496A (en) Method for improving the inspection of printed circuit boards
US6736699B2 (en) Electrolytic polishing apparatus, electrolytic polishing method and wafer subject to polishing
JP3038114U (ja) 絶縁性被膜付きプローブ及びこれを用いたプローブカード
Seger New method of measuring electrode resistance for quality control
US6248601B1 (en) Fix the glassivation layer's micro crack point precisely by using electroplating method
JP2959529B2 (ja) 荷電粒子ビームによる半導体ウエハー検査装置及び検査方法
JP2000232141A (ja) 半導体パッケージ用基板の導通検査方法
JPS63119216A (ja) 電解コンデンサの極性判別方法及びその装置
Gajda Techniques in failure analysis of MOS devices
JP2600102B2 (ja) 超伝導集積回路構造とその製造方法
US7393702B2 (en) Characterizing the integrity of interconnects
JP3281164B2 (ja) Icのインサーキットテスタによる足浮き検出方法
KR100632534B1 (ko) 절연층 측정장치 및 측정방법
Libsch et al. Potential‐Induced Impedance Variations in Barrier‐Type Aluminum Oxide Films in Aqueous Sodium Sulfate
JPH0566732B2 (enrdf_load_stackoverflow)
JPH0152690B2 (enrdf_load_stackoverflow)
CN117491832A (zh) 半导体器件的检测方法
JPS6257255B2 (enrdf_load_stackoverflow)
Manca et al. In situ failure detection in thick film multilayer systems
JPH0541419A (ja) 検査装置の評価方法
JPS63122136A (ja) 集積回路

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term