JPH0381575U - - Google Patents

Info

Publication number
JPH0381575U
JPH0381575U JP14284489U JP14284489U JPH0381575U JP H0381575 U JPH0381575 U JP H0381575U JP 14284489 U JP14284489 U JP 14284489U JP 14284489 U JP14284489 U JP 14284489U JP H0381575 U JPH0381575 U JP H0381575U
Authority
JP
Japan
Prior art keywords
output
address
multiplexer
control information
test pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14284489U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0742150Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14284489U priority Critical patent/JPH0742150Y2/ja
Publication of JPH0381575U publication Critical patent/JPH0381575U/ja
Application granted granted Critical
Publication of JPH0742150Y2 publication Critical patent/JPH0742150Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14284489U 1989-12-11 1989-12-11 テストパタン発生器 Expired - Fee Related JPH0742150Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14284489U JPH0742150Y2 (ja) 1989-12-11 1989-12-11 テストパタン発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14284489U JPH0742150Y2 (ja) 1989-12-11 1989-12-11 テストパタン発生器

Publications (2)

Publication Number Publication Date
JPH0381575U true JPH0381575U (enExample) 1991-08-20
JPH0742150Y2 JPH0742150Y2 (ja) 1995-09-27

Family

ID=31689653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14284489U Expired - Fee Related JPH0742150Y2 (ja) 1989-12-11 1989-12-11 テストパタン発生器

Country Status (1)

Country Link
JP (1) JPH0742150Y2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7603604B2 (en) * 2007-04-09 2009-10-13 Advantest Corporation Test apparatus and electronic device

Also Published As

Publication number Publication date
JPH0742150Y2 (ja) 1995-09-27

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees